G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
11/2004
11/09/2004	US6816708 Measuring instrument with multiple signal terminals shared in multiple operation modes
11/09/2004	US6816614 Method for comparing recorded pixel images representing equipotential lines of at least an integrated circuit chip
11/09/2004	US6816429 Integrated circuit capable of being burn-in tested using an alternating current stress and a testing method using the same
11/09/2004	US6816422 Semiconductor memory device having multi-bit testing function
11/09/2004	US6816418 MIS semiconductor device having improved gate insulating film reliability
11/09/2004	US6816255 Method and apparatus for leak-testing an electroluminescent device
11/09/2004	US6816228 Electro-optical device, inspection method thereof, and electronic equipment
11/09/2004	US6815992 Circuit for testing and fine tuning integrated circuit (switch control circuit)
11/09/2004	US6815978 Single clock source for plural scan capture chains
11/09/2004	US6815977 Scan cell systems and methods
11/09/2004	US6815976 Apparatus and method for inspecting array substrate
11/09/2004	US6815975 Inspection method and inspection device for active matrix substrate, inspection program used therefor, and information storage medium
11/09/2004	US6815973 Optical testing port and wafer level testing without probe cards
11/09/2004	US6815972 Method of determining disconnection location in a circuit
11/09/2004	US6815971 Method and apparatus for stress testing integrated circuits using an adjustable AC hot carrier injection source
11/09/2004	US6815970 Method for measuring NBTI degradation effects on integrated circuits
11/09/2004	US6815969 Semiconductor inspection device capable of performing various inspections on a semiconductor device
11/09/2004	US6815968 Reduced terminal testing system
11/09/2004	US6815967 In-tray burn-in board, device and test assembly for testing integrated circuit devices in situ on processing trays
11/09/2004	US6815966 System for burn-in testing of electronic devices
11/09/2004	US6815965 Integrated circuit internal heating system and method therefor
11/09/2004	US6815964 Test board de-embedding method to improve RF measurements accuracy on an automatic testing equipment for IC wafers
11/09/2004	US6815962 Connection/inspection device for semiconductor elements
11/09/2004	US6815961 Construction structures and manufacturing processes for integrated circuit wafer probe card assemblies
11/09/2004	US6815960 Electron beam test system and electron beam test method
11/09/2004	US6815959 Systems and methods for measuring properties of conductive layers
11/09/2004	US6815958 Method and apparatus for measuring thickness of thin films with improved accuracy
11/09/2004	US6815957 Method and device for inspecting laminated iron cores of electrical machines for interlamination shorts
11/09/2004	US6815956 Automatic hi-pot, megohmeter and continuity, circuit tester
11/09/2004	US6815955 Circuit and circuit breaker tester
11/09/2004	US6815943 Electric component test system and electric component test method
11/09/2004	US6815712 Method for selecting components for a matched set from a wafer-interposer assembly
11/09/2004	US6815658 Testing circuit for charge detection circuit, LSI, image sensor, and testing method for the charge detection circuit
11/09/2004	US6815233 Method of simultaneous display of die and wafer characterization in integrated circuit technology development
11/09/2004	US6815230 Control signal transmitting method with package power pin and related integrated circuit package structure
11/09/2004	US6813817 Method of using a replacement headplate to adapt a probe station
11/04/2004	WO2004095893A1 Fence condition monitoring apparatus and method
11/04/2004	WO2004095667A1 Electronic circuit breaker
11/04/2004	WO2004095646A1 Anisotropic conductive sheet and its manufacturing method, adaptor device and its manufacturing method, and circuit device electric test instrument
11/04/2004	WO2004095297A2 A high performance serial bus testing methodology
11/04/2004	WO2004095280A2 Diagnostic data capture within an integrated circuit
11/04/2004	WO2004095240A2 A method and apparatus for detecting on-die voltage variations
11/04/2004	WO2004095233A2 Apparatus and method for distance extension of fibre-channel over transport
11/04/2004	WO2004095041A1 Communication interface for diagnostic circuits of an integrated circuit
11/04/2004	WO2004095040A1 Automated circuit board test actuator system
11/04/2004	WO2004084033A8 Method and system for testing a signal path having an operational signal
11/04/2004	WO2004083980A3 Method of mitigating effects of component deflection in a probe card analyzer
11/04/2004	WO2004081978A3 Radio frequency clamping circuit
11/04/2004	WO2004079377A8 Apparatus and method for electrical cable identification
11/04/2004	WO2004073088A3 Method and system for modeling energy transfer
11/04/2004	WO2004053944A3 Fast localization of electrical failures on an integrated circuit system and method
11/04/2004	WO2004025811A3 Method and device for detecting sparking and spark erosion in electric machines
