| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 01/20/2005 | WO2005005996A2 Apparatus and method for electromechanical testing and validation of probe cards |
| 01/20/2005 | WO2004104531A3 Method and system for improved single-ended loop make-up identification |
| 01/20/2005 | WO2004093302A3 Ac servo driver motor power line disconnection detection method |
| 01/20/2005 | WO2004090560A3 Automatic test machine for testing printed circuit boards |
| 01/20/2005 | WO2004086827A3 Thermal apparatus for engaging electronic device |
| 01/20/2005 | WO2004083747A3 Thermal stratification test apparatus and method providing cyclical and steady-state stratified environments |
| 01/20/2005 | WO2004049395A3 Probe station with low inductance path |
| 01/20/2005 | US20050015693 Semiconductor integrated circuit verification system |
| 01/20/2005 | US20050015692 Adjustable voltage boundary scan adapter for emulation and test |
| 01/20/2005 | US20050015691 Semiconductor integrated circuit device and test method thereof |
| 01/20/2005 | US20050015690 Semiconductor device |
| 01/20/2005 | US20050015689 Electronic component and method for measuring its qualification |
| 01/20/2005 | US20050015688 Phase shifter with reduced linear dependency |
| 01/20/2005 | US20050015214 Measuring constraint parameters at different combinations of circuit parameters |
| 01/20/2005 | US20050015213 Method and apparatus for testing an electronic device |
| 01/20/2005 | US20050014399 Socket for electrical parts |
| 01/20/2005 | US20050014394 Contact-connection device for electronic circuit units and production method |
| 01/20/2005 | US20050014327 Sequential unique marking |
| 01/20/2005 | US20050013604 Battery capacity display device and camera |
| 01/20/2005 | US20050013474 Edge normal process |
| 01/20/2005 | US20050013356 Methods and apparatus for providing test access to asynchronous circuits and systems |
| 01/20/2005 | US20050013070 Device and method for checking differential switches in low voltage |
| 01/20/2005 | US20050012923 Method for inspecting semiconductor device |
| 01/20/2005 | US20050012632 Sensor signal detection device |
| 01/20/2005 | US20050012558 Extraction of interconnect parasitics |
| 01/20/2005 | US20050012518 Mother substrate, substrate for display panel and method of manufacturing display panel |
| 01/20/2005 | US20050012517 In-tray burn-in board, device and test assembly for testing integrated circuit devices in situ on processing trays |
| 01/20/2005 | US20050012515 Apparatus for testing integrated circuit chips |
| 01/20/2005 | US20050012514 Test system including an apparatus for conveying signals between a first circuit board and a second circuit board |
| 01/20/2005 | US20050012513 Probe card assembly |
| 01/20/2005 | US20050012510 Testing and display of electrical system impedance |
| 01/20/2005 | US20050012507 Partial discharge monitoring apparatus and partial discharge remote monitoring system for rotating electric machines |
| 01/20/2005 | US20050012506 Leakage detection apparatus and motor car |
| 01/20/2005 | US20050012505 Control of relay opening events |
| 01/20/2005 | US20050012504 Switch testing apparatus |
| 01/20/2005 | US20050012498 System and method for testing semiconductor devices |
| 01/20/2005 | US20050012496 Electric current detection apparatus |
| 01/20/2005 | US20050011289 Torque measuring device for electric motors and method to measure the torque of an electric motor |
| 01/20/2005 | US20050011288 Torque measuring device for electric motors |
| 01/20/2005 | US20050011027 Contact actuator with contact force control |
| 01/20/2005 | DE202004018242U1 Vorrichtung zur Prüfung von Steckverbindungen und/oder Verbindungskabeln an Triebfahrzeugen, vorzugsweise an schienengebundenen Triebfahrzeugen Apparatus for testing of connectors and / or connection cables of traction vehicles, preferably on rail locomotives |
| 01/20/2005 | DE19507060B4 Verfahren sowie Vorrichtung zur Überprüfung von Schutzmaßnahmen in realen IT-Netzen Method and apparatus for checking of safety measures in real IT networks |
| 01/20/2005 | DE19503809B4 Sicherungsvorrichtung für eine Stromleitung in Fahrzeugen Safety device for a power line in vehicles |
| 01/20/2005 | DE10328237A1 Test data or test procedure generating method for testing a chip card using a computer-based, design testing station, wherein a proven base test procedure is modified to generate new test procedures |
| 01/20/2005 | DE10211831B4 Schaltungsanordnung und Verfahren zur Überwachung von Leistungshalbleiterbauelementen Circuit arrangement and method for monitoring power semiconductor components |
| 01/20/2005 | DE102004029437A1 Den Zustand einer Fahrzeugbatterie überwachendes Gerät The state of a vehicle battery-monitoring device |
| 01/20/2005 | DE102004029301A1 Referenzspannungsdiagnose zur Verwendung in einer Steuereinheit für Kraftfahrzeuge Reference voltage diagnostics for use in a control unit for motor vehicles |
