G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
12/2004
12/02/2004	DE10320925A1 Verfahren zum Testen von unbestückten Leiterplatten A method for testing of bare printed circuit boards
12/02/2004	DE10297437T5 Prüfvorrichtung Tester
12/02/2004	DE10135798A1 Verfahren zur Diagnose diskreter Endstufen über Digitaleingänge Method for the diagnosis of discrete amplifiers with digital inputs
12/02/2004	CA2780146A1 Power control and scheduling in an ofdm system
12/02/2004	CA2525588A1 Power control and scheduling in an ofdm system
12/01/2004	EP1482595A2 Connector apparatus
12/01/2004	EP1482395A1 Transfer clocks for a multi-channel architecture
12/01/2004	EP1482318A2 Battery life monitor and battery state of charge monitor
12/01/2004	EP1482314A1 Microelectronic spring contact element
12/01/2004	EP1481421A2 Semiconductor package device and method of formation and testing
12/01/2004	EP1415168B1 Application-specific testing methods for programmable logic devices
12/01/2004	EP1415167B1 Method and apparatus for evaluating a set of electronic components
12/01/2004	EP1129553B1 Decision-feedback decoding method and system
12/01/2004	EP0766092B1 Testable circuit with multiple identical circuit blocks
12/01/2004	CN2660671Y High voltage load switch
12/01/2004	CN2660548Y Local discharging on-line monitor for high voltage electrical equipment
12/01/2004	CN2660547Y Intelligent fault analyzer for motorcycle
12/01/2004	CN2660546Y Variable illuminator for detecting and regulating photoelectric controller
12/01/2004	CN2660540Y Conducting structure of probe assembly and wire in electronic and detecting implement
12/01/2004	CN1551993A Method and apparatus for evaluating a set of electronic components
12/01/2004	CN1551992A Measuring back-side voltage of an integrated circuit
12/01/2004	CN1551446A Cell low-voltage protector
12/01/2004	CN1551325A System and method for heating semiconductor in standard test environment
12/01/2004	CN1551242A Semiconductor storage device
12/01/2004	CN1550785A Probe device and its manufacturing method
12/01/2004	CN1550776A Substrate inspecting method and substrate inspecting apparatus using the method
12/01/2004	CN1178327C Battery pack and battery system
12/01/2004	CN1178271C A method and apparatus for transport and tracking of electronic component
12/01/2004	CN1178069C Check clamp for electric distribution
12/01/2004	CN1178068C CGROM detection device and method
12/01/2004	CN1178066C Aging test socket
12/01/2004	CN1178065C Aging test socket
11/2004
11/30/2004	US6826721 Data accelerator and methods for increasing data throughput
11/30/2004	US6826720 Testing board for semiconductor memory, method of testing semiconductor memory and method of manufacturing semiconductor memory
11/30/2004	US6826717 Synchronization of hardware and software debuggers
11/30/2004	US6826494 Psuedo noise generator
11/30/2004	US6826463 In-vehicle button-stuck malfunction notice system
11/30/2004	US6826147 Method and apparatus for aggregate flow control in a differentiated services network
11/30/2004	US6826101 Semiconductor device and method for testing the same
11/30/2004	US6826100 Push button mode automatic pattern switching for interconnect built-in self test
11/30/2004	US6825771 Identification system
11/30/2004	US6825688 System for yield enhancement in programmable logic
11/30/2004	US6825685 Method and system for wafer level testing and burning-in semiconductor components
11/30/2004	US6825684 Hot carrier oxide qualification method
11/30/2004	US6825683 System and method for testing multiple integrated circuits that are in the same package
11/30/2004	US6825682 Test configuration for the functional testing of a semiconductor chip
11/30/2004	US6825681 Thermal control of a DUT using a thermal control substrate
11/30/2004	US6825680 Automated semiconductor probing device
11/30/2004	US6825678 Wafer level interposer
11/30/2004	US6825673 Method and apparatus for circuit board continuity test, tool for continuity test, and recording medium
11/30/2004	US6825672 Cable tester
11/30/2004	US6825670 Method and device for testing a telecommunication cable
11/30/2004	US6825669 Apparatus and method for data and command input and having a display in a battery charger and tester
11/30/2004	US6825652 Tester incorporating opening and closing mechanism
