| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 09/16/2004 | US20040178769 Battery-condition detection |
| 09/16/2004 | US20040178427 A-C:H ISFET device, manufacturing method, and testing methods and apparatus thereof |
| 09/16/2004 | DE4332618B4 Einbrenntestschaltung für eine Halbleiterspeichervorrichtung Einbrenntestschaltung for a semiconductor memory device |
| 09/16/2004 | DE19918529B4 Verfahren und Vorrichtung zur Bestimmung des Ladezustands und/oder der aktuellen Kapazität einer Batterie Method and device for determining the charge state and / or the current capacity of a battery |
| 09/16/2004 | DE10325818B3 Handling device especially for positioning a test head, e.g. for use in testing integrated circuits, has carrier and bearing plates for the test head with cut-out sections to simplify head mounting |
| 09/16/2004 | DE10310143A1 Verfahren und Vorrichtung zur Bestimmung der Resonanzfrequenz eines Resonanzkreises Method and apparatus for determining the resonant frequency of a resonant circuit |
| 09/16/2004 | DE10310140A1 Integrated device tester, has connection locations arranged in groups, with control connections connected to control bus, and address and command connections for each location |
| 09/16/2004 | DE10309079A1 Semiconductor appliance consists of at least one non-wrapped chip inserted in pocket-shaped depression of wafer pack, with contacting members including contact faces |
| 09/16/2004 | DE10308333A1 Burn-in system for semiconductor devices on wafer plane, has power supplies connected to input contacts of contacting device, and with signal contacts connected to measuring contacts |
| 09/16/2004 | DE10296952T5 Vorrichtung und Verfahren zum Prüfen einer Halbleitervorrichtung Apparatus and method for testing a semiconductor device |
| 09/16/2004 | DE10118724B4 Positioniervorrichtung für Testköpfe von elektronischen Testsystemen zum Testen elektronischer Bauelemente Positioning for test heads of electronic test systems for testing electronic components |
| 09/16/2004 | CA2537927A1 Apparatus and method for electrical cable identification |
| 09/16/2004 | CA2517383A1 An antenna for detecting partial discharges in an electrical equipment tank |
| 09/15/2004 | EP1457786A1 Battery life determination |
| 09/15/2004 | EP1457785A2 Wiring error detector |
| 09/15/2004 | EP1456679A1 Controller based hardware device and method for setting the same |
| 09/15/2004 | EP1456678A1 Automated test sequence editor and engine for transformer testing |
| 09/15/2004 | EP1456675A1 Input buffer and method for voltage level detection |
| 09/15/2004 | EP1226445B1 Initial stage of a multi-stage algorithmic pattern generator for testing ic chips |
| 09/15/2004 | EP1019735A4 Format sensitive timing calibration for an integrated circuit tester |
| 09/15/2004 | CN2641664Y Automatic test system for zero powder voltage effect of positive temp. coefficient thermistor |
| 09/15/2004 | CN1529855A Method and apparatus for fault tolerant and flexible test signature generator |
| 09/15/2004 | CN1529853A Error detection on programmable logic resources |
| 09/15/2004 | CN1529820A Method and apparatus for leak-testing electroluminescent device |
| 09/15/2004 | CN1529819A Apparatus with interchangeable modules for measuring characteristics of cables and networks |
| 09/15/2004 | CN1529817A Socket for semiconductor package |
| 09/15/2004 | CN1529352A Probe card for testing wafer having plurality of semiconductor devices and its manufacturing method |
| 09/15/2004 | CN1529182A Electricity-quantity identification of active radio-frequency identification card cell and charging method thereof |
| 09/15/2004 | CN1529181A Composite tool for electronic and testing industry |
| 09/15/2004 | CN1529180A High-volage transmitting-line multiple-path high-precision GPS single-end fault positioning method and apparatus |
| 09/15/2004 | CN1529179A F-shape wiring transmitting-line fault precision potitioning method |
| 09/15/2004 | CN1529178A Electric-power system transmitting-line fault diagnosis and phase selecting method |
| 09/15/2004 | CN1529177A Methanism for preventing pipe line from wearing-out and processing apparatus |
| 09/15/2004 | CN1529176A Method for detecting travelling-wave protection device |
| 09/15/2004 | CN1167176C Relay protection and failure location system for power distribution network |
| 09/15/2004 | CN1167117C Method and device for testing integrated circuit |
| 09/15/2004 | CN1166544C Multi-sheet stocker of stacker-reclaimer |
| 09/15/2004 | CN1166542C Part holding device |
| 09/14/2004 | US6792386 Method and system for statistical comparison of a plurality of testers |
| 09/14/2004 | US6792385 Methods and apparatus for characterizing board test coverage |
| 09/14/2004 | US6792379 Data-based control of integrated circuits |
| 09/14/2004 | US6792378 Method for testing I/O ports of a computer motherboard |
| 09/14/2004 | US6792376 Apparatus and method for testing socket |
| 09/14/2004 | US6792375 Apparatus, system, and method of determining loading characteristics on an integrated circuit module |
| 09/14/2004 | US6792374 Apparatus and method for determining effect of on-chip noise on signal propagation |
