| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 01/13/2005 | DE10328721A1 Verfahren zur Vorhersage einer Restlebensdauer eines elektrischen Energiespeichers A method for predicting a residual life of an electrical energy storage |
| 01/13/2005 | DE10326317A1 Test system for integrated components in burn-in test procedure uses adapter element for connection of burn-in board to several test modules with different testing circuits |
| 01/13/2005 | DE10326086A1 Computer-controlled positioning method for measuring head relative to circuit board for automatic testing, uses search movement to detect alignment marking coordinates used for subsequent positioning |
| 01/13/2005 | DE10297436T5 Zeitgenerator und Prüfvorrichtung Time Generator and Tester |
| 01/13/2005 | DE10297426T5 Halbleiterprüfgerät Semiconductor tester |
| 01/13/2005 | DE102004026165A1 Umgebungsprüfverfahren und -system Test method and system environment |
| 01/13/2005 | DE102004025907A1 Bildanzeigevorrichtung mit vergrößerter Spanne zum Schreiben des Bildsignals An image display device with increased margin for writing the image signal |
| 01/12/2005 | EP1496369A1 Optical method and apparatus for monitoring an electric conductor |
| 01/12/2005 | EP1495582A1 Method for testing subscriber connection lines for broadband services |
| 01/12/2005 | EP1495486A1 Method and device for conditioning semiconductor wafers and/or hybrids |
| 01/12/2005 | EP1495484A2 Single axis manipulator with controlled compliance |
| 01/12/2005 | EP1495339A2 Semiconductor test system with easily changed interface unit |
| 01/12/2005 | EP1495336A2 Test head positioner system |
| 01/12/2005 | EP1425594A4 Multilevel signal interface testing with binary test apparatus by emulation of multilevel signals |
| 01/12/2005 | EP1425593A4 Built-in self-testing of multilevel signal interfaces |
| 01/12/2005 | EP1370878B1 Low profile pneumatically actuated docking module with power fault release |
| 01/12/2005 | EP1345652B1 Method and apparatus for determining depleted capacity of a battery |
| 01/12/2005 | EP1257837A4 Phase shifter with reduced linear dependency |
| 01/12/2005 | EP1203202A4 Enhancing voltmeter functionality |
| 01/12/2005 | EP1151311A4 System for testing real and simulated versions of an integrated circuit |
| 01/12/2005 | EP1090303B1 Method and device for monitoring an electrode line of a bipolar high voltage direct current (hvdc) transmission system |
| 01/12/2005 | CN2670954Y Tester of cable connector |
| 01/12/2005 | CN2670953Y External testing post for antenna |
| 01/12/2005 | CN1565151A Socket and contact of semiconductor package |
| 01/12/2005 | CN1565067A Method for estimating polarization voltage of secondary cell, method and device for estimating remaining capacity of secondary cell, battery pack system, and vehicle |
| 01/12/2005 | CN1565054A Prober and probe testing method for temperature-controlling object to be tested |
| 01/12/2005 | CN1564949A Electronic component characteristic measuring device |
| 01/12/2005 | CN1564947A Socket and contact of semiconductor package |
| 01/12/2005 | CN1564946A Test head manipulator |
| 01/12/2005 | CN1564458A Element structure utlizing photoshort circuit for generating sub-carrier lifetime guide electrical pulse |
| 01/12/2005 | CN1564378A Board-to-board connector and its testing method |
| 01/12/2005 | CN1564315A Device and method for measuring movability of semiconductor excess carrier and diffusion length |
| 01/12/2005 | CN1564014A Testing method and appliance for horizontal conductivity of fuel cell proton exchange membrane |
| 01/12/2005 | CN1564013A Testing method for effective diffusion length of solar cell |
| 01/12/2005 | CN1564012A Portable auto detection system for solid oxide fuel cell |
| 01/12/2005 | CN1564011A Single chip voltage monitor for vehicle fuel cell stack |
| 01/12/2005 | CN1564010A Four-quadrant dynamo dynamometer machine |
| 01/12/2005 | CN1564009A On-line detector for insulation of cross-linked polythylene power cable sheath |
| 01/12/2005 | CN1564008A High precision online monitoring sensor for a.c. current leakage |
| 01/12/2005 | CN1564007A Single phase earthing wire selection method for small earthing current system |
| 01/12/2005 | CN1564006A Recognition method of power cable |
| 01/12/2005 | CN1564005A Integrated assayer for photoelectric performance |
| 01/12/2005 | CN1564000A Digital signal source with waveform indication |
| 01/12/2005 | CN1184755C Intrustment with multi-channel telecommunication time scales testing and measuring capacibility |
| 01/12/2005 | CN1184754C Instrument with self adaptable time scales characteristics for testing and measuring capacibility of telecommunication time scales test |
| 01/12/2005 | CN1184734C Light load detection method and circuit for shifted power supply system |
| 01/12/2005 | CN1184680C Method forp roducing semi-conductor device |
| 01/12/2005 | CN1184677C Method for producing semi-conductor device |
| 01/12/2005 | CN1184488C Semiconductor device contg. macro and its test method |
