| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 01/27/2005 | US20050019965 Process for testing IC wafer |
| 01/27/2005 | US20050019060 Inspection apparatus for inspecting a display module |
| 01/27/2005 | US20050018604 Method and system for congestion control in a fibre channel switch |
| 01/27/2005 | US20050018499 Apparatus for determining burn-in reliability from wafer level burn-in |
| 01/27/2005 | US20050018461 Semiconductor integrated circuit device, method of testing semiconductor integrated circuit device and method of manufacturing semiconductor integrated circuit device |
| 01/27/2005 | US20050017750 Wafer-level burn-in and test |
| 01/27/2005 | US20050017749 Electronic devices mounted on electronic equipment board test system and test method |
| 01/27/2005 | US20050017748 Test system for testing integrated chips and an adapter element for a test system |
| 01/27/2005 | US20050017746 Resistance defect assessment device, resistance defect assessment method, and method for manufacturing resistance defect assessment device |
| 01/27/2005 | US20050017745 Semiconductor integrated circuit, and electrostatic withstand voltage test method and apparatus therefor |
| 01/27/2005 | US20050017744 Device and method for evaluating at least one electrical conducting structure of an electronic component |
| 01/27/2005 | US20050017743 Circuit board inspection device |
| 01/27/2005 | US20050017741 Wafer probe station having environment control enclosure |
| 01/27/2005 | US20050017734 Method for on-line calibration of low accuracy voltage sensor through communication bus |
| 01/27/2005 | US20050017733 Model-based fault detection in a motor drive |
| 01/27/2005 | US20050017729 Circuit board testing apparatus and method for testing a circuit board |
| 01/27/2005 | US20050017726 Handheld tester for starting/charging systems |
| 01/27/2005 | US20050017725 Method and device for estimating remaining capacity of secondary cell battery pack system and electric vehicle |
| 01/27/2005 | US20050017708 Apparatus and method for electromechanical testing and validation of probe cards |
| 01/27/2005 | US20050017707 Oscilloscope-based automatic finder for locating high power dissipation areas in switch-mode power supply (smps) switching devices |
| 01/27/2005 | US20050017687 Degradation judgment circuit for secondary battery |
| 01/27/2005 | US20050017686 Method and device for diagnosing rechargeable batteries |
| 01/27/2005 | US20050017685 Battery life monitor and battery state of charge monitor |
| 01/27/2005 | US20050017494 Automotive passenger restraint and protection apparatus |
| 01/27/2005 | US20050017239 Test element group, method of manufacturing a test element group, method of testing a semiconductor device, and semiconductor device |
| 01/27/2005 | US20050016823 High speed channel selector switch |
| 01/27/2005 | US20050015967 Method for testing print circuit boards |
| 01/27/2005 | DE10392225T5 Prüfvorrichtung Tester |
| 01/27/2005 | DE10328709A1 Semiconductor component test method in which a series of tests are applied to the components with the results of one test used to modify or even cancel the next test |
| 01/27/2005 | DE10297648T5 Prüfstation Inspection station |
| 01/27/2005 | DE10297339T5 Elektronischer Batterietester mit relativem Testausgangssignal Electronic battery tester with relative test output |
| 01/27/2005 | DE102004007978A1 Multichip-Modul Multichip module |
| 01/27/2005 | CA2531523A1 Device for monitoring and charging of a selected group of battery cells |
| 01/26/2005 | EP1501195A1 Circuit arrangement to generate a clock signal for a sigma-delta analog-to-digital converter |
| 01/26/2005 | EP1501146A2 Fuel cell system, fuel cell operation method, program, and recording medium |
| 01/26/2005 | EP1500945A2 Methods and devices for diagnosing the condition of rechargeable batteries |
| 01/26/2005 | EP1500943A1 High speed channel selector switch |
| 01/26/2005 | EP1500942A1 Device for voltage testing of cables and cable fittings by a very low frequency voltage |
| 01/26/2005 | EP1500941A1 Method for finding disconnection of conductive wires formed on plate glass and apparatus therefor |
| 01/26/2005 | EP1499906A1 Method and apparatus for secure scan testing |
| 01/26/2005 | EP1499905A1 Method and arrangement for protecting a chip and checking its authenticity |
| 01/26/2005 | EP1499904A1 Testable cascode circuit and method for testing the same |
| 01/26/2005 | EP1499903A2 Method and system for monitoring winding insulation resistance |
| 01/26/2005 | EP1143256B1 Test device for the functional testing of a semiconductor chip |
| 01/26/2005 | EP1012614B1 Production interface for an integrated circuit test system |
| 01/26/2005 | EP0725935B1 A device for the automatic control of joints in electrical high voltage lines |
| 01/26/2005 | CN2674659Y Combined battery with electric quantity display and protective circuit |
