| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 10/06/2004 | EP1464974A1 Online detection of shorted turns in a generator field winding |
| 10/06/2004 | EP1464973A1 Methods and apparatus for analyzing high voltage circuit breakers |
| 10/06/2004 | EP1464972A2 Computer-based method for testing an arrangement of electrical apparatus |
| 10/06/2004 | EP1464971A2 System and method for in-situ signal delay measurement for a microprocessor |
| 10/06/2004 | EP1464970A1 Loop-back testing with delay elements |
| 10/06/2004 | EP1464969A1 Loop-back testing with delay elements |
| 10/06/2004 | EP1464968A2 A method for determining the current-voltage characteristic of a snap-back device |
| 10/06/2004 | EP1358498B1 Input/output continuity test mode circuit |
| 10/06/2004 | EP1290460B1 Method and apparatus for testing source synchronous integrated circuits |
| 10/06/2004 | EP0985175B1 Distributed logic analyzer for use in a hardware logic emulation system |
| 10/06/2004 | CN2646721Y An improved signal sampler |
| 10/06/2004 | CN2646720Y Transformer test bench |
| 10/06/2004 | CN1535436A System and method for product yield prediction |
| 10/06/2004 | CN1535384A Fuel cell votage monitoring system and its method |
| 10/06/2004 | CN1535383A Metod and apparatus for recycling cryogenic liquid or gas from test chambers |
| 10/06/2004 | CN1534754A Temperature monitoring system of testing classifying machine |
| 10/06/2004 | CN1534753A Low power consumption self testing producer of quasi mono jump testing set |
| 10/06/2004 | CN1534687A 半导体集成电路装置 The semiconductor integrated circuit device |
| 10/06/2004 | CN1534360A Semiconductor device and its testing method |
| 10/06/2004 | CN1534304A Semiconductor testing circuit, semiconductor storage and semiconductor testing method |
| 10/06/2004 | CN1534302A 电压检测电路 A voltage detecting circuit |
| 10/06/2004 | CN1534301A Electro optical voltage sensor used for high voltage |
| 10/06/2004 | CN1170441C Method and device for detecting beam current of kinescope and its application |
| 10/06/2004 | CN1170311C Manufacturing method of semiconductor device and packaging equipment therefor |
| 10/06/2004 | CN1170167C Method and device for testing operativeness of printed circuit boards |
| 10/06/2004 | CN1170166C Method for controlling IC handler and control system using same |
| 10/06/2004 | CN1170165C Detection method and its detection structure of array electronic contact reliability |
| 10/05/2004 | US6802047 Calculating resistance of conductor layer for integrated circuit design |
| 10/05/2004 | US6802046 Time domain measurement systems and methods |
| 10/05/2004 | US6802034 Test pattern generation circuit and method for use with self-diagnostic circuit |
| 10/05/2004 | US6801870 Apparatus and method for determining effect of on-chip noise on signal propagation |
| 10/05/2004 | US6801869 Method and system for wafer and device-level testing of an integrated circuit |
| 10/05/2004 | US6801863 Method for detecting the connectivity of electrical conductors during automated test using longitudinal balance measurements |
| 10/05/2004 | US6801650 Mechanism and method for controlling focal point position of UV light and apparatus and method for inspection |
| 10/05/2004 | US6801461 Built-in self-test arrangement for integrated circuit memory devices |
| 10/05/2004 | US6801162 Doppler-based automated direction finding system and method for locating cable television signal leaks |
| 10/05/2004 | US6801145 Interleaving A/D conversion type waveform digitizer module and a test apparatus |
| 10/05/2004 | US6801099 Methods for bi-directional signaling |
| 10/05/2004 | US6801081 Switching device provided with integrated test means |
| 10/05/2004 | US6801071 Semiconductor integrated circuit device with differential output driver circuit, and system for semiconductor integrated circuit device |
| 10/05/2004 | US6801050 Driver circuit integrated with load current output circuit, pin electronics and IC tester having thereof |
| 10/05/2004 | US6801049 Method and apparatus for defect analysis of semiconductor integrated circuit |
| 10/05/2004 | US6801048 Device and method for testing integrated circuit dice in an integrated circuit module |
| 10/05/2004 | US6801047 Wafer probe station having environment control enclosure |
| 10/05/2004 | US6801046 Method of testing the electrostatic discharge performance of an IC device |
| 10/05/2004 | US6801044 Universal electromagnetic resonance system for detecting and measuring local non-uniformities in metal and non-metal objects |
| 10/05/2004 | US6801031 Method and apparatus for current measurement for electronically-controlled pump |
| 10/05/2004 | US6800869 Monitoring apparatus and method for tape automated bonding process |
| 10/05/2004 | US6800496 Characterization methodology for the thin gate oxide device |
