| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 12/30/2004 | US20040268197 Method and apparatus for integrated circuit self-description |
| 12/30/2004 | US20040268196 Bypassing a device in a scan chain |
| 12/30/2004 | US20040268195 Diagnosable scan chain |
| 12/30/2004 | US20040268194 Test card for multiple functions testing |
| 12/30/2004 | US20040268193 Test circuit, integrated circuit, and test method |
| 12/30/2004 | US20040268192 Method and circuitry for the functional testing and analysis of large digital circuits using hardware emulators |
| 12/30/2004 | US20040268181 Method and apparatus for unifying self-test with scan-test during prototype debug and production test |
| 12/30/2004 | US20040267504 Flexible scan architecture |
| 12/30/2004 | US20040267489 Data compaction and pin assignment |
| 12/30/2004 | US20040267487 Apparatus and method for testing non-deterministic device data |
| 12/30/2004 | US20040267486 Use of I2C-based potentiometers to enable voltage rail variation under BMC control |
| 12/30/2004 | US20040267484 Functional testing of logic circuits that use high-speed links |
| 12/30/2004 | US20040267483 Methods and systems for masking faults in a margin testing environment |
| 12/30/2004 | US20040267482 Method and construct for enabling programmable, integrated system margin testing |
| 12/30/2004 | US20040267480 Selective control of test-access ports in integrated circuits |
| 12/30/2004 | US20040267479 Automatic self test of an integrated circuit component via AC I/O loopback |
| 12/30/2004 | US20040267476 Method and product for processing system test data |
| 12/30/2004 | US20040267469 On-die waveform capture |
| 12/30/2004 | US20040267467 Alarm recovery system and method for fuel cell testing systems |
| 12/30/2004 | US20040267417 In-vehicle system control device |
| 12/30/2004 | US20040266272 Contactor for testing semiconductor device and manufacturing method thereof |
| 12/30/2004 | US20040266036 Apparatus for deforming resilient contact structures on semiconductor components |
| 12/30/2004 | US20040265992 Multicompartment biochip for monitoring constituents of blood |
| 12/30/2004 | US20040264760 Defect inspecting method, defect inspecting apparatus and inspection machine |
| 12/30/2004 | US20040264759 Pattern inspection method and apparatus, and pattern alignment method |
| 12/30/2004 | US20040264380 Distributing information across equal-cost paths in a network |
| 12/30/2004 | US20040264378 Flow control and congestion control in a data distribution network |
| 12/30/2004 | US20040264366 System and method for optimizing link throughput in response to non-congestion-related packet loss |
| 12/30/2004 | US20040264081 Pulse coupling apparatus, systems, and methods |
| 12/30/2004 | US20040264079 Method for detection of a ground fault, which occurs in the vicinity of a neutral point in an electrical device, as well as an apparatus for carrying out the method |
| 12/30/2004 | US20040263830 Method and apparatus for inspecting semiconductor device |
| 12/30/2004 | US20040263450 Method and apparatus for measuring response time of liquid crystal, and method and apparatus for driving liquid crystal display device using the same |
| 12/30/2004 | US20040263216 Integrated circuit having a voltage monitoring circuit and a method for monitoring an internal burn-in voltage |
| 12/30/2004 | US20040263202 Display panel inspection apparatus and inspection method |
| 12/30/2004 | US20040263200 A method and apparatus for measuring leakage current and/or temperature variation |
| 12/30/2004 | US20040263199 Adaptive integrated circuit based on transistor current measurements |
| 12/30/2004 | US20040263198 Methods and apparatus for testing electronic circuits |
| 12/30/2004 | US20040263194 Inspecting apparatus for semiconductor device |
| 12/30/2004 | US20040263193 Inspecting apparatus for semiconductor device |
| 12/30/2004 | US20040263192 Method and apparatus for measuring relative, within-die leakage current and/or providing a temperature variation profile using a leakage inverter and ring oscillator |
| 12/30/2004 | US20040263191 Method for controlling delay time of signal in semiconductor device |
| 12/30/2004 | US20040263184 High-speed duty cycle test through DC measurement using a combination of relays |
| 12/30/2004 | US20040263183 Arc fault detector and method |
| 12/30/2004 | US20040263182 Arc detection apparatus utilizing a dynamic processing module |
| 12/30/2004 | US20040263181 Methods for minimizing the impedance discontinuity between a conductive trace and a component and structures formed thereby |
| 12/30/2004 | US20040263180 Reference voltage diagnostic suitable for use in an automobile controller and method therefor |
| 12/30/2004 | US20040263179 On-line detection of partial discharge in electrical power systems |
| 12/30/2004 | US20040263178 Diagnostic safety inspection apparatus |
| 12/30/2004 | US20040263176 Electronic battery tester |
| 12/30/2004 | US20040263153 Testing circuits on substrates |
| 12/30/2004 | US20040263152 Optimized pin assignment with constraints |
| 12/30/2004 | US20040263146 PLL manufacturing test apparatus |
