| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 12/14/2004 | US6831296 Device for seating semiconductor device in semiconductor test handler |
| 12/14/2004 | US6831294 Semiconductor integrated circuit device having bump electrodes for signal or power only, and testing pads that are not coupled to bump electrodes |
| 12/14/2004 | US6830940 Method and apparatus for performing whole wafer burn-in |
| 12/14/2004 | CA2108403C Electrical distribution equipment with torque estimating capability |
| 12/09/2004 | WO2004107402A2 Smart capture for atpg (automatic test pattern generation) and fault simulation of scan-based integrated circuits |
| 12/09/2004 | WO2004107400A2 Chuck for holding a device under test |
| 12/09/2004 | WO2004107103A2 Apparatus and method for sensing emulator cable orientation while providing signal drive capability |
| 12/09/2004 | WO2004107086A2 Method for reducing the cost of handling incoming/outgoing phone calls |
| 12/09/2004 | WO2004106958A1 Delay-fault testing method, related system and circuit |
| 12/09/2004 | WO2004106957A2 Signal integrity self-test architecture |
| 12/09/2004 | WO2004106956A1 A method for testing analog and mixed-signal circuits using funtionally related excitations and functionally related measurements |
| 12/09/2004 | WO2004106955A1 Tester architecture for testing semiconductor integrated circuits |
| 12/09/2004 | WO2004106954A1 Electronic component test instrument |
| 12/09/2004 | WO2004106953A1 Electronic component test instrument |
| 12/09/2004 | WO2004106952A1 Harness checker and harness checking method |
| 12/09/2004 | WO2004106946A2 A method and apparatus for measuring and analyzing electrical or electrochemical systems |
| 12/09/2004 | WO2004106945A2 Electronic component testing apparatus |
| 12/09/2004 | WO2004106944A2 Electronic part test device |
| 12/09/2004 | WO2004106885A2 Battery pack of a mobile communication terminal to be capable of reading output of bio-sensors and self-diagnosis system |
| 12/09/2004 | WO2004095297A3 A high performance serial bus testing methodology |
| 12/09/2004 | WO2004079379A3 Antenna for detection of partial discharges in a chamber of an electrical instrument |
| 12/09/2004 | US20040250190 X-Tree test method and apparatus in a multiplexed digital system |
| 12/09/2004 | US20040250189 Systems and methods for injecting an exception into a target thread |
| 12/09/2004 | US20040250188 Method and apparatus for generating test data sets in accordance with user feedback |
| 12/09/2004 | US20040250187 High speed serial interface test |
| 12/09/2004 | US20040250186 Scan-path circuit, logic circuit including the same, and method for testing integrated circuit |
| 12/09/2004 | US20040250185 Semiconductor integrated circuit |
| 12/09/2004 | US20040250180 Input/output circuit and semiconductor integrated circuit |
| 12/09/2004 | US20040250165 Semiconductor memory device permitting boundary scan test |
| 12/09/2004 | US20040249986 Control unit for vehicle and total control system therefor |
| 12/09/2004 | US20040249612 Apparatus and method for monitoring high impedance failures in chip interconnects |
| 12/09/2004 | US20040249607 Method for determining a system operating state |
| 12/09/2004 | US20040249598 Method to selectively identify reliability risk die based on characteristics of local regions on the wafer |
| 12/09/2004 | US20040249588 Operation analyzing method for semiconductor integrated circuit device, analyzing system used in the same, and optimization design method using the same |
| 12/09/2004 | US20040249585 Apparatus and method for detecting high impedance failures in system interconnect |
| 12/09/2004 | US20040248448 Small contactor pin |
| 12/09/2004 | US20040248435 Socket for semiconductor device |
| 12/09/2004 | US20040246791 Semiconductor memory apparatus and self-repair method |
| 12/09/2004 | US20040246637 Motor condition detection apparatus and vehicle height control apparatus |
| 12/09/2004 | US20040246337 Self-test executable integrated circuit, a design apparatus thereof, and a scan chain design apparatus |
| 12/09/2004 | US20040246246 Image display device with increased margin for writing image signal |
| 12/09/2004 | US20040246031 Ultra-low power programmable timer and low voltage detection circuits |
| 12/09/2004 | US20040246019 Inspection device and inspection method for active matrix panel, and manufacturing method for active matrix organic light emitting diode panel |
| 12/09/2004 | US20040246018 TFT array inspection device |
| 12/09/2004 | US20040246017 AC testing of leakage current in integrated circuits using RC time constant |
| 12/09/2004 | US20040246016 System and method for input/output induced latch up detection |
| 12/09/2004 | US20040246013 Environmental test method and system |
| 12/09/2004 | US20040246011 Method and apparatus for inspecting wire breaking of integrated circuit |
| 12/09/2004 | US20040246009 Method and apparatus for bringing laser chips to a measurement position |
| 12/09/2004 | US20040246008 Apparatus and method for detecting and rejecting high impedance interconnect failures in manufacturing process |
| 12/09/2004 | US20040246006 Techniques to test signal propagation media |
| 12/09/2004 | US20040246003 Electric circuit test device |
| 12/09/2004 | US20040246002 Method and device for use in DC parametric tests |
| 12/09/2004 | US20040246001 Method and apparatus for guided establishment of a signal probe configuration |
