| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
|---|
| 10/28/2004 | US20040215361 Automatic test system with easily modified software |
| 10/28/2004 | US20040214613 Mobile communication terminal and method for warning a user of a low-voltage state of the same |
| 10/28/2004 | US20040214455 Socket for electrical parts |
| 10/28/2004 | US20040214409 Method and apparatus for manufacturing known good semiconductor die |
| 10/28/2004 | US20040214372 Method for fabricating image sensor semiconductor package |
| 10/28/2004 | US20040213060 ROM-based controller monitor in a memory device |
| 10/28/2004 | US20040213058 Semiconductor integrated circuit device having a test function |
| 10/28/2004 | US20040213050 Semiconductor integrated circuit device |
| 10/28/2004 | US20040212573 Luminance compensation for emissive displays |
| 10/28/2004 | US20040212571 AM-OEL display, electronic system comprising the AM-OEL display and a testing method thereof |
| 10/28/2004 | US20040212407 Semiconductor integrated circuit having system bus divided in stages |
| 10/28/2004 | US20040212404 Semiconductor integrated circuit device with differential output driver circuit, and system for semiconductor integrated circuit device |
| 10/28/2004 | US20040212393 Reconfigurable fabric for SoCs |
| 10/28/2004 | US20040212392 Measuring device and measuring method for electric motors |
| 10/28/2004 | US20040212391 Method for universal wafer carrier for wafer level die burn-in |
| 10/28/2004 | US20040212388 High activity, spatially distributed radiation source for accurately simulating semiconductor device radiation environments |
| 10/28/2004 | US20040212387 Apparatus for measuring voltage fluctuation waveform in semiconductor integrated circuit, and semiconductor integrated circuit having function for measuring voltage fluctuation waveform |
| 10/28/2004 | US20040212385 Integrated spectrum analyzer for tuners |
| 10/28/2004 | US20040212384 Test apparatus for a printed-circuit board |
| 10/28/2004 | US20040212383 IC socket |
| 10/28/2004 | US20040212381 Inspection coaxial probe and inspection unit incorporating the same |
| 10/28/2004 | US20040212380 Failure analyzer |
| 10/28/2004 | US20040212377 Method for measuring resistivity of semiconductor wafer |
| 10/28/2004 | US20040212376 Space-saving test structures having improved capabilities |
| 10/28/2004 | US20040212372 Test instrument for arc fault circuit interrupters |
| 10/28/2004 | US20040212371 Ground fault detection device |
| 10/28/2004 | US20040212369 Method and device for detecting a signal |
| 10/28/2004 | US20040212368 Electro-chemical deterioration test method and apparatus |
| 10/28/2004 | US20040212367 Battery characterization system |
| 10/28/2004 | US20040212347 Battery charging method and apparatus |
| 10/28/2004 | US20040211061 Method of forming socket contacts |
| 10/28/2004 | DE10348027A1 Testsonde mit variabler Impedanz Test probe with variable impedance |
| 10/28/2004 | DE10317431A1 Verfahren zur Generierung von Testersteuerungen A method for generating control Tester |
| 10/28/2004 | DE10316901A1 Kontrollsystem und Kontrollverfahren zum Überprüfen der Funktion von LCD-Anzeigen Control system and control method for checking the function of LCD displays |
| 10/28/2004 | DE10316638A1 Method for recognizing acid coating in battery, determines first charge state value in battery load phase, based on estimation of rest voltage, followed by determining second charge state after load phase, based on measured rest voltage |
| 10/28/2004 | DE10315372A1 Method of providing a measurement signal based on pulses of a sampled input signal such as to measure electromagnetic interference by forming groups of pulses and arranging them in given time intervals |
| 10/28/2004 | DE10313264A1 Verfahren zum Testen von Bauelementen einer Schaltungsplatine A method for testing components of a circuit board |
| 10/28/2004 | CA2521769A1 Alarm recovery system and method for fuel cell testing systems |
| 10/27/2004 | EP1471619A1 Circuit and method for monitoring charge/discharge of a battery |
| 10/27/2004 | EP1471361A2 Mobile communication terminal and method for warning a user of low-voltage state of the same |
| 10/27/2004 | EP1471358A2 Coaxial probe interface |
| 10/27/2004 | EP1471357A2 Ic socket |
| 10/27/2004 | EP1470504A2 Verification test method for programmable logic devices |
| 10/27/2004 | EP1470432A2 Predictive, adaptive power supply for an integrated circuit under test |
| 10/27/2004 | EP1470431A2 Apparatus and method for dynamic diagnostic testing of integrated circuits |
| 10/27/2004 | EP1090338A4 Temperature tracking voltage-to-current converter |
| 10/27/2004 | EP1075655A4 Electronic battery tester |
