| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 02/02/2005 | CN2676216Y Electrical connection state automatic detector |
| 02/02/2005 | CN2676215Y High power converter testing device |
| 02/02/2005 | CN2676210Y Driver and signal collector for resonant transducer |
| 02/02/2005 | CN2676206Y Test film probe for display panel |
| 02/02/2005 | CN1575514A Reliability evaluation test apparatus, reliability evaluation test system, contactor, and reliability evaluation test method |
| 02/02/2005 | CN1575421A Testing circuits on substrates |
| 02/02/2005 | CN1575418A Apparatus and method for handling and testing of wafers |
| 02/02/2005 | CN1574560A Motor driving apparatus |
| 02/02/2005 | CN1574543A Backup battery and discharging control apparatus therefor |
| 02/02/2005 | CN1574540A Chargeable cell monitoring and balancing circuit |
| 02/02/2005 | CN1574513A Contact-connection device for electronic circuit units and production method |
| 02/02/2005 | CN1574289A Operation analyzing method for semiconductor integrated circuit device, analyzing system used in the same, and optimization design method using the same |
| 02/02/2005 | CN1574268A Device test apparatus and test method |
| 02/02/2005 | CN1574265A Device for seating semiconductor device in semiconductor test handler |
| 02/02/2005 | CN1573852A Image display device with increased margin for writing image signal |
| 02/02/2005 | CN1573708A Apparatus and method for testing multiple hard disk drives using single computer |
| 02/02/2005 | CN1573707A Method of testing hard disk drive |
| 02/02/2005 | CN1573695A Memory rewind and reconstruction for hardware emulator |
| 02/02/2005 | CN1573348A Method and apparatus for measuring photoelectric conversion characteristics of solar cell element |
| 02/02/2005 | CN1573347A Battery capacity detection apparatus and detection method |
| 02/02/2005 | CN1573346A Hyperfine oversampler method and apparatus |
| 02/02/2005 | CN1573344A Equipment for testing semiconductor integrated circuit |
| 02/02/2005 | CN1573343A Diagnostic system and method for electric leak detecting device |
| 02/02/2005 | CN1573342A Display device and method for testing the same |
| 02/02/2005 | CN1573341A Inspection device and inspection method for active matrix panel, and manufacturing method for active matrix organic light emitting diode panel |
| 02/02/2005 | CN1573337A Test card |
| 02/02/2005 | CN1187898C Scannable latch circuit for providing scan output from it and its method |
| 02/02/2005 | CN1187859C 电池状态监视电路 Battery state monitoring circuit |
| 02/02/2005 | CN1187832C 半导体存储器件 The semiconductor memory device |
| 02/02/2005 | CN1187826C 半导体集成电路 The semiconductor integrated circuit |
| 02/02/2005 | CN1187817C Cooling system for IC module processing device |
| 02/02/2005 | CN1187621C Measurer of high-speed memory bus |
| 02/02/2005 | CN1187619C Method and device for testing printed circuit boards with a parallel tester |
| 02/02/2005 | CN1187571C Method of probing substrate |
| 02/02/2005 | CN1187246C Method and apparatus for taking out IC module from normal tray of IC module conveying device |
| 02/02/2005 | CN1187245C Modular integrated circuit for use in modular integrated circuit handling device and handling method of carrier thereof |
| 02/01/2005 | US6851096 Method and apparatus for testing semiconductor wafers |
| 02/01/2005 | US6851080 Automatic activation of ASIC test mode |
| 02/01/2005 | US6851079 Jtag test access port controller used to control input/output pad functionality |
| 02/01/2005 | US6851078 Data transfer apparatus, memory device testing apparatus, data transfer method, and memory device testing method |
| 02/01/2005 | US6851076 Memory tester has memory sets configurable for use as error catch RAM, Tag RAM's, buffer memories and stimulus log RAM |
| 02/01/2005 | US6850860 Semiconductor device testing apparatus and test method therefor |
| 02/01/2005 | US6850854 Semiconductor production system |
| 02/01/2005 | US6850437 Nonvolatile semiconductor memory device and method of retrieving faulty in the same |
| 02/01/2005 | US6850399 Gas insulated device and failure rating method |
| 02/01/2005 | US6850123 Circuits and methods for characterizing the speed performance of multi-input combinatorial logic |
| 02/01/2005 | US6850086 System and method of monitoring, predicting and optimizing production yields in a liquid crystal display (LCD) manufacturing process |
| 02/01/2005 | US6850085 Reference voltage generating device, semiconductor integrated circuit including the same, and testing device and method for semiconductor integrated circuit |
| 02/01/2005 | US6850083 Burn in board having a remote current sensor |