11/30/2004	US6825651 Test method for characterizing currents associated with powered components in an electronic system
11/30/2004	US6825649 Non-contact voltage measurement method and device, and detection probe
11/30/2004	US6825647 Method for testing a frequency converter
11/30/2004	US6825639 Charging/discharging apparatus and method, power supplying apparatus and method, power supplying system and method, program storage medium, and program
11/30/2004	US6825558 Carrier module for μ-BGA type device
11/30/2004	US6825480 Particle image and processing units for obtaining plurality of two-dimensional images generated by sample scanned by irradiation; computing focal offset; sharpness, accuracy
11/30/2004	US6825052 Test assembly including a test die for testing a semiconductor product die
11/30/2004	US6824427 Coaxial probe interconnection system
11/30/2004	US6824411 Socket for electrical parts
11/30/2004	US6824395 Semiconductor device-socket
11/25/2004	WO2004102803A2 A scalable scan-path test point insertion technique
11/25/2004	WO2004102617A2 Test circuit for input-to output speed measurement
11/25/2004	WO2004102598A2 Switched suspended conductor and connection
11/25/2004	WO2004102594A2 Method and testing equipment for checking the operation of a lightning arrester
11/25/2004	WO2004102299A2 Test apparatus for evaluating voltage regulators
11/25/2004	WO2004102218A1 Fuel cell testing system
11/25/2004	WO2004102217A1 Test device
11/25/2004	WO2004102216A2 Test systems and methods
11/25/2004	WO2004102210A1 RECONFIGURABLE FABRIC FOR SoCs
11/25/2004	WO2004102209A1 Coaxial probe interface
11/25/2004	WO2004102207A1 Probe for testing electric conduction
11/25/2004	WO2004102056A2 Systems and methods for non-destructively testing conductive members employing electromagnetic back scattering
11/25/2004	WO2004093317A3 System and method for determining voltage levels
11/25/2004	WO2004075250A3 Testing of electronic circuits
11/25/2004	WO2004070400B1 Wrist joint for positioning a test head
11/25/2004	US20040237021 Cyclic redundancy checking of a field programmable gate array having an SRAM memory architecture
11/25/2004	US20040237015 Method and apparatus for debug, diagnosis, and yield improvement of scan-based integrated circuits
11/25/2004	US20040237014 Test compaction using linear-matrix driven scan chains
11/25/2004	US20040237013 Apparatus and method for sensing emulator cable orientation while providing signal drive capability
11/25/2004	US20040237012 Generating a test sequence using a satisfiability technique
11/25/2004	US20040237011 Apparatus and method for saving precise system state following exceptions
11/25/2004	US20040236564 Simulation of a PCI device's memory-mapped I/O registers
11/25/2004	US20040236534 Integrated circuit with configuration based on parameter measurement
11/25/2004	US20040236531 Method for adaptively testing integrated circuits based on parametric fabrication data
11/25/2004	US20040236530 System and method of heating up a semiconductor device in a standard test environment
11/25/2004	US20040236052 Biodegradable and include recurring units of dicarboxylic monomers such as maleic anhydride, itaconic anhydride or citraconic anhydride; may be complexed with ions to provide fertilizers
11/25/2004	US20040235208 Multi beam scanning with bright/dark field imaging
11/25/2004	US20040235207 Connection device and test system
11/25/2004	US20040234755 Anionic polymers composed of dicarboxylic acids and uses thereof
11/25/2004	US20040234684 Anionic polymers composed of dicarboxylic acids and uses thereof
11/25/2004	US20040234121 Circuit wiring inspetion instrument and circuit wiring inspecting method
11/25/2004	US20040233980 Measuring system with a reference signal between a signal generator and a signal analyser
11/25/2004	US20040233966 Method and apparatus for rapid thermal testing
11/25/2004	US20040233745 Dynamic memory and method for testing a dynamic memory
11/25/2004	US20040233738 Apparatus and method for reducing test resources in testing DRAMS
11/25/2004	US20040233704 Semiconductor integrated circuit device with differential output driver circuit, and system for semiconductor integrated circuit device

1 ... 1072 1073 1074 1075 1076 1077 1078 1079 1080 1081 1082 1083 1084 1085 1086 1087 1088 1089 1090 1091 1092 ... 1523