| 10/05/2004 | US6800495 Lot-optimized wafer level burn-in |
| 10/05/2004 | US6799976 Construction structures and manufacturing processes for integrated circuit wafer probe card assemblies |
| 10/05/2004 | US6799909 Method of providing for an automated split runcard processing |
| 10/05/2004 | CA2423414C Battery state of charge indicator |
| 09/30/2004 | WO2004084581A1 Method of programming a hearing aid by a programming device |
| 09/30/2004 | WO2004084491A1 Non-intrusive cable connection monitoring for use in hfc networks |
| 09/30/2004 | WO2004084461A2 Method and system for emulating a fibre channel link over a sonet/sdh path |
| 09/30/2004 | WO2004084395A1 Inverter |
| 09/30/2004 | WO2004084296A1 Probe positioning and bonding device and probe bonding method |
| 09/30/2004 | WO2004084276A2 Apparatus and method for controlling the temperature of an electronic device |
| 09/30/2004 | WO2004084033A2 Method and system for testing a signal path having an operational signal |
| 09/30/2004 | WO2004083980A2 Method of mitigating effects of component deflection in a probe card analyzer |
| 09/30/2004 | WO2004083880A1 Calibration method for system performance validation of automatic test equipment |
| 09/30/2004 | WO2004083879A1 Test device and setting method |
| 09/30/2004 | WO2004083878A1 System and method for monitoring partial discharge in electrical components |
| 09/30/2004 | WO2004083876A1 Generation and measurement of timing delays by digital phase error compensation |
| 09/30/2004 | WO2004083873A2 Adjusting device for the planarization of probe sets of a probe card |
| 09/30/2004 | WO2004083783A2 Hand mounted testing meter |
| 09/30/2004 | WO2004083747A2 Thermal stratification test apparatus and method providing cyclical and steady-state stratified environments |
| 09/30/2004 | WO2004083000A1 Method and system for early detecting the defects of an electrically controlled brake system |
| 09/30/2004 | WO2004070398A3 Method and apparatus for characterizing a signal path carrying an operational signal |
| 09/30/2004 | WO2004070343A3 System and method for measuring internal resistance of electrochemical devices |
| 09/30/2004 | WO2004059334A8 Programmable logic analyzer data analyzing method |
| 09/30/2004 | WO2004027868A3 Electrical device, a method for manufacturing an electrical device, test structure, a method for manufacturing such a test structure and a method for testing a display panel |
| 09/30/2004 | US20040194040 Method of cross-mapping integrated circuit design formats |
| 09/30/2004 | US20040193992 Method and apparatus for preventing and recovering from TLB corruption by soft error |
| 09/30/2004 | US20040193991 Semiconductor integrated circuit including operation test circuit and operation test method thereof |
| 09/30/2004 | US20040193990 Test apparatus and test method |
| 09/30/2004 | US20040193989 Test system including a test circuit board including through-hole vias and blind vias |
| 09/30/2004 | US20040193988 Engine speed sensor with fault detection |
| 09/30/2004 | US20040193986 On-die pattern generator for high speed serial interconnect built-in self test |
| 09/30/2004 | US20040193985 Autonomous built-in self-test for integrated circuits |
| 09/30/2004 | US20040193984 Signature Cell |
| 09/30/2004 | US20040193983 IC scan means changing output signals synchronous with clock signal |
| 09/30/2004 | US20040193982 Built-in self-test for digital transmitters |
| 09/30/2004 | US20040193981 On-chip scan clock generator for asic testing |
| 09/30/2004 | US20040193980 Configurator arrangement and approach therefor |
| 09/30/2004 | US20040193979 Circuit configurator arrangement and approach therefor |
| 09/30/2004 | US20040193978 Parallel testing of integrated circuits |
| 09/30/2004 | US20040193977 Non-invasive, low pin count test circuits and methods utilizing emulated stress conditions |
| 09/30/2004 | US20040193976 Method and apparatus for interconnect built-in self test based system management failure monitoring |
| 09/30/2004 | US20040193975 Method and an apparatus for transmit phase select |
| 09/30/2004 | US20040193966 Semiconductor device |
| 09/30/2004 | US20040193962 Bus interface module |
| 09/30/2004 | US20040193954 Method for transmitting messages between bus users |
| 09/30/2004 | US20040193790 System and method for using a debug bus as a capture buffer |
| 09/30/2004 | US20040190355 Semiconductor device and method for testing semiconductor device |
| 09/30/2004 | US20040190338 Structure for testing NAND flash memory and method of testing NAND flash memory |
| 09/30/2004 | US20040190325 Ferroelectric memory device having test memory cell |
| 09/30/2004 | US20040189978 Laser probe points |
| 09/30/2004 | US20040189564 Semiconductor device and testing method of semiconductor device |