11/04/2004	WO2004025232A3 Method and device for detecting oscillations of the shafting of an electric machine
11/04/2004	US20040221215 Test apparatus, computer readable program for test apparatus, test pattern recording medium,and method for controlling test apparatus
11/04/2004	US20040221214 Test apparatus
11/04/2004	US20040221213 Communications jacks including test circuits and related circuits and methods
11/04/2004	US20040221212 Digital signal processor including an interface therein capable of allowing direct access to registers from an external device
11/04/2004	US20040221199 Systems and methods for probing processor signals
11/04/2004	US20040221197 Extensible IO testing implementation
11/04/2004	US20040221084 Form factor converter and tester in an open architecture modular computing system
11/04/2004	US20040220776 Instantaneous wire interruption detection system for vehicle electrical system
11/04/2004	US20040220765 Method for communication with a test system for integrated circuits
11/04/2004	US20040220764 Tuning chart for devices under test
11/04/2004	US20040220763 Test apparatus and setting method therefor
11/04/2004	US20040220759 Leakage current or resistance measurement method, and monitoring apparatus and monitoring system of the same
11/04/2004	US20040220758 Circuit and method for measurement of battery capacity fade
11/04/2004	US20040220752 System and method for measuring internal resistance of electrochemical devices
11/04/2004	US20040219827 System for monitoring connection pattern of data ports
11/04/2004	US20040218665 Signal transmit-receive device, circuit, and loopback test method
11/04/2004	US20040218527 Method and apparatus for measuring quality of service parameters of networks delivering real time MPEG video
11/04/2004	US20040218459 Oscillation based access time measurement
11/04/2004	US20040217809 Measurement circuit with improved accuracy
11/04/2004	US20040217795 Delay adjusting apparatus providing different delay times by producing a plurality of delay control signals
11/04/2004	US20040217773 Method and device for inspection active matrix substrate
11/04/2004	US20040217772 System for testing semiconductor die on multiple semiconductor wafers
11/04/2004	US20040217770 Planarizing and testing of BGA packages
11/04/2004	US20040217769 Device probing using a matching device
11/04/2004	US20040217767 Wafer probing that conditions devices for flip-chip bonding
11/04/2004	US20040217766 Apparatus and methods for measuring resistance of conductive layers
11/04/2004	US20040217764 Electronic component characteristic measuring device
11/04/2004	US20040217530 Indexing rotatable chuck for a probe station
11/04/2004	US20040217349 Integrated circuit with a test circuit
11/04/2004	US20040217342 Anisotropically conductive connector, production process thereof and application product thereof
11/04/2004	US20040216537 Continuous test flow method and apparatus
11/04/2004	US20040216536 Handler for testing semiconductor device
11/04/2004	DE202004012798U1 Contact monitoring circuit for high-voltage test systems compares end of shield or auxiliary wire with reference potential via semiconducting switch, displaying signal if potential difference exists
11/04/2004	DE10357243A1 System und Verfahren zum Erzeugen von symetrischen Signalen mit willkürlicher Amplituden- und Phasensteuerung unter Verwendung einer Modulation System and method for generating symmetrical signals with arbitrary amplitude and phase control using a modulation
11/04/2004	DE10317524A1 Verfahren und Vorrichtung zur Vorhersage der Startfähigkeit eines Fahrzeugs Method and apparatus for predicting the starting capability of a vehicle
11/04/2004	DE10316357A1 Verfahren zur Überwachung von Leistungshalbleiterbauelementen The method for monitoring power semiconductor components
11/04/2004	DE10315240A1 Rechnergestütztes Prüfverfahren für eine Anordnung elektrischer Geräte Computer-based test methods for placement of electrical equipment
11/04/2004	DE10297381T5 Vorrichtung und Verfahren zur Taktschrägemessung Apparatus and method for Taktschrägemessung
11/04/2004	DE10140757B4 Verfahren zur Ermittlung der Laufzeit elektrischer Signale auf gedruckten Leiterplatten durch eine automatische Standardtestausrüstung A method for determining the transit time of electrical signals on printed circuit boards by automatic test equipment Standard
11/04/2004	DE10061106B4 Verfahren und Vorrichtung zur Überprüfung elektrischer Materialeigenschaften Method and apparatus for checking electrical material properties
11/03/2004	EP1473573A1 Intelligent test adapter
11/03/2004	EP1473572A1 Apparatus and methods for measuring the resistance of conductive layers
11/03/2004	EP1472552A2 Integrated circuit with self-testing circuit
11/03/2004	EP1472551A1 Testing of circuit with plural clock domains
11/03/2004	EP1472550A2 Timing system measurement and calibration
11/03/2004	EP1368943A4 Apparatus and method for network-initiated real-time multi-party communications
11/03/2004	EP1259831A4 Control system simulation, testing, and operator training

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