| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 12/16/2004 | US20040255224 Semiconductor storage device and evaluation method |
| 12/16/2004 | US20040255216 Test apparatus and test method |
| 12/16/2004 | US20040255215 Systems and methods for adaptively compressing test data |
| 12/16/2004 | US20040255214 Systems and methods for testing performance of an electronic device |
| 12/16/2004 | US20040255213 Parameterized signal conditioning |
| 12/16/2004 | US20040255212 Scan stream sequencing for testing integrated circuits |
| 12/16/2004 | US20040255211 Apparatus and method for reducing test resources in testing DRAMs |
| 12/16/2004 | US20040255180 Highly reliable distributed system |
| 12/16/2004 | US20040255178 Micro-system for burn-in system program from a plug-able subsystem into main memory and method thereof |
| 12/16/2004 | US20040254756 Internal bias measure with onboard ADC for electronic devices |
| 12/16/2004 | US20040254755 Method and apparatus for automatically configuring and/or inserting chip resources for manufacturing tests |
| 12/16/2004 | US20040254749 Insulation verification system, insulation verification method, and storage medium |
| 12/16/2004 | US20040253866 Terminal examination jig |
| 12/16/2004 | US20040253812 Method for BARC over-etch time adjust with real-time process feedback |
| 12/16/2004 | US20040253754 System and method for testing a semiconductor chip |
| 12/16/2004 | US20040253753 Method for testing a remnant batch of semiconductor devices |
| 12/16/2004 | US20040253752 Method and system for monitoring implantation of ions into semiconductor substrates |
| 12/16/2004 | US20040253751 Photothermal ultra-shallow junction monitoring system with UV pump |
| 12/16/2004 | US20040253495 Fuel cell device condition detection |
| 12/16/2004 | US20040252802 Data transmission device and input/output interface circuit |
| 12/16/2004 | US20040252029 Breaking detector for shear pin |
| 12/16/2004 | US20040251927 Characterization of ultra shallow junctions in semiconductor wafers |
| 12/16/2004 | US20040251926 Method and device for time measurement on semiconductor modules employing the ball-grid-array technique |
| 12/16/2004 | US20040251925 Measurement of package interconnect impedance using tester and supporting tester |
| 12/16/2004 | US20040251924 Semiconductor device tester |
| 12/16/2004 | US20040251921 Method and device system for testing electrical components |
| 12/16/2004 | US20040251914 Test apparatus |
| 12/16/2004 | US20040251913 Cable diagnostics using time domain reflectometry and applications using the same |
| 12/16/2004 | US20040251912 Cable diagnostics using time domain reflectometry and applications using the same |
| 12/16/2004 | US20040251911 Method and device for phase calculation from attenuation values using a hilbert transform for reflectometric measurements in the frequency domain |
| 12/16/2004 | US20040251910 Method and apparatus for detecting shorted rectifying control elements of an engine driven power source for a welding-type system |
| 12/16/2004 | US20040251908 Electronic battery tester having a user interface to configure a printer |
| 12/16/2004 | US20040251907 Part tester and method |
| 12/16/2004 | US20040251889 Method and device for testing the operativeness of printed circuit boards |
| 12/16/2004 | US20040251875 Battery system, battery monitoring method and apparatus |
| 12/16/2004 | US20040251874 Method and apparatus for controlling the voltage of electrochemical cells in a rechargeable battery |
| 12/16/2004 | US20040251460 Device for seating semiconductor device in semiconductor test handler |
| 12/16/2004 | US20040251401 Delay circuit and test apparatus |
| 12/16/2004 | DE69631658T2 Verfahren und gerät zur prüfung einer megazelle in einem asic unter verwendung von jtag Method and apparatus for testing a megacell in an ASIC using JTAG |
| 12/16/2004 | DE69133365T2 Halbleiterspeicher mit sequenzgetakteten Zugriffscodes zum Eintritt in den Prüfmodus Semiconductor memory with sequence clocked access code to enter the test mode |
| 12/16/2004 | DE20312254U1 Earthing device for a tool or implement, comprises a crocodile clip and earthing cable for connecting to the implement and a display attached to distal cable end that indicates when a correct earth has been established |
| 12/16/2004 | DE20221050U1 Probe station for measuring characteristics of silicon wafer, includes chuck for supporting device under test and platen for supporting probe for testing DUT |
| 12/16/2004 | DE202004016049U1 Test system for solar cells has optical and electrical testing means as well a conveyer belt system comprising three separate transport arrangements for moving the solar cells into, through and out of the test area |
| 12/16/2004 | DE10356759A1 Drain to source transient disturbance detector for thyristor transient latch up measurement has pulse generator connected to p and n well CMOS test structure |
| 12/16/2004 | DE10337064A1 Determination method for the high-current carrying capacity of a battery, wherein parameters of a model of the battery impedance are determined and from them its current carrying ability predicted |