| 09/14/2004 | US6792373 Methods and apparatus for semiconductor testing |
| 09/14/2004 | US6792365 Sequential unique marking |
| 09/14/2004 | US6792328 Metrology diffraction signal adaptation for tool-to-tool matching |
| 09/14/2004 | US6791890 Semiconductor memory device reading data based on memory cell passing current during access |
| 09/14/2004 | US6791697 Scatterometry structure with embedded ring oscillator, and methods of using same |
| 09/14/2004 | US6791479 System for logic state detection |
| 09/14/2004 | US6791464 Apparatus of monitoring motor vehicle's electric power and method thereof |
| 09/14/2004 | US6791429 Transmission line parasitic element discontinuity cancellation |
| 09/14/2004 | US6791389 Variable delay circuit and a testing apparatus for a semiconductor circuit |
| 09/14/2004 | US6791373 High-voltage detecting circuit |
| 09/14/2004 | US6791364 Conditional burn-in keeper for dynamic circuits |
| 09/14/2004 | US6791352 Method and apparatus for debugging a chip |
| 09/14/2004 | US6791351 Electromagnetic stator insulation flaw detector |
| 09/14/2004 | US6791350 Inspection method for array substrate and inspection device for the same |
| 09/14/2004 | US6791348 Digital overcurrent test |
| 09/14/2004 | US6791347 Probe apparatus applicable to a wafer level burn-in screening |
| 09/14/2004 | US6791346 Testing of BGA and other CSP packages using probing techniques |
| 09/14/2004 | US6791345 Contactor for testing semiconductor device and manufacturing method thereof |
| 09/14/2004 | US6791344 System for and method of testing a microelectronic device using a dual probe technique |
| 09/14/2004 | US6791336 Apparatus and method for validating wiring diagrams and creating wirelists |
| 09/14/2004 | US6791332 Alternator testing device and method |
| 09/14/2004 | US6791317 Load board for testing of RF chips |
| 09/14/2004 | US6791316 High speed semiconductor test system using radially arranged pin cards |
| 09/14/2004 | US6791314 Device and method for measuring weak current signals using a floating amplifier |
| 09/14/2004 | US6791171 Systems for testing and packaging integrated circuits |
| 09/14/2004 | US6791110 Semiconductor-package measuring method, measuring socket, and semiconductor package |
| 09/14/2004 | US6790065 Socket for electric part |
| 09/14/2004 | US6789328 Semiconductor load port alignment device |
| 09/10/2004 | WO2004077904A1 Circuit board checker and circuit board checking method |
| 09/10/2004 | WO2004077638A1 Testing using independently controllable voltage islands |
| 09/10/2004 | WO2004077623A1 An interconnection device for a printed circuit board, a method of manufacturing the same, and an interconnection assembly having the same |
| 09/10/2004 | WO2004077528A2 A very small pin count ic tester |
| 09/10/2004 | WO2004077524A2 Method and apparatus for test and characterization of semiconductor components |
| 09/10/2004 | WO2004077260A2 Method and apparatus for creating circuit redundancy in programmable logic devices |
| 09/10/2004 | WO2004077083A1 Device and method for the tolerance analysis of digital and/or digitalised measuring values |
| 09/10/2004 | WO2004077082A1 Electron-beam ic tester |
| 09/10/2004 | WO2004077081A1 Integrated circuit testing methods using well bias modification |
| 09/10/2004 | WO2004077080A1 Short-circuit indicator equipped with a telecommunication device for electric conductors |
| 09/10/2004 | WO2004077077A1 Method for measuring the current consumption of an electric radiator in a vehicle ventilation, heating or air conditioning system |
| 09/10/2004 | WO2004077076A1 Short-circuit detection in a frequency converter |
| 09/10/2004 | WO2004076966A1 Conductor inspecting device and conductor inspecting method |
| 09/10/2004 | CA2421909A1 Epitester |
| 09/09/2004 | US20040177331 Self-diagnostic circuit of I/O circuit system |
| 09/09/2004 | US20040177314 Digital system and a method for error detection thereof |
| 09/09/2004 | US20040177303 Analog-hybrid ic test system |
| 09/09/2004 | US20040177302 Apparatus for testing semiconductor integrated circuit |
| 09/09/2004 | US20040177300 Apparatus with a test interface |
| 09/09/2004 | US20040177299 Scalable scan-path test point insertion technique |
| 09/09/2004 | US20040177298 Device and method for testing integrated circuit dice in an integrated circuit module |
| 09/09/2004 | US20040177297 Apparatus with resolution enhancement feature for improving accuracy of conversion of required chemical mechanical polishing pressure to force to be applied by polishing head to wafer |
| 09/09/2004 | US20040177296 Semiconductor testing circuit, semiconductor storage device, and semiconductor testing method |
| 09/09/2004 | US20040177294 Integrated circuit with test signal routing module |
| 09/09/2004 | US20040177293 Programmable multi-function module for automatic test equipment systems |
| 09/09/2004 | US20040177289 Method and arrangement for detecting and correcting line defects |
| 09/09/2004 | US20040176939 Method, system, and product for determining loop inductance of an entire integrated circuit package |