| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 03/01/2005 | US6862548 Methods and circuits for measuring clock skew on programmable logic devices |
| 03/01/2005 | US6862546 Integrated adjustable short-haul/long-haul time domain reflectometry |
| 03/01/2005 | US6862538 Induction motor module and motor incorporating same |
| 03/01/2005 | US6862504 System and method for detecting alternator condition |
| 03/01/2005 | US6862489 System and method of monitoring, predicting and optimizing production yields in a liquid crystal display (LCD) manufacturing process |
| 03/01/2005 | US6862405 Apparatus, method and system of liquid-based, wide range, fast response temperature control of electric devices |
| 03/01/2005 | US6862233 Method and circuit for determining sense amplifier sensitivity |
| 03/01/2005 | US6861887 Clocked-scan flip-flop for multi-threshold voltage CMOS circuit |
| 03/01/2005 | US6861867 Method and apparatus for built-in self-test of logic circuits with multiple clock domains |
| 03/01/2005 | US6861866 System on chip (SOC) and method of testing and/or debugging the system on chip |
| 03/01/2005 | US6861863 Inspection apparatus for conductive patterns of a circuit board, and a holder thereof |
| 03/01/2005 | US6861861 Device for compensating for a test temperature deviation in a semiconductor device handler |
| 03/01/2005 | US6861860 Integrated circuit burn-in test system and associated methods |
| 03/01/2005 | US6861859 Testing circuits on substrates |
| 03/01/2005 | US6861857 Apparatus and method for positioning an integrated circuit for test |
| 03/01/2005 | US6861856 Guarded tub enclosure |
| 03/01/2005 | US6861855 High density interconnection test connector especially for verification of integrated circuits |
| 03/01/2005 | US6861854 Peizoelectric microactuator and sensor failure detection in disk drives |
| 03/01/2005 | US6861845 Fault locator |
| 03/01/2005 | US6861842 Method for determining the amount of charge which can still be drawn from an energy storage battery, and an energy storage battery |
| 03/01/2005 | US6861835 Method and system for non-invasive power transistor die voltage measurement |
| 03/01/2005 | US6861666 Apparatus and methods for determining and localization of failures in test structures using voltage contrast |
| 03/01/2005 | US6859990 Characteristics evaluation method of intermediate layer circuit |
| 02/25/2005 | CA2478577A1 Integrated printed circuit board and test contactor for high speed semiconductor testing |
| 02/24/2005 | WO2005017997A1 Charged particle beam inspection |
| 02/24/2005 | WO2005017961A2 Plasma etching using dibromomethane addition |
| 02/24/2005 | WO2005017959A2 Integrated circuit with test pad structure and method of testing |
| 02/24/2005 | WO2005017648A2 System and method for processing and identifying errors in data |
| 02/24/2005 | WO2005017545A1 Secondary battery voltage correcting method and unit and battery residual capacity estimating method and unit |
| 02/24/2005 | WO2005017543A1 Temperature control device and temperature control method |
| 02/24/2005 | WO2005017542A2 Calibration of tester and testboard by golden sample |
| 02/24/2005 | WO2005017541A1 Method and circuit arrangement for monitoring the mode of operation of one or more load circuits, especially of a domestic appliance |
| 02/24/2005 | WO2005005996A3 Apparatus and method for electromechanical testing and validation of probe cards |
| 02/24/2005 | WO2004095280A3 Diagnostic data capture within an integrated circuit |
| 02/24/2005 | WO2004075418A3 Method and apparatus for transmitting information within a communication system |
| 02/24/2005 | US20050044463 Programmable jitter generator |
| 02/24/2005 | US20050044462 Apparatus and method for testing circuit units to be tested |
| 02/24/2005 | US20050044461 Semiconductor device test circuit and semiconductor device |
| 02/24/2005 | US20050044460 Mapping test mux structure |
| 02/24/2005 | US20050044458 Testing board for semiconductor memory, method of testing semiconductor memory and method of manufacturing semiconductor memory |
| 02/24/2005 | US20050044055 Method and apparatus for case-based learning |
| 02/24/2005 | US20050043912 Memory testing apparatus and method |
| 02/24/2005 | US20050043909 Method for measuring integrated circuit processor power demand and associated system |
| 02/24/2005 | US20050043908 Circuits and methods for characterizing random variations in device characteristics in semiconductor integrated circuits |
| 02/24/2005 | US20050043826 Method and apparatus for positioning a test head on a printed circuit board |
| 02/24/2005 | US20050043226 having a building unit containing one nitrogen atom of the peptide backbone connected to a bridging group comprising an amide, thioether, thioester, or disulfide; used to treat cancers, diabetes, diabetic-associated complications, endocrine disorders, gastrointestinal disorders, and pancreatitis |
| 02/24/2005 | US20050042932 Construction structures and manufacturing processes for integrated circuit wafer probe card assemblies |
| 02/24/2005 | US20050042905 Contact pin and socket for electrical parts |
| 02/24/2005 | US20050041849 Whole-wafer photoemission analysis |
| 02/24/2005 | US20050041727 PHY control module for a multi-pair gigabit transceiver |
| 02/24/2005 | US20050041599 Method and apparatus for maintaining consistent per-hop forwarding behavior in a network using network-wide per-hop behavior definitions |
| 02/24/2005 | US20050041493 Semiconductor storage device |
| 02/24/2005 | US20050041482 Semiconductor device suitable for system in package |
| 02/24/2005 | US20050041454 Failure analysis vehicle for yield enhancement with self test at speed burnin capability for reliability testing |
| 02/