G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
11/2004
11/11/2004	WO2004097893A2 Method of restoring encapsulated integrated circuit devices
11/11/2004	WO2004097872A2 Test instrument for arc fault circuit interrupters
11/11/2004	WO2004097840A1 Apparatus and method for generating test patterns for sdram
11/11/2004	WO2004097521A1 Optical proximity effect correction verification method
11/11/2004	WO2004097439A1 Measurement device and program
11/11/2004	WO2004097438A1 Data compression
11/11/2004	WO2004097437A1 Space-saving test structures having improved capabilities
11/11/2004	WO2004097436A2 Measurement circuit with improved accuracy
11/11/2004	WO2004097435A1 Examining instrument for liquid crystal panel
11/11/2004	US20040225974 System and method for parsing HDL events for observability
11/11/2004	US20040225973 Post-silicon test coverage verification
11/11/2004	US20040225972 Automation of the development, testing, and release of a flow framework and methodology to design integrated circuits
11/11/2004	US20040225938 Scan of chip state from a hierarchical design
11/11/2004	US20040225937 Testing of integrated circuit devices
11/11/2004	US20040225924 Method and apparatus for mapping signals of a device under test to logic analyzer measurement channels
11/11/2004	US20040225888 Smart card with enhanced security features and related system, integrated circuit, and methods
11/11/2004	US20040225783 Bus to multiple jtag bus bridge
11/11/2004	US20040225489 Integrated self-testing of a reconfigurable interconnect
11/11/2004	US20040225466 Testing apparatus, method of controlling the same, and program for implementing the method
11/11/2004	US20040225465 Method and apparatus for testing integrated circuits
11/11/2004	US20040225459 Method and structure to develop a test program for semiconductor integrated circuits
11/11/2004	US20040225418 Arrangement comprising a first semiconductor chip and a second semiconductor chip connected thereto
11/11/2004	US20040225400 Non-contact optical system for production testing of electronic assemblies
11/11/2004	US20040224430 Arrangements having IC voltage and thermal resistance designated on a per IC basis
11/11/2004	US20040224427 [a detection method for metal contamination and micro particles of a fabrication device]
11/11/2004	US20040223639 System for creating an inspection recipe, system for reviewing defects, method for creating an inspection recipe and method for reviewing defects
11/11/2004	US20040223569 Hyperfine oversampler method and apparatus
11/11/2004	US20040223559 Integrated data jitter generator for the testing of high-speed serial interfaces
11/11/2004	US20040223384 Semiconductor memory device and test method thereof
11/11/2004	US20040223309 Enhanced compliant probe card systems having improved planarity
11/11/2004	US20040223140 TFT array inspection apparatus
11/11/2004	US20040222960 Method for driving a reflection liquid crystal display
11/11/2004	US20040222837 Semiconductor integrated circuit and a burn-in method thereof
11/11/2004	US20040222828 Timing adjustment circuit and semiconductor device including the same
11/11/2004	US20040222816 Method and apparatus for testing flat display apparatus
11/11/2004	US20040222814 Method and apparatus for inspecting flat panel display
11/11/2004	US20040222813 Method and apparatus for testing liquid crystal display
11/11/2004	US20040222812 Integrated circuit having a test circuit
11/11/2004	US20040222811 Integrated module having a delay element
11/11/2004	US20040222810 Integrated test circuit in an integrated circuit
11/11/2004	US20040222809 System for probing, testing, burn-in, repairing and programming of integrated circuits
11/11/2004	US20040222808 System and method of measuring probe float
11/11/2004	US20040222807 Switched suspended conductor and connection
11/11/2004	US20040222806 Semiconductor device test method and semiconductor device tester
11/11/2004	US20040222798 Method for and arrangement comprising means for determining the available power capacity of an electric power supply
11/11/2004	US20040222797 Method and apparatus for determining cold cranking amperes value
11/11/2004	US20040222784 Fixture for test cards of testing machine
11/11/2004	US20040222770 Battery quality monitoring method
11/11/2004	US20040222385 Substrate testing device and substrate testing method
11/11/2004	US20040222305 Smart card including a JTAG test controller and related methods
11/11/2004	DE10318951A1 Arcing detection circuit, especially for use with a motor vehicle power supply circuit, has high and low-pass filter elements for filtering the current signal, with both filter outputs input to an evaluation unit
