| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 11/25/2004 | US20040233356 Method for producing a reflection liquid crystal display |
| 11/25/2004 | US20040233355 Reflection liquid crystal display |
| 11/25/2004 | US20040233064 Voltage-detecting method and related circuits |
| 11/25/2004 | US20040232940 Method of detecting defects in TFT-arrays and a TFT-array testing system incorporating the same |
| 11/25/2004 | US20040232939 Testing flat panel display plates using high frequency AC signals |
| 11/25/2004 | US20040232938 Method and apparatus for testing semiconductor devices using the back side of a circuit board |
| 11/25/2004 | US20040232937 Semiconductor integrated circuit device |
| 11/25/2004 | US20040232936 Tester architecture for testing semiconductor integrated circuits |
| 11/25/2004 | US20040232935 Chuck for holding a device under test |
| 11/25/2004 | US20040232933 Dynamic burn-in equipment |
| 11/25/2004 | US20040232932 Chip testing machine |
| 11/25/2004 | US20040232930 Coupling unit, test head, and test apparatus |
| 11/25/2004 | US20040232928 Testing circuits on substrates |
| 11/25/2004 | US20040232926 Electrical signal taking-out device |
| 11/25/2004 | US20040232925 Integrated circuit probe card |
| 11/25/2004 | US20040232919 Fault detection system and method |
| 11/25/2004 | US20040232918 Automotive battery charging system tester |
| 11/25/2004 | US20040232884 Self-diagnosis system for an energy storage device |
| 11/25/2004 | US20040232449 Arrangement comprising a first semiconductor chip and a second semiconductor chip connected thereto |
| 11/25/2004 | US20040232446 Semiconductor integrated circuit device and manufacture thereof |
| 11/25/2004 | US20040232414 Interconnect routing over semiconductor for editing through the back side of an integrated circuit |
| 11/25/2004 | DE19541595C5 Verfahren zur Steuerung der Aufladung oder Entladung einer Batterie eines Elektrofahrzeugs Method for controlling the charge or discharge of a battery of an electric vehicle |
| 11/25/2004 | DE10321256A1 High voltage alternating current circuit breaker synthetic test circuit has semiconductor diode or thyristor circuits switching shortly before high current circuit |
| 11/25/2004 | DE10319157A1 Monitoring method for the burn-in voltage during an integrated circuit burn-in process, whereby a voltage representative of the internal burn-in voltage is compared with a reference value and a corresponding signal output |
| 11/25/2004 | DE102004019091A1 Verfahren und Gerät für einen kontinuierlichen Prüfablauf Method and apparatus for continuous test sequence |
| 11/25/2004 | DE10155467B4 Verfahren und Vorrichtung zum Auffinden eines Fehlers in einem Signalpfad auf einer Leiterplatte Method and device for locating a fault in a signal path on a PCB |
| 11/25/2004 | CA2522695A1 Fuel cell testing system |
| 11/24/2004 | EP1480271A1 Method of analysis of the quality of contacts and vias in multi-level metallisation fabrication processes of semiconductor devices, and corresponding test chip architecture |
| 11/24/2004 | EP1480051A2 Device and method for the determination of the high current capacity of a battery |
| 11/24/2004 | EP1480050A2 Hyperfine oversampler method and apparatus |
| 11/24/2004 | EP1480049A1 Automatic test pattern generation |
| 11/24/2004 | EP1480048A1 Automatic test pattern generation |
| 11/24/2004 | EP1480047A1 Automatic test pattern generation |
| 11/24/2004 | EP1480046A1 A method for determining the current-voltage characteristic of a snap-back device |
| 11/24/2004 | EP1479025A2 Methods and apparatus for semiconductor testing |
| 11/24/2004 | EP1478932A1 Method and circuit arrangement for determining the average current consumption of a battery-operated apparatus |
| 11/24/2004 | EP1078272A4 Method for generating a shmoo plot contour for integrated circuit tester |
| 11/24/2004 | EP0954822B1 Method of checking the authenticity of an electric circuit arrangement |
| 11/24/2004 | CN2658755Y Compound testing apparatus |
| 11/24/2004 | CN1549932A Circuit wiring inspetion instrument and circuit wiring inspecting method |
| 11/24/2004 | CN1549931A Method and device for the diagnosis of an electric system in a motor vehicle electric system |
| 11/24/2004 | CN1549667A Testing structure and printed circuit board with the same testing structure |
| 11/24/2004 | CN1549386A Method for judging state of secondary cell and device for judging state thereof, and method for regenerating secondary cell |
| 11/24/2004 | CN1549385A Detecting method and detecting apparatus for detecting internal resistance of a rechargeable battery and rechargeable battery pack having said detecting apparatus therein |
| 11/24/2004 | CN1548978A Electric power generator air gap magnetic field change on-line real-time detecting method |
| 11/24/2004 | CN1548977A Power source characteristic testing insrument |
| 11/24/2004 | CN1548976A Electric power generator rotor turn-to-turn short-circuit on-line monitoring system |
| 11/24/2004 | CN1548975A Phase current detecting method for motor |
