| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 10/13/2004 | EP1218887A4 Method and apparatus for supplying regulated power to memory device components |
| 10/13/2004 | EP1104579B1 Memory supervision |
| 10/13/2004 | EP1090304B1 Method for monitoring electromechanical, pneumatic or hydraulic actuators, and implementing device |
| 10/13/2004 | EP1073911B1 Fault location in a medium-voltage network |
| 10/13/2004 | CN2648455Y Testing table for vacuum switch valve performance parameter |
| 10/13/2004 | CN2648454Y Connecting wire examining device for multi-functional socket |
| 10/13/2004 | CN2648453Y Switching model of needle bed and switch for printed circuit board tester |
| 10/13/2004 | CN1537362A Loop diagnositc mode for ADSL modems |
| 10/13/2004 | CN1537312A Memory cell structural test |
| 10/13/2004 | CN1537232A Programmable test socket |
| 10/13/2004 | CN1537217A Apparatus and method for controlling temp. of electronic device under test |
| 10/13/2004 | CN1536829A On-line monitoring method of communication network equipment battery |
| 10/13/2004 | CN1536637A Antistatic IC element testing system |
| 10/13/2004 | CN1536635A Detection card for testing semiconductor |
| 10/13/2004 | CN1536581A Semiconductor integrated circuit and its check method |
| 10/13/2004 | CN1536370A Device capable of displaying its cell capacity when handset is not opened |
| 10/13/2004 | CN1536369A Testing equipment of single cell of fuel cell |
| 10/13/2004 | CN1536368A Electronic loading device |
| 10/13/2004 | CN1536367A Inspection plate of printed circuit and inspection equipment by using said inspection plate |
| 10/13/2004 | CN1171420C Method and system for communication of data via optimum data path in network |
| 10/13/2004 | CN1171235C Integrated memory possessing bit line, word line and plate line and its working method |
| 10/13/2004 | CN1171095C Method and apparatus for testing video display chip |
| 10/13/2004 | CN1171094C Internal signal monitor of integrated circuit |
| 10/13/2004 | CN1171093C Ic测试装置 Ic test device |
| 10/13/2004 | CN1171092C IC testing device |
| 10/13/2004 | CN1171091C Device for detecting fault of gas insulation electric appliance |
| 10/12/2004 | USRE38622 Parts handling method |
| 10/12/2004 | US6804807 Method of characterizing an electronic device having unbalanced ground currents |
| 10/12/2004 | US6804802 JTAG instruction register and decoder for PLDS |
| 10/12/2004 | US6804801 Integrated circuit fault insertion system |
| 10/12/2004 | US6804725 IC with state machine controlled linking module |
| 10/12/2004 | US6804620 Calibration method for system performance validation of automatic test equipment |
| 10/12/2004 | US6804557 Battery monitoring system for an implantable medical device |
| 10/12/2004 | US6804155 Semiconductor storage device |
| 10/12/2004 | US6804154 Semiconductor memory device including power generation circuit implementing stable operation |
| 10/12/2004 | US6804076 Method and device for entering test mode in an integrated circuit for use in a floppy disk drive, and a floppy disk drive apparatus incorporating the method |
| 10/12/2004 | US6803781 Resolver, resolver fault detection circuit, and resolver fault detection method |
| 10/12/2004 | US6803779 Interconnect assembly for use in evaluating probing networks |
| 10/12/2004 | US6803778 Probe for a wire inserting detection jig |
| 10/12/2004 | US6803777 Voltage testing and measurement |
| 10/12/2004 | US6803770 Wireless multiconductor cable test system and method |
| 10/12/2004 | US6803769 Cable continuity test system |
| 10/12/2004 | US6803766 Battery pack voltage detection apparatus |
| 10/12/2004 | US6803756 Wafer probe station |
| 10/12/2004 | US6803678 Battery communication system |
| 10/12/2004 | US6803547 Apparatus for and method of heating semiconductor devices |
| 10/12/2004 | US6803241 Method of monitoring contact hole of integrated circuit using corona charges |
| 10/12/2004 | US6802731 Contact pin and socket for electrical parts |
| 10/12/2004 | US6802368 Temperature control system for a workpiece chuck |
| 10/08/2004 | CA2463416A1 Apparatus for detecting coil failure in an actuating solenoid of an electrical power switch |
| 10/07/2004 | WO2004086827A2 Thermal apparatus for engaging electronic device |
| 10/07/2004 | WO2004086495A1 Work-handling device |
| 10/07/2004 | WO2004086071A1 Test apparatus |
| 10/07/2004 | WO2004086070A1 Inspection circuit and inspection method of semiconductor device |
| 10/07/2004 | WO2004086069A1 Method for testing components of a circuit board |
| 10/07/2004 | WO2004086068A1 System and method for in-situ monitor and control of film thickness and trench depth |
| 10/07/2004 | WO2004086065A1 Voltage measurement device |
| 10/07/2004 | WO2004086064A1 Electro-optical voltage sensor |
| 10/07/2004 | WO2004086062A1 Connecteur de mesure de resistances electriques, dispositif de connecteur de mesure de resistances electriques et leur procede de fabrication, dispositif de mesure de la resistance electrique de circuits substrats, et methode de mesure |
