| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 02/23/2005 | CN1584620A Battery volume detecting method and detector |
| 02/23/2005 | CN1584619A Monitoring circuit of generator battery charger |
| 02/23/2005 | CN1584618A Chip core parallel packing circuit and method for system level chip test |
| 02/23/2005 | CN1584617A Method and compressing circuits carried by high code rate convolutional codes |
| 02/23/2005 | CN1584616A Automatic tester for semiconductor epitaxial sheet performance and testing method thereof |
| 02/23/2005 | CN1584615A Method and apparatus for industrial frequency voltage holding test of switch on column |
| 02/23/2005 | CN1584614A Single-phase grounding selection for small-current system |
| 02/23/2005 | CN1584613A Fault selecting method by attenuated DC component |
| 02/23/2005 | CN1584612A DC power supply system grounded fault detecting method and circuit |
| 02/23/2005 | CN1584609A Method and apparatus for measuring impedance across pressure joints in a power distribution system |
| 02/23/2005 | CN1584510A Modular self-diagnostic detector |
| 02/23/2005 | CN1190877C Method and apparatus for identifying battery |
| 02/22/2005 | US6859902 Method and apparatus for high speed IC test interface |
| 02/22/2005 | US6859770 Method and apparatus for generating transaction-based stimulus for simulation of VLSI circuits using event coverage analysis |
| 02/22/2005 | US6859743 Method for determining an effective voltage of a battery |
| 02/22/2005 | US6859698 Detachable cartridge unit and auxiliary unit for function expansion of a data processing system |
| 02/22/2005 | US6859070 Semiconductor integrated circuit device having flip-flops that can be reset easily |
| 02/22/2005 | US6859067 Semiconductor apparatus |
| 02/22/2005 | US6859062 Apparatus and method for inspecting a board used in a liquid crystal panel |
| 02/22/2005 | US6859061 Device for analyzing failure in semiconductor device provided with internal voltage generating circuit |
| 02/22/2005 | US6859060 Inspection method of semiconductor device and inspection system |
| 02/22/2005 | US6859059 Systems and methods for testing receiver terminations in integrated circuits |
| 02/22/2005 | US6859058 Method and apparatus for testing electronic devices |
| 02/22/2005 | US6859053 Probe apparatus manufacturing method thereof and substrate inspecting method using the same |
| 02/22/2005 | US6859052 Electric test of the interconnection of electric conductors on a substrate |
| 02/22/2005 | US6859045 Cable-testing adapter |
| 02/22/2005 | US6859043 Ergonomic multi-unit test fixture |
| 02/22/2005 | US6859041 Methods for locating faults in aircraft branch conductors and determining the distance to the faults |
| 02/22/2005 | US6859031 Apparatus and method for dynamic diagnostic testing of integrated circuits |
| 02/22/2005 | US6859028 Design-for-test modes for a phase locked loop |
| 02/22/2005 | US6858934 Semiconductor device structures including metal silicide interconnect structures that extend at least partially over transistor gate structures and methods for making the same |
| 02/22/2005 | US6858530 Method for electrically characterizing charge sensitive semiconductor devices |
| 02/22/2005 | US6858453 Integrated circuit package alignment feature |
| 02/22/2005 | US6858448 Method for evaluating and manufacturing a semiconductor device |
| 02/22/2005 | US6858447 Method for testing semiconductor chips |
| 02/22/2005 | US6857283 Semiconductor burn-in thermal management system |
| 02/22/2005 | CA2204786C Method and device for quantitatively determining the setting of an alternator |
| 02/22/2005 | CA2096683C Method of and apparatus for automated sensor diagnosis through quantitative measurement of one of sensor-to-earth conductance or loop resistance |
| 02/19/2005 | CA2477606A1 Method and apparatus for measuring impedance across pressure joints in a power distribution system |
| 02/17/2005 | WO2005015252A1 Method for judging deterioration of accumulator, method for measuring secondary cell internal impedance, device for measuring secondary cell internal impedance, device for judging deterioration of secondary cell, and power source system |
| 02/17/2005 | WO2005015251A1 Integrated circuit with bit error test capability |
| 02/17/2005 | WO2005015250A1 Test device, correction value management method, and program |
| 02/17/2005 | WO2005015249A2 Electronic element comprising an electronic circuit which is to be tested and test system arrangement which is used to test the electronic element |
| 02/17/2005 | WO2005015248A1 Digital data signal testing using arbitrary test signal |
| 02/17/2005 | WO2005015245A2 Test head positioning system |
| 02/17/2005 | WO2005015188A1 Scanning probe inspection apparatus |
| 02/17/2005 | WO2004106945A3 Electronic component testing apparatus |
| 02/17/2005 | WO2004106944A3 Electronic part test device |
| 02/17/2005 | WO2004010522A3 Method and apparatus for fuel cell protection |
| 02/17/2005 | US20050039099 Systems and methods for testing a device-under-test |
| 02/17/2005 | US20050039098 Apparatus and method for self testing programmable logic arrays |
| 02/17/2005 | US20050039094 Static timing analysis approach for multi-clock domain designs |
