G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
12/2004
12/23/2004	US20040257090 Apparatus and method for detecting and communicating interconnect failures
12/23/2004	US20040257087 Method for estimating polarization voltage of secondary cell, method and device for estimating remaining capacity of secondary cell, battery pack system, and vehicle
12/23/2004	US20040257086 Method and apparatus for testing a micro electromechanical device
12/23/2004	US20040257084 Cable for electronic battery tester
12/23/2004	US20040257066 Ancillary equipment for testing semiconductor integrated circuit
12/23/2004	US20040257065 System bench wireless mapping board
12/23/2004	US20040257064 Device for automatically detecting harmful electromagnetic wave
12/23/2004	US20040257045 Automotive battery state monitor apparatus
12/23/2004	US20040257044 Backup battery and discharging control apparatus therefor
12/23/2004	US20040257043 Secondary cell charger and charging method
12/23/2004	US20040257042 Battery cell monitoring and balancing circuit
12/23/2004	US20040257031 Apparatus for detecting fuel cell voltage
12/23/2004	US20040257029 Motor driving apparatus
12/23/2004	US20040256463 Semiconductor device and an information management system therefor
12/23/2004	DE69433542T2 Prüfung, sequenziellogischer Schaltung auf grund einer kombinatorischen Logikschaltungsveränderung Examination, sequenziellogischer circuit on the basis of a combinational logic circuit change
12/23/2004	DE10324815A1 Car electrical generator power capability measurement procedure determines current as change in battery current with generator briefly switched off
12/23/2004	DE10324080A1 Testing and control process for electronic chips such as logic or memory chips individually compares test data with identifying unit and operates command block or deactivates failures
12/23/2004	DE10323413A1 Test method for testing high-speed semiconductor memory, especially DDR-DRAM in conjunction with a memory control unit, whereby the test signal is provided by the memory control unit or a unit derived from it
12/23/2004	DE10319128B3 Current circuit connection monitoring device using oscillation circuit stimulated by transmitter upon threshold temperature being exceeded and evaluation unit for oscillation circuit resonance signal
12/23/2004	DE10223506B4 Verfahren und Einrichtung zum Messen des Wirkwiderstands einer Fahrzeugbordbatterie Method and device for measuring the effective resistance of a vehicle on-board battery
12/23/2004	DE102004002901A1 Verfahren zur Fehleranalyse einer Halbleiterbaugruppe Method for fault analysis of a semiconductor package
12/23/2004	DE10120881B4 Kabelprüfstand für ein Kabel bei Wechselbelastungen Cable tester for a cable when moving loads
12/23/2004	CA2523285A1 Fuel cell device condition detection
12/22/2004	EP1489549A2 Smartcard test system
12/22/2004	EP1489431A2 Apparatus and method for detecting residual energy of a battery
12/22/2004	EP1489430A1 Sigma-delta modulator with pulse width modulation output
12/22/2004	EP1489429A1 Ancillary equipment for testing semiconductor integrated circuit
12/22/2004	EP1488246A1 System and method for monitoring a packet network
12/22/2004	EP1488245A1 Apparatus for interfacing electronic packages and test equipment
12/22/2004	EP1264443B1 Method and system for communication of data via an optimum data path in a network
12/22/2004	EP1206826A4 Energy management system for automotive vehicle
12/22/2004	EP1086381B1 System for digital measurement of breakdown voltage of high-voltage samples
12/22/2004	EP0870338A4 Thermochromic battery tester
12/22/2004	CN2665976Y 电连接器 The electrical connector
12/22/2004	CN2665722Y Fault indication device for power distribution line
12/22/2004	CN2665721Y 通用串行总线速度指示器 Universal Serial Bus Speed Indicator
12/22/2004	CN2664799Y Grading machine testing gripper mechanism
12/22/2004	CN1557043A Charging system for quick charge battery
12/22/2004	CN1556928A Connection unit, board mounting device to be measured, probe card, and device interface unit
12/22/2004	CN1556927A Tester and testing method
12/22/2004	CN1556926A Tester and testing method
12/22/2004	CN1556417A Judging method of electromobile car battery discharging termination bused on small wave transformation
12/22/2004	CN1556416A Circuit automatic testing device possessing appliance capable of displaying appropriate time aelay and its method
12/22/2004	CN1556415A Detecting method
12/22/2004	CN1181593C Device for automatic equilization of charge-and-discharge based on cell dynamic electricity different compensation
12/22/2004	CN1181528C Probe card for testing semiconductor chip with many semiconductor device and method thereof
12/22/2004	CN1181383C Liquid crystal display and its inspecting method
12/22/2004	CN1181356C Auto asynchronous battery grading method
