Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
09/2004
09/30/2004US20040189382 Gain control methods and systems in an amplifier assembly
09/30/2004US20040189372 Timing vernier using a delay locked loop
09/30/2004US20040189341 Power-on self test for a computer system
09/30/2004US20040189339 Hybrid AC/DC-coupled channel for automatic test equipment
09/30/2004US20040189338 Apparatus for testing reliability of interconnection in integrated circuit
09/30/2004US20040189337 Current mirror based multi-channel leakage current monitor circuit and method
09/30/2004US20040189336 Apparatus for monitoring the connection state of connectors and a method for using the same
09/30/2004US20040189335 Apparatus and method for detecting photon emissions from transistors
09/30/2004US20040189333 Carrier for receiving and electrically contacting individually separated dies
09/30/2004US20040189330 Circuit and method for detecting insulation faults
09/30/2004US20040189328 Hybrid gap measurement circuit
09/30/2004US20040189323 Disconnection detecting circuit for sensor apparatus
09/30/2004US20040189319 Methods and apparatus for analyzing high voltage circuit breakers
09/30/2004US20040189317 Method of precisely determining the location of a fault on an electrical transmission system
09/30/2004US20040189316 Method of diagnosing inverter trouble
09/30/2004US20040189310 Method and device for determining the state of a vehicle battery
09/30/2004US20040189309 Electronic battery tester cable
09/30/2004US20040189308 Electronic battery tester
09/30/2004US20040189307 Methods and apparatus for analyzing high voltage circuit breakers
09/30/2004US20040189281 Universal automated circuit board tester
09/30/2004US20040189280 Hybrid cooling system for automatic test equipment
09/30/2004US20040189279 Online detection of shorted turns in a generator field winding
09/30/2004US20040189278 Electro-optical voltage sensor for high voltages
09/30/2004US20040189257 Battery monitoring system and method
09/30/2004US20040189256 Reusable state of charge indicator
09/30/2004US20040189255 Method for determining the amount of charge which can be drawn on a storage battery, and monitoring device for a storage battery
09/30/2004US20040189254 Method of improving fuel economy
09/30/2004US20040189097 Battery communication system
09/30/2004US20040188853 Semiconductor device
09/30/2004DE69630730T2 Analogabtastpfadzelle Analogabtastpfadzelle
09/30/2004DE19930169B4 Testeinrichtung und Verfahren zum Prüfen eines Speichers Test device and method for testing a memory
09/30/2004DE19852775B4 Verfahren zur Sortierprüfung von Varistoren A method for screening inspection of varistors
09/30/2004DE10358298A1 Modifizieren eines Halbleiterbauelements, um eine Überwachung elektrischer Parameter bereitzustellen Modifying a semiconductor device to provide a monitoring electrical parameters
09/30/2004DE10313786A1 Verfahren und Vorrichtung zur Fehlersuche in elektronischen Meß- und Prüfanordnungen für galvanische Elemente Method and device for troubleshooting electronic measuring and test setups for galvanic elements
09/30/2004DE10312612A1 Switch state monitoring device, especially for a motor vehicle, has a voltage transducer circuit connected to two or more switches with a single output to a microprocessor analogue to digital converter
09/30/2004DE10127054B4 Verfahren zur Überwachung einer Spannungsversorgung eines Steuergeräts in einem Kraftfahrzeug Method for monitoring a voltage supply of a control device in a motor vehicle
09/30/2004DE10120066B4 Elektronisches Modul zum Einbau in eine elektonische Baugruppeneinheit, entsprechendes System, sowie Verfahren zum Test einer elektronischen Baugruppeneinheit Electronic module for installation in an electonic assembly unit, corresponding system and method for testing an electronic component unit
09/30/2004CA2517013A1 Non-intrusive cable connection monitoring for use in hfc networks
09/29/2004EP1463144A1 Apparatus for judging state of assembled battery
09/29/2004EP1463063A1 Signature cell
09/29/2004EP1462964A2 Method for stimulating functional logic circuit with logical stimulus
09/29/2004EP1462962A1 Method and circuitry for the functional testing and analysis of large digital circuits using hardware emulators
09/29/2004EP1462815A2 System and method of determining the state of charge of a battery and use of such a method for charge managment
09/29/2004EP1462814A1 Method for and arrangement comprising means for determining the available power capacity of an electric power supply
09/29/2004EP1462813A2 System for detecting defective battery packs
09/29/2004EP1462811A1 Electro-optic voltage sensor for high voltages