| 02/17/2005 | US20050039093 Automatic scan-based testing of complex integrated circuits |
| 02/17/2005 | US20050039092 Reprogramming system including reprogramming symbol |
| 02/17/2005 | US20050039088 High speed comparator for 10G SERDES |
| 02/17/2005 | US20050039079 Test emulator, test module emulator, and record medium storing program therein |
| 02/17/2005 | US20050039077 Method and apparatus for solving bit-slice operators |
| 02/17/2005 | US20050038950 Storage device having a probe and a storage cell with moveable parts |
| 02/17/2005 | US20050038640 Method and apparatus for automatically testing the design of a simulated integrated circuit |
| 02/17/2005 | US20050038623 In-operation test of a signal path |
| 02/17/2005 | US20050038616 Method and apparatus for diagnosing jitter tolerance |
| 02/17/2005 | US20050038614 Remote battery monitoring systems and sensors |
| 02/17/2005 | US20050038613 Apparatus and method for inspecting electrical continuity of circuit board, jig for use therein, and recording medium thereon |
| 02/17/2005 | US20050038554 Inspection and metrology module cluster tool |
| 02/17/2005 | US20050036578 On-chip jitter measurement circuit |
| 02/17/2005 | US20050036576 Multi-pair gigabit ethernet transceiver |
| 02/17/2005 | US20050036485 Network having switchover with no data loss |
| 02/17/2005 | US20050036444 WDM bidirectional add/drop self-healing hubbed ring network |
| 02/17/2005 | US20050036374 Probe card substrate |
| 02/17/2005 | US20050036371 Semiconductor memory including error correction function |
| 02/17/2005 | US20050036355 Semiconductor memory device capable of testing data line redundancy replacement circuit |
| 02/17/2005 | US20050036352 Self-heating burn-in |
| 02/17/2005 | US20050036306 Flashlight having a power indication function |
| 02/17/2005 | US20050036275 Insert and electronic component handling apparatus comprising the same |
| 02/17/2005 | US20050036250 Power converter apparatus and method for controlling the same |
| 02/17/2005 | US20050036249 Threshold adjustment accuracy for ground fault condition determination |
| 02/17/2005 | US20050036151 Method and device for opically testing semiconductor elements |
| 02/17/2005 | US20050035805 Circuit for inspecting semiconductor device and inspecting method |
| 02/17/2005 | US20050035778 Flip-over alignment station for probe needle adjustment |
| 02/17/2005 | US20050035777 Probe holder for testing of a test device |
| 02/17/2005 | US20050035776 Frame transfer prober |
| 02/17/2005 | US20050035774 System for measuring signal path resistance for an integrated circuit tester interconnect structure |
| 02/17/2005 | US20050035772 Method and device for determining the ratio between an RC time constant in an integrated circuit and a set value |
| 02/17/2005 | US20050035768 Method and electromagnetic sensor for measuring partial discharges in windings of electrical devices |
| 02/17/2005 | US20050035767 Plug detector for an electrical test instrument |
| 02/17/2005 | US20050035754 Socket connection test modules and methods of using the same |
| 02/17/2005 | US20050035753 Testing a multi-channel device |
| 02/17/2005 | US20050035752 Alternator tester |
| 02/17/2005 | US20050035750 Built-in self-test apparatus and method for digital-to-analog converter |
| 02/17/2005 | US20050035743 Detecting method and detecting apparatus for detecting internal of rechargeable battery, rechargeable battery pack having said detecting apparatus therein, apparatus having said detecting apparatus therein, program in which said detecting method is incorporated, and medium in which said program is stored |
| 02/17/2005 | US20050035742 Method and system for calculating available power of a battery |
| 02/17/2005 | US20050035739 Power control device and the operating method thereof |
| 02/17/2005 | US20050035347 Probe card assembly |
| 02/17/2005 | DE10392497T5 Herstellungsverfahren und Herstellungsvorrichtung zum Vermeiden eines Prototypen-Aufschubs bei der ASIC/SOC-Herstellung Manufacturing process and manufacturing apparatus for avoiding a prototype deferral in ASIC / SOC-production |
| 02/17/2005 | DE10350356B3 Integrated circuit e.g. memory circuit, with test circuit for read-out of fault data during test mode supplying fault data to alternate data outputs in response to different read commands |
| 02/17/2005 | DE10333396A1 Drehmoment-Meßvorrichtung für Elektromotoren und Verfahren zur Messung des Drehmoments eines Elektromotors Torque measuring apparatus for electric motors and method for measuring the torque of an electric motor |
| 02/17/2005 | DE10332008A1 Elektrische Schaltung sowie Verfahren zum Testen von elktronischen Bauteilen Electrical circuit and method for testing components elktronischen |
| 02/17/2005 | DE10331543A1 Verfahren zum Testen einer zu testenden Schaltungseinheit und Schaltungsanordnung zur Durchführung des Verfahrens A method of testing a circuit under test unit and circuit arrangement for carrying out the method |
| 02/17/2005 | DE10331068A1 Verfahren zum Auslesen von Fehlerinformationen aus einem integrierten Baustein und integrierter Speicherbaustein A method for extraction of fault information from an integrated module and an integrated memory chip |
| 02/16/2005 | EP1507326A1 Secondary cell charger and charging method |