| 12/09/2004 | US20040246000 Method of detecting partial discharges and diagnostic system for electrical apparatus |
| 12/09/2004 | US20040245996 Apparatus and method for monitoring and predicting failures in system interconnect |
| 12/09/2004 | US20040245994 Method and error location in branched low voltage and medium boltage networks and evaluation circuit used thereof |
| 12/09/2004 | US20040245982 Handling device, especially for positioning a test head on a testing device |
| 12/09/2004 | US20040245981 Apparatus and method for detecting and rejecting high impedance failures in chip interconnects |
| 12/09/2004 | US20040245868 Synchronous machine |
| 12/09/2004 | US20040245628 Tape package having test pad on reverse surface and method for testing the same |
| 12/09/2004 | US20040245100 Method, system and apparatus for testing electrochemical cells |
| 12/09/2004 | DE19714575B4 Verfahren zur Bewertung der Netzrückwirkung von einem Prüfling auf ein elektrisches Netz sowie Vorrichtung zur Durchführung des Verfahrens Method for evaluating the phase effect of a test specimen to an electrical network, and device for carrying out the method |
| 12/09/2004 | DE10361079A1 Timing member for evaluating signal condition for monitoring and evaluating position switches for lasers, e.g. in robot treatment cells for car body treating |
| 12/09/2004 | DE10346662B3 Arrangement for measuring vehicle electrical system parameters, has contact element on carrying body; contact can be made to energy storage device pole with carrying body above positioning element |
| 12/09/2004 | DE10323145A1 Testing method for electric machine, e.g. car generator, driven by car engine and coupled in car network to battery and control appliance, by which measured values of battery current during time period |
| 12/09/2004 | DE10297415T5 Testvorrichtung für Halbleiterbauelemente Test apparatus for semiconductor devices |
| 12/09/2004 | DE10297319T5 Anwendungsspezifisches ereignisbasiertes Halbleiterspeicher-Testsystem Application-specific event-based semiconductor memory test system |
| 12/09/2004 | DE10296750T5 Faser-optische Wafer-Sonde Fiber-optic wafer probe |
| 12/09/2004 | DE102004023293A1 Kontaktloses optisches System zum Testen von Elektronikbaugruppen während der Fertigung A non-contact optical system for testing electronic components during manufacture |
| 12/09/2004 | DE102004006529A1 Formfaktorwandler und Tester in einem modularen Rechensystem mit offener Architektur Form factor converter and testers in a modular computing system with open architecture |
| 12/09/2004 | DE10132489B4 Handling device for positioning a test head holding an integrated circuit or wafer relative to a testing device, has a positioning mechanism that ensures exactly reproducible and smooth movement of the test head |
| 12/09/2004 | DE10080254B4 Wellenformerzeugungsvorrichtung und Halbleiterprüfvorrichtung Waveform generation device and semiconductor test |
| 12/09/2004 | CA2527985A1 Method for reducing the cost of handling incoming/outgoing phone calls |
| 12/09/2004 | CA2526491A1 A method and apparatus for measuring and analyzing electrical or electrochemical systems |
| 12/08/2004 | EP1484616A1 Method for detecting partial discharges and system for diagnozing an electrical apparatus |
| 12/08/2004 | EP1483818A1 Device for a battery charger |
| 12/08/2004 | EP1483596A1 Integrated circuit with test circuit |
| 12/08/2004 | EP1315976B1 Thermographic wiring inspection |
| 12/08/2004 | EP1214605A4 Charge-based frequency measurement bist |
| 12/08/2004 | EP1166428B1 Monitoring internal parameters of electrical motor systems |
| 12/08/2004 | CN2662261Y Semiconductor test classifier temperature changing test device |
| 12/08/2004 | CN2662260Y Automatic monitoring device for high/low voltage and AC/DC electric appliance circuit |
| 12/08/2004 | CN1553759A High-frequency circuit board with signal pickup pad and measuring tool thereof |
| 12/08/2004 | CN1553565A Airplane generator loading system |
| 12/08/2004 | CN1553541A Multilayer distributed battery managing system based on CAN bus |
| 12/08/2004 | CN1553210A Battery state phonetic alarming method for wireless communication apparatus |
| 12/08/2004 | CN1553209A Plane constant speed transmission, integrated driving generator testing system |
| 12/08/2004 | CN1553208A Travelling time difference based power distribution network fault positioning method and apparatus |
| 12/08/2004 | CN1553207A High-frequency wide-band local discharging on-line monitoring method in gas insulative converting station |
| 12/08/2004 | CN1553206A Electric power apparatus external insulative leakage current on-line monitoring system in converting station |
| 12/08/2004 | CN1553205A Electrical property testing method of printing circuit board |
| 12/08/2004 | CN1553204A Automatic electrostatic instant warning device and method thereof |
| 12/08/2004 | CN1553203A Automatic testing and system in factory |
| 12/08/2004 | CN1553202A Testing circuit and testing method for liquid-crystal displaying driver |
| 12/08/2004 | CN1553201A Testing method for on-line testing transformer internal insulating hidden trouble |
| 12/08/2004 | CN1179450C Receiving device for crimp connector and automatic crimping machnie with said receiving device |
| 12/08/2004 | CN1179213C Electric arc monitoring systems |
| 12/07/2004 | US6829751 Diagnostic architecture using FPGA core in system on a chip design |
| 12/07/2004 | US6829740 Method and apparatus for selectively compacting test responses |