| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 02/16/2005 | EP1507270A1 Apparatus for testing the ageing of a varistor |
| 02/16/2005 | EP1506571A2 Large substrate test system |
| 02/16/2005 | EP1506428A1 Method for calibrating and de-embedding, set of devices for de-embedding and vector network analyzer |
| 02/16/2005 | EP1506414A2 High peformance probe system for testing semiconductor wafers |
| 02/16/2005 | EP1364436A4 Method and apparatus for diagnosing failures in an integrated circuit using design-for-debug (dfd) techniques |
| 02/16/2005 | EP1118007B1 Method and apparatus for automotive and other battery testing |
| 02/16/2005 | CN2679699Y Detection circuit for electrical safety protector for electronic measurers |
| 02/16/2005 | CN2679698Y Monitoring warner for disconnection and short circuit |
| 02/16/2005 | CN2679232Y Test bench for electrical system performance of paver |
| 02/16/2005 | CN1582436A Admission control system for home video servers |
| 02/16/2005 | CN1582399A Electronic component with output buffer control |
| 02/16/2005 | CN1582398A Reconditioning integrated circuit for integrated circuit testing |
| 02/16/2005 | CN1582395A Method and system for compensating thermally induced motion of probe cards |
| 02/16/2005 | CN1581861A Break and shortbreak detection circuit |
| 02/16/2005 | CN1581564A Method for determining stable cell terminal voltage |
| 02/16/2005 | CN1581456A Crystal circle grade seamless link for memory semiconductor circuit |
| 02/16/2005 | CN1581359A Semiconductor testing apparatus using leakage current and compensation system for leakage current |
| 02/16/2005 | CN1581063A CPU card chip measuring method |
| 02/16/2005 | CN1580801A Boundary scanning-measuring method for circuit board |
| 02/16/2005 | CN1580800A Multifunctional detecting platform for liquid crystal display panel and its detecting method |
| 02/16/2005 | CN1580799A Boundary Scanning chain self-testing method |
| 02/16/2005 | CN1580798A Method for estimating semiconductor device |
| 02/16/2005 | CN1580797A Power cable local discharge on-line monitoring method and device |
| 02/16/2005 | CN1580796A DC. detection circuit and DC. earthing current detection circuit |
| 02/16/2005 | CN1580794A Method for on-line monitoring insulating hidden danger of double-pipe for transformer |
| 02/16/2005 | CN1580793A Method for measuring contact impedance of joint point of liquid crystal display panel and the liquid crystal display panel |
| 02/16/2005 | CN1580787A Probe device for flatboard display detection |
| 02/16/2005 | CN1580752A Method and device for synchronized determining hydrogen storage alloy structure and tissue change during charging-discharing circle |
| 02/16/2005 | CN1580735A Insulation diagnosis method for electric appliance |
| 02/16/2005 | CN1189932C Detection method of electric defect in inner conduting layer of tested area |
| 02/16/2005 | CN1189891C Examination method integrated circuit |
| 02/16/2005 | CN1189757C Automatic tester and its method for motherboard |
| 02/16/2005 | CN1189756C Inspection apparatus and sensor |
| 02/15/2005 | US6857094 Method and system for inferring fault propagation paths in combinational logic circuit |
| 02/15/2005 | US6857093 Semiconductor integrated circuit device capable of self-testing internal power supply currents provided to internal circuits integrated on chip |
| 02/15/2005 | US6857092 Method and apparatus to facilitate self-testing of a system on a chip |
| 02/15/2005 | US6857091 Method for operating a TAP controller and corresponding TAP controller |
| 02/15/2005 | US6857090 System and method for automatically analyzing and managing loss factors in test process of semiconductor integrated circuit devices |
| 02/15/2005 | US6857089 Differential receiver architecture |
| 02/15/2005 | US6857088 Method and system for testing the logic of a complex digital circuit containing embedded memory arrays |
| 02/15/2005 | US6856939 Fault assessment using fractional failure rates |
| 02/15/2005 | US6856936 Method and system to provide an improved time domain reflectrometry technique |
| 02/15/2005 | US6856409 Tool and method for evaluating a pin connector |
| 02/15/2005 | US6856174 Versatile system for high resolution device calibration |
| 02/15/2005 | US6856167 Field programmable gate array with a variably wide word width memory |
| 02/15/2005 | US6856162 AC/DC monitor system |
| 02/15/2005 | US6856161 Sensor array and method for detecting the condition of a transistor in a sensor array |
| 02/15/2005 | US6856160 Maximum VCC calculation method for hot carrier qualification |
| 02/15/2005 | US6856159 Contactless optical probe for use in semiconductor processing metrology |
