| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 01/06/2005 | US20050005211 Logic circuitry having self-test function |
| 01/06/2005 | US20050005210 Semiconductor integrated circuit having a number of data output pins capable of selectively providing output signals and test method thereof |
| 01/06/2005 | US20050005209 Memory bus checking procedure |
| 01/06/2005 | US20050005102 Memory data copying system for devices |
| 01/06/2005 | US20050004777 Generation of a testbench for a representation of a device |
| 01/06/2005 | US20050004776 Test process for memory card and test machine using the same |
| 01/06/2005 | US20050004775 Test machine for testing an integrated circuit with a comparator |
| 01/06/2005 | US20050004773 Method for analyzing in-line qc test parameters |
| 01/06/2005 | US20050003710 Power module for motor vehicles |
| 01/06/2005 | US20050003579 Imaging system |
| 01/06/2005 | US20050003575 Apparatus, systems and methods relating to the reconstruction of semiconductor wafers for wafer-level processing and reconstructed semiconductor wafers |
| 01/06/2005 | US20050002448 Method and apparatus for non-conductively interconnecting integrated circuits |
| 01/06/2005 | US20050002423 Technique for determining performance characteristics of electronic systems |
| 01/06/2005 | US20050002247 Shared sense amplifier scheme semiconductor memory device and method of testing the same |
| 01/06/2005 | US20050001692 Transmission line parasitic element discontinuity cancellation |
| 01/06/2005 | US20050001658 Power-supply voltage detection circuit and integrated circuit device |
| 01/06/2005 | US20050001648 Timing generator and semiconductor test apparatus |
| 01/06/2005 | US20050001647 Semiconductor test system and method |
| 01/06/2005 | US20050001645 Cleaning system, device and method |
| 01/06/2005 | US20050001640 Apparatus for scan testing printed circuit boards |
| 01/06/2005 | US20050001639 Test probe for finger tester and corresponding finger tester |
| 01/06/2005 | US20050001631 Method for single ended line testing and single ended line testing device |
| 01/06/2005 | US20050001629 Verification system for verifying authenticity of a battery and method thereof |
| 01/06/2005 | US20050001627 Apparatus, methods and computer program products for estimation of battery reserve life using adaptively modified state of health indicator-based reserve life models |
| 01/06/2005 | US20050001626 Modular electronic battery tester |
| 01/06/2005 | US20050001625 Method for determining the deterioration of a battery |
| 01/06/2005 | US20050001611 Applying parametric test patterns for high pin count asics on low pin count testers |
| 01/06/2005 | US20050001608 Phase shift circuit application for DVD ROM chipset in HTOL board design |
| 01/06/2005 | US20050001588 Battery characteristic evaluation device and battery characteristic evaluating method |
| 01/06/2005 | US20050001487 Concept for compensating the influences of external disturbing quantities on physical functional parameters of integrated circuits |
| 01/06/2005 | US20050001283 Semiconductor integrated circuit device and method of testing the same |
| 01/06/2005 | US20050001244 Semiconductor memory device having externally controllable data input and output mode |
| 01/05/2005 | EP1494217A1 Optical information device, optical storage medium, optical storage medium inspection device, and optical storage inspection method |
| 01/05/2005 | EP1494038A1 Method and device for the determination of the ratio of a RC time constant in an integrated circuit to a set value |
| 01/05/2005 | EP1494037A1 Method and device for single ended testing of a line |
| 01/05/2005 | EP1494034A2 Power-supply voltage detection circuit and integrated circuit device |
| 01/05/2005 | EP1493085A1 Method and apparatus for unifying self-test with scan-test during prototype debug and production test |
| 01/05/2005 | EP1185876B1 Pass/fail battery indicator |
| 01/05/2005 | DE10392309T5 Eine Anschlusseinheit, eine Platine zum Befestigen eines Prüflings, eine Nadelkarte und eine Bauelemente-Schnittstellenpartie A connection unit, a circuit board for mounting a device under test, a probe card and a component interface section |
| 01/05/2005 | DE10392204T5 Verzögerungsschaltung und Prüfvorrichtung Delay circuit and Tester |
| 01/05/2005 | DE10392202T5 Testvorrichtung für einen LSI-Prüfling, Jitteranalysator und Phasendifferenzdetektor Test apparatus for an LSI device under test, jitter analyzer and phase difference detector |
| 01/05/2005 | DE10351442A9 Vorrichtung und Verfahren zur Bildung einer Signatur Apparatus and method for forming a signature |
| 01/05/2005 | DE10324450A1 Kontaktierungsvorrichtung für elektronische Schaltungseinheiten und Herstellungsverfahren A contacting device for electronic circuit units, and manufacturing processes |
| 01/05/2005 | DE10297654T5 Halteeinsatz und Handhabungsvorrichtung mit einem solchen Halteeinsatz für elektronische Bauelemente Holding insert and handling device with such a retaining insert for electronic components |
| 01/05/2005 | DE102004028745A1 Anschussklemmen-Prüfvorrichtung Anschussklemmen Tester |
| 01/05/2005 | DE102004015937A1 Vorrichtung und Verfahren zum Testen von Halbleiterbausteinen auf einer Halbleitersubstratscheibe Apparatus and method for testing semiconductor devices on a semiconductor substrate wafer, |