11/11/2004	DE10297488T5 Halbleiterprüfer Semiconductor tester
11/11/2004	DE10297457T5 Zeiterzeugungsvorrichtung und Prüfvorrichtung Timing generation device and testing unit
11/11/2004	DE10218695B4 Vorrichtung und Verfahren zur Erzeugung einer definierten Wechselspannung Apparatus and method for generating a defined ac voltage
11/11/2004	DE10153192B4 Teststrukturbereich für eine Mehrlagenverdrahtung von integrierten Schaltungen und Verfahren zum Herstellen eines solchen Teststrukturbereichs Test structure region for a multi-layer wiring of integrated circuits and methods for manufacturing such a test structure region
11/11/2004	DE10143034B4 Vorrichtung zum Messen von Störkapazitäten auf einer integrierten Schaltung An apparatus for measuring parasitic capacitances on an integrated circuit
11/10/2004	EP1475891A1 Built-in self-test circuit for phase locked loops, test method and computer program product therefore
11/10/2004	EP1475645A1 Synthetic testing circuit for high voltage alternating current circuit breakers
11/10/2004	EP1475644A1 Data compression
11/10/2004	EP1475643A1 Test pattern compression for an integrated circuit test environment
11/10/2004	EP1475642A1 Method and arrangement for measuring the coupling capacitance between two interconnect lines
11/10/2004	EP1474858A1 Method and apparatus for controlling energy transfer between an energy bus and a battery system based upon battery operating condition
11/10/2004	EP1474700A2 Method and apparatus for testing assisted position location capable devices
11/10/2004	EP1474698A1 Signal paths providing multiple test configurations
11/10/2004	EP1261882B1 Device for monitoring and forecasting the probability of inductive proximity sensor failure
11/10/2004	EP0721591B1 Device for testing an integrated circuit
11/10/2004	CN2655257Y Cell voltage and its internal resistance sampling detector
11/10/2004	CN2655256Y Tester for battery performance
11/10/2004	CN2655255Y Battery electricity quantity indicator for light time domain reflector
11/10/2004	CN2655254Y Fault positioner for high-voltage transmission line multi-channel high-precise GPS single terminal
11/10/2004	CN2655253Y Counter-force measurer for electromagnetic contactor
11/10/2004	CN2655252Y Measuring appliance for host machine circuit board
11/10/2004	CN1545708A Method and device for testing semiconductor memory devices
11/10/2004	CN1545625A Insert and electronic component handling apparatus having the same
11/10/2004	CN1545622A Testing device sensor and testing device
11/10/2004	CN1545229A A multichannel testing method
11/10/2004	CN1545162A Universal charging method and equipment for battery electric quantity
11/10/2004	CN1544955A Comprehensive test instrument of electric system primary cut out
11/10/2004	CN1544954A Method for testing power type LED thermal resistance and special purpose chip thereof
11/10/2004	CN1544953A Multi-channel surface stick welding spot fatigue state real-time monitoring system
11/10/2004	CN1175513C Method for producing data for monitoring and controlling the secondary cell discharge state
11/10/2004	CN1175484C Tester of chip without package
11/10/2004	CN1175278C Circuit for testing voltage using four-wire method in security protection mode
11/10/2004	CN1175277C Method and apparatus for wireless testing of integrated circuits
11/10/2004	CN1175276C Testing and ageing apparatus, cascade system using the apparatus and method of testing
11/10/2004	CN1175275C Inspection device and inspection method
11/10/2004	CN1175274C Tester and holder for tester
11/10/2004	CN1175273C Powering frame
11/10/2004	CN1175270C Machine for electric test of printed circuits with adjustable position of sound needles
11/09/2004	USRE38651 Variable depth and width memory device
11/09/2004	US6817006 Application-specific testing methods for programmable logic devices
11/09/2004	US6816992 Test generator having a poisson distribution error signal
11/09/2004	US6816991 Built-in self-testing for double data rate input/output
11/09/2004	US6816990 VLSI chip test power reduction
11/09/2004	US6816989 Method and apparatus for efficiently managing bandwidth of a debug data output port or buffer
11/09/2004	US6816988 Method and system for minimal-time bit-error-rate testing
11/09/2004	US6816983 Microprocessor internally provided with test circuit
11/09/2004	US6816825 Simulation vector generation from HDL descriptions for observability-enhanced statement coverage
11/09/2004	US6816814 Method and apparatus for decomposing and verifying configurable hardware
11/09/2004	US6816797 System and method for measuring fuel cell voltage and high frequency resistance

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