G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
10/2004
10/21/2004	WO2004090852A1 Control system and control method for checking the function of liquid crystal displays
10/21/2004	WO2004090723A2 A high reliability memory module with a fault tolerant address and command bus
10/21/2004	WO2004090562A1 Test emulation device, test module emulation device, and recording medium recorded with programs for the devices
10/21/2004	WO2004090561A1 Connection unit, test head, and test device
10/21/2004	WO2004090560A2 Automatic test machine for testing printed circuit boards
10/21/2004	WO2004090559A1 Performance monitor for a photovoltaic supply
10/21/2004	WO2004090558A2 Test head positioning system and method
10/21/2004	WO2004081585A3 Method and installation for lead battery state monitoring and management
10/21/2004	WO2004072814A3 Arc fault detection system
10/21/2004	WO2004051291A3 Method and apparatus for locating a discharge in a stator of an electrical machine
10/21/2004	WO2004046738A3 Virtual to physical memory address mapping within a system having a secure domain and a non-secure domain
10/21/2004	US20040210938 Method and system for automatically analyzing and modifying cable television signal leak information
10/21/2004	US20040210810 Test method and circuit for testing inter-device connections of field programmable gate arrays
10/21/2004	US20040210809 Input/output compression test circuit
10/21/2004	US20040210808 Diagnostic method for structural scan chain designs
10/21/2004	US20040210807 Methodology for selectively testing portions of an integrated circuit
10/21/2004	US20040210806 Flexible and extensible implementation of sharing test pins in ASIC
10/21/2004	US20040210805 Communication interface for diagnostic circuits of an integrated circuit
10/21/2004	US20040210804 Diagnostic data capture within an integrated circuit
10/21/2004	US20040210798 Test emulator, test module emulator, and record medium storing program therein
10/21/2004	US20040210431 Method and apparatus for accelerated post-silicon testing and random number generation
10/21/2004	US20040210413 Dynamic creation and modification of wafer test maps during wafer testing
10/21/2004	US20040210408 Magnetic field analysis method and programs for rotating machines
10/21/2004	US20040210406 Information handling system including a power management apparatus capable of independently switching between a primary and secondary battery
10/21/2004	US20040209172 Defect correction method for a photomask
10/21/2004	US20040208354 Electronic assembly video inspection system
10/21/2004	US20040208353 Substrate inspecting method and substrate inspecting apparatus using the method
10/21/2004	US20040208227 Apparatus and method for measuring operating temperatures of an electrical component
10/21/2004	US20040208084 Imaging sonar and detection system using one such sonar
10/21/2004	US20040208071 Semiconductor memory device
10/21/2004	US20040208048 Timing generator and test apparatus
10/21/2004	US20040207864 Method for operating a printer and method for operating a printer controller
10/21/2004	US20040207637 Measuring device with functional units controllable via a block diagram
10/21/2004	US20040207555 Doppler-based automated direction finding system and method for locating cable television signal leaks
10/21/2004	US20040207436 Timing generating apparatus and test apparatus
10/21/2004	US20040207428 Single clock source for plural scan capture chains
10/21/2004	US20040207426 Active prematching tuner system
10/21/2004	US20040207424 High resolution analytical probe station
10/21/2004	US20040207423 Electrical inspection apparatus
10/21/2004	US20040207422 Aligning and testing system for communication device manufacturing
10/21/2004	US20040207421 Method and apparatus for testing semiconductor circuitry for operability and method of forming apparatus for testing semiconductor circuitry for operability
10/21/2004	US20040207420 Modularized probe card with coaxial transmitters
10/21/2004	US20040207418 Inspection apparatus for printed board
10/21/2004	US20040207415 Semiconductor device tester
10/21/2004	US20040207414 Methodologies for efficient inspection of test structures using electron beam scanning and step and repeat systems
10/21/2004	US20040207408 Preconditional quiescent current testing of a semiconductor device
10/21/2004	US20040207407 Apparatus and method for simulating arcing
10/21/2004	US20040207393 Bar level lifecycle analyzer
10/21/2004	US20040207387 Method for electrical testing of semiconductor package that detects socket defects in real time
10/21/2004	US20040207383 Test structure and related methods for evaluating stress-induced voiding