12/22/2004	CN1181355C In-situ fault diagnosing technology for turn-to-turn short-circuit of transformer windings based on change in loss
12/22/2004	CN1181354C Inspection unit and method of manufacturing substrate
12/21/2004	US6834380 Automated EMC-driven layout and floor planning of electronic devices and systems
12/21/2004	US6834368 Semiconductor integrated circuit including a test facilitation circuit for functional blocks intellectual properties and automatic insertion method of the same test facilitation circuit
12/21/2004	US6834366 Method of outputting internal information through test pin of semiconductor memory and output circuit thereof
12/21/2004	US6834364 Algorithmically programmable memory tester with breakpoint trigger, error jamming and 'scope mode that memorizes target sequences
12/21/2004	US6834356 Functional clock generation controlled by JTAG extensions
12/21/2004	US6834258 Field transmitter with diagnostic self-test mode
12/21/2004	US6834256 Method and system for determining motor reliability
12/21/2004	US6834246 Multiprobe blob test in lieu of 100% probe test
12/21/2004	US6834243 Apparatus and method for electrical testing of electrical circuits
12/21/2004	US6833739 Input buffer circuit for semiconductor device
12/21/2004	US6833727 Method and apparatus for testing semiconductor circuitry for operability and method of forming apparatus for testing semiconductor circuitry for operability
12/21/2004	US6833725 Semiconductor characteristic evaluation apparatus
12/21/2004	US6833724 Methods and apparatus for testing electronic circuits
12/21/2004	US6833723 Semiconductor device with phase comparator comparing phases between internal signal and external signal
12/21/2004	US6833722 Electronic circuit device with a short circuit switch using transistors and method of testing such a device
12/21/2004	US6833721 Method and apparatus for testing semiconductor devices using an actual board-type product
12/21/2004	US6833720 Electrical detection of dicing damage
12/21/2004	US6833719 Apparatus for evaluating electrical characteristics
12/21/2004	US6833718 Photon beacon
12/21/2004	US6833717 Electron beam test system with integrated substrate transfer module
12/21/2004	US6833716 Electro-optical analysis of integrated circuits
12/21/2004	US6833715 Semiconductor testing apparatus and semiconductor testing method
12/21/2004	US6833712 Differentiating between board-insertion power-on and chassis power-on
12/21/2004	US6833711 Protective relay for powers systems having dependable out-of-step blocking capability
12/21/2004	US6833709 Low loss fuel cell configuration
12/21/2004	US6833708 Leak detecting circuit for power source device
12/21/2004	US6833696 Methods and apparatus for creating a high speed connection between a device under test and automatic test equipment
12/21/2004	US6833695 Simultaneous display of data gathered using multiple data gathering mechanisms
12/21/2004	US6833636 Compact load bank for testing power systems
12/21/2004	US6833626 Multichip module structure
12/21/2004	US6833557 Integrated circuit and a method of manufacturing an integrated circuit
12/19/2004	CA2470986A1 Vacuum-actuated test fixture for testing printed circuit boards
12/16/2004	WO2004110077A2 Input voltage sense circuit in a line powered network element
12/16/2004	WO2004109970A1 Transmission system, receiver, test equipment and test head
12/16/2004	WO2004109916A1 Digital system, clock signal adjusting method for digital system, recording medium recording processing program executed in the adjusting method
12/16/2004	WO2004109720A1 High pressure resistance body element
12/16/2004	WO2004109527A1 A network analyzing method and a network analyzing apparatus
12/16/2004	WO2004109376A1 Array substrate inspection method
12/16/2004	WO2004109311A1 Methods and apparatus for battery monitoring, characterisation and reserve time estimation
12/16/2004	WO2004109310A1 Device for determining constant of rotating machine
12/16/2004	WO2004109309A1 Testing device
12/16/2004	WO2004109307A1 Pattern generator and test device
12/16/2004	WO2004109306A1 Method and apparatus for testing electrical characteristics of object under test
12/16/2004	WO2004109305A1 Transportation device, electronic component-handling device, and transportation method in electronic component-handling device
12/16/2004	WO2004109304A1 Electronic component handling device, and method for temperature application in electronic component handling device
12/16/2004	WO2004108366A1 Transport device, electronic component handling device, and transporting method for electronic component handling device
12/16/2004	WO2004083783A3 Hand mounted testing meter
12/16/2004	WO2004075011A3 Methods and apparatus for data analysis
12/16/2004	WO2004068162A3 System and method for identifying and location an acoustic event (sniper)
12/16/2004	WO2004012289A3 Low loss fuel cell configuration

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