| 01/05/2005 | DE102004009328A1 Batteriesystem, Verfahren zum Überwachen der Batterie und Vorrichtung hierfür Battery system, method and apparatus for monitoring the battery for this purpose |
| 01/05/2005 | CN2669207Y Time tester of oven-current protection relay of heat relay |
| 01/05/2005 | CN2669206Y Device for bounce time of press-button contact |
| 01/05/2005 | CN2669205Y Display probe detection relay board |
| 01/05/2005 | CN2669204Y Line fault detection-control automatic alarming device |
| 01/05/2005 | CN2669203Y 改良的讯号隔离箱 Improved signal isolation box |
| 01/05/2005 | CN1561656A Method for mounting an electronic component |
| 01/05/2005 | CN1560976A Protection and fault positioning method for generator stator winding single-phase earthing |
| 01/05/2005 | CN1560972A Monitoring alarm device for overtemperature when (ultra) high-voltage charged body operating |
| 01/05/2005 | CN1560959A Special cavity resonator and testing method for mediat resonator material at 8mm band test |
| 01/05/2005 | CN1560914A Plug and play chip testing vector generating circuit and method |
| 01/05/2005 | CN1560674A System for detecting image quality of luminous device |
| 01/05/2005 | CN1560647A Non-contact test method and apparatus |
| 01/05/2005 | CN1560646A Quick integrated circuit testing process optimization method |
| 01/05/2005 | CN1560645A Small Current earthing line selecting method based on model parametric recognition |
| 01/05/2005 | CN1560644A Transfermer internal-external fault recognition technology based on four-point algorithm and comparision phasor principle |
| 01/05/2005 | CN1560643A Semi-wave impulse current automatic testing device of pressure-sensitive resistor disc |
| 01/05/2005 | CN1560642A Coating technique on surface of testing covering plate and is manufacturing method |
| 01/05/2005 | CN1183549C Test device for testing a memory |
| 01/05/2005 | CN1183546C Method and apparatus for nondestructive reading storage cell of magnetic resistance random access storing unit |
| 01/04/2005 | US6839873 Method and apparatus for programmable logic device (PLD) built-in-self-test (BIST) |
| 01/04/2005 | US6839657 Method of and an arrangement for characterizing non-linear behavior of RF and microwave devices in a near matched environment |
| 01/04/2005 | US6839650 Electronic test system and method |
| 01/04/2005 | US6839648 Systems for providing zero latency, non-modulo looping and branching of test pattern data for automatic test equipment |
| 01/04/2005 | US6839646 Electron beam test system and electron beam test method |
| 01/04/2005 | US6839470 Pattern evaluation method, pattern evaluation system and computer readable recorded medium |
| 01/04/2005 | US6839327 Method and apparatus for maintaining consistent per-hop forwarding behavior in a network using network-wide per-hop behavior definitions |
| 01/04/2005 | US6839324 Method and apparatus providing dial on demand scaling |
| 01/04/2005 | US6839293 Word-line deficiency detection method for semiconductor memory device |
| 01/04/2005 | US6839261 Semiconductor memory device |
| 01/04/2005 | US6839032 Protable radio terminal testing apparatus using single self-complementary antenna |
| 01/04/2005 | US6838914 Semiconductor device |
| 01/04/2005 | US6838913 Charge/discharge current detection circuit and variable resistor |
| 01/04/2005 | US6838897 Integrated circuit test system and method |
| 01/04/2005 | US6838896 Method and system for probing, testing, burn-in, repairing and programming of integrated circuits in a closed environment using a single apparatus |
| 01/04/2005 | US6838895 High resolution analytical probe station |
| 01/04/2005 | US6838894 Stress relieved contact array |
| 01/04/2005 | US6838893 Probe card assembly |
| 01/04/2005 | US6838892 Probe card carrier and method of carrying probe card |
| 01/04/2005 | US6838891 Semiconductor device |
| 01/04/2005 | US6838890 Membrane probing system |
| 01/04/2005 | US6838883 Method and system for monitoring state of lead acid battery |
| 01/04/2005 | US6838869 Clocked based method and devices for measuring voltage-variable capacitances and other on-chip parameters |
| 01/04/2005 | US6838868 Test head actuation system with positioning and compliant modes |
| 01/04/2005 | US6838803 System for detecting abrasion of brush of direct current motor |
| 01/04/2005 | US6837936 Semiconductor manufacturing device |
| 01/04/2005 | US6837125 Automatic test manipulator with support internal to test head |
| 01/04/2005 | CA2308043C Method and apparatus for detection, classification and reduction of internal electrical faults in alternating current propulsion machinery using synchronous detection scheme |
| 01/04/2005 | CA2278708C Arcing fault detection system |
| 12/30/2004 | US20040268280 On-chip signal state duration measurement and adjustment |
| 12/30/2004 | US20040268275 Analysis of the quality of contacts and vias in multi-metal fabrication processes of semiconductor devices, method and test chip architecture |
| 12/30/2004 | US20040268200 Pseudo bus agent to support functional testing |
| 12/30/2004 | US20040268199 Method for testing non-deterministic device data |
| 12/30/2004 | US20040268198 Method, system and apparatus for aggregating failures across multiple memories and applying a common defect repair solution to all of the multiple memories |