| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 12/29/2004 | EP1066536B1 Voltage indicator for indicating that the voltage of a battery passes a given value |
| 12/29/2004 | EP0838687B1 Abnormality detection apparatus and abnormality detection method |
| 12/29/2004 | CN2667760Y Insulation conduction wire capable of monitoring short-circuit damage |
| 12/29/2004 | CN2667502Y Universal automatic cable detecting instrument |
| 12/29/2004 | CN1559086A Method of manufacturing an integrated circuit, integrated circuit obtained in accordance with said method, wafer provided with an integrated circuit obtained in accordance with the method, and system |
| 12/29/2004 | CN1559008A Coaxial tilt pin fixture for testing high frequency circuit board |
| 12/29/2004 | CN1558253A Method and apparatus for measuring complex impedance of cells and batteries |
| 12/29/2004 | CN1558251A On-chip fast signal generating circuit in alternating current sweep test |
| 12/29/2004 | CN1558250A Heavy current high speed memory sensor |
| 12/29/2004 | CN1558249A Charged detection method for insulator of high voltage direct current transmission line |
| 12/29/2004 | CN1558248A Earth fault detection circuit for battery |
| 12/29/2004 | CN1558241A Adapter structure for testing patch integrated circuit |
| 12/29/2004 | CN1182619C Electric device with timer means |
| 12/29/2004 | CN1182577C Method for reducing expense of pin of non-scanning measurable design |
| 12/29/2004 | CN1182539C Semiconductor storage and its ageing sieving method |
| 12/29/2004 | CN1182534C Chip of semiconductor memory |
| 12/29/2004 | CN1182407C Method for measuring electric quantity of lithium ion batteries and its device |
| 12/29/2004 | CN1182406C Battery voltage detector |
| 12/29/2004 | CN1182405C Ceramic capacitance sensor for ultra-high frequency on-line monitoring local high-voltage discharge high of voltage port of generator |
| 12/29/2004 | CA2528980A1 Fuel cell protection |
| 12/28/2004 | US6836872 On-chip testing of integrated circuits |
| 12/28/2004 | US6836868 High-speed algorithmic pattern generator |
| 12/28/2004 | US6836867 Method of generating a pattern for testing a logic circuit and apparatus for doing the same |
| 12/28/2004 | US6836866 Circuit including a built-in self-test |
| 12/28/2004 | US6836865 Method and apparatus for facilitating random pattern testing of logic structures |
| 12/28/2004 | US6836864 Methods of testing a digital frequency synthesizer in a programmable logic device using a reduced set of multiplier and divider values |
| 12/28/2004 | US6836863 Semiconductor memory testing method and apparatus |
| 12/28/2004 | US6836856 Methods for characterizing, generating test sequences for, and/or simulating integrated circuit faults using fault tuples and related systems and computer program products |
| 12/28/2004 | US6836445 Memory device in semiconductor for enhancing ability of test |
| 12/28/2004 | US6836235 Interleaving AD conversion type waveform digitizer |
| 12/28/2004 | US6836231 Signal generator |
| 12/28/2004 | US6836206 Apparatus diagnosing a breaking of a fuse for a vehicle |
| 12/28/2004 | US6836140 Method for manufacturing a display device, and display device substrate |
| 12/28/2004 | US6836139 Method and apparatus for determining defect and impurity concentration in semiconducting material of a semiconductor wafer |
| 12/28/2004 | US6836138 Module having test architecture for facilitating the testing of ball grid array packages, and test method using the same |
| 12/28/2004 | US6836137 Configuration for testing semiconductor devices |
| 12/28/2004 | US6836136 Pin driver for AC and DC semiconductor device testing |
| 12/28/2004 | US6836135 Optical testing device |
| 12/28/2004 | US6836132 High resolution heat exchange |
| 12/28/2004 | US6836131 Spray cooling and transparent cooling plate thermal management system |
| 12/28/2004 | US6836125 Method and a device for testing a power module |
| 12/28/2004 | US6836124 Capacitance monitoring systems |
| 12/28/2004 | US6836122 Deterioration degree calculating apparatus and deterioration degree calculating method for a battery |
| 12/28/2004 | US6836109 Guiding apparatus for docking a testing head for electronic components |
| 12/28/2004 | US6836106 Apparatus and method for testing semiconductors |
| 12/28/2004 | US6836104 Internal power supply voltage control apparatus having two internal power supply reference voltage generating circuits |
| 12/28/2004 | US6836096 Method of calculating capacity of intelligent battery, intelligent battery and portable electronic device |
| 12/28/2004 | US6836095 Battery charging method and apparatus |
| 12/28/2004 | US6836014 Optical testing of integrated circuits with temperature control |
| 12/28/2004 | US6836004 Lead frame, and method for manufacturing semiconductor device and method for inspecting electrical properties of small device using the lead frame |
