| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 01/19/2005 | CN1185748C Consumer battery having built-in indicator |
| 01/19/2005 | CN1185710C 半导体装置 Semiconductor device |
| 01/19/2005 | CN1185500C Capturing and evaluating high speed data streams |
| 01/19/2005 | CN1185499C Method and apparatus for searching conductor in conductor array with tight space |
| 01/19/2005 | CN1185498C Circuit board for testing semiconductor device |
| 01/19/2005 | CN1185497C Method for electrified testing high-voltage transmission line insulator |
| 01/19/2005 | CN1185496C Method for pure electrical measuring no-load potential phasor of synchronous electric generator |
| 01/18/2005 | US6845480 Test pattern generator and test pattern generation |
| 01/18/2005 | US6845479 Method for testing for the presence of faults in digital circuits |
| 01/18/2005 | US6845460 Device and system for adjusting delay in a data path based on comparison of data from a latch and data from a register |
| 01/18/2005 | US6845407 Semiconductor memory device having externally controllable data input and output mode |
| 01/18/2005 | US6845341 Method and mechanism for improved performance analysis in transaction level models |
| 01/18/2005 | US6845335 Automatic test vector generation method, test method making use of the test vectors as automatically generated, chip manufacturing method and automatic test vector generation program |
| 01/18/2005 | US6845332 State of charge calculation device and state of charge calculation method |
| 01/18/2005 | US6845249 Analog test output switchably connected to PCMCIA connector pin |
| 01/18/2005 | US6845043 Method of verifying a semiconductor integrated circuit apparatus, which can sufficiently evaluate a reliability of a non-destructive fuse module after it is assembled |
| 01/18/2005 | US6844825 Electric energy service apparatus with tamper detection |
| 01/18/2005 | US6844752 Thermal conditioning for integrated circuit testing |
| 01/18/2005 | US6844751 Multi-state test structures and methods |
| 01/18/2005 | US6844750 Current mirror based multi-channel leakage current monitor circuit and method |
| 01/18/2005 | US6844749 Integrated circuit test probe |
| 01/18/2005 | US6844748 Inspection jig for radio frequency device, and contact probe incorporated in the jig |
| 01/18/2005 | US6844747 Wafer level system for producing burn-in/screen, and reliability evaluations to be performed on all chips simultaneously without any wafer contacting |
| 01/18/2005 | US6844746 Electrical system like a testing system for testing the channels of a communication system |
| 01/18/2005 | US6844741 Method and system for electrical length matching |
| 01/18/2005 | US6844738 Coaxial radio frequency adapter and method |
| 01/18/2005 | US6844737 Device and process for detecting an electrical short-circuit, and circuit breaker comprising such a device |
| 01/18/2005 | US6844736 Systems and methods for locating a ground fault without de-energizing the circuit |
| 01/18/2005 | US6844725 Electric and magnetic field detection device and electric and magnetic field measurement apparatus |
| 01/18/2005 | US6844718 Docking device, more particularly for a probe and a tester |
| 01/18/2005 | US6844717 Test handler |
| 01/18/2005 | US6844712 Multi-test circuit breaker locator having a transmitter and a receiver |
| 01/18/2005 | US6844704 Voltage threshold device and energy storage cell failure detection system for power supply |
| 01/18/2005 | US6844624 Multichip module |
| 01/18/2005 | US6844559 Apparatus and method for testing substrate |
| 01/18/2005 | US6844208 Method and system for monitoring implantation of ions into semiconductor substrates |
| 01/18/2005 | US6843927 Method and apparatus for endpoint detection in electron beam assisted etching |
| 01/18/2005 | US6843339 Automotive passenger restraint and protection apparatus |
| 01/18/2005 | CA2137287C Corrosion resistant cable |
| 01/16/2005 | CA2435321A1 Fuse saving tester for fused circuit |
| 01/13/2005 | WO2005004571A1 Cover for cooling heat generating element, heat generating element mounter and test head |
| 01/13/2005 | WO2005004370A2 Quality determination for packetized information |
| 01/13/2005 | WO2005004208A2 Wafer inspection device |
| 01/13/2005 | WO2005004009A1 Load current evaluation device, load current evaluation method, and recording medium containing load current evaluation program |
| 01/13/2005 | WO2005003896A2 Test standard interfaces and architectures |
| 01/13/2005 | WO2005003891A2 Data compaction and pin assignment |
| 01/13/2005 | WO2005003884A2 Dynamic signaling and routing |
| 01/13/2005 | WO2005003800A1 Apparatus, methods and computer program products for estimation of battery reserve life using adaptively modified state of health indicator-based reserve life models |
| 01/13/2005 | WO2005003799A2 Method for predicting the residual service life of an electric energy accumulator |