| 02/01/2005 | US6850082 Probe holder for testing of a test device |
| 02/01/2005 | US6850081 Semiconductor die analysis via fiber optic communication |
| 02/01/2005 | US6850080 Inspection method and inspection apparatus |
| 02/01/2005 | US6850074 System and method for island detection |
| 02/01/2005 | US6850073 Power circuit tester apparatus and method |
| 02/01/2005 | US6850072 Methods and apparatus for analyzing high voltage circuit breakers |
| 02/01/2005 | US6850070 Coil on plug inductive sampling method |
| 02/01/2005 | US6850052 Probing method |
| 02/01/2005 | US6850050 Reticle inspection |
| 02/01/2005 | US6850037 In-vehicle battery monitor |
| 02/01/2005 | US6850036 Method for checking power status of batteries |
| 02/01/2005 | US6850034 Circuit arrangement for monitoring the state of charge of an accummulator |
| 02/01/2005 | US6849956 Semiconductor integrated circuit with shortened pad pitch |
| 02/01/2005 | US6849142 Method of making multi-layer female component for refastenable fastening device |
| 02/01/2005 | US6848928 Socket |
| 02/01/2005 | US6848194 Apparatus for monitoring a semiconductor wafer during a spin drying operation |
| 02/01/2005 | CA2195521C Antenna and feeder cable tester |
| 01/31/2005 | CA2475195A1 Electronic component test apparatus |
| 01/27/2005 | WO2005008896A1 Electrical circuit and method for testing electronic components |
| 01/27/2005 | WO2005008850A2 Spatial and temporal selective laser assisted fault localization |
| 01/27/2005 | WO2005008768A2 A system and method for determining a cross sectional feature of a structural element using a reference structural element |
| 01/27/2005 | WO2005008737A2 Inspection and metrology module cluster tool with multi-tool manager |
| 01/27/2005 | WO2005008729A2 Method and apparatus for scrambling cell content in an integrated circuit |
| 01/27/2005 | WO2005008318A1 Inspection method, semiconductor device, and display device |
| 01/27/2005 | WO2005008270A1 Device and method for testing electronic components |
| 01/27/2005 | WO2005008266A1 Device for monitoring and charging of a selected group of battery cells |
| 01/27/2005 | WO2005008265A1 Sensor unit for an on-board network of a motor vehicle, and method for the production of a sensor unit |
| 01/27/2005 | WO2005008264A1 Shift clock generation device, timing generator, and test device |
| 01/27/2005 | WO2005008263A1 Pattern generation device and test device |
| 01/27/2005 | WO2004092752A3 Method for detecting fault arcs and arc monitoring device therefor |
| 01/27/2005 | WO2004070343B1 System and method for measuring internal resistance of electrochemical devices |
| 01/27/2005 | US20050022142 Integrated circuit capable of locating failure process layers |
| 01/27/2005 | US20050022088 Semiconductor tester |
| 01/27/2005 | US20050022087 Method and system for controlling interchangeable components in a modular test system |
| 01/27/2005 | US20050022086 Method for generating tester controls |
| 01/27/2005 | US20050022085 Functional failure analysis techniques for programmable integrated circuits |
| 01/27/2005 | US20050022084 Built-in self-test arrangement for integrated circuit memory devices |
| 01/27/2005 | US20050022083 System and method for performing scan test with single scan clock |
| 01/27/2005 | US20050022082 Integrated circuit test apparatus |
| 01/27/2005 | US20050022081 Test systems and methods with compensation techniques |
| 01/27/2005 | US20050022080 Systems and methods associated with test equipment |
| 01/27/2005 | US20050022079 Circuit and method for configuring CAM array margin test and operation |
| 01/27/2005 | US20050022062 Method for debugging reconfigurable architectures |
| 01/27/2005 | US20050021304 Abnormality diagnosis apparatus for automatic activation timer circuit |
| 01/27/2005 | US20050021300 Method for detecting fault on transmission lines by using harmonics and state transition diagram |
| 01/27/2005 | US20050021273 Dynamically adaptable semiconductor parametric testing |
| 01/27/2005 | US20050021260 Use of I2C programmable clock generator to enable frequency variation under BMC control |
| 01/27/2005 | US20050021254 Method and apparatus for determining the complex impedance of an electrical component |
| 01/27/2005 | US20050021253 Charging/discharging apparatus and method, power supplying apparatus and method, program storing medium, and program |
| 01/27/2005 | US20050020402 Apparatus and method for balancing and for providing a compliant range to a test head |
| 01/27/2005 | US20050020148 Integrated network-port socket and physical-layer device and main board incorporating the same |