| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 09/22/2004 | CN2643327Y Test device for volt-ampere characteristic of sense organ |
| 09/22/2004 | CN2643326Y Low-frequency time code carrier phase meter |
| 09/22/2004 | CN2643325Y Low-frequency time code signal detecting instrument |
| 09/22/2004 | CN1531079A Integrated module with delayed assembly |
| 09/22/2004 | CN1531046A Fault positioning method for scanning link of logic integrated circuit |
| 09/22/2004 | CN1530981A Apparatus and method for detecting electronic element |
| 09/22/2004 | CN1530722A Automatic controller of liquid-crystal panel for panel crade of automatic detector and method thereof |
| 09/22/2004 | CN1530664A Circuit analog method |
| 09/22/2004 | CN1530663A 微型计算机 Microcomputers |
| 09/22/2004 | CN1530662A Detecting method for integrated circuit |
| 09/22/2004 | CN1530660A Method for determining system operating state |
| 09/22/2004 | CN1168173C Method for measuring residual capacity of secondary cell having nickel hydroxide positive plate |
| 09/22/2004 | CN1168129C Carrier for testing chip |
| 09/22/2004 | CN1168097C Semiconductor device with test circuit capable of inhibiting enlargement of circuit scale |
| 09/22/2004 | CN1167955C AC method for measuring insulation resistance |
| 09/21/2004 | US6795948 Weighted random pattern test using pre-stored weights |
| 09/21/2004 | US6795945 Method and arrangement for testing digital circuits |
| 09/21/2004 | US6795944 Testing regularly structured logic circuits in integrated circuit devices |
| 09/21/2004 | US6795943 Semiconductor device with test mode |
| 09/21/2004 | US6795802 Apparatus and method for calculating temporal deterioration margin amount of LSI, and LSI inspection method |
| 09/21/2004 | US6795789 System for testing of intelligent electronic devices with digital communications |
| 09/21/2004 | US6795788 Method and apparatus for discovery of operational boundaries for shmoo tests |
| 09/21/2004 | US6795782 Battery test module |
| 09/21/2004 | US6795456 157 nm laser system and method for multi-layer semiconductor failure analysis |
| 09/21/2004 | US6795446 Collective monitor and control system for plural networks |
| 09/21/2004 | US6795395 Automation of call setup in IP telephony for tests and measurements |
| 09/21/2004 | US6795186 Adaptive tolerance reference inspection system |
| 09/21/2004 | US6794898 Scan flip-flop circuit, scan flip-flop circuit array, and integrated circuit device |
| 09/21/2004 | US6794891 Semiconductor integrated circuit |
| 09/21/2004 | US6794889 Unified apparatus and method to assure probe card-to-wafer parallelism in semiconductor automatic wafer test, probe card measurement systems, and probe card manufacturing |
| 09/21/2004 | US6794888 Probe device |
| 09/21/2004 | US6794887 Test head including displaceable switch element |
| 09/21/2004 | US6794884 Method and system for evaluating core stack pressure |
| 09/21/2004 | US6794883 Method and system for monitoring winding insulation resistance |
| 09/21/2004 | US6794879 Apparatus and method for detecting and calculating ground fault resistance |
| 09/21/2004 | US6794876 Method and device for estimating open circuit voltage of battery |
| 09/21/2004 | US6794861 Method and apparatus for socket calibration of integrated circuit testers |
| 09/21/2004 | US6794852 System and method of battery capacity reporting |
| 09/21/2004 | US6794849 Battery, based power supply device and associated maintenance system |
| 09/21/2004 | US6794679 Semiconductor device that can measure timing difference between input and output signals |
| 09/21/2004 | US6794678 Semiconductor integrated circuit device, method of testing semiconductor integrated circuit device and method of manufacturing semiconductor integrated circuit device |
| 09/21/2004 | US6794620 Feedforward temperature control of device under test |
| 09/21/2004 | CA2317045C Device and system for management of battery back up power source |
| 09/16/2004 | WO2004079990A1 Repeater testing system |
| 09/16/2004 | WO2004079965A2 Wireless network system for collecting data |
| 09/16/2004 | WO2004079865A2 High speed connector |
| 09/16/2004 | WO2004079382A1 Automatically detecting and routing of test signals |
| 09/16/2004 | WO2004079381A1 Circuit arrangement for detecting a fault in a circuit logic |
| 09/16/2004 | WO2004079380A1 Apparatus and mthod for cooling optically probed integrated circ uits |
| 09/16/2004 | WO2004079379A2 Antenna for detection of partial discharges in a chamber of an electrical instrument |
| 09/16/2004 | WO2004079378A1 Detection of earth faults in three phase systems |