| 10/07/2004 | WO2004086016A1 Optical inspection system and method for displaying imaged objects in greater than two dimensions |
| 10/07/2004 | WO2004038429A3 Frequency domain reflectometry system for baselining and mapping of wires and cables |
| 10/07/2004 | US20040199887 Determining one or more reachable states in a circuit using distributed computing and one or more partitioned data structures |
| 10/07/2004 | US20040199881 Evaluating a validation vector for validating a network design |
| 10/07/2004 | US20040199844 Test system including a test circuit board including resistive devices |
| 10/07/2004 | US20040199842 Test system with high accuracy time measurement system |
| 10/07/2004 | US20040199841 Method and system for detecting a mode of operation of an integrated circuit, and a memory device including same |
| 10/07/2004 | US20040199840 Semiconductor wiring substrate, semiconductor device, method for testing semiconductor device, and method for mounting semiconductor device |
| 10/07/2004 | US20040199839 Changing scan cell output signal states with a clock signal |
| 10/07/2004 | US20040199838 Enhanced boundary-scan method and apparatus providing tester channel reduction |
| 10/07/2004 | US20040199836 Propagating an error through a network |
| 10/07/2004 | US20040199807 Generating a test environment for validating a network design |
| 10/07/2004 | US20040199717 Semiconductor memory |
| 10/07/2004 | US20040199683 Admission control system for home video servers |
| 10/07/2004 | US20040199480 Detection of pump cavitation/blockage and seal failure via current signature analysis |
| 10/07/2004 | US20040199343 Integrated, self-powered battery monitoring device and system |
| 10/07/2004 | US20040199146 System and method for monitoring power source longevity of an implantable medical device |
| 10/07/2004 | US20040198081 Microelectronic spring contact elements |
| 10/07/2004 | US20040197954 Chip scale image sensor semiconductor package and method of fabrication |
| 10/07/2004 | US20040197941 Semiconductor wiring substrate, semiconductor device, method for testing semiconductor device, and method for mounting semiconductor device |
| 10/07/2004 | US20040197180 Fall protected test-head manipulator |
| 10/07/2004 | US20040196693 Magnetic random access memory device having write test mode |
| 10/07/2004 | US20040196083 System and method for generating balanced signals with arbitrary amplitude and phase control using modulation |
| 10/07/2004 | US20040196073 Voltage detection circuit |
| 10/07/2004 | US20040196069 System and method for in-situ signal delay measurement for a microprocessor |
| 10/07/2004 | US20040196061 Socket or adapter device for semiconductor devices, method for testing semiconductor devices, and system comprising at least one socket or adapter device |
| 10/07/2004 | US20040196060 Method of identifying physical mapping of IC products |
| 10/07/2004 | US20040196055 Time division multiplexed, piloted current monitoring in a switched mode DC-DC voltage converter and phase current measurement calibration for a multiphase converter |
| 10/07/2004 | US20040196052 Timing generator, semiconductor test apparatus, and timing generating method |
| 10/07/2004 | US20040196025 Integrated circuit characterization printed circuit board, test equipment including same, method of fabrication thereof and method of characterizing an integrated circuit device |
| 10/07/2004 | US20040196005 Uninterruptible power supply device with circuit for degradation judgment of storage battery |
| 10/07/2004 | US20040195672 Semiconductor wiring substrate, semiconductor device, method for testing semiconductor device, and method for mounting semiconductor device |
| 10/07/2004 | US20040195665 Apparatus and method for testing semiconductor devices |
| 10/07/2004 | US20040195207 Substrate cleaning device and a method for manufacturing electronic devices |
| 10/07/2004 | US20040195010 Printed circuit board and method of use thereof |
| 10/07/2004 | US20040194299 Method of manufacturing a probe card |
| 10/07/2004 | DE202004012075U1 Test device for checking earth connections in aircraft power units uses a voltage drop measured by voltage test equipment via an earth connection through which a current flows |
| 10/07/2004 | DE10359214A1 Verfahren zur Schaltkreissimulation eines Transistoren enthaltenden Schaltkreises A process for circuit simulation of a circuit containing transistors |
| 10/07/2004 | DE102004013956A1 Elektronischer Batterietester Electronic battery tester |
| 10/06/2004 | EP1465320A2 Method and system for the automatic testing of electric equipments, in particular household appliances, and apparatus adapted for said method |
| 10/06/2004 | EP1465319A2 Uninterruptible power supply device with circuit for degradation judgment of storage battery |