| 10/27/2004 | EP1004031A4 Electric arc monitoring systems |
| 10/27/2004 | EP0786667B1 Method and apparatus for testing integrated circuits |
| 10/27/2004 | CN2652013Y Large-power lithium ion battery safety charger |
| 10/27/2004 | CN2651760Y Bias testing board |
| 10/27/2004 | CN2651759Y Protector of AC three-phase electric monitoring and power-driven apparatus |
| 10/27/2004 | CN2651758Y Holding frame of flexible and hard circuit board |
| 10/27/2004 | CN1541337A Battery capacity calculating method |
| 10/27/2004 | CN1541336A Electronic circuit and method for testing |
| 10/27/2004 | CN1541021A Moble communication terminal and method of nitifying clinent when its low voltage state |
| 10/27/2004 | CN1540736A Fault analytical device |
| 10/27/2004 | CN1540734A Method for testing cunnel length of grid electrode in MOS transistor |
| 10/27/2004 | CN1540733A Device for testing chip operation system and compatibility of chip in IC card |
| 10/27/2004 | CN1540515A Semiconductor device |
| 10/27/2004 | CN1540472A Electronic load of constant resistance |
| 10/27/2004 | CN1540362A Monitoring circuit for battery charge/discharge and monitoring method thereof |
| 10/27/2004 | CN1540361A Test set for testing perfomance of accumulator and control method |
| 10/27/2004 | CN1540360A Test method for postioning fault point of low resistivity in cable |
| 10/27/2004 | CN1540359A Device and method for testing panel display |
| 10/27/2004 | CN1173392C Equipment and method for screening test of fault leakage of storage device |
| 10/27/2004 | CN1173190C System and method for automatically creating and transmitting test conditions of integrated circuit devices |
| 10/27/2004 | CN1173189C Device for testing electric passing through for electric wire connector |
| 10/27/2004 | CN1173187C Device for testing passing through electric wire connector |
| 10/26/2004 | US6810498 RAM functional test facilitation circuit with reduced scale |
| 10/26/2004 | US6810372 Multimodal optimization technique in test generation |
| 10/26/2004 | US6810347 Robust power-on meter and method |
| 10/26/2004 | US6810346 Composite eye diagrams |
| 10/26/2004 | US6810344 Semiconductor testing method and semiconductor testing apparatus for semiconductor devices, and program for executing semiconductor testing method |
| 10/26/2004 | US6810340 Electromagnetic disturbance analysis method and apparatus and semiconductor device manufacturing method using the method |
| 10/26/2004 | US6810338 Monitoring circuit |
| 10/26/2004 | US6810010 Redundant LAN system, active line/stand-by line switching method, and recording medium |
| 10/26/2004 | US6809982 Defective cell remedy method capable of automatically cutting capacitor fuses within the fabrication process |
| 10/26/2004 | US6809975 Semiconductor memory device having test mode and memory system using the same |
| 10/26/2004 | US6809543 Abrupt power change method of preventing an integrated circuit chip from being thermally destroyed, in a tester, due to a defective pressed joint |
| 10/26/2004 | US6809542 Wafer resistance measurement apparatus and method using capacitively coupled AC excitation signal |
| 10/26/2004 | US6809541 Testing apparatus embedded in scribe line and a method thereof |
| 10/26/2004 | US6809539 Probe card for testing an integrated circuit |
| 10/26/2004 | US6809538 Active cooling to reduce leakage power |
| 10/26/2004 | US6809537 Interconnect device for electrically coupling a test system to a circuit board adapted for use with a ball-grid array connector |
| 10/26/2004 | US6809536 Apparatus for measuring properties of probe card and probing method |
| 10/26/2004 | US6809534 Semiconductor device test method and semiconductor device tester |
| 10/26/2004 | US6809532 Inspection method and inspection apparatus for semiconductor circuit |
| 10/26/2004 | US6809525 Method and system for estimating conductor losses in a transformer |
| 10/26/2004 | US6809524 Testing of conducting paths using a high speed I/O test package |
| 10/26/2004 | US6809523 On-line detection of partial discharge in electrical power systems |
| 10/26/2004 | US6809522 Automated electrostatic discharge device testing system |
| 10/26/2004 | US6809511 Device power supply and IC test apparatus |
| 10/26/2004 | US6809509 Electrical monitoring system |
| 10/26/2004 | US6809501 Method of improving fuel economy |
| 10/26/2004 | US6809378 Structure for temporarily isolating a die from a common conductor to facilitate wafer level testing |
| 10/26/2004 | US6808841 Battery terminal unit provided with a current sensor |
| 10/26/2004 | CA2321103C Zone arc fault detection |
| 10/26/2004 | CA2213966C Monitoring control apparatus |
| 10/21/2004 | WO2004091236A1 Method and arrangement of testing device in mobile station |