| 11/24/2004 | CN1548974A Super large scale integrated circuit testing channel compression method and circuit |
| 11/24/2004 | CN1548973A Method and apparatus for inspecting flat panel display |
| 11/24/2004 | CN1548972A Apparatus for testing electric power system |
| 11/24/2004 | CN1548971A Method for testing flexible circuit board connection qualification and flexible circuit board with testing pad |
| 11/24/2004 | CN1548970A Picture element measuring method |
| 11/24/2004 | CN1548969A Testing structure for multi-directional leakage current path |
| 11/24/2004 | CN1548968A Automatic correcting method for electronic ballast automatic testing system |
| 11/24/2004 | CN1548967A 电力设备在线监测方法 Power Equipment Online Monitoring Method |
| 11/24/2004 | CN1177309C Electrooptical device and its testing method, testing circuit and for electrooptical device and electrooptical device and electronic equipment |
| 11/24/2004 | CN1177232C Data buffer method for real-time closed-loop test of relay protector in electric power system |
| 11/24/2004 | CN1177231C Circuit board design diagram debugging method and system |
| 11/24/2004 | CN1177230C Microcomputer based electric power digital dynamic realtime emulation method |
| 11/24/2004 | CN1177227C Conductive contact |
| 11/23/2004 | US6823486 Automatic test pattern generation for functional register transfer level circuits using assignment decision diagrams |
| 11/23/2004 | US6823483 Physical coding sublayer for a multi-pair gigabit transceiver |
| 11/23/2004 | US6823466 Circuit and method for adjusting the clock skew in a communications system |
| 11/23/2004 | US6823293 Hierarchical power supply noise monitoring device and system for very large scale integrated circuits |
| 11/23/2004 | US6823274 Apparatus and method for testing remaining capacity of a battery |
| 11/23/2004 | US6823272 Test executive system with progress window |
| 11/23/2004 | US6823040 X-ray inspection method and apparatus used for the same |
| 11/23/2004 | US6822984 Device for and method of testing semiconductor laser module |
| 11/23/2004 | US6822840 Method for protecting MOS components from antenna effect and the apparatus thereof |
| 11/23/2004 | US6822712 Reflection liquid crystal display, method for producing the same, and method for driving the same |
| 11/23/2004 | US6822628 Methods and systems for compensating row-to-row brightness variations of a field emission display |
| 11/23/2004 | US6822498 Clock distribution system for automatic test equipment |
| 11/23/2004 | US6822482 Dynamic scan circuitry for B-phase |
| 11/23/2004 | US6822474 On chip logic analyzer debug bus |
| 11/23/2004 | US6822473 Determination of permeability of layer material within interconnect |
| 11/23/2004 | US6822471 Dynamically switched voltage screen |
| 11/23/2004 | US6822469 Method for testing multiple semiconductor wafers |
| 11/23/2004 | US6822468 Method and apparatus for implementing printed circuit board high potential testing to identify latent defects |
| 11/23/2004 | US6822465 Method of regulating the temperature of integrated circuit modules, using a heat exchanger with a face of a solid malleable metal and a release agent |
| 11/23/2004 | US6822464 Probe card transporting apparatus and to-be-connected body moving mechanism |
| 11/23/2004 | US6822462 Providing circuit point electrically connectable with component, second circuit point electrically connectable with electrical conductor, monitoring voltage potential of third point representative of potential proximate first point |
| 11/23/2004 | US6822458 Apparatus and method for simulating arcing |
| 11/23/2004 | US6822457 Method of precisely determining the location of a fault on an electrical transmission system |
| 11/23/2004 | US6822456 Bi-metallic test switch |
| 11/23/2004 | US6822439 Control of tristate buses during scan test |
| 11/23/2004 | US6822436 Universal test interface between a device under test and a test head |
| 11/23/2004 | US6822435 Comparator circuit for differential swing comparison and common-mode voltage comparison |
| 11/23/2004 | US6822430 Method of assessing lateral dopant and/or charge carrier profiles |
| 11/23/2004 | US6822330 Semiconductor integrated circuit device with test element group circuit |
| 11/23/2004 | US6821131 IC socket for a fine pitch IC package |
| 11/23/2004 | US6820794 Solderless test interface for a semiconductor device package |
| 11/23/2004 | CA2234203C Apparatus and method for testing snow removal equipment |
| 11/23/2004 | CA2171307C Scan test circuit using fast transmission gate switch |
| 11/18/2004 | WO2004099987A1 Logic analyzer data retrieving circuit and its retrieving method |
| 11/18/2004 | WO2004099804A1 Method and apparatus for determining cold cranking amperes value |
| 11/18/2004 | WO2004099802A1 Method for testing empty printed circuit boards |
| 11/18/2004 | WO2004099801A1 Method and apparatus for measuring quality of service parameters of networks delivering real time mpeg video |
| 11/18/2004 | WO2004099800A2 Measuring device, and method for locating a partial discharge |
| 11/18/2004 | WO2004099793A2 Device probing using a matching device |