| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 09/07/2004 | US6788068 Method and device for measuring pure resistance of on-vehicle battery by periodically measuring a discharge current and terminal voltage while a rush current flows into a constant load |
| 09/07/2004 | US6788047 DUT board for eliminating electrostatic discharge damage |
| 09/07/2004 | US6788000 Distributed emergency lighting system having self-testing and diagnostic capabilities |
| 09/07/2004 | US6787935 Battery sensor device |
| 09/07/2004 | US6787802 Semiconductor device including evaluation elements |
| 09/07/2004 | US6787801 Wafer with additional circuit parts in the kerf area for testing integrated circuits on the wafer |
| 09/07/2004 | US6787799 Device and method for detecting a reliability of integrated semiconductor components at high temperatures |
| 09/07/2004 | US6787708 Printed circuit board debug technique |
| 09/07/2004 | US6787375 Microelectronic fabrication die electrical test method providing enhanced microelectronic fabrication die electrical test efficiency |
| 09/07/2004 | US6787374 Semiconductor device manufacturing method and semiconductor device sorting system to be used with the same |
| 09/07/2004 | US6786319 Belt conveyer with power conduction for electrical test |
| 09/07/2004 | CA2459214A1 Method and apparatus for determining the resonant frequency of a resonant circuit |
| 09/06/2004 | CA2459441A1 Power circuit tester apparatus and method |
| 09/05/2004 | CA2459314A1 Signal leakage detector |
| 09/02/2004 | WO2004075418A2 Method and apparatus for transmitting information within a communication system |
| 09/02/2004 | WO2004075283A1 Anisotropic conductive connector and probe member and wafer inspecting device and wafer inspecting method |
| 09/02/2004 | WO2004075270A1 Probe pin zero-point detecting method and probe device |
| 09/02/2004 | WO2004075250A2 Testing of electronic circuits |
| 09/02/2004 | WO2004075011A2 Methods and apparatus for data analysis |
| 09/02/2004 | WO2004074859A1 Method and system for electrical length matching |
| 09/02/2004 | WO2004074857A1 Device for measuring electric characteristic of cable assembly, program for measuring electric characteristic of cable assembly, and method for measuring electric characteristic of cable assembly |
| 09/02/2004 | WO2004074852A2 Method and circuit for at-speed testing of scan circuits |
| 09/02/2004 | WO2004074316A1 Conformationally constrained backbone cyclized peptide analogs |
| 09/02/2004 | WO2004063738A3 Battery monitoring system and method |
| 09/02/2004 | US20040172607 Method of characterizing an electronic device having unbalanced ground currents |
| 09/02/2004 | US20040172606 Semiconductor device having embedded array |
| 09/02/2004 | US20040172605 Semiconductor integrated circuit device and design automation apparatus, method and program |
| 09/02/2004 | US20040172430 Method and device for acquiring data |
| 09/02/2004 | US20040172211 Test wafer usage forecast modeling method |
| 09/02/2004 | US20040172152 Sorting a group of integrated circuit devices for those devices requiring special testing |
| 09/02/2004 | US20040171353 Device and method for checking signal transmission quality of circuit board |
| 09/02/2004 | US20040170067 Semiconductor memory device permitting control of internal power supply voltage in packaged state |
| 09/02/2004 | US20040169524 Dynamic burn-in method and apparatus |
| 09/02/2004 | US20040169523 On-chip ADC test for image sensors |
| 09/02/2004 | US20040169522 Method and device for testing electronic devices |
| 09/02/2004 | US20040169520 Methods and apparatus for testing optical and electrical components |
| 09/02/2004 | US20040169518 Fault location method and device |
| 09/02/2004 | US20040169517 Electrical continuity tester |
| 09/02/2004 | US20040169495 Estimating apparatus and method of input and output enabling powers for secondary cell |
| 09/02/2004 | US20040169243 Apparatus and method for fabricating arrays of atomic-scale contacts and gaps between electrodes and applications thereof |
| 09/02/2004 | DE69726219T2 Verfahren und Vorrichtung zur Prüfung einer Speicher-integrierten Schaltung Method and apparatus for testing a memory-integrated circuit |
| 09/02/2004 | DE10392148T5 Messvorrichtung und Messverfahren Measuring apparatus and measurement procedures |
| 09/02/2004 | DE10343301A1 Charakterisieren eines Jitter von wiederholten Mustern Characterizing a jitter of repeated patterns |
| 09/02/2004 | DE10309197A1 Kurzschlussanzeiger mit Fernmeldeeinrichtung für elektrische Leiter Short Circuit Indicator with telecommunications device for electrical conductors |
| 09/02/2004 | DE10225058B4 Verfahren zur selektiven Erfassung von Erdschlusswischern in Drehstromnetzen Process for the selective detection of Erdschlusswischern in three-phase systems |
| 09/02/2004 | DE102004004308A1 Halbleiterbaustein und Testschaltung zum effektiven Ausführen eines Verifizierungstests für nichtflüchtige Speicherzellen Semiconductor device and test circuit for effectively performing a verification test for non-volatile memory cells |