| 12/16/2004 | DE10325144A1 Detection method for determining efficiency in a device for storing a charge evaluates the extent of internal resistance in the device for storing the charge |
| 12/16/2004 | DE10205120B4 Verfahren und Vorrichtung zur Ermittlung des Innenwiderstandes einer Batterie, insbesondere einer Starterbatterie für ein Kraftfahrzeug Method and apparatus for determining the internal resistance of a battery, in particular a starter battery for a motor vehicle |
| 12/16/2004 | CA2527541A1 Input voltage sense circuit in a line powered network element |
| 12/15/2004 | EP1486909A2 Smart card including a jtag test controller |
| 12/15/2004 | EP1486791A1 Semiconductor chip with a device for monitoring mechanical damages |
| 12/15/2004 | EP1485778A2 Integrated circuit security and method therefor |
| 12/15/2004 | EP1485726A1 Electronic battery tester with battery failure temperature determination |
| 12/15/2004 | EP1485725A1 Technique for programming clocks in automatic test system |
| 12/15/2004 | EP1485724A1 Scatterometry structure with embedded ring oscillator, and methods of using same |
| 12/15/2004 | EP1485700A2 Battery monitoring method and apparatus |
| 12/15/2004 | EP1430321B1 Electronic component |
| 12/15/2004 | EP1415166B1 Apparatus and method for testing bare circuit boards |
| 12/15/2004 | EP1092338B1 Assembly of an electronic component with spring packaging |
| 12/15/2004 | EP0895598B1 Apparatus for performing logic and leakage current tests on a digital logic circuit |
| 12/15/2004 | CN2664170Y Microscope device for testing electron beam drop point position of color kinescope |
| 12/15/2004 | CN2664001Y Clamping device for testing square electrokinetic cell |
| 12/15/2004 | CN2664000Y A simulation test circuit arrangement for lithium ion cell |
| 12/15/2004 | CN2663999Y 智能型蓄电池组在线监测装置 Intelligent battery online monitoring device group |
| 12/15/2004 | CN2663998Y Intelligent detecting instrument with remote switch |
| 12/15/2004 | CN2663997Y Multipurpose instrument for borehole cable fault detection |
| 12/15/2004 | CN2663996Y Transmission line insulator flashover positioning device |
| 12/15/2004 | CN2663995Y Cable line pairs recognizer |
| 12/15/2004 | CN2663994Y A high-frequency transformer simulated test unit |
| 12/15/2004 | CN2663993Y Multisection function testing device |
| 12/15/2004 | CN1555491A 电子装置 Electronic devices |
| 12/15/2004 | CN1555489A Method and apparatus for retaining a spring probe |
| 12/15/2004 | CN1554955A Method and device for checking remaining quantity of battery |
| 12/15/2004 | CN1554954A Detecting structure and method for relaying type relay open and close state |
| 12/15/2004 | CN1554953A Identifying method for transformer exciting surge and internal failure current based on instantaneous power |
| 12/15/2004 | CN1554930A Optical signal collecting and on-line monitoring method for electric power equipment internal failure |
| 12/15/2004 | CN1180507C Accumulator with protective circuit |
| 12/15/2004 | CN1180275C Method for measuring motor constant of induction motor |
| 12/15/2004 | CN1180274C Grinding chip |
| 12/15/2004 | CN1180273C Sectional detection of small current earthing fault of power system |
| 12/15/2004 | CN1180272C Small-current earth fault switch-selecting and sectioning method for power system |
| 12/15/2004 | CN1180271C Apparatus and method for positioning parallel double electricity transmission line |
| 12/15/2004 | CN1180270C Method of detecting short circuit of inner layer in multilayer printed circuit board |
| 12/15/2004 | CN1180263C Probe adapter for spherical grid array component |
| 12/14/2004 | US6832359 Apparatus and method for calculating simulation coverage |
| 12/14/2004 | US6832348 Semiconductor integrated circuit having self-diagnosis test function and test method thereof |
| 12/14/2004 | US6832345 Method for coexistence and cooperation between system firmware and debug code |
| 12/14/2004 | US6832172 Apparatus and method for spectrum analysis-based serial data jitter measurement |
| 12/14/2004 | US6832171 Circuit and method for determining battery impedance increase with aging |
| 12/14/2004 | US6832170 Methods for embedding and de-embedding using a circulator |
| 12/14/2004 | US6831901 System and method for retransmission of data |
| 12/14/2004 | US6831477 Motor abnormality detecting apparatus |
| 12/14/2004 | US6831476 On-chip ADC test for image sensors |
| 12/14/2004 | US6831475 Device and method for isolating a short-circuited integrated circuit (IC) from other ICs on a semiconductor wafer |
| 12/14/2004 | US6831474 Apparatus and method for testing a plurality of electrical components that are coupled to one another |
| 12/14/2004 | US6831472 Method of forming an electrical contact |
| 12/14/2004 | US6831466 Method and system for sensor fault detection |
| 12/14/2004 | US6831455 Mechanism for fixing probe card |
| 12/14/2004 | US6831454 Indexing device in semiconductor device handler and method for operating the same |
| 12/14/2004 | US6831451 Method for adjusting a Weibull slope for variations in temperature and bias voltage |
| 12/14/2004 | US6831439 Apparatus for measuring magnetic flux of synchronous reluctance motor and sensorless control system for the same motor |