| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 02/08/2005 | US6853177 Semiconductor device with process monitor circuit and test method thereof |
| 02/08/2005 | US6853175 Apparatus and method for measuring electrical characteristics of a semiconductor element in a packaged semiconductor device |
| 02/08/2005 | US6853078 Semiconductor device and method for fabricating the same |
| 02/08/2005 | US6852999 Reduced terminal testing system |
| 02/08/2005 | US6852992 Method and apparatus of diagnosing deterioration of an article |
| 02/08/2005 | US6852553 Semiconductor device fabrication method and semiconductor device fabrication apparatus |
| 02/08/2005 | US6851612 Portable diagnostic device |
| 02/08/2005 | CA2484670A1 In-situ determination of mea resistance and electrode diffusivity of a fuel cell |
| 02/03/2005 | WO2005011344A2 Method for configuration throughput of electronic circuits |
| 02/03/2005 | WO2005011069A1 Socket, and testing device |
| 02/03/2005 | WO2005010945A2 Failure analysis methods and systems |
| 02/03/2005 | WO2005010942A2 Method and apparatus for calibrating a metrology tool |
| 02/03/2005 | WO2005010932A2 Mask network design for scan-based integrated circuits |
| 02/03/2005 | WO2005010600A1 Inspection equipment and inspection method of liquid crystal display panel |
| 02/03/2005 | WO2005010541A2 Testing and display of electrical system impedance |
| 02/03/2005 | WO2005010540A1 Method and device for estimating charge/discharge electricity amount of secondary cell |
| 02/03/2005 | WO2005010539A1 Battery pack capacity control system |
| 02/03/2005 | WO2005010538A1 High frequency circuit analyser |
| 02/03/2005 | WO2005010536A1 Noncontact sensor |
| 02/03/2005 | WO2004099791A3 Diagnosis for expected life of emergency power apparatus |
| 02/03/2005 | WO2004097872A3 Test instrument for arc fault circuit interrupters |
| 02/03/2005 | WO2004093331A3 Built-in-self-test for digital transmitters |
| 02/03/2005 | WO2004083783B1 Hand mounted testing meter |
| 02/03/2005 | WO2004079865A3 High speed connector |
| 02/03/2005 | WO2004063949A3 Method and system for computer-assisted testing of a machine system |
| 02/03/2005 | WO2004001807B1 Construction structures and manufacturing processes for probe card assemblies and packages having wafer level springs |
| 02/03/2005 | US20050028115 Method of mapping logic failures in an integrated circuit die |
| 02/03/2005 | US20050028063 Integration type input circuit and method of testing it |
| 02/03/2005 | US20050028060 Accelerated scan circuitry and method for reducing scan test data volume and execution time |
| 02/03/2005 | US20050028059 Processor interface for test access port |
| 02/03/2005 | US20050028055 System and method for reducing waveform distortion in transferring signals |
| 02/03/2005 | US20050028051 Method for evaluating delay test quality |
| 02/03/2005 | US20050028050 BIST circuit for measuring path delay in an IC |
| 02/03/2005 | US20050027470 Interactive stub apparatus for testing a program and stub program storage medium |
| 02/03/2005 | US20050027469 De-embedding devices under test |
| 02/03/2005 | US20050027467 Eye diagram analyzer correctly samples low dv/dt voltages |
| 02/03/2005 | US20050027465 Method for estimating time to full-charge in a rechargeable battery |
| 02/03/2005 | US20050026491 Connector assembly with actuation system |
| 02/03/2005 | US20050026477 Method of making contact with circuit units to be tested and self-planarizing test module device of implementing the method |
| 02/03/2005 | US20050026315 Isolation circuit |
| 02/03/2005 | US20050026311 Method and apparatus for performing whole wafer burn-in |
| 02/03/2005 | US20050025274 Transition tracking |
| 02/03/2005 | US20050025190 Self-calibrating strobe signal generator |
| 02/03/2005 | US20050024306 Flat display apparatus and flat display apparatus testing method |
| 02/03/2005 | US20050024220 Built-in circuitry and method to test connectivity to integrated circuit |
| 02/03/2005 | US20050024089 Physical layers |
| 02/03/2005 | US20050024082 Display device and method for testing the same |
| 02/03/2005 | US20050024081 Testing apparatus and method for thin film transistor display array |
| 02/03/2005 | US20050024079 Method for evaluating semiconductor device |
| 02/03/2005 | US20050024078 Device for making pass/fail judgement of semiconductor integrated circuit |
| 02/03/2005 | US20050024077 Method and test structures for measuring interconnect coupling capacitance in an IC chip |
| 02/03/2005 | US20050024076 Systems for wafer level burn-in of electronic devices |
| 02/03/2005 | US20050024075 IDDQ testing of CMOS mixed-signal integrated circuits |
| 02/03/2005 | US20050024074 Method and apparatus for characterizing an electronic circuit |
| 02/03/2005 | US20050024072 Selectively configurable probe structures, e.g., for testing microelectronic components |
| 02/03/2005 | US20050024071 Selectively configurable probe structures, e.g., for testing microelectronic components |
| 02/03/2005 | US20050024070 Test signal distribution system for IC tester |
| 02/03/2005 | US20050024064 System and method for testing devices |