| 01/26/2005 | CN2674466Y Display device for modularized electronic device operating state |
| 01/26/2005 | CN2674465Y Shared hand electric testing base |
| 01/26/2005 | CN2674464Y Base for glass chip jointed module |
| 01/26/2005 | CN2674458Y Adapter structure for testing integrated circuit |
| 01/26/2005 | CN2673744Y Automobile electric circuit testing device |
| 01/26/2005 | CN1572042A Apparatus for judging state of assembled battery |
| 01/26/2005 | CN1571928A Method of assembling and testing an electronics module |
| 01/26/2005 | CN1571923A Optical inspection system having integrated component learning |
| 01/26/2005 | CN1571613A Method and apparatus for determining the resonant frequency of a resonant circuit |
| 01/26/2005 | CN1571267A Method for measuring modulation efficiency of generating set primary frequency-modulation |
| 01/26/2005 | CN1571136A Device and method for nondestructive inspection on semiconductor device |
| 01/26/2005 | CN1571135A Device and method for nondestructive inspection on semiconductor device |
| 01/26/2005 | CN1571133A Inverse needle regulating harness for liftable probe card and needle regulating method |
| 01/26/2005 | CN1570660A Method and device for testing bridge circuit |
| 01/26/2005 | CN1186809C Embedded internal storage test platform device and testing method |
| 01/26/2005 | CN1186644C System, method and appts. suitable for actively selecting scan test |
| 01/26/2005 | CN1186643C Method and apparatus for testing signal paths between integrated circuit wafer and wafer tester |
| 01/26/2005 | CN1186642C Reliability of vias and e-beam probing diagnosis |
| 01/26/2005 | CN1186641C Systemic hierarchial test |
| 01/26/2005 | CN1186640C Electric arc monitoring systems |
| 01/25/2005 | US6848068 Soft coding of multiple device IDs for IEEE compliant JTAG devices |
| 01/25/2005 | US6848067 Multi-port scan chain register apparatus and method |
| 01/25/2005 | US6847909 System and method for generating a shmoo plot by tracking the edge of the passing region |
| 01/25/2005 | US6847907 Defect detection and repair of micro-electro-mechanical systems (MEMS) devices |
| 01/25/2005 | US6847900 System and method for identifying solder joint defects |
| 01/25/2005 | US6847855 Method for fault analysis in wafer production |
| 01/25/2005 | US6847587 System and method for identifying and locating an acoustic event |
| 01/25/2005 | US6847563 Semiconductor storage device and method for remedying defects of memory cells |
| 01/25/2005 | US6847267 Methods for transmitting a waveform having a controllable attenuation and propagation velocity |
| 01/25/2005 | US6847224 Test probe |
| 01/25/2005 | US6847223 Method and device for inspection active matrix substrate |
| 01/25/2005 | US6847222 Apparatus for measuring voltage fluctuation waveform in semiconductor integrated circuit, and semiconductor integrated circuit having function for measuring voltage fluctuation waveform |
| 01/25/2005 | US6847221 Probe pin assembly |
| 01/25/2005 | US6847219 Probe station with low noise characteristics |
| 01/25/2005 | US6847218 Probe card with an adapter layer for testing integrated circuits |
| 01/25/2005 | US6847212 Apparatus and method for calibrating voltage spike waveforms |
| 01/25/2005 | US6847211 Apparatus and method for calibrating voltage spike waveforms for three-phase electrical devices and systems |
| 01/25/2005 | US6847203 Applying parametric test patterns for high pin count ASICs on low pin count testers |
| 01/25/2005 | US6847202 Apparatus for recognizing working position of device transfer system in semiconductor device test handler and method thereof |
| 01/25/2005 | US6847199 Capturing both digital and analog forms of a signal through the same probing path |
| 01/25/2005 | US6847191 Power control device and the operating method thereof |
| 01/25/2005 | US6847067 A-C:H ISFET device, manufacturing method, and testing methods and apparatus thereof |
| 01/25/2005 | US6846682 Chemically synthesized and assembled electronic devices |
| 01/25/2005 | US6846193 Socket |
| 01/25/2005 | CA2450302C Synchronous machine |
| 01/25/2005 | CA2421047C Method and apparatus for optimized parallel testing and access of electronic circuits |
| 01/20/2005 | WO2005006824A1 Method for minimizing the impedance discontinuity of a via |
| 01/20/2005 | WO2005006394A2 Circuit for testing and fine tuning integrated circuit (switch control circuit) |
| 01/20/2005 | WO2005006189A1 Automatic self test of an integrated circuit via ac i/o loopback |
| 01/20/2005 | WO2005006006A1 Charging rate estimating method, charging rate estimating unit and battery system |
| 01/20/2005 | WO2005006005A1 Ic with on-board characterization unit |
| 01/20/2005 | WO2005006004A1 Scan test design method, scan test circuit, scan test circuit insertion cad program, large-scale integrated circuit, and mobile digital device |
| 01/20/2005 | WO2005006000A1 Electrical switchboard monitoring system |