| 09/16/2004 | WO2004079377A2 Apparatus and method for electrical cable identification |
| 09/16/2004 | WO2004070395A3 Testing of integrated circuits |
| 09/16/2004 | US20040181763 Automatic manufacturing test case generation method and system |
| 09/16/2004 | US20040181762 System for detecting and reporting defects in a chip |
| 09/16/2004 | US20040181761 Circuit simulation for a circuit including transistors |
| 09/16/2004 | US20040181738 System and method for trellis decoding in a multi-pair transceiver system |
| 09/16/2004 | US20040181730 Voltage margin testing of bladed servers |
| 09/16/2004 | US20040181729 Probeless testing of pad buffers on wafer |
| 09/16/2004 | US20040181728 Methods and systems for estimating reticle bias states |
| 09/16/2004 | US20040181727 Overflow error diffusion |
| 09/16/2004 | US20040181726 Method and system for alternating between programs for execution by cells of an integrated circuit |
| 09/16/2004 | US20040181725 Method of controlling a test mode of a circuit |
| 09/16/2004 | US20040181724 System for storing device test information on a semiconductor device using on-device logic for determination of test results |
| 09/16/2004 | US20040181723 Scan test control method and scan test circuit |
| 09/16/2004 | US20040181722 Methodology of locating faults of scan chains in logic integrated circuits |
| 09/16/2004 | US20040181721 Semiconductor test system and method |
| 09/16/2004 | US20040181720 Isolation testing circuit and testing circuit optimization method |
| 09/16/2004 | US20040181719 Sequential tester for longest prefix search engines |
| 09/16/2004 | US20040181717 Adaptive defect based testing |
| 09/16/2004 | US20040181637 Memory test circuit with data expander |
| 09/16/2004 | US20040181355 Automatic testing system |
| 09/16/2004 | US20040181352 Inspection window guard banding |
| 09/16/2004 | US20040181348 Method for detecting the connectivity of electrical conductors during automated test using longitudinal balance measurements |
| 09/16/2004 | US20040180602 Device for inspecting element substrates and method of inspection using this device |
| 09/16/2004 | US20040180456 Acess trench probing of device elements |
| 09/16/2004 | US20040180455 Method and apparatus for determining burn-in reliability from wafer level burn-in |
| 09/16/2004 | US20040179510 Method and apparatus for source device synchronization in a communication system |
| 09/16/2004 | US20040179413 Automated test method |
| 09/16/2004 | US20040179408 Microcomputer |
| 09/16/2004 | US20040179385 Ferroelectric memory and method of testing the same |
| 09/16/2004 | US20040179343 Structures for testing circuits and methods for fabricating the structures |
| 09/16/2004 | US20040178918 Battery monitor |
| 09/16/2004 | US20040178847 Method and system for monitoring a deliverable radio frequency power of an amplifier operable on a monolithic microwave integrated circuit |
| 09/16/2004 | US20040178820 Reconfigurable integrated circuit with integrated debugging facilities and scalable programmable interconnect |
| 09/16/2004 | US20040178817 Method for independent measurement of mosfet source and drain resistances |
| 09/16/2004 | US20040178816 Apparatus for testing integrated circuits |
| 09/16/2004 | US20040178815 Tester for printed circuit boards |
| 09/16/2004 | US20040178814 Semiconductor tester coupling arrangement and electrical testing method thereof |
| 09/16/2004 | US20040178813 Apparatus and method for testing electronic component |
| 09/16/2004 | US20040178812 Structures for testing circuits and methods for fabricating the structures |
| 09/16/2004 | US20040178811 Apparatus for inspecting defects of devices and method of inspecting defects |
| 09/16/2004 | US20040178808 Thermal stratification test apparatus and method providing cyclical and steady-state stratified environments |
| 09/16/2004 | US20040178801 Non-intrusive cable connection monitoring for use in HFC networks |
| 09/16/2004 | US20040178798 Secondary battery state-of-charge estimating apparatus and method, and recording medium usable thereby |
| 09/16/2004 | US20040178788 includes a mechanical switching mechanism and a wiring line connected to the pin; can include a resistor |
| 09/16/2004 | US20040178787 Integrated circuit testing device and a method of use therefor |
| 09/16/2004 | US20040178786 Ic tester for preventing damage from electrostatic discharge and operation method thereof |
| 09/16/2004 | US20040178771 Battery life determination |
| 09/16/2004 | US20040178770 Back-up power system |