10/21/2004	US20040207367 Internal condition detection system for a charge accumulating device
10/21/2004	US20040207365 Battery testers
10/21/2004	US20040207057 Semiconductor device, semiconductor device manufacturing method, and semiconductor device test method
10/21/2004	US20040207042 Structure and method for embedding capacitors in z-connected multi-chip modules
10/21/2004	US20040206984 Semiconductor device
10/21/2004	US20040206903 Surface contamination analyzer for semiconductor wafers, method used therein and process for fabricating semiconductor device
10/21/2004	US20040206425 Fabrication of a high-strength steel article with inclusion control during melting
10/21/2004	US20040206192 Measuring apparatus with value editor and corresponding method
10/21/2004	DE19840944B4 Sicherheitsrelevantes System, insbesondere elektromechanisches Bremssystem Safety-relevant system, in particular electro-mechanical brake system
10/21/2004	DE10354020A1 Verfahren zum Testen einer Halbleitervorrichtung A method for testing a semiconductor device
10/21/2004	DE10325746A1 Operating method for detecting an operating status in direct current voltage motor e.g. in passenger safety system in motor vehicle, involves making an analog signal available for an operating status
10/21/2004	DE10314462A1 Electric circuit boards fabrication test arrangement, includes actuator for releasing link between main- and secondary-guide slides as reaction to control signal
10/21/2004	DE10257588B3 Verfahren zur Vorhersage einer Spannung einer Batterie A method for predicting a voltage of a battery
10/21/2004	DE102004015528A1 Unterbrechungserfassungsschaltung für eine Sensorvorrichtung Interruption detecting circuit for a sensor device
10/21/2004	DE102004014099A1 Schnelles Verfahren zur Strahlrasterung und Bilderzeugung Rapid method for beam scanning and imaging
10/21/2004	CA2521737A1 Control system and control method for checking the function of liquid crystal displays
10/20/2004	EP1469321A1 Device for monitoring the state of charge of a battery
10/20/2004	EP1469320A1 Method for generating tester controls
10/20/2004	EP1468776A2 Microelectronics spring contact elements
10/20/2004	EP1468302A1 Electric motor monitoring system
10/20/2004	EP1468301A1 Method and device for optically testing semiconductor elements
10/20/2004	EP1368669B1 Method for testing a measurement recording device and corresponding testing device
10/20/2004	EP1137952B1 Boundary scan method for terminating or modifying integrated circuit operating modes
10/20/2004	EP1050053A4 Event phase modulator for integrated circuit tester
10/20/2004	EP1036338B1 Boundary scan system with address dependent instructions
10/20/2004	EP0774124B1 Ac power outlet ground integrity and wire test circuit device
10/20/2004	EP0748450B2 Printed circuit board test set with test adapter and method for setting the latter
10/20/2004	CN2650146Y Electrode potential measuring and treating device
10/20/2004	CN2650145Y Power line earthing point positioning instrument
10/20/2004	CN2650144Y Domestic appliance and equipment leakage display device
10/20/2004	CN2650143Y Multi-purpose wire matching device
10/20/2004	CN2650142Y Electric vehicle appliance comprehensive measuring instrument
10/20/2004	CN2650141Y Distributing frame protecting function on-line measuring pen
10/20/2004	CN1539177A Multiple plateau battery charging method and systm to charge to the second plateau
10/20/2004	CN1539083A Test head docking system and method
10/20/2004	CN1538794A Quasi continuous light generating power supply of single flash light sun analogue device
10/20/2004	CN1538604A Method of diagnosing inverter trouble
10/20/2004	CN1538515A Method for manufacturng semiconductor device
10/20/2004	CN1538514A 半导体装置 Semiconductor device
10/20/2004	CN1538500A Semiconductor device and its manufacturing method and testing method of semiconductor device
10/20/2004	CN1538459A Semiconductor storage device
10/20/2004	CN1538189A Detecting method of glass crystal covered type liquid crystal display
10/20/2004	CN1538186A Electron device having brightness indicating driving circuit
10/20/2004	CN1538185A 多重插座侦测器 Multiple socket detector
10/20/2004	CN1172424C Monitoring internal parameters of electrical motor systems
10/20/2004	CN1172359C Pre-burning controller of integrated circuit
10/20/2004	CN1172316C Integrated circuit testing device
10/20/2004	CN1172313C Circuit device and method for accelerated ageing in magnetoresistance memory
10/19/2004	US6807647 IC test system and storage medium for the same
10/19/2004	US6807646 System and method for time slicing deterministic patterns for reseeding in logic built-in self-test

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