G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
11/2004
11/18/2004	WO2004099792A2 Planarizing and testing of bga packages
11/18/2004	WO2004099791A2 Diagnosis for expected life of emergency power apparatus
11/18/2004	WO2004062170A8 Field transmitter with diagnostic self-test mode
11/18/2004	US20040230935 Method and Apparatus for Creating Circuit Redundancy in Programmable Logic Devices
11/18/2004	US20040230928 Apparatus connectable to a computer network for circuit design verification, computer implemented method for circuit design verification, and computer progam product for controlling a computer system so as to verify circuit designs
11/18/2004	US20040230925 Method and device for IC identification
11/18/2004	US20040230884 Compressing test responses using a compactor
11/18/2004	US20040230882 Pseudo random LBIST controls
11/18/2004	US20040230880 Memory-Module Burn-In System With Removable Pattern-Generator Boards Separated from Heat Chamber by Backplane
11/18/2004	US20040230399 Method of testing hard disk drive and computer readable medium therefor
11/18/2004	US20040230392 System and method for generating a SHMOO plot by varying the resolution thereof
11/18/2004	US20040230390 Method and system for improved single-ended loop make-up identification
11/18/2004	US20040230388 Signal detecting circuit and method therefor
11/18/2004	US20040230387 Wire event detection
11/18/2004	US20040230385 Wire fault detection
11/18/2004	US20040230383 Wire fault detection
11/18/2004	US20040229505 Coaxial probe interconnection system
11/18/2004	US20040228283 Power control and scheduling in an OFDM system
11/18/2004	US20040228186 Analysis method for semiconductor device, analysis system and a computer program product
11/18/2004	US20040228052 Method for checking the electrical safety of a household appliance and corresponding household appliance
11/18/2004	US20040227862 Liquid crystal panel, apparatus for inspecting the same, and method of fabricating liquid crystal display thereof
11/18/2004	US20040227637 Built-in circuitry and method to test connector loading
11/18/2004	US20040227545 Method and apparatus to remotely sense the temperature of a power semiconductor
11/18/2004	US20040227538 Test apparatus for evaluating voltage regulators
11/18/2004	US20040227537 Low-current probe card
11/18/2004	US20040227536 Prober and probe testing method for temperature-controlling object to be tested
11/18/2004	US20040227535 Probing method and probing apparatus
11/18/2004	US20040227534 Test head positioning system and method
11/18/2004	US20040227533 System and method of mitigating effects of component deflection in a probe card analyzer
11/18/2004	US20040227532 Apparatus and method for use in testing a semiconductor wafer
11/18/2004	US20040227531 Semiconductor device test method and semiconductor device tester
11/18/2004	US20040227527 Method and relative test structure for measuring the coupling capacitance between two interconnect lines
11/18/2004	US20040227522 Power-line, differential, isolation loss detector
11/18/2004	US20040227521 Electrical leak detecting apparatus
11/18/2004	US20040227520 Traction motor fault detection system
11/18/2004	US20040227505 Wafer probe station
11/18/2004	US20040227504 Method of applying the analysis of scrub mark morphology and location to the evaluation and correction of semiconductor testing, analysis, and manufacture
11/18/2004	US20040227491 Battery capacity and usage system
11/18/2004	US20040227488 Method of calculating capacity of intelligent battery, intelligent battery and portable electronic device
11/18/2004	US20040227191 Evaluation method of a field effect transistor
11/18/2004	US20040227079 Inspection apparatus for circuit pattern
11/18/2004	DE20122278U1 Wafer for electronic chip manufacture has electronic chips and memory device with stored classification map with position and classification information for at least one part of chip
11/18/2004	DE19826028B4 Vorrichtung zur Überwachung eines in einem Fahrzeug verwendeten Kabels Device for monitoring a cable used in a vehicle
11/18/2004	DE10355326A1 Differential amplifier arrangement for use in testing applications with physical value sensors has a self-test input generating circuit, which permits independent self-testing of the amplifier operation
11/18/2004	DE10333241B3 Voltage testing device for testing HV or MV cable using VLF voltage uses setting transformer with positioning drive coupled via switch to primary of HV transformer connected to tested cable on secondary side
11/18/2004	DE10297489T5 Phasenanpassungsvorrichtung und Halbleiterspeicher-Testvorrichtung Phase adjusting device and semiconductor memory test apparatus
11/18/2004	DE10202904B4 Vorrichtung und Verfahren zum parallelen und unabhängigen Test spannungsversorgter Halbleiterspeichereinrichtungen Apparatus and method for parallel and independent test voltage powered semiconductor storage devices