| 01/12/2005 | CN1184487C Method for removing micro short circuit and its apparatus |
| 01/12/2005 | CN1184486C Electron product circuit signal position detecting system and its method |
| 01/11/2005 | US6842883 Application of co-verification tools to the testing of IC designs |
| 01/11/2005 | US6842728 Time-multiplexing data between asynchronous clock domains within cycle simulation and emulation environments |
| 01/11/2005 | US6842717 Method and apparatus for evaluating automotive window regulators |
| 01/11/2005 | US6842714 Method for determining the leakage power for an integrated circuit |
| 01/11/2005 | US6842712 Method for testing an electronic component; computer program product, computer readable medium, and computer embodying the method; and method for downloading the program embodying the method |
| 01/11/2005 | US6842710 Calibration of integrated circuit time constants |
| 01/11/2005 | US6842708 Method and apparatus for determining battery life |
| 01/11/2005 | US6842707 Apparatus and method for testing and charging a power source with ethernet |
| 01/11/2005 | US6842398 Multi-mode synchronous memory device and methods of operating and testing same |
| 01/11/2005 | US6842388 Semiconductor memory device with bit line precharge voltage generating circuit |
| 01/11/2005 | US6842061 Timing generating apparatus and test apparatus |
| 01/11/2005 | US6842033 Method for controlling delay time of signal in semiconductor device |
| 01/11/2005 | US6842032 IDDQ test methodology based on the sensitivity of fault current to power supply variations |
| 01/11/2005 | US6842031 Method of electrically testing semiconductor devices |
| 01/11/2005 | US6842030 Test systems for low-temperature environmental testing of semiconductor devices |
| 01/11/2005 | US6842029 Non-invasive electrical measurement of semiconductor wafers |
| 01/11/2005 | US6842028 Apparatus for testing reliability of interconnection in integrated circuit |
| 01/11/2005 | US6842026 Inspecting apparatus and inspecting method for circuit board |
| 01/11/2005 | US6842025 Apparatus and method for multiple identical continuous records of characteristics on the surface of an object after selected stages of manufacture and treatment |
| 01/11/2005 | US6842024 Probe station having multiple enclosures |
| 01/11/2005 | US6842022 System and method for heterogeneous multi-site testing |
| 01/11/2005 | US6842021 System and method for detecting location of a defective electrical connection within an integrated circuit |
| 01/11/2005 | US6842019 Structures and methods for determining the effects of high stress currents on conducting layers and contacts in integrated circuits |
| 01/11/2005 | US6841990 Mechanical interface for rapid replacement of RF fixture components |
| 01/11/2005 | US6841985 Method and circuit for measuring on-chip, cycle-to-cycle clock jitter |
| 01/11/2005 | US6841972 Method for resetting a state of charge of a battery of a hybrid electric vehicle |
| 01/11/2005 | US6841405 Photomask for test wafers |
| 01/11/2005 | US6841291 Method and apparatus for detecting abnormality in battery pack system |
| 01/11/2005 | US6840666 Methods and systems employing infrared thermography for defect detection and analysis |
| 01/11/2005 | US6839948 Tooling plate adapted to facilitate rapid and precise attachment into a probing station |
| 01/11/2005 | CA2294506C Electrical tester for small motor vehicles |
| 01/08/2005 | WO2005003796A1 Dry-type high-voltage load system device and method for preventing chain disconnection/arc discharge of the device |
| 01/06/2005 | WO2005002294A2 Gas-collecting unit, test head, and ic device testing apparatus |
| 01/06/2005 | WO2005001897A2 Non-invasive, low pin count test circuits and methods utilizing emulated stress conditions |
| 01/06/2005 | WO2005001493A1 Test system with high accuracy time measurement system |
| 01/06/2005 | WO2005001492A1 High current electron beam inspection |
| 01/06/2005 | WO2004099800A3 Measuring device, and method for locating a partial discharge |
| 01/06/2005 | WO2004082304A3 Method and apparatus for source device synchronization in a communication system |
| 01/06/2005 | WO2004079965A3 Wireless network system for collecting data |
| 01/06/2005 | WO2004049164A3 Interface circuit |
| 01/06/2005 | WO2003034391A9 Method and system for adjusting the voltage of a precharge circuit |
| 01/06/2005 | WO2003034385A9 System and method for illumination timing compensation in response to row resistance |
| 01/06/2005 | US20050005219 Adapting scan-bist architectures for low power opertation |
| 01/06/2005 | US20050005217 Test standard interfaces and architectures |
| 01/06/2005 | US20050005216 Electronic component |
| 01/06/2005 | US20050005215 Built-in self-test circuit for phase locked loops, test method and computer program product therefor |
| 01/06/2005 | US20050005214 Transparent latch circuit |
| 01/06/2005 | US20050005213 Digital bus monitor integrated circuits |
| 01/06/2005 | US20050005212 Electronic component with output buffer control |