| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 12/07/2004 | US6829737 Method and system for storing device test information on a semiconductor device using on-device logic for determination of test results |
| 12/07/2004 | US6829736 Method of testing a memory |
| 12/07/2004 | US6829730 Method of designing circuit having multiple test access ports, circuit produced thereby and method of using same |
| 12/07/2004 | US6829724 Method for monitoring the condition of a battery in a high temperature high current environment |
| 12/07/2004 | US6829574 Logic emulation module and logic emulation board |
| 12/07/2004 | US6829573 Method and system to search for critical path |
| 12/07/2004 | US6829565 Stepper motor automated self-test routine |
| 12/07/2004 | US6829562 Method and device for state sensing of technical systems such as energy stores |
| 12/07/2004 | US6829556 Method and system for detecting incipient failures in a traction system |
| 12/07/2004 | US6829553 Method of and apparatus for measuring the correctness of and correcting an automatic test arrangement |
| 12/07/2004 | US6829545 Method of calculating capacity of intelligent battery, intelligent battery and portable electronic device |
| 12/07/2004 | US6829262 Aging in tunable semiconductor lasers |
| 12/07/2004 | US6829223 Computer network physical-layer analysis method and system |
| 12/07/2004 | US6829214 Multi-part communications card assembly |
| 12/07/2004 | US6828914 In-use unambiguously determining the near-end-of-life state of a combustion engine battery |
| 12/07/2004 | US6828850 Method and system for charge pump active gate drive |
| 12/07/2004 | US6828815 Method and apparatus for defect analysis of semiconductor integrated circuit |
| 12/07/2004 | US6828812 Test apparatus for testing semiconductor dice including substrate with penetration limiting contacts for making electrical connections |
| 12/07/2004 | US6828811 Optics landing system and method therefor |
| 12/07/2004 | US6828809 Photon detection enhancement of superconducting hot-electron photodetectors |
| 12/07/2004 | US6828799 Propagation delay time measuring method and testing apparatus |
| 12/07/2004 | US6828798 Method for inspecting relay contacts for contact weld in battery power source device |
| 12/07/2004 | US6828797 Alternative method for VOD testing of linear differential line drivers |
| 12/07/2004 | US6828796 Electrical continuity tester |
| 12/07/2004 | US6828793 Battery voltage detecting circuit |
| 12/07/2004 | US6828778 Circuit board coupon tester |
| 12/07/2004 | US6828777 Fixture for test cards of testing machine |
| 12/07/2004 | US6828776 Method for analyzing defect inspection parameters |
| 12/07/2004 | US6828775 High-impedance mode for precision measurement unit |
| 12/07/2004 | US6828774 Rear-mounted gimbal for supporting test head |
| 12/07/2004 | US6828761 Battery charging/discharging apparatus and battery charging/discharging method |
| 12/07/2004 | US6828758 Charge/discharge control method for battery pack and charge/discharge control apparatus for battery pack |
| 12/07/2004 | US6828733 Remote lamp control apparatus |
| 12/07/2004 | US6828571 Apparatus and methods of controlling surface charge and focus |
| 12/07/2004 | CA2326061C Apparatus and method for inline testing of electrical components |
| 12/05/2004 | CA2469443A1 Method of detecting partial discharges and diagnostic system for electrical apparatus |
| 12/02/2004 | WO2004105294A2 Power control and scheduling in an ofdm system |
| 12/02/2004 | WO2004105172A1 Insulating mount structure, insulation monitoring system, and insulation monitoring method for fuel cells |
| 12/02/2004 | WO2004105120A1 Lsi package, lsi device testing method, semiconductor device manufacturing method |
| 12/02/2004 | WO2004104609A1 Automatic test pattern generation |
| 12/02/2004 | WO2004104608A1 Automatic test pattern generation |
| 12/02/2004 | WO2004104607A1 Test apparatus and test module |
| 12/02/2004 | WO2004104606A1 Power source device, test device, and power source voltage stabilizing device |
| 12/02/2004 | WO2004104605A1 Current measurement device and test device |
| 12/02/2004 | WO2004104531A2 Method and system for improved single-ended loop make-up identification |
| 12/02/2004 | WO2004083873A3 Adjusting device for the planarization of probe sets of a probe card |
| 12/02/2004 | WO2004066413A3 Condition detection and indicating means for a storage battery |
| 12/02/2004 | WO2004063758A3 Semiconductor test system storing pin calibration data, commands and other data in non-volatile memory |
| 12/02/2004 | WO2004059331A3 Apparatus and method for limiting over travel in a probe card assembly |