| 12/28/2004 | US6836003 Integrated circuit package alignment feature |
| 12/28/2004 | US6835898 Electrical contact structures formed by configuring a flexible wire to have a springable shape and overcoating the wire with at least one layer of a resilient conductive material, methods of mounting the contact structures to electronic components, and applications for employing the contact structures |
| 12/28/2004 | US6835491 Battery having a built-in controller |
| 12/28/2004 | US6835318 Method for forming a recognition mark on a substrate for a KGD |
| 12/28/2004 | US6834999 Fan apparatus for chamber of handler |
| 12/28/2004 | CA2417975C Variable volume test chamber |
| 12/28/2004 | CA2417974C Variable volume test chamber |
| 12/25/2004 | CA2433258A1 Diagnostic safety inspection apparatus |
| 12/23/2004 | WO2004112445A1 Soft x-ray applying apparatus, semiconductor assembling apparatus, and inspecting instrument |
| 12/23/2004 | WO2004112168A2 Part tester and method |
| 12/23/2004 | WO2004112167A2 Fuel cell device condition detection |
| 12/23/2004 | WO2004112089A2 Method and system for fabricating multi layer devices on a substrate |
| 12/23/2004 | WO2004111669A1 Portable electronic device |
| 12/23/2004 | WO2004111668A1 Method and device for determining the performance of a charge accumulator |
| 12/23/2004 | WO2004111667A1 Timing closure monitoring circuit and method |
| 12/23/2004 | WO2004111666A1 Method and apparatus for testing a medium |
| 12/23/2004 | WO2004111664A1 Method and device system for testing electrical components |
| 12/23/2004 | WO2004111662A2 Integrated circuit device for monitoring power supply |
| 12/23/2004 | WO2004111660A2 System and method for classifying defects in and identifying process problems for an electrical circuit |
| 12/23/2004 | WO2004061459A3 Circuit and method for testing high speed data circuits |
| 12/23/2004 | WO2004040324A3 A method of and apparatus for testing for integrated circuit contact defects |
| 12/23/2004 | WO2004001807A3 Construction structures and manufacturing processes for probe card assemblies and packages having wafer level springs |
| 12/23/2004 | WO2004001433A9 Electronic circuit with asynchronously operating components |
| 12/23/2004 | WO2003098769A3 Methods and apparatus for indicating a fault condition in fuel cells and fuel cell components |
| 12/23/2004 | WO2003093844A8 Secure scan |
| 12/23/2004 | WO2003016929A9 Pin electronics interface circuit |
| 12/23/2004 | US20040261058 Method and system for implementing parallel execution in a computing system and in a circuit simulator |
| 12/23/2004 | US20040260993 Method, system, and program for simulating Input/Output (I/O) requests to test a system |
| 12/23/2004 | US20040260992 Test circuit, integrated circuit, and test method |
| 12/23/2004 | US20040260990 Automatable scan partitioning for low power using external control |
| 12/23/2004 | US20040260988 Semiconductor memory, system for testing a memory cell, and method for testing a memory cell |
| 12/23/2004 | US20040260503 Inspecting apparatus for semiconductor device |
| 12/23/2004 | US20040260502 Accelerated test method and system |
| 12/23/2004 | US20040260501 Method and circuit for detecting a fault of semiconductor circuit elements and use thereof in electronic regulators of braking force and of dynamics movement of vehicles |
| 12/23/2004 | US20040260494 Method of screening defects using low voltage IDDQ measurement |
| 12/23/2004 | US20040260492 Direct jitter analysis of binary sampled data |
| 12/23/2004 | US20040259402 Tray transfer unit and automatic test handler having same |
| 12/23/2004 | US20040257892 Method and apparatus for improving the reliability of the reading of integrated circuit fuses |
| 12/23/2004 | US20040257885 Semiconductor memory device |
| 12/23/2004 | US20040257882 Bias generation having adjustable range and resolution through metal programming |
| 12/23/2004 | US20040257303 Driving circuit, method of testing driving circuit, electro-optical apparatus, and electro-optical device |
| 12/23/2004 | US20040257122 Clock signal detection circuit and semiconductor integrated circuit using the same |
| 12/23/2004 | US20040257107 TDDB test pattern and method for testing TDDB of MOS capacitor dielectric |
| 12/23/2004 | US20040257106 Semiconductor device for reducing the number of probing pad used during wafer test and method for testing the same |
| 12/23/2004 | US20040257105 Testing vias and contacts in integrated circuit |
| 12/23/2004 | US20040257103 Module having test architecture for facilitating the testing of ball grid array packages, and test method using the same |
| 12/23/2004 | US20040257101 Probe area setting method and probe device |
| 12/23/2004 | US20040257098 Probe card |
| 12/23/2004 | US20040257097 Vacuum-actuated test fixture for testing printed circuit boards |
| 12/23/2004 | US20040257095 Current detecting circuit AC/DC flyback switching power supply |