| 09/02/2004 | CA2515784A1 Methods and apparatus for data analysis |
| 09/02/2004 | CA2515265A1 Method and system for electrical length matching |
| 09/01/2004 | EP1452882A2 Component mounting inspection method and apparatus |
| 09/01/2004 | EP1452881A1 Printed circuit board and method of use thereof |
| 09/01/2004 | EP1452877A1 Short-circuit detection in a converter |
| 09/01/2004 | EP1451973A1 Policy-based forward error correction in packet networks |
| 09/01/2004 | EP1451599A1 Method and apparatus for embeded built-in self-test (bist) of electronic circuits and systems |
| 09/01/2004 | EP1451598A2 Test machine for testing an integrated circuit with a comparator |
| 09/01/2004 | EP1451597A1 Erdschlussdetektor für wicklungen |
| 09/01/2004 | EP1451596A1 Method for detecting the operability of a number of identical zener diodes that are connected in parallel to one another and to a solenoid |
| 09/01/2004 | EP1451594A1 Test probe for a finger tester and corresponding finger tester |
| 09/01/2004 | EP0650067B1 Electrooptic instrument |
| 09/01/2004 | CN1526163A Probe device and probe testing method |
| 09/01/2004 | CN1526077A Digital system and a method for error detection thereof |
| 09/01/2004 | CN1526076A Apparatus for handling electronic components and method for controlling temperature of electronic components |
| 09/01/2004 | CN1526075A Heater-equipped pusher, electronic component handling apparatus, and temperature control method for electronic component |
| 09/01/2004 | CN1525592A Estimating apparatus and method of input and output enabling powers for secondary cell |
| 09/01/2004 | CN1525490A Method for testing semiconductor memory device and test circuit for semiconductor memory device |
| 09/01/2004 | CN1525188A Delay fault quality checking and assessment method |
| 09/01/2004 | CN1525187A Apparatus for testing semiconductor integrated circuit |
| 09/01/2004 | CN1525186A Electric line fault location device |
| 09/01/2004 | CN1525185A Electrical inspection apparatus |
| 09/01/2004 | CN1525184A Printed board checking apparatus |
| 09/01/2004 | CN1525182A Detection structure and fabrication method for organic light emitting diode display panel |
| 09/01/2004 | CN1525179A Work measurement apparatus |
| 09/01/2004 | CN1165101C Apparatus and method for determining local short-circuit |
| 09/01/2004 | CN1164952C Monitoring method of back-up period of battery in steady load UPS |
| 08/31/2004 | US6785858 Semiconductor device capable of adjusting timing of input waveform by tester with high accuracy |
| 08/31/2004 | US6785857 Fixed-logic signal generated in an integrated circuit for testing a function macro integrated in an integrated circuit |
| 08/31/2004 | US6785854 Test access port (TAP) controller system and method to debug internal intermediate scan test faults |
| 08/31/2004 | US6785853 Integration type input circuit and method of testing it |
| 08/31/2004 | US6785852 Memory device redundant repair analysis method, recording medium and apparatus |
| 08/31/2004 | US6785629 Accuracy determination in bit line voltage measurements |
| 08/31/2004 | US6785628 Apparatus and method for determining effect of on-chip noise on signal propagation |
| 08/31/2004 | US6785627 Apparatus and method for determining effect of on-chip noise on signal propagation |
| 08/31/2004 | US6785626 Apparatus and method for determining effect of on-chip noise on signal propagation |
| 08/31/2004 | US6785625 Characterizing multi-port cascaded networks |
| 08/31/2004 | US6785516 Testing device for wireless transmission towers |
| 08/31/2004 | US6785413 Rapid defect analysis by placement of tester fail data |
| 08/31/2004 | US6785173 Semiconductor memory device capable of performing high-frequency wafer test operation |
| 08/31/2004 | US6785172 Semiconductor memory device |
| 08/31/2004 | US6785106 Integrate circuit device |
| 08/31/2004 | US6785104 Low energy pulsing device and method for electrical system arc detection |
| 08/31/2004 | US6784819 Measuring skew between digitizer channels using fourier transform |
| 08/31/2004 | US6784802 Real time monitoring of cable patch panel |
| 08/31/2004 | US6784715 Conditional clock buffer circuit |
| 08/31/2004 | US6784686 Semiconductor testing device |
| 08/31/2004 | US6784685 Testing vias and contacts in an integrated circuit |
| 08/31/2004 | US6784684 Testing apparatus including testing board having wirings connected to common point and method of testing semiconductor device by composing signals |
| 08/31/2004 | US6784682 Method of detecting shallow trench isolation corner thinning by electrical trapping |
| 08/31/2004 | US6784681 Semiconductor integrated circuit testing system and method |
| 08/31/2004 | US6784680 Contact probe with guide unit and fabrication method thereof |
| 08/31/2004 | US6784674 Test signal distribution system for IC tester |
| 08/31/2004 | US6784668 Electrical conduction array on the bottom side of a tester thermal head |