| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 09/28/2004 | US6798211 Power line fault detector and analyzer |
| 09/28/2004 | US6798210 Speed sensitive field ground detection mode for a generator field winding |
| 09/28/2004 | US6798209 Circuit breaker with integral testing unit |
| 09/28/2004 | US6798186 Physical linearity test for integrated circuit delay lines |
| 09/28/2004 | US6798183 Method of and apparatus for simultaneously providing tone and intermittent link onto a cable to assist identifying the cable |
| 09/28/2004 | US6798171 Battery state monitoring circuit and battery device |
| 09/28/2004 | US6798112 Armature ground locating test process and equipment |
| 09/28/2004 | US6797545 Method and apparatus for fabricating electronic device |
| 09/28/2004 | US6797529 Processing apparatus with measuring unit and method |
| 09/28/2004 | US6797528 Micro probing tip made by micro machine method |
| 09/28/2004 | US6796818 Extender card with insertion/removal arrangement |
| 09/23/2004 | WO2004082304A2 Method and apparatus for source device synchronization in a communication system |
| 09/23/2004 | WO2004081985A2 Methods and systems for estimating reticle bias states |
| 09/23/2004 | WO2004081978A2 Radio frequency clamping circuit |
| 09/23/2004 | WO2004081949A1 Dc test instrument and semiconductor test instrument |
| 09/23/2004 | WO2004081896A1 In-use unambiguously determining the near-end-of-life state of a combustion engine battery |
| 09/23/2004 | WO2004081594A1 Laminated core testing device |
| 09/23/2004 | WO2004081593A1 Testing apparatus, program for testing apparatus, test pattern recording medium, and method of controlling testing appratus |
| 09/23/2004 | WO2004081592A1 Method and device for determining a characteristic of a semiconductor sample |
| 09/23/2004 | WO2004081587A2 Apparatus and method for testing electronic systems |
| 09/23/2004 | WO2004081585A2 Method and installation for lead battery state monitoring and management |
| 09/23/2004 | WO2002095802A3 Methods and apparatus for semiconductor testing |
| 09/23/2004 | US20040187060 Generating test patterns for testing an integrated circuit |
| 09/23/2004 | US20040187059 Boundary scan path method and system with functional and non-functional scan cell memories |
| 09/23/2004 | US20040187058 Semiconductor integrated circuit and scan test method therefor |
| 09/23/2004 | US20040187057 Logic circuit and methods for designing and testing the same |
| 09/23/2004 | US20040187056 Position independent testing of circuits |
| 09/23/2004 | US20040187054 On-chip service processor |
| 09/23/2004 | US20040187050 Test structure and method for accurate determination of soft error of logic components |
| 09/23/2004 | US20040187049 Very small pin count IC tester |
| 09/23/2004 | US20040187046 Method of timing calibration using slower data rate pattern |
| 09/23/2004 | US20040186678 Sensing circuit for single bit-line semiconductor memory device |
| 09/23/2004 | US20040186677 Testing system for printing press circuit board controllers |
| 09/23/2004 | US20040186675 Calibration method for system performance validation of automatic test equipment |
| 09/23/2004 | US20040185913 Small electronic device |
| 09/23/2004 | US20040185802 Method and device for determining sideband ratio of superconduction mixer using comb generator |
| 09/23/2004 | US20040185694 Contact for spiral contactor and spiral contactor |
| 09/23/2004 | US20040185586 Preparation of sample chip, method of observing wall surface thereof and system therefor |
| 09/23/2004 | US20040185585 Method of testing semiconductor device |
| 09/23/2004 | US20040185582 System and method for in-situ monitor and control of film thickness and trench depth |
| 09/23/2004 | US20040184508 Test handler temperature monitoring system |
| 09/23/2004 | US20040184409 Physical layer loopback |
| 09/23/2004 | US20040184344 Semiconductor wafer, semiconductor chip, and manufacturing method of semiconductor device |
| 09/23/2004 | US20040184339 Semiconductor device |
| 09/23/2004 | US20040184328 Semiconductor integrated circuit capable of testing with small scale circuit configuration |
| 09/23/2004 | US20040184327 Semiconductor memory device and test method |
| 09/23/2004 | US20040184032 Optical inspection system and method for displaying imaged objects in greater than two dimensions |
| 09/23/2004 | US20040183840 Battery residual capacity detection method and printing apparatus using the method |
| 09/23/2004 | US20040183613 Method and apparatus for detecting on-die voltage variations |
| 09/23/2004 | US20040183581 Semiconductor integrated circuit |
| 09/23/2004 | US20040183572 Apparatus for sensing the presence of an inductive load driven by a pulse width modulated signal |
| 09/23/2004 | US20040183563 Semiconductor integrated circuit including test pins and method for testing thereof |
| 09/23/2004 | US20040183561 Reliability evaluation test apparatus, reliability evaluation test system, contactor, and reliability evaluation test method |
| 09/23/2004 | US20040183560 Method and integrated circuit for capacitor measurement with digital readout |
| 09/23/2004 | US20040183559 Method and apparatus for test and characterization of semiconductor components |