| 12/30/2004 | US20040262747 Multichip module |
| 12/30/2004 | US20040262603 Apparatus for preventing cross talk and interference in semiconductor devices during test |
| 12/30/2004 | US20040262260 Method and system for processing multi-layer films |
| 12/30/2004 | US20040261832 Method and apparatus for measuring photoelectric conversion characteristics of solar cell element |
| 12/30/2004 | US20040261439 Apparatus and method for controlling the temperature of an electronic device |
| 12/30/2004 | DE202004017322U1 Inspection system for testing workpiece on carriers moving along conveyor comprises frame with uprights mounted on either side of conveyor, up which carrier can be raised while subsequent workpieces continue along conveyor |
| 12/30/2004 | DE10345470A1 Semiconductor chip wafer contact structure has cup shaped test contact surfaces and active connection multiplexer circuit in sawing grid areas |
| 12/30/2004 | DE10326785A1 Fan motor seizure recognition procedure checks for excessive difference between measured and individual motor stored current voltage characteristics |
| 12/30/2004 | DE10326595A1 Car defective component detection procedure compares measured and stored quiet current characteristics to identify matching defective unit |
| 12/30/2004 | DE10326594A1 Car quiet current test procedure measures magnetic field using measurement unit powered from car battery with wireless link to test system. |
| 12/30/2004 | DE10325389A1 Insulation test device for inspecting insulation between rotor coil and stator winding in electric motor, applies test current on each electric contact of electric circuit |
| 12/30/2004 | DE10323706A1 Battery and generator current prediction procedure for vehicle drive train torque management uses comparison of actual and expected values to predict current change |
| 12/30/2004 | DE102004026521A1 Dynamic RAM test device selects address of address pointer and pattern generator while generating back pattern after count of defective number of bits, for output to failed memory |
| 12/30/2004 | DE102004026114A1 Diagnosesystem und Verfahren für eine Vorrichtung zur Erfassung eines Leckstroms The diagnostic system and method for a device for detecting a leakage current |
| 12/30/2004 | DE10123362B4 Wafer sowie Verfahren zum Herstellen eines Wafers Wafer and method for manufacturing a wafer |
| 12/29/2004 | WO2004114639A1 Portable battery driven apparatus |
| 12/29/2004 | WO2004114569A2 Optimizing link throughput associated with non-congestion loss |
| 12/29/2004 | WO2004114449A2 Fuel cell protection |
| 12/29/2004 | WO2004114392A1 Method and equipment for inspecting electric characteristics of specimen |
| 12/29/2004 | WO2004114318A1 Semiconductor test device and control method thereof |
| 12/29/2004 | WO2004114317A1 Test device and program |
| 12/29/2004 | WO2004113944A1 Battery monitor |
| 12/29/2004 | WO2004113943A1 System and apapratus for vehicle electrical power analysis |
| 12/29/2004 | WO2004113942A1 Method for fault localization in circuits |
| 12/29/2004 | WO2004113941A1 Test equipment |
| 12/29/2004 | WO2004113940A1 Testing radio frequency and analogue circuits |
| 12/29/2004 | WO2004113939A2 Method and apparatus for judging deterioration of battery |
| 12/29/2004 | WO2004113938A1 Method and circuit arrangement for the self-testing of a reference voltage in electronic components |
| 12/29/2004 | WO2004113937A1 Method and circuit arrangement for the self-testing of a reference voltage in electronic components |
| 12/29/2004 | WO2004113936A1 Loss-compensating circuit |
| 12/29/2004 | WO2004113884A1 Photothermal ultra-shallow junction monitoring system with uv pump |
| 12/29/2004 | WO2004097436A3 Measurement circuit with improved accuracy |
| 12/29/2004 | WO2004017695B1 Shock absorber means for components and cards |
| 12/29/2004 | EP1491907A1 Motor driving apparatus |
| 12/29/2004 | EP1491906A1 An integrated device with an improved BIST circuit for executing a structured test |
| 12/29/2004 | EP1491905A1 Samping active-load circuit |
| 12/29/2004 | EP1491880A1 Method and apparatus for inspecting semiconductor device |
| 12/29/2004 | EP1490702A1 Driver circuit employing high-speed tri-state for automatic test equipment |
| 12/29/2004 | EP1490672A2 An electrical condition monitoring method for polymers |
| 12/29/2004 | EP1423718B1 System and method for monitoring performance data related to an electrical component |
| 12/29/2004 | EP1166137A4 Integrated circuit testing device with dual purpose analog and digital channels |
| 12/29/2004 | EP1149294A4 Algorithmic pattern generator for integrated circuit tester |
| 12/29/2004 | EP1149293A4 Integrated circuit tester having pattern generator controlled data bus |
| 12/29/2004 | EP1147470A4 Integrated circuit tester with real time branching |
| 12/29/2004 | EP1135840A4 System and method for monitoring a vehicle battery |
| 12/29/2004 | EP1129363A4 Instruction processing pattern generator controlling an integrated circuit tester |
| 12/29/2004 | EP1125140A4 Integrated circuit tester with disk-based data streaming |
| 12/29/2004 | EP1095287A4 Integrated circuit tester with amorphous logic |