09/29/2004EP1462769A2 Sensor with fault detection
09/29/2004EP1461789A2 Electric field sensor
09/29/2004EP1461732A2 Multi-environment testing with a responder
09/29/2004EP1461629A2 Remote battery monitoring systems and sensors
09/29/2004EP1461628A1 Cooling assembly with direct cooling of active electronic components
09/29/2004EP1461626A1 Fault location using measurements from two ends of a line
09/29/2004EP1461584A1 Method and apparatus for measuring stress in semiconductor wafers
09/29/2004EP1346232B1 Method of and apparatus for testing wiring
09/29/2004EP1129415B1 Automatic generation of user definable memory bist circuitry
09/29/2004EP0988558B1 Low cost, easy to use automatic test system software
09/29/2004EP0946882B1 Method and device for controlling a motor vehicle electric circuit
09/29/2004CN2645324Y High voltage breaker secondary circuit total operating mode monitoring arrangement
09/29/2004CN2645090Y 电池托盘 Battery tray
09/29/2004CN1533627A Circuit formonitoring cells of multi-cell battery during charge
09/29/2004CN1533214A Array speaker detector, array speaker device and its distributing line judging method
09/29/2004CN1532934A Integrated circuit with detecting circuit
09/29/2004CN1532933A 半导体集成电路 The semiconductor integrated circuit
09/29/2004CN1532910A Method and device for measuring time on semiconductor module with semiconductor chip
09/29/2004CN1532909A Dtecting method for semiconductor element
09/29/2004CN1532557A Fault tracking method and device for electronic measurement and detection configuration of electrochemical element
09/29/2004CN1532556A Detection method for speed sensitive winding earthing of generator exciter winding
09/29/2004CN1532555A Single node sampled voltage-current characteristic digital detecting circuit
09/29/2004CN1532554A Fault diagnostic method for transformer winding
09/29/2004CN1532553A Automatic detection method
09/29/2004CN1169288C Electronic volume circuit
09/29/2004CN1169210C Testability design method for circuit, circuit design device and integrated circuit device
09/29/2004CN1169053C Circuit with built-in self-tester
09/29/2004CN1168995C Device for testing cables provided with plug connectors
09/29/2004CN1168989C Check terminal for testing electronic chip element, checking method and verifying attachment thereof
09/28/2004US6799311 Batch/lot organization based on quality characteristics
09/28/2004US6799292 Method for generating test pattern for semiconductor integrated circuit and method for testing semiconductor integrated circuit
09/28/2004US6799289 On-board testing circuit and method for improving testing of integrated circuits
09/28/2004US6799134 Characterization of self-timed sequential circuits
09/28/2004US6799133 Test mode control circuit for reconfiguring a device pin of an integrated circuit chip
09/28/2004US6799127 Signal transition and stable regions diagram for positioning a logic analyzer sample
09/28/2004US6799125 Method and system for on-line monitoring of bearing insulation in an electrical generator
09/28/2004US6798746 Method and apparatus for implementing a quality of service policy in a data communications network
09/28/2004US6798740 Method and apparatus for switch core health monitoring and redundancy
09/28/2004US6798702 Semiconductor memory device capable of testing data line redundancy replacement circuit
09/28/2004US6798701 Semiconductor integrated circuit device having data input/output configuration variable
09/28/2004US6798636 Method of estimating the effect of the parasitic currents in an electromagnetic actuator for the control of an engine valve
09/28/2004US6798286 Gain control methods and systems in an amplifier assembly
09/28/2004US6798233 Digital method of measuring driver slew rates for reduced test time
09/28/2004US6798231 Inspection device for liquid crystal driving substrate
09/28/2004US6798229 Wide-bandwidth coaxial probe
09/28/2004US6798227 Two axis self-centering probe block assembly with two axis float and self-alignment
09/28/2004US6798225 Tester channel to multiple IC terminals
09/28/2004US6798224 Method for testing semiconductor wafers
09/28/2004US6798223 Test methods, systems, and probes for high-frequency wireless-communications devices
09/28/2004US6798222 Migration measuring method and measuring apparatus
09/28/2004US6798221 Method, apparatus and article to test fuel cells
09/28/2004US6798218 Circuit for measuring absolute spread in capacitors implemented in planary technology
09/28/2004US6798213 Circuit analyzer with component testing capability
09/28/2004US6798212 Time domain reflectometer probe having a built-in reference ground point