| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 09/09/2004 | US20040176924 Apparatus and method for testing electronic systems |
| 09/09/2004 | US20040176923 Testing of a frequency converter device |
| 09/09/2004 | US20040175943 System and method of pattern detection for semiconductor wafer map data |
| 09/09/2004 | US20040175851 Wafer level system for producing burn-in/screen, and reliability evaluations to be performed on all chips simultaneously without any wafer contacting |
| 09/09/2004 | US20040175850 Test system and manufacturing of semiconductor device |
| 09/09/2004 | US20040174753 Semiconductor integrated circuit apparatus and circuit board and information readout method |
| 09/09/2004 | US20040174641 Magneto-resistance effect element, magneto-resistance effect head, magneto-resistance transducer system, and magnetic storage system |
| 09/09/2004 | US20040174530 Semiconductor fabricating apparatus with function of determining etching processing state |
| 09/09/2004 | US20040174309 Signal leakage detector |
| 09/09/2004 | US20040174183 Image display device having inspection terminal |
| 09/09/2004 | US20040174182 Apparatus and method for testing pixels arranged in a matrix array |
| 09/09/2004 | US20040174181 Temperature-controlled thermal platform for automated testing |
| 09/09/2004 | US20040174180 Connection unit, a board for mounting a device under test, a probe card and a device interfacing part |
| 09/09/2004 | US20040174179 Modifying a semiconductor device to provide electrical parameter monitoring |
| 09/09/2004 | US20040174178 Method and apparatus for testing semiconductor circuitry for operability and method of forming apparatus for testing semiconductor circuitry for operability |
| 09/09/2004 | US20040174177 Inspection method and inspection apparatus |
| 09/09/2004 | US20040174176 Semiconductor interconnect having semiconductor spring contacts, test systems incorporating the interconnect and test methods using the interconnect |
| 09/09/2004 | US20040174174 Methods and apparatus for creating a high speed connection between a device under test and automatic test equipment |
| 09/09/2004 | US20040174173 Power circuit tester apparatus and method |
| 09/09/2004 | US20040174170 Method and apparatus for measuring voltage of battery module of electric vehicle |
| 09/09/2004 | US20040174169 Synthetic test circuit for circuit breaker testing |
| 09/09/2004 | US20040174153 Apparatus and method for electrical cable identification |
| 09/09/2004 | US20040174141 Vehicle electrical system including battery state of charge detection on the positive terminal of the battery |
| 09/09/2004 | US20040173003 Method for calibrating semiconductor test instrument |
| 09/09/2004 | US20040172816 Interconnect validation instruments |
| 09/09/2004 | DE3923937C5 Diagnoseeinrichtung zum Überprüfen eines elektronischen Steuersystems einer Brennkraftmaschine Diagnosis means for checking an electronic control system of an internal combustion engine |
| 09/09/2004 | DE202004008636U1 Current and voltage sensing component diagnosis unit for car safety components has compact ergonomic hand held housing with display, control button and probes |
| 09/09/2004 | DE10307972A1 Earth connection method for recognizing and locating earth connections with low and high impedance measures frequencies different from a mains frequency |
| 09/09/2004 | DE10307537A1 Integrated module with delay element has means of controlling and checking signal propagation times |
| 09/09/2004 | DE10307344A1 Vorrichtung und Verfahren zur dezentralen On-Board-Diagnose für Kraftfahrzeuge Apparatus and method for decentralized On-board diagnostics for motor vehicles |
| 09/09/2004 | DE10306620A1 Integrated test circuit for testing integrated semiconductor circuits tests multiple internal voltages in an integrated circuit |
| 09/09/2004 | DE10305662A1 Series internal resistance measurement method, for photovoltaic cells and modules, measures first characteristic current-voltage line, and calculates second characteristic line by simulation of irradiation intensity reduction |
| 09/09/2004 | DE10297252T5 Fahrzeugmontierte Batterieüberwachungsvorrichtung und Batterieüberwachungsverfahren Vehicle-mounted battery monitor and battery monitoring procedures |
| 09/09/2004 | DE102004005530A1 Brennstoffzellen-Betriebszustandbestimmungsgerät und Verfahren Fuel cell operating state determination apparatus and method |
| 09/09/2004 | DE10060438B4 Testanordnung zum parallelen Test einer Mehrzahl von integrierten Schaltkreisen und Testverfahren Test arrangement for parallel testing of a plurality of integrated circuits and test procedures |
| 09/09/2004 | DE10017622B4 Prüfvorrichtung und Verfahren zum elektrischen Prüfen von elektronischen Vorrichtungen Tester and method for electrical testing of electronic devices |
| 09/08/2004 | EP1455428A2 Electronic tripping device for low-voltage circuit-breakers |
| 09/08/2004 | EP1455388A1 Reliability evaluation tester, reliability evaluation test system, contactor, and reliability evaluation test method |
| 09/08/2004 | EP1455387A1 Probe device |
| 09/08/2004 | EP1455259A2 Method and apparatus for selecting an operating mode in an integrated circuit |
| 09/08/2004 | EP1455195A1 Improved apparatus and method to control the voltage of electrochemical generators for a rechargable battery |
