G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
11/2004
11/03/2004	EP1125142B1 Device for and method of preventing bus contention
11/03/2004	EP1101158A4 Algorithmic pattern generator
11/03/2004	EP1018026B1 Load circuit for integrated circuit tester
11/03/2004	EP0781419B1 Method and device for making connection
11/03/2004	CN2653521Y Phase lost detection circuit for power supply grid
11/03/2004	CN2653518Y Electric cut-off alarm detector
11/03/2004	CN1543698A Method for charging secondary battery
11/03/2004	CN1543687A Multiple plateau battery charging method and system to fully charge the first plateau
11/03/2004	CN1543595A Apparatus with resolution enhancement feature for improving accuracy of conversion of required chemical mechanical polishing pressure to force to be applied by polishing head to wafer
11/03/2004	CN1543574A Apparatus and method for testing circuit board
11/03/2004	CN1543033A Far loopback testing technique for circuit longitudinal differential protection
11/03/2004	CN1543032A Circuit longitudinal differential protection braking curve and closed locking angle testing method
11/03/2004	CN1542938A Handler for testing semiconductor device
11/03/2004	CN1542937A Method for testing RFID chip using digital signal and radiofrequency signal transmission/identification circuit
11/03/2004	CN1542859A 半导体存储器件 The semiconductor memory device
11/03/2004	CN1542836A Integrated circuit, optical disc device and signal monitoring method
11/03/2004	CN1542460A Electronic load apparatus
11/03/2004	CN1542459A Boundary scan testing device for integrated circuit
11/03/2004	CN1542458A Method for testing internal capacitance of integrated circuit using bridge circuit
11/03/2004	CN1542457A Method for testing internal capacitance of integrated circuit using CR circuit
11/03/2004	CN1542440A Detection device based on electric leakage trace appearance proof characteristic and electrical erosion proof property of electrical resistant material
11/03/2004	CN1174536C Automatic test method for battery
11/03/2004	CN1174512C Membrane electrode assembly with integral sensor and method for operating fuel battery
11/03/2004	CN1174426C Semiconductor memory chip
11/03/2004	CN1174257C Method and device for detecting circuit board
11/03/2004	CN1174256C Multi-ended fault locating system
11/03/2004	CN1174255C Positioning system of fault point
11/03/2004	CN1174253C Circuit and method for detecting voltage state of power supply
11/03/2004	CN1174252C Multiplex transmission voltage measuring equipment
11/02/2004	US6813751 Creating standard VHDL test environments
11/02/2004	US6813740 Method for the testing of electronic components
11/02/2004	US6813739 Scan interface chip (SIC) system and method for scan testing electronic systems
11/02/2004	US6813738 IC test cell with memory output connected to input multiplexer
11/02/2004	US6813737 Short circuited capacitor detection in AC coupled links using boundary scan test methodology
11/02/2004	US6813732 Trace circuit
11/02/2004	US6813598 Logic simulation method and logic simulation apparatus
11/02/2004	US6813579 Apparatus and method for test mode control
11/02/2004	US6813578 Process for measuring CMOS device performance from hot carrier luminescence
11/02/2004	US6813572 Apparatus and methods for managing reliability of semiconductor devices
11/02/2004	US6813241 Network architecture and method of providing link protection in a bidirectional data traffic network
11/02/2004	US6813203 Semiconductor memory device and method for testing semiconductor memory device
11/02/2004	US6813202 Semiconductor integrated circuit device capable of shortening period required for performing data retention test
11/02/2004	US6813199 Semiconductor memory device with improved saving rate for defective chips
11/02/2004	US6813132 Control system for an electromagnetic switching device and electromagnetic switching device corresponding thereto
11/02/2004	US6812730 Method for independent measurement of mosfet source and drain resistances
11/02/2004	US6812729 System and method for characterizing the quality of the interface between a silicon and a gate insulator in a MOS device
11/02/2004	US6812728 Test method of internal connections in a semiconductor package
11/02/2004	US6812727 Semiconductor integrated circuit device and testing method thereof
11/02/2004	US6812726 Entering test mode and accessing of a packaged semiconductor device
11/02/2004	US6812725 Semiconductor processing apparatus and wafer sensor module