| 01/20/2005 | CA2531416A1 System, apparatus and method for detection of electrical faults |
| 01/19/2005 | EP1499140A1 Battery voltage monitoring and communication mode enabling means for a radiotelephone |
| 01/19/2005 | EP1498996A2 Device for checking differential switches in low voltage systems |
| 01/19/2005 | EP1498942A1 Signal detection contactor and signal correcting system |
| 01/19/2005 | EP1498743A2 System for displaying residual capacity of a battery and camera |
| 01/19/2005 | EP1498742A1 Fuse saving tester for fused circuit |
| 01/19/2005 | EP1498740A1 Watthour-meter measuring circuit including a detection of an incorrect line connection |
| 01/19/2005 | EP1498738A1 Socket for electrical parts |
| 01/19/2005 | EP1498727A1 Method for inspecting semiconductor device |
| 01/19/2005 | EP1498322A1 Method for determining charging capacitance of capacitor |
| 01/19/2005 | EP1497804A1 Remote control with low battery indication |
| 01/19/2005 | EP1497666A1 Flexible streaming hardware |
| 01/19/2005 | EP1497621A1 Semiconductor load port alignment device |
| 01/19/2005 | EP1440324B1 Electronic component with output buffer control |
| 01/19/2005 | EP1360513A4 Multiple-capture dft system for detecting or locating crossing clock-domain faults during self-test or scan test |
| 01/19/2005 | EP1275183A4 Method and apparatus for providing optimized access to circuits for debug, programming, and test |
| 01/19/2005 | EP1256007A4 Decompressor/prpg for applying pseudo-random and deterministic test patterns |
| 01/19/2005 | EP1242885A4 Continuous application and decompression of test patterns to a circuit-under-test |
| 01/19/2005 | EP1190264B1 Integrated circuit and method for determining the current yield of a part of the integrated circuit |
| 01/19/2005 | EP1183544A4 Apparatus and method for implementing a wireless system-on-a-chip with a reprogrammable tester, debugger, and bus monitor |
| 01/19/2005 | EP1047947B1 Test device for testing a module for a data carrier intended for contactless communication |
| 01/19/2005 | EP0927356B2 Method of checking electrical components and device for carrying out this method |
| 01/19/2005 | CN2672855Y Multi path micro flow control chip unit detecting system |
| 01/19/2005 | CN2672668Y Lithium power cell detecting and control device |
| 01/19/2005 | CN2672667Y Variable frequency type series resonance work frequency anti-pressure test device |
| 01/19/2005 | CN2672666Y Detecting circuit for anti surge property |
| 01/19/2005 | CN2672665Y Detector for thunder and lighting surge |
| 01/19/2005 | CN2672664Y Antit-theft safety warning device for irrigation transformer |
| 01/19/2005 | CN2672663Y Test needle plate for detachable needle bed |
| 01/19/2005 | CN1568539A Providing photonic control over wafer borne semiconductor devices |
| 01/19/2005 | CN1568433A Methods of conducting wafer level burn-in of electronic devices |
| 01/19/2005 | CN1568432A Providing current control over wafer borne semiconductor devices using trenches |
| 01/19/2005 | CN1568431A Systems for wafer level burn-in of electronic devices |
| 01/19/2005 | CN1568430A Method and apparatus for accelerated determination of electromigration characteristics of semiconductor wiring |
| 01/19/2005 | CN1568429A Providing current control over wafer borne semiconductor devices using overlayer patterns |
| 01/19/2005 | CN1567665A Method of diagnosing partial discharge in gas-insulated apparatus and partial discharge diagnosing syatem for carrying out the same |
| 01/19/2005 | CN1567558A Stack test method |
| 01/19/2005 | CN1567557A Test carrier plate |
| 01/19/2005 | CN1567556A RTL level real-time hardware testing platform in memory card and test method thereof |
| 01/19/2005 | CN1567555A Microscopical analysis technique for side ion-beam induction charge |
| 01/19/2005 | CN1567482A Automatic variable timing structure for recovering writing using low speed tester |
| 01/19/2005 | CN1566982A Voltage detecting method and related circuit |
| 01/19/2005 | CN1566981A AC-DC electrical contact electricity life testing device and method |
| 01/19/2005 | CN1566980A Ageing testing system |
| 01/19/2005 | CN1566979A Organic luminescent display pixel testing method and apparatus |
| 01/19/2005 | CN1566978A Testing arrangement for universal type semiconductor detector |
| 01/19/2005 | CN1566977A Method for determining laser diode breakage degree |
| 01/19/2005 | CN1566976A High-voltage electrical appliance insulation parameter on-line monitoring method based on reference phase method |
| 01/19/2005 | CN1566975A Examination apparatus and examination method |
| 01/19/2005 | CN1566974A Ground wire monitoring system and method |
| 01/19/2005 | CN1566973A Modularized elastic needle set arrangement |
| 01/19/2005 | CN1566972A Testing system for electronic equipment |
| 01/19/2005 | CN1566971A Power driven coaxial rotating rapid orientating system and method |