| 02/15/2005 | US6856158 Comparator circuit for semiconductor test system |
| 02/15/2005 | US6856157 Method and device for testing electronic devices |
| 02/15/2005 | US6856155 Methods and apparatus for testing and burn-in of semiconductor devices |
| 02/15/2005 | US6856154 Test board for testing IC package and tester calibration method using the same |
| 02/15/2005 | US6856152 Impedance measuring device for printed wiring board |
| 02/15/2005 | US6856151 Conductive polymer contact system and test method for semiconductor components |
| 02/15/2005 | US6856149 Current detecting circuit AC/DC flyback switching power supply |
| 02/15/2005 | US6856143 System and method for measuring a capacitance of a conductor |
| 02/15/2005 | US6856138 Time-domain reflectometer for testing terminated network cable |
| 02/15/2005 | US6856137 Ground fault detection system and method |
| 02/15/2005 | US6856128 Semiconductor device testing apparatus and a test tray for use in the testing apparatus |
| 02/15/2005 | US6856127 Oscilloscope-based automatic finder for locating high power dissipation areas in switch-mode power supply (SMPS) switching devices |
| 02/15/2005 | US6856126 Differential voltage probe |
| 02/15/2005 | US6855569 Current leakage measurement |
| 02/15/2005 | US6855568 Apparatus and methods for monitoring self-aligned contact arrays using voltage contrast inspection |
| 02/15/2005 | CA2281587C Method and device for detecting partial discharges |
| 02/10/2005 | WO2005013591A1 Tone and probe set for non-intrusively identifying pairs in a telecommunications network |
| 02/10/2005 | WO2005013573A1 Testing method, communication device and testing system |
| 02/10/2005 | WO2005013546A1 Clock transfer unit and test equipment |
| 02/10/2005 | WO2005013332A2 Apparatus for planarizing a probe card and method using same |
| 02/10/2005 | WO2005013229A2 Circuit arrangement comprising a multi-wire line for supplying current and emitting signals |
| 02/10/2005 | WO2005013037A2 Method and apparatus for shifting at-speed scan patterns in a scan-based integrated circuit |
| 02/10/2005 | WO2005012933A1 Device and method for testing integrated circuits |
| 02/10/2005 | WO2005012930A1 Test device |
| 02/10/2005 | WO2005012929A1 Method for the diagnosis of driver outputs and diagnosis pulse manager |
| 02/10/2005 | WO2004095233A3 Apparatus and method for distance extension of fibre-channel over transport |
| 02/10/2005 | WO2004077528A3 A very small pin count ic tester |
| 02/10/2005 | WO2004040824A3 A multi-rate, multi-port, gigabit serdes transceiver |
| 02/10/2005 | WO2003041212A3 Non-linear transmission line using varactors and non-parallel waveguide |
| 02/10/2005 | US20050034044 Semiconductor test device and timing measurement method |
| 02/10/2005 | US20050034043 Test apparatus, correction value managing method, and computer program |
| 02/10/2005 | US20050034042 System and method for processing and identifying errors in data |
| 02/10/2005 | US20050034041 Integrated device with an improved BIST circuit for executing a structured test |
| 02/10/2005 | US20050034040 System and method for self-adaptive redundancy choice logic |
| 02/10/2005 | US20050034038 Scan capture frequency modulator |
| 02/10/2005 | US20050034037 Methods and apparatus for testing integrated circuits |
| 02/10/2005 | US20050034021 Semiconductor device and method for testing the same |
| 02/10/2005 | US20050033949 Test method, test receptacle and test arrangement for high-speed semiconductor memory devices |
| 02/10/2005 | US20050033535 Adaptive algorithm to control and characterize super-capacitor performance |
| 02/10/2005 | US20050032252 Testing apparatus for carrying out inspection of a semiconductor device |
| 02/10/2005 | US20050032229 Probe tip design applied in a flip chip packaging process |
| 02/10/2005 | US20050031186 Systems and methods for characterizing a three-dimensional sample |
| 02/10/2005 | US20050031029 Measuring apparatus and measuring method |
| 02/10/2005 | US20050030898 Using inter-packet gap as management channel |
| 02/10/2005 | US20050030822 Apparatus and method for reading out defect information items from an integrated chip |
| 02/10/2005 | US20050030693 Protective relay test device |
| 02/10/2005 | US20050030527 Multi beam scanning with bright/dark field imaging |
| 02/10/2005 | US20050030209 Signal processor and apparatus and method for testing same |
| 02/10/2005 | US20050030074 Semiconductor device having PLL-circuit |
| 02/10/2005 | US20050030069 Semiconductor test device |
| 02/10/2005 | US20050030057 Semiconductor test device using leakage current and compensation system of leakage current |