| 12/02/2004 | WO2004021022A3 Integrated circuit with embedded identification code |
| 12/02/2004 | US20040243948 Systems and methods for generating test vectors to analyze cells of electronic gates |
| 12/02/2004 | US20040243899 Serializer/deserializer circuit for jitter sensitivity characterization |
| 12/02/2004 | US20040243898 Apparatus and method for adapting a level sensitive device to produce edge-triggered behavior |
| 12/02/2004 | US20040243897 Dual mode memory for IC terminals |
| 12/02/2004 | US20040243896 Test scan cells |
| 12/02/2004 | US20040243892 Method, system, and program for improved device blocking and suspension |
| 12/02/2004 | US20040243891 Failure analysis method of semiconductor device |
| 12/02/2004 | US20040243870 Transfer clocks for a multi-channel architecture |
| 12/02/2004 | US20040243375 Method and system for implementing circuit simulators |
| 12/02/2004 | US20040243374 Method and system for implementing, controlling, and interfacing with circuit simulators |
| 12/02/2004 | US20040243371 System and method for automatic derivation of coverage metrics for validation of pipelined designs |
| 12/02/2004 | US20040243348 Apparatus and method for detecting incorrect connector insertion, and program for carrying out the method |
| 12/02/2004 | US20040243345 Tester and testing method |
| 12/02/2004 | US20040243339 Integrated circuit testing method, program, storing medium, and apparatus |
| 12/02/2004 | US20040243337 Adapting scan architectures for low power operation |
| 12/02/2004 | US20040243288 Diagnostic system and method for electric leak detecting device |
| 12/02/2004 | US20040242037 Top plate release mechanism |
| 12/02/2004 | US20040241888 Method and system for increasing yield of vertically integrated devices |
| 12/02/2004 | US20040241887 Sensor for inspection instrument and inspection instrument |
| 12/02/2004 | US20040240724 Tester and testing method |
| 12/02/2004 | US20040240485 Apparatus and method for increasing optical density of SONET multiplexer using integral components |
| 12/02/2004 | US20040240385 Real-time monitoring, analysis, and forecasting of trunk group usage |
| 12/02/2004 | US20040240249 Redundancy fuse circuit |
| 12/02/2004 | US20040240136 Method for checking electrical safety of a household appliance and corresponding household appliance |
| 12/02/2004 | US20040239921 Probe needle for testing semiconductor chips and method for producing said probe needle |
| 12/02/2004 | US20040239513 Input voltage sense circuit in a line powered network element |
| 12/02/2004 | US20040239363 Integrated circuit that can be externally tested through a normal signal output pin |
| 12/02/2004 | US20040239362 Input system for an operations circuit |
| 12/02/2004 | US20040239361 System used to test plurality of duts in parallel and method thereof |
| 12/02/2004 | US20040239360 Method and apparatus for evaluating a set of electronic components |
| 12/02/2004 | US20040239359 Device test apparatus and test method |
| 12/02/2004 | US20040239358 Output buffer circuit having signal path used for testing and integrated circuit and test method including the same |
| 12/02/2004 | US20040239357 Contactor for electronic components and test method using the same |
| 12/02/2004 | US20040239356 Conductive contact |
| 12/02/2004 | US20040239354 Startup/yank circuit for self-biased phase-locked loops |
| 12/02/2004 | US20040239353 Test head docking system and method |
| 12/02/2004 | US20040239352 Probe card used for inspecting semiconductor devices |
| 12/02/2004 | US20040239351 Probe head, its assembly method and probe card |
| 12/02/2004 | US20040239350 Novel solution for low cost, speedy probe cards |
| 12/02/2004 | US20040239349 Probe card and testing method of semiconductor chip, capacitor and manufacturing method thereof |
| 12/02/2004 | US20040239347 Semiconductor device tester |
| 12/02/2004 | US20040239346 Method of determining current-voltage characteristics of a device |
| 12/02/2004 | US20040239340 Resistor value detection circuit |
| 12/02/2004 | US20040239334 Coaxial radio frequency adapter and method |
| 12/02/2004 | US20040239333 Apparatus for judging state of assembled battery |
| 12/02/2004 | US20040239332 Method and device for determining the starting capability of a vehicle |
| 12/02/2004 | US20040239310 Tester |
| 12/02/2004 | US20040238818 Semiconductor chip with test pads and tape carrier package using the same |
| 12/02/2004 | DE69729771T2 Integrierte Schaltung mit einer eingebauten Selbsttestanordnung An integrated circuit having a built-in self-test assembly |
| 12/02/2004 | DE19652173B4 Verfahren zur Prüfung der Funktionsfähigkeit von Akkumulatoren Method for testing the functionality of accumulators |