11/18/2004	DE102004002707A1 Handler zum Testen von Halbleitervorrichtungen Handler for the testing of semiconductor devices
11/18/2004	CA2516815A1 Diagnosis for expected life of emergency power apparatus
11/17/2004	EP1477883A1 Smart card with enhanced security features and related system, integrated circuit, and methods
11/17/2004	EP1477820A2 Wire fault detection
11/17/2004	EP1477819A1 Method of measuring electromagnetic field intensity and device therefor,method of measuring electromagnetic field intensity distribution and device thereof, method of measuring current/voltage distribution and divice thereof
11/17/2004	EP1476971A1 Enable propagation controller
11/17/2004	EP1476816A2 Data bus for electrically controlling the installation of modules
11/17/2004	EP1476765A1 Radio frequency power generation and power measurement
11/17/2004	EP1476761A1 Contact actuator with contact force control
11/17/2004	EP1393280B1 Safety device
11/17/2004	EP1212629B1 Tester for concurrently testing multiple chips
11/17/2004	EP1070385A4 Inhibitable, continuously-terminated, differential drive circuit for an integrated circuit tester
11/17/2004	EP0775318B1 Capacitive open-circuit test employing an improved threshold determination
11/17/2004	CN2657013Y Apparatus for measuring luminous diolde
11/17/2004	CN2657012Y Full automatic electrity power protective CT volt-ampere characteristics, conversion ratio, polartiy test instrument
11/17/2004	CN2657011Y Synchronous generator power angle intelligent on-line stable measuring control device
11/17/2004	CN1547767A Semiconductor epitaxial wafer and method for measuring withstand voltage thereof
11/17/2004	CN1547670A Measurement control apparatus
11/17/2004	CN1547669A Method of manufacturing a probe card
11/17/2004	CN1547037A Electric loading state-output voltage characteristic curve on-line updating method for storage battery
11/17/2004	CN1176383C Boundary scan testing system of integrated circuit
11/16/2004	US6820234 Skew calibration means and a method of skew calibration
11/16/2004	US6820227 Method and apparatus for performing error checking
11/16/2004	US6820226 Method, apparatus and computer program product for contention testing
11/16/2004	US6820220 Control unit for controlling safety-critical applications
11/16/2004	US6820205 Electric power unit with a battery and a memory for recording the date of first use of the battery
11/16/2004	US6820047 Method and system for simulating an operation of a memory
11/16/2004	US6820029 Method for determining failure rate and selecting best burn-in time
11/16/2004	US6820027 System and method for generating a shmoo plot by avoiding testing in failing regions
11/16/2004	US6820021 System and method for generating a shmoo plot by varying the resolution thereof
11/16/2004	US6819788 Failure analysis method that allows high-precision failure mode classification
11/16/2004	US6819609 Semiconductor memory device with built-in self-diagnostic function and semiconductor device having the semiconductor memory device
11/16/2004	US6819596 Semiconductor memory device with test mode
11/16/2004	US6819161 Structure for temporarily isolating a die from a common conductor to facilitate wafer level testing
11/16/2004	US6819140 Self-synchronous logic circuit having test function and method of testing self-synchronous logic circuit
11/16/2004	US6819130 Floating and self-aligning suspension system to automatically align and attach a connector to an assembly
11/16/2004	US6819128 Latch locking mechanism of a KGD carrier
11/16/2004	US6819125 Method and apparatus for integrated circuit failure analysis
11/16/2004	US6819124 Detection of electromigration in integrated circuits
11/16/2004	US6819123 Extraction of interconnect parasitics
11/16/2004	US6819119 Method for evaluating a crystalline semiconductor substrate
11/16/2004	US6819117 PICA system timing measurement & calibration
11/16/2004	US6819116 Terminal crimped state testing method
11/16/2004	US6819115 Fault location device and method
11/16/2004	US6819099 Programmable carrier plate for automated circuit board tester
11/16/2004	US6819096 Power measurement mechanism for a transformer coupled plasma source
11/16/2004	US6818986 Semiconductor device and method of inspecting the same
11/16/2004	US6818840 Method for manufacturing raised electrical contact pattern of controlled geometry
11/16/2004	US6818039 Anionic polymers composed of dicarboxylic acids and uses thereof
11/16/2004	US6817231 Scanning probe microscope for ultra sensitive electro-magnetic field detection and probe thereof
11/14/2004	CA2467263A1 Method, system and apparatus for testing electrochemical cells
11/12/2004	CA2455457A1 Wire fault detection
11/11/2004	WO2004098056A2 Input stage of a signal-processing unit

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