| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 10/19/2004 | US6807645 Method and apparatus for implementing enhanced LBIST diagnostics of intermittent failures |
| 10/19/2004 | US6807644 JTAG testing arrangement |
| 10/19/2004 | US6807509 Method and systems to measure propagation delay in semiconductor chips |
| 10/19/2004 | US6807507 Electrical over stress (EOS) monitor |
| 10/19/2004 | US6807506 Electronic test program with test triggered interactive displays |
| 10/19/2004 | US6807505 Circuit with interconnect test unit |
| 10/19/2004 | US6807502 Apparatus and method for determining effect of on-chip noise on signal propagation |
| 10/19/2004 | US6807498 Method for measuring PLL lock time |
| 10/19/2004 | US6807495 Plausibility checking of voltage transformers in substations |
| 10/19/2004 | US6807243 Delay clock generating apparatus and delay time measuring apparatus |
| 10/19/2004 | US6807228 Dynamic regulation of power consumption of a high-speed communication system |
| 10/19/2004 | US6807117 Semiconductor device having PLL-circuit |
| 10/19/2004 | US6807116 Semiconductor circuit device capable of accurately testing embedded memory |
| 10/19/2004 | US6807115 Method of testing a semiconductor integrated device |
| 10/19/2004 | US6807109 Semiconductor device suitable for system in package |
| 10/19/2004 | US6807037 Electronic earth leakage current device |
| 10/19/2004 | US6806731 Semiconductor integrated circuit device and fault-detecting method of a semiconductor integrated circuit device |
| 10/19/2004 | US6806727 Alternator testing method and system using ripple detection |
| 10/19/2004 | US6806726 Semiconductor integrated circuit |
| 10/19/2004 | US6806723 Contactor having contact electrodes formed by laser processing |
| 10/19/2004 | US6806720 Method of reliability testing |
| 10/19/2004 | US6806719 Insulation inspection apparatus for motor |
| 10/19/2004 | US6806718 On-circuit board continuity tester |
| 10/19/2004 | US6806716 Electronic battery tester |
| 10/19/2004 | US6806715 Illuminable indicator testing apparatus |
| 10/19/2004 | US6806696 Method for determining a Weibull slope having a bias voltage variation adjustment |
| 10/19/2004 | US6806494 Method and apparatus for wafer-level burn-in and testing of integrated circuits |
| 10/19/2004 | US6806103 Method for fabricating semiconductor devices that uses efficient plasmas |
| 10/19/2004 | US6805563 Socket for electrical parts |
| 10/19/2004 | US6805293 Data collection system |
| 10/14/2004 | WO2004088795A1 Anisotropic electrically conductive film and method of producing the same |
| 10/14/2004 | WO2004088749A1 Semiconductor integrated circuit device and method for controlling semiconductor integrated circuit device |
| 10/14/2004 | WO2004088478A2 Autonomous built-in self-test for integrated circuits |
| 10/14/2004 | WO2004088343A1 Apparatus and method for detecting fully charged condition, apparatus and method for detecting charged condition, and apparatus and method for determining degree of degradation |
| 10/14/2004 | WO2004088342A1 Battery status monitoring apparatus and method |
| 10/14/2004 | WO2004088341A1 Method and device for estimating battery’s dischargeable capacity |
| 10/14/2004 | WO2004088340A1 Battery state monitoring device and its method, and dischargeable capacity detecting method |
| 10/14/2004 | WO2004088339A1 Test device and test method |
| 10/14/2004 | WO2004088338A1 Apparatus and method for evaluating underground electric power cables |
| 10/14/2004 | WO2004088334A1 Measurement of the current distribution/heat distribution of an electrochemical electrode |
| 10/14/2004 | WO2004088331A2 Method of precisely determining the location of a fault on an electrical transmision system |
| 10/14/2004 | WO2004074852A3 Method and circuit for at-speed testing of scan circuits |
| 10/14/2004 | WO2004044949A3 Probe station with low noise characteristics |
| 10/14/2004 | WO2004023521A3 Apparatus and method for detecting photon emissions from transistors |
| 10/14/2004 | US20040205681 Calculation system of fault coverage and calculation method of the same |
| 10/14/2004 | US20040205437 System for testing device under test and test method thereof |
| 10/14/2004 | US20040205436 Generalized fault model for defects and circuit marginalities |
| 10/14/2004 | US20040205433 High reliability memory module with a fault tolerant address and command bus |
| 10/14/2004 | US20040205432 Clock architecture for a frequency-based tester |
| 10/14/2004 | US20040205431 Method for testing jitter tolerance of high speed receivers |
| 10/14/2004 | US20040205430 Integrated circuit, optical disc drive and signal monitoring method |
| 10/14/2004 | US20040205429 Semiconductor storage device |
| 10/14/2004 | US20040205427 Semiconductor integrated circuit and test method thereof |
| 10/14/2004 | US20040205404 Integrated circuit |
| 10/14/2004 | US20040205402 Semiconductor test unit having low contact resistance with examined electronic products, semiconductor contact board, method for testing semiconductor device, semiconductor device, and method for manufacturing thereof |