| 01/13/2005 | WO2005003798A1 Automatic test system with easily modified software |
| 01/13/2005 | WO2005003797A1 Memory bus checking procedure |
| 01/13/2005 | WO2005003793A1 Probe card and semiconductor testing device using probe sheet or probe card and semiconductor device producing method |
| 01/13/2005 | WO2005003707A1 Pressure-sensitive sensor |
| 01/13/2005 | WO2004098056A3 Input stage of a signal-processing unit |
| 01/13/2005 | US20050010886 Apparatus for generating test vector of semiconductor integrated circuit |
| 01/13/2005 | US20050010884 Optimizing IC clock structures by minimizing clock uncertainty |
| 01/13/2005 | US20050010880 Method and user interface for debugging an electronic system |
| 01/13/2005 | US20050010849 Method and system for emulating a Fibre Channel link over a SONET/SDH path |
| 01/13/2005 | US20050010845 Method and apparatus for probing a computer bus |
| 01/13/2005 | US20050010844 Method for testing a circuit which is under test, and circuit configuration for carrying out the method |
| 01/13/2005 | US20050010843 Storage system and a method for diagnosing failure of the storage system |
| 01/13/2005 | US20050010842 System and method for performing concurrent mixed signal testing on a single processor |
| 01/13/2005 | US20050010839 Methods for evaluating quality of test sequences for delay faults and related technology |
| 01/13/2005 | US20050010836 Apparatus for testing hard disk drive |
| 01/13/2005 | US20050009577 Method of monitoring battery characteristics and radio terminal equipment |
| 01/13/2005 | US20050008105 Dynamic regulation of power consumption of a high-speed communication system |
| 01/13/2005 | US20050007856 [power source detector] |
| 01/13/2005 | US20050007841 Semiconductor memory apparatus and self-repair method |
| 01/13/2005 | US20050007581 Optical testing device |
| 01/13/2005 | US20050007266 Sigma-delta modulator with PWM output |
| 01/13/2005 | US20050007180 Sampling active-load circuit |
| 01/13/2005 | US20050007172 Semiconductor integrated circuit device |
| 01/13/2005 | US20050007165 Method and apparatus for determining a processing speed of an integrated circuit |
| 01/13/2005 | US20050007154 System and method for evaluating the speed of a circuit |
| 01/13/2005 | US20050007144 Fuel cell testing system having an energy conversion system for providing a useful output |
| 01/13/2005 | US20050007143 Fault tolerant semiconductor system |
| 01/13/2005 | US20050007140 Apparatus and method for performing parallel test on integrated circuit devices |
| 01/13/2005 | US20050007137 System for burn-in testing of electronic devices |
| 01/13/2005 | US20050007136 Thermal control of a DUT using a thermal control substrate |
| 01/13/2005 | US20050007135 Method and prober for contacting a contact area with a contact tip |
| 01/13/2005 | US20050007134 Probe card |
| 01/13/2005 | US20050007132 Assembly for electrically connecting a test component to a testing machine for testing electrical circuits on the test component |
| 01/13/2005 | US20050007131 Membrane probing system |
| 01/13/2005 | US20050007129 Wafer test method |
| 01/13/2005 | US20050007126 Circuit for measuring on-chip power supply integrity |
| 01/13/2005 | US20050007122 Procedure and device for the evaluation of the quality of a cable |
| 01/13/2005 | US20050007121 Systems and methods for non-destructively testing conductive members employing electromagnetic back scattering |
| 01/13/2005 | US20050007120 Semiconductor device |
| 01/13/2005 | US20050007097 Dynamic register with IDDQ testing capability |
| 01/13/2005 | US20050007074 Method for assessment of the state of batteries in battery-supported power supply systems |
| 01/13/2005 | US20050007073 Indicator of remaining energy in storage cell of implantable medical device |
| 01/13/2005 | US20050007068 Method and system for battery protection |
| 01/13/2005 | US20050007064 Charging apparatus and charging current detecting circuit thereof |
| 01/13/2005 | US20050006726 Apparatus and method for testing semiconductor nodules on a semiconductor substrate wafer |
| 01/13/2005 | US20050006602 Synchronization of laser; positioning defects; semiconductors; process control |
| 01/13/2005 | US20050006583 Method of inspecting pattern and inspecting instrument |
| 01/13/2005 | US20050005718 Manipulator for positioning a test head |
| 01/13/2005 | US20050005438 Method of testing printed circuit board opening spacings |
| 01/13/2005 | DE19819472B4 Überwachungsvorrichtung für eine mit Öl gefüllte elektrische Einrichtung Monitoring apparatus for an oil-filled electrical device |
| 01/13/2005 | DE10347110B3 Cell voltage measuring device for cell stack in motor vehicle power network, has diode pairs connected in parallel with each cell, and switch connected to differential amplifier |