11/02/2004	US6812724 Method and system for graphical evaluation of IDDQ measurements
11/02/2004	US6812721 PC mainboard test fixture background of the invention
11/02/2004	US6812720 Modularized probe card with coaxial transmitters
11/02/2004	US6812718 Massively parallel interface for electronic circuits
11/02/2004	US6812717 Use of a coefficient of a power curve to evaluate a semiconductor wafer
11/02/2004	US6812714 Apparatus for collecting signal measurement data at signal ports of an RF and microwave device-under-test, under different impedance load conditions
11/02/2004	US6812712 Wire test method and apparatus
11/02/2004	US6812692 Inspection terminal for inspecting electronic chip component, and inspection method and inspection apparatus using the same
11/02/2004	US6812691 Compensation for test signal degradation due to DUT fault
11/02/2004	US6812690 Integrated circuit with power supply test interface
11/02/2004	US6812674 Apparatus and method for testing battery condition
11/02/2004	US6812670 Battery control device
11/02/2004	US6812494 Semiconductor device
11/02/2004	US6812485 Dual interposer packaging for high density interconnect
11/02/2004	US6812049 Method and system for performing failure analysis on a multilayer silicon-on-insulator (SOI) device
11/02/2004	US6812047 Evaluating a geometric or material property of a multilayered structure
11/02/2004	US6811420 Contact pin and socket for electrical parts
11/02/2004	US6811407 Socket for electrical parts
11/02/2004	US6810758 Apparatus and method for automatically changing the probe head in a four-point probe system
11/02/2004	US6810743 Non-destructive evaluation of wire insulation and coatings
11/02/2004	US6810728 Selecting specimens for removal from an installation, capturing pre-removal environmental information using a camera, and removing the specimens to be sent off for aging testing
11/02/2004	CA2291682C Boundary scanning element and communication equipment using the same
10/2004
10/28/2004	WO2004093331A2 Built-in-self-test for digital transmitters
10/28/2004	WO2004093317A2 System and method for determining voltage levels
10/28/2004	WO2004093302A2 Ac servo driver motor power line disconnection detection method
10/28/2004	WO2004093191A1 Semiconductor device
10/28/2004	WO2004093189A1 Helical microelectronic contact and method for fabricating same
10/28/2004	WO2004092758A1 Method and device for predicting the starting capacity of a vehicle
10/28/2004	WO2004092757A1 Method for identifying electrolyte stratification in a battery
10/28/2004	WO2004092756A1 Alarm recovery system and method for fuel cell testing systems
10/28/2004	WO2004092755A1 Test device
10/28/2004	WO2004092754A1 System and method for calibration of testing equipment using device photoemission
10/28/2004	WO2004092753A1 Event based test method for debugging timing related failures in integrated circuits
10/28/2004	WO2004092752A2 Method for detecting fault arcs and arc monitoring device therefor
10/28/2004	WO2004092751A1 Pulse width measuring apparatus with auto-range setting function
10/28/2004	WO2004092090A2 Temperature compensated vertical pin probing device
10/28/2004	WO2004091697A1 System and method for monitoring power source longevity of an implantable medical device
10/28/2004	WO2004042787A3 Method and apparatus for testing asynchronous set/reset faults in a scan-based integrated circuit
10/28/2004	WO2004042412A9 Method and apparatus for diagnosis injectors
10/28/2004	WO2003015276A3 Logic state transition sensor circuit
10/28/2004	US20040216081 Application-specific testing methods for programmable logic devices
10/28/2004	US20040216061 Embeddable method and apparatus for functional pattern testing of repeatable program instruction-driven logic circuits via signal signature generation
10/28/2004	US20040216023 Method and apparatus for maximizing and managing test coverage
10/28/2004	US20040216021 Semiconductor apparatus
10/28/2004	US20040216018 Direct memory access controller and method
10/28/2004	US20040216014 Delay device, semiconductor testing device, semiconductor device, and oscilloscope
10/28/2004	US20040216006 Semiconductor memory device capable of accessing all memory cells
10/28/2004	US20040216005 Event based test method for debugging timing related failures in integrated circuits
10/28/2004	US20040215417 Method of inkless wafer blind assembly
10/28/2004	US20040215378 Method of diagnosing an electronic control unit

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