| 09/23/2004 | US20040183554 Reduction of positional errors in a four point probe resistance measurement |
| 09/23/2004 | US20040183547 Method and an apparatus for measuring the performance of antennas, mobile phones and other wireless terminals |
| 09/23/2004 | US20040183546 Signal detection contactor and signal correcting system |
| 09/23/2004 | US20040183545 Cable fault detector |
| 09/23/2004 | US20040183544 Method and apparatus for monitoring integrity of wires or electrical cables |
| 09/23/2004 | US20040183543 Power source test instrument |
| 09/23/2004 | US20040183541 Method and apparatus for fault tracing in electronic measurement and test arrangements for electrochemical elements |
| 09/23/2004 | US20040183540 Electronic battery tester |
| 09/23/2004 | US20040183525 Transporting mechanism, movable probe card transporting apparatus using transporting mechanism, and prober |
| 09/23/2004 | US20040183524 Method and apparatus for implementing printed circuit board high potential testing to identify latent defects |
| 09/23/2004 | US20040183523 Hand mounted testing meter |
| 09/23/2004 | US20040183517 Generation and measurement of timing delays by digital phase error compensation |
| 09/23/2004 | US20040183450 Method and apparatus for determining the resonant frequency of a resonant circuit |
| 09/23/2004 | US20040182573 Method and apparatus for predicting the time to failure of electronic devices at high temperatures |
| 09/23/2004 | US20040182564 Heat exchange system chip temperature sensor |
| 09/23/2004 | US20040182160 Non-destructive evaluation of wire insulation and coatings |
| 09/23/2004 | US20040181961 Handler for testing semiconductor device |
| 09/23/2004 | DE202004009366U1 Optical quality control device e.g. for circuit boards, has surface of circuit boards seized by relative motion by scanner and evaluated in data processor by comparison of seized actual condition with stored specified conditions |
| 09/23/2004 | DE19620459B4 Halbleiter-Beschleunigungsmesser und Verfahren zur Bewertung der Eigenschaften eines Halbleiter-Beschleunigungsmessers Semiconductor accelerometer and method for evaluating the properties of a semiconductor accelerometer |
| 09/23/2004 | DE10311658A1 Procedure for determining a characteristic of a semiconductor sample, involves lighting up a surface of the semiconductor sample at the same time with overlaid energizing light source such as a laser of a specific wavelengths |
| 09/23/2004 | DE10309937A1 Vehicle capacitor test and diagnosis circuit measures voltage and current during charge and discharge for processing to determine internal impedance |
| 09/23/2004 | DE10309313A1 Schaltungsanordnung zur Detektion eines Fehlers in einer Schaltungslogik Circuit arrangement for detecting a fault in a logic circuit |
| 09/23/2004 | DE10309208A1 Communication method for use with a test system for integrated circuits, whereby a system specific interface program is provided to convert between high and low level program commands or vice versa |
| 09/22/2004 | EP1460709A1 Method and device for estimating remaining capacity of secondary cell, battery pack system, and electric vehicle |
| 09/22/2004 | EP1460708A1 Method for estimating polarization voltage of secondary cell, method and device for estimating remaining capacity of secondary cell, battery pack system, and electric vehicle |
| 09/22/2004 | EP1460569A1 Semiconductor integrated circuit device with test signal repeater circuit and related design automation apparatus, method and program |
| 09/22/2004 | EP1460447A1 Method and apparatus for error detection in electronic measuring and testing devices for galvanic cells |
| 09/22/2004 | EP1460441A2 Apparatus and method of estimating possible input and output powers of a secondary cell |
| 09/22/2004 | EP1460440A2 Apparatus for sensing the presence of an inductive load driven by a pulse width modulated signal |
| 09/22/2004 | EP1460439A1 Leak detection apparatus and motor car |
| 09/22/2004 | EP1459323A1 Multi-mode synchronous memory device and method of operating and testing same |
| 09/22/2004 | EP1459082A1 A method for on-line calibration of low accuracy voltage sensor through communication bus |
| 09/22/2004 | EP1459081A1 Compact ate with timestamp system |
| 09/22/2004 | EP1459080A2 Test circuit topology reconfiguration and utilization method |
| 09/22/2004 | EP1459079A2 Probe card covering system and method |
| 09/22/2004 | EP1459078A2 Microprocessor-based probe for integrated circuit testing |
| 09/22/2004 | EP1459077A2 Method for checking the electrical safety of a household appliance, and corresponding household appliance |
| 09/22/2004 | EP1202774B1 Battery status detection |
| 09/22/2004 | EP1129551B1 Point-to-point link implemented over a broadcast network |
| 09/22/2004 | EP1015900A4 Integrated circuit tester having multiple period generators |
| 09/22/2004 | EP0990165B1 Virtual channel data distribution system for integrated circuit tester |
| 09/22/2004 | EP0845383B1 Controller for on-vehicle battery |
| 09/22/2004 | CN2643330Y Digital cell with liquid crystal display |
| 09/22/2004 | CN2643329Y Battery holder |
| 09/22/2004 | CN2643328Y A multi-purpose subscriber cable test interface pinboard |