| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
|---|
| 02/10/2005 | US20050030056 Apparatus for measuring VS parameters in a wafer burn-in system |
| 02/10/2005 | US20050030055 Integrated circuit with test pad structure and method of testing |
| 02/10/2005 | US20050030053 Temperature and condensation control system for functional tester |
| 02/10/2005 | US20050030052 Temperature and condensation control system for functional tester |
| 02/10/2005 | US20050030051 Optics landing system and method therefor |
| 02/10/2005 | US20050030045 Ride through in electronic power converters |
| 02/10/2005 | US20050030043 Automatic transmission line pulse system |
| 02/10/2005 | US20050030041 Method for determining a steady state battery terminal voltage |
| 02/10/2005 | US20050030039 Handheld tester for starting/charging systems |
| 02/10/2005 | US20050030007 Pusher in an autohandler for pressing a semiconductor device |
| 02/10/2005 | US20050030005 Direct current detection circuit |
| 02/10/2005 | US20050029990 Safety method, device and system for an energy storage device |
| 02/10/2005 | US20050029988 System and method of battery capacity reporting |
| 02/10/2005 | US20050029661 Integrated circuit and associated test method |
| 02/10/2005 | US20050029226 Plasma etching using dibromomethane addition |
| 02/10/2005 | US20050028363 Contact structures and methods for making same |
| 02/10/2005 | DE60008789T2 Bitfehlerkarten-kompression mit signaturanalyse Bitfehlerkarten-compression with signature analysis |
| 02/10/2005 | DE19840167B4 Verfahren zur elektrischen Prüfung von Basismaterial für die Herstellung gedruckter Schaltungen und Verfahren zur Erzeugung einer elektrisch geprüften Leiterplatte A method for electrical testing of a base material for the production of printed circuits and methods for producing a circuit board electrically tested |
| 02/10/2005 | DE19514814B4 Übertragungsvorrichtung und Übertragungsverfahren für Kalibrierungsdaten eines Halbleiter-Testgeräts Transmission apparatus and transmission method for calibration data of a semiconductor test equipment |
| 02/10/2005 | DE10331830A1 Semiconductor functional test procedure uses two different clocks driving different circuit blocks separated in test phase by multiplexer |
| 02/10/2005 | DE10331092A1 Phase synchronization arrangement for electronic measurement units, especially network or spectrum analyzers, whereby each unit has a frequency generator with a phase locked loop with the generator outputs linked to each other |
| 02/10/2005 | DE10316357B4 Verfahren zur Überwachung von Leistungshalbleiterbauelementen The method for monitoring power semiconductor components |
| 02/10/2005 | DE10297600T5 Gerät und Verfahren zur Verarbeitung von Ereignissen für ereignisbasierte Hochgeschwindigkeitstestsysteme Apparatus and method for processing events for event-based high-speed test systems |
| 02/10/2005 | DE10297404T5 Mehrplateau-Batterieaufladeverfahren und -system, um das erste Plateau voll aufzuladen More Platforms-Batterieaufladeverfahren and system to fully charge the first plateau |
| 02/10/2005 | DE102004035470A1 Charge state measurement method for a rechargeable battery in which the battery has a discharging current pulse applied for a known duration after which a no-load voltage is measured at least once to indicate the charge state |
| 02/10/2005 | DE102004034446A1 Elektrische Stromdetektierungseinrichtung Electrical Stromdetektierungseinrichtung |
| 02/10/2005 | DE102004027883A1 Integrierte Speicherschaltungsbausteine und Betriebsverfahren, die ausgeführt sind, um Datenbits mit einer niedrigeren Rate in einer Testbetriebsart auszugeben An integrated circuit memory devices and operating procedures that are designed to output data bits at a lower rate in a test mode |
| 02/10/2005 | DE10158224B4 Mobiles optoelektronisches Testgerät für Kfz-Bremslichter, insbesondere an diversen Anhängerarten Mobile optoelectronic test device for car brake lights, especially in various kinds of trailers |
| 02/10/2005 | DE10116349B4 Vorrichtung und Verfahren zum Prüfen von Halbleitervorrichtungen Apparatus and method for testing semiconductor devices |
| 02/10/2005 | CA2533807A1 Body capacitance electric field powered device for high voltage lines |
| 02/09/2005 | EP1505403A1 Method for determining a parameter related to the state of the charge of a storage battery |
| 02/09/2005 | EP1505402A1 Method for predicting electric properties of an electrochemical storage-battery |
| 02/09/2005 | EP1505401A1 Battery capacity calculation method |
| 02/09/2005 | EP1505400A1 Scan capture frequency modulator |
| 02/09/2005 | EP1505399A2 Method for Generating Test Data for functional test of data processing circuits |
| 02/09/2005 | EP1505398A1 Direct current detection circuit |
| 02/09/2005 | EP1504382A1 Method and mechanism for improved performance analysis in transaction level models |
| 02/09/2005 | EP1504273A1 System for testing digital components |
| 02/09/2005 | EP1236111B1 Test pattern compression for an integrated circuit test environment |
| 02/09/2005 | CN2677947Y Integral digital AC.-DC two-purpose arc-welding power-supply testing system |
| 02/09/2005 | CN2677946Y Local discharge testing instrument |
| 02/09/2005 | CN2677945Y Nondistructive short-circuit detector |