| 09/08/2004 | EP1455194A1 Apparatus and method for charging battery cells |
| 09/08/2004 | EP1455192A2 Apparatus and method for measuring the resonance frequency of a resonant circuit |
| 09/08/2004 | EP1454375A1 Multiple plateau battery charging method and system to fully charge the first plateau |
| 09/08/2004 | EP1454250A2 System and method for modifying a video stream based on a client or network environment |
| 09/08/2004 | EP1454153A2 Flexible interface for a test head |
| 09/08/2004 | EP1153465A4 Method and apparatus for monitoring and maintaining a plurality of batteries using a fuzzy logic |
| 09/08/2004 | EP1025479A4 Parallel processing pattern generation system for an integrated circuit tester |
| 09/08/2004 | CN2639904Y Ligature type needle bed testing machine |
| 09/08/2004 | CN2639903Y Large power electric energy quality signal generating device |
| 09/08/2004 | CN1528051A Method and apparatus for adjusting the phase of input/ output circuitry |
| 09/08/2004 | CN1528032A Self-aligning socket connector |
| 09/08/2004 | CN1527948A Low-jitter clock for test system |
| 09/08/2004 | CN1527457A Integrated cell charging and testing device |
| 09/08/2004 | CN1527373A Apparatus for testing integrated module and method for operating the testing device |
| 09/08/2004 | CN1527228A Order reducing method for non-linear circuit model based on direct progection and variation analysis |
| 09/08/2004 | CN1527104A Image display device equipment with checking terminal |
| 09/08/2004 | CN1527064A Information collecting device and information collecting and analytical system |
| 09/08/2004 | CN1527063A On-line test pen for the protection function of distribution frame |
| 09/08/2004 | CN1527062A Test device |
| 09/08/2004 | CN1166091C Instrument with focus variable characteristics for testing and measuring capacibility of telecommunication time scales test |
| 09/08/2004 | CN1165775C High-voltage transmission line insulator live intelligent detector apparatus |
| 09/08/2004 | CN1165772C Sensor for detecting high-frequency oscillations of voltage and arrangement of sensor |
| 09/07/2004 | US6789239 Program conversion system |
| 09/07/2004 | US6789236 Integrated circuit device characterization |
| 09/07/2004 | US6789224 Method and apparatus for testing semiconductor devices |
| 09/07/2004 | US6789223 Method for optimizing test development for digital circuits |
| 09/07/2004 | US6789222 Single-pass methods for generating test patterns for combinational circuits |
| 09/07/2004 | US6789221 Integrated circuit with self-test circuit |
| 09/07/2004 | US6789220 Method and apparatus for vector processing |
| 09/07/2004 | US6789219 Arrangement and method of testing an integrated circuit |
| 09/07/2004 | US6789205 System for determining intrinsic safety status of the combination of a communication device and a battery |
| 09/07/2004 | US6789137 Semiconductor memory device allowing reduction of I/O terminals |
| 09/07/2004 | US6789055 Timing verification checking value extracting method |
| 09/07/2004 | US6789036 Microelectronic transient power generator for power system validation |
| 09/07/2004 | US6789026 Circuit and method for monitoring battery state of charge |
| 09/07/2004 | US6788993 Sorting a group of integrated circuit devices for those devices requiring special testing |
| 09/07/2004 | US6788610 Semiconductor memory device and method for selecting multiple word lines in a semiconductor memory device |
| 09/07/2004 | US6788445 Multi-beam polygon scanning system |
| 09/07/2004 | US6788127 Circuit for variably delaying data |
| 09/07/2004 | US6788105 Semiconductor integrated circuit |
| 09/07/2004 | US6788095 Method for gross input leakage functional test at wafer sort |
| 09/07/2004 | US6788094 Wafer-level burn-in and test |
| 09/07/2004 | US6788093 Methodology and apparatus using real-time optical signal for wafer-level device dielectrical reliability studies |
| 09/07/2004 | US6788092 Test assembly for integrated circuit package |
| 09/07/2004 | US6788091 Method and apparatus for automatic marking of integrated circuits in wafer scale testing |
| 09/07/2004 | US6788090 Method and apparatus for inspecting semiconductor device |
| 09/07/2004 | US6788089 Method and apparatus for inspecting and integrated circuit by measuring voltage on a signal line |
| 09/07/2004 | US6788087 Integrated circuit having a test circuit, and method of decoupling a test circuit in an integrated circuit |
| 09/07/2004 | US6788085 Self-aligning wafer burn-in probe |
| 09/07/2004 | US6788084 Temperature control of electronic devices using power following feedback |
| 09/07/2004 | US6788083 Method and apparatus to provide a burn-in board with increased monitoring capacity |
| 09/07/2004 | US6788082 Probe card |
| 09/07/2004 | US6788079 Indexing multiple test probe system and method |
| 09/07/2004 | US6788078 Apparatus for scan testing printed circuit boards |
| 09/07/2004 | US6788077 Automated test sequence editor and engine for transformer testing |
| 09/07/2004 | US6788076 Apparatus for determining doping concentration of a semiconductor wafer |
| 09/07/2004 | US6788073 Data processing systems having mismatched impedance components |
| 09/07/2004 | US6788070 Fault tolerant semiconductor system |
| 09/07/2004 | US6788069 Method for calculating the parameters of the power battery of an electric motor vehicle |