| 02/03/2005 | US20050024063 Method and apparatus for measuring high speed glitch energy in an integrated circuit |
| 02/03/2005 | US20050024062 Test device and test module |
| 02/03/2005 | US20050024059 Apparatus and method for calibrating a semiconductor test system |
| 02/03/2005 | US20050024058 Semi-conductor component test process and a system for testing semi-conductor components |
| 02/03/2005 | US20050024057 Methods of using measured time resolved photon emission data and simulated time resolved photon emission data for fault localization |
| 02/03/2005 | US20050024041 Pin electronics interface circuit |
| 02/03/2005 | US20050024039 Integratged circuit characterization printed circuit board, test equipment including same, method of fabrication thereof and method of characterizing an integrated circuit device |
| 02/03/2005 | US20050024037 Method and circuit for measuring on-chip, cycle-to-cycle clock jitter |
| 02/03/2005 | US20050024036 Test apparatus |
| 02/03/2005 | US20050024020 Secondary cell residual capacity calculation method and battery pack |
| 02/03/2005 | US20050024018 Battery capacity detection apparatus and detection method |
| 02/03/2005 | US20050024013 Battery load power detecting system |
| 02/03/2005 | US20050022376 Electronic component test apparatus |
| 02/03/2005 | DE69433618T2 Gerät zur prüfung der verbindung zwischen dem ausgang einer schaltung mit fester logischer ausgabe und dem eingang eines weiteren schaltkreises Apparatus for testing the connection between the output of a circuit with a fixed logical output and the input of another switching circle |
| 02/03/2005 | DE202004014440U1 Measurement arrangement for continuous monitoring of parallel switched accumulators in an accumulator charging system, whereby measurement channels are connected to each accumulator cell via a shunt resistance |
| 02/03/2005 | DE19831634B4 Chipträgeranordnung sowie Verfahren zur Herstellung einer Chipträgeranordnung mit elektrischem Test Chip carrier assembly and method of manufacturing a chip carrier assembly with electrical test |
| 02/03/2005 | DE10330330A1 Superconducting flat cable insulation test procedure rolls cable with one side against conducting spool and applies high voltage whilst unreeling to locate fault |
| 02/03/2005 | DE10330043A1 Einrichtung und Verfahren zum Kalibrieren eines Halbleiter-Bauelement-Test-Systems Apparatus and method for calibrating a semiconductor device test system |
| 02/03/2005 | DE10330042A1 Semiconductor component test system has two test units for separate digital functional and analogue quality test sequences |
| 02/03/2005 | DE10329856A1 Verfahren und Vorrichtung zur Ermittlung des Verhältnisses zwischen einer RC-Zeitkonstante in einer integrierten Schaltung und einem Sollwert Method and apparatus for determining the relationship between a RC time constant in an integrated circuit and a target value |
| 02/03/2005 | DE102004011452A1 System und Verfahren zum Auswerten der Geschwindigkeit einer Schaltung System and method for evaluating the speed of a circuit |
| 02/03/2005 | CA2533281A1 Method for configuration throughput of electronic circuits |
| 02/02/2005 | EP1503408A1 Method for measuring withstand voltage of semiconductor epitaxial wafer and semiconductor epitaxial wafer |
| 02/02/2005 | EP1503219A2 Secondary cell residual capacity calculation method and battery pack |
| 02/02/2005 | EP1503218A1 Method for diagnosing deterioration of coil and system for diagnosing deterioration of coil |
| 02/02/2005 | EP1503217A2 Electronic component test apparatus |
| 02/02/2005 | EP1503216A1 Sheet-form connector and production method and application therefor |
| 02/02/2005 | EP1502124A1 Multiple model systems and methods for testing electrochemical systems |
| 02/02/2005 | EP1502123A1 Device and method for testing printed circuit boards, and testing probe for said device and method |
| 02/02/2005 | EP1502121A1 Test apparatus |
| 02/02/2005 | EP1261972A4 Apparatus for testing memories with redundant storage elements |
| 02/02/2005 | EP1224479B1 Built-in spare row and column replacement analysis system for embedded memories |
| 02/02/2005 | EP1222709A4 Low power indication circuit for lead acid battery pack |
| 02/02/2005 | EP1210612A4 Apparatus for electrical testing of a substrate having a plurality of terminals |
| 02/02/2005 | EP1200847A4 A method and system for detecting arcing faults and testing such system |
| 02/02/2005 | EP1198717A4 Apparatus and method for fault detection on conductors |
| 02/02/2005 | EP1171247A4 Four electrical contact testing machine for miniature inductors and process of using |
| 02/02/2005 | EP1129343A4 Method and apparatus for determining battery properties from complex impedance/admittance |
| 02/02/2005 | EP0995226B1 Heat-transfer enhancing features for semiconductor carriers and devices |
| 02/02/2005 | EP0990166B1 Integrated circuit tester including at least one quasi-autonomous test instrument |
| 02/02/2005 | CN2676218Y Device for testing digital circuit |
| 02/02/2005 | CN2676217Y Burglar alarm for loss of phase and zero line drop of low-voltage circuit |