| 02/09/2005 | CN2677944Y Device for detecting circuit board |
| 02/09/2005 | CN2677943Y Fault monitoring alarm device for traction rectifier |
| 02/09/2005 | CN1578534A 高速信道选择器开关 High-speed channel selector switch |
| 02/09/2005 | CN1578360A Method for single ended line testing and single ended line testing device |
| 02/09/2005 | CN1578148A 半导体集成电路 The semiconductor integrated circuit |
| 02/09/2005 | CN1578050A Charging apparatus and charging current detecting circuit thereof |
| 02/09/2005 | CN1578016A Socket for electronic elements |
| 02/09/2005 | CN1578008A Electric connector apparatus |
| 02/09/2005 | CN1578006A 插座装置 Outlet device |
| 02/09/2005 | CN1577952A Degradation judgment circuit for secondary battery |
| 02/09/2005 | CN1577930A Fuel cell system, fuel cell operation method, program, and recording medium |
| 02/09/2005 | CN1577843A Semiconductor device |
| 02/09/2005 | CN1577784A Writing buffer-supporting FLASH internal unit testing metod |
| 02/09/2005 | CN1577634A 半导体装置 Semiconductor device |
| 02/09/2005 | CN1577633A Method for reading out defect information item of self integrated chip and integrated memory chip |
| 02/09/2005 | CN1577632A 半导体集成电路装置 The semiconductor integrated circuit device |
| 02/09/2005 | CN1577631A Method for testing a circuit which is under test, and circuit configuration for carrying out the method |
| 02/09/2005 | CN1577469A Flat display apparatus and flat display apparatus testing method |
| 02/09/2005 | CN1576965A Mother substrate, substrate for display panel and method of manufacturing display panel |
| 02/09/2005 | CN1576957A Inspection apparatus for inspecting a display module |
| 02/09/2005 | CN1576876A Calibrating deviceand testing system for testing channel of calibrating and testing apparatus |
| 02/09/2005 | CN1576873A Verification system for verifying authenticity of a battery and method thereof |
| 02/09/2005 | CN1576872A 传感器信号检测装置 The sensor signal detection means |
| 02/09/2005 | CN1576871A System and method for testing semiconductor devices |
| 02/09/2005 | CN1576870A Conductive pattern check-up apparatus |
| 02/09/2005 | CN1576869A Method and apparatus for measuring response time of liquid crystal, and method and apparatus for driving liquid crystal display device using the same |
| 02/09/2005 | CN1576868A Semiconductor integrated circuit, and electrostatic withstand voltage test method and apparatus therefor |
| 02/09/2005 | CN1576867A Display panel inspection apparatus and inspection method |
| 02/09/2005 | CN1576866A Tester for energy-saving fuse of circuit mounted with fuse |
| 02/09/2005 | CN1576865A Method for automatic identifying circuit board type |
| 02/09/2005 | CN1576864A Insulation resistance tester for insulation bearing and detecting method |
| 02/09/2005 | CN1576782A Pattern inspection method and apparatus, and pattern alignment method |
| 02/09/2005 | CN1189072C Method for measuring device for plugging printed circuit board |
| 02/09/2005 | CN1188733C Support frame of displaying panel or detector block |
| 02/09/2005 | CN1188707C Multifunctional integrated power virtual test analysis method and its test analysis apparatus |
| 02/09/2005 | CN1188693C Instpection of printed citcuit board using color |
| 02/08/2005 | US6854081 Initializing/diagnosing system in on-chip multiprocessor system |
| 02/08/2005 | US6854080 Memory LSI failure analysis apparatus and analysis method thereof |
| 02/08/2005 | US6854079 Apparatus and method for reducing test resources in testing Rambus DRAMs |
| 02/08/2005 | US6854078 Multi-bit test circuit |
| 02/08/2005 | US6853941 Open-loop for waveform acquisition |
| 02/08/2005 | US6853939 Systems and methods for multiple winding impulse frequency response analysis test |
| 02/08/2005 | US6853744 System and method for confirming electrical connection defects |
| 02/08/2005 | US6853698 Ripple counter circuits and methods providing improved self-testing functionality |
| 02/08/2005 | US6853592 Semiconductor memory device permitting control of internal power supply voltage in packaged state |
| 02/08/2005 | US6853364 Liquid crystal display device |
| 02/08/2005 | US6853317 Circuit and method for generating mode register set code |
| 02/08/2005 | US6853231 Timing vernier using a delay locked loop |
| 02/08/2005 | US6853211 Method and system having switching network for testing semiconductor components on a substrate |
| 02/08/2005 | US6853209 Contactor assembly for testing electrical circuits |
| 02/08/2005 | US6853208 Vertical probe card |
| 02/08/2005 | US6853207 Method for evaluating contact pin integrity of electronic components having multiple contact pins |
| 02/08/2005 | US6853206 Method and probe card configuration for testing a plurality of integrated circuits in parallel |
| 02/08/2005 | US6853205 Probe card assembly |
| 02/08/2005 | US6853204 Wafer inspection method of charging wafer with a charged particle beam then measuring electric properties thereof, and inspection device based thereon |
| 02/08/2005 | US6853202 Non-stick detection method and mechanism for array molded laminate packages |
| 02/08/2005 | US6853196 Method and apparatus for electrical cable testing by pulse-arrested spark discharge |
| 02/08/2005 | US6853181 Silicon-on-insulator channel architecture for automatic test equipment |