| 10/14/2004 | US20040204923 Information collecting apparatus and information collecting/analyzing system |
| 10/14/2004 | US20040204912 High performance serial bus testing methodology |
| 10/14/2004 | US20040204895 Method for determining the impact on test coverage of scan chain parallelization by analysis of a test set for independently accessible flip-flops |
| 10/14/2004 | US20040204893 Instruction register and access port gated clock for scan cells |
| 10/14/2004 | US20040204892 Testing of integrated circuits from design documentation |
| 10/14/2004 | US20040204891 Semiconductor memory device having a test mode for testing an operation state |
| 10/14/2004 | US20040204887 Method and apparatus for decreasing automatic test equipment setup time |
| 10/14/2004 | US20040204886 Measuring device with dialog control occuring via dialog windows and corresponding method |
| 10/14/2004 | US20040204873 Method and apparatus for the analysis and monitoring of the partial discharge behavior of an electrical operating device |
| 10/14/2004 | US20040204174 Method for using system information from a wireless network to predict current consumption in different modes of a mobile telephone |
| 10/14/2004 | US20040203264 Socket having terminals with reslient contact arms |
| 10/14/2004 | US20040203262 Helical microelectronic contact and method for fabricating same |
| 10/14/2004 | US20040202155 Apparatus and method for distance extension of fibre-channel over transport |
| 10/14/2004 | US20040201944 Apparatus for detecting coil failure in an actuating solenoid of an electrical power switch |
| 10/14/2004 | US20040201399 System for testing integrated circuit devices |
| 10/14/2004 | US20040201398 Conductive material for integrated circuit fabrication |
| 10/14/2004 | US20040201397 Method and apparatus for die testing on wafer |
| 10/14/2004 | US20040201395 Test apparatus for testing integrated modules and method for operating a test apparatus |
| 10/14/2004 | US20040201393 Electronic load apparatus |
| 10/14/2004 | US20040201391 Tester channel to multiple IC terminals |
| 10/14/2004 | US20040201389 Needle assembly of probe card |
| 10/14/2004 | US20040201375 System and method for calibration of testing equipment using device photoemission |
| 10/14/2004 | US20040201093 Evaluating pattern for measuring and erosion of a semiconductor wafer polished by a chemical mechanical polishing |
| 10/14/2004 | US20040201077 Semiconductor integrated circuit device and method of testing the same |
| 10/14/2004 | US20040201016 Interconnect structure |
| 10/14/2004 | US20040201013 Method of fabricating multi layer mems and microfluidic devices |
| 10/14/2004 | US20040201012 Method of fabricating vertical integrated circuits |
| 10/14/2004 | US20040200633 Compliant electrical contact assembly |
| 10/14/2004 | DE202004011572U1 Failsafe autopilot, for remote controlled model aircraft or boats or cars, activates a servo to stop the motor and apply any brakes on a control fault and low batteries |
| 10/14/2004 | DE10312557A1 Testing method for checking on functional safety of a motor vehicle electronic systems and/or one of its components prepares functional and diagnostics models in tandem to define behavior |
| 10/14/2004 | DE10312481A1 Verfahren und System zur Früherkennung eines Ausfalls eines elektrisch gesteuerten Bremssystems Method and system for early detection of a failure of an electrically controlled brake system |
| 10/14/2004 | DE10297363T5 Zeitgenerator, Halbleiter-Prüfvorrichtung und Zeiterzeugungsverfahren Time generator, semiconductor test apparatus and timing generation method |
| 10/14/2004 | DE10296904T5 Verfahren zum Kalibrieren eines Halbleiter-Prüfgeräts A method of calibrating a semiconductor tester |
| 10/13/2004 | EP1467595A2 Hearing instrument with self-diagnostics |
| 10/13/2004 | EP1467583A1 Method and mobile station for testing devices within said mobile station |
| 10/13/2004 | EP1467460A2 Apparatus for detecting coil failure in an actuating solenoid of an electrical power switch |
| 10/13/2004 | EP1467379A1 Semiconductor memory device capable of accessing all memory cells |
| 10/13/2004 | EP1467215A2 Electronic load apparatus |
| 10/13/2004 | EP1466380A1 Multiple plateau battery charging method and system to charge to the second plateau |
| 10/13/2004 | EP1466365A2 Method of manufacturing an integrated circuit, integrated circuit obtained in accordance with said method, wafer provided with an integrated circuit obtained in accordance with the method, and system comprising an integrated circuit obtained by means of the method |
| 10/13/2004 | EP1466185A2 High speed and high accuracy dut power supply with boost circuitry |
| 10/13/2004 | EP1466184A1 Method and apparatus for broadcasting scan patterns in a scan-based integrated circuit |
| 10/13/2004 | EP1417587A4 Method and system for allocating protection path resources |
| 10/13/2004 | EP1368974B1 Method and device for testing the electromagnetic compatibility of screen devices |
| 10/13/2004 | EP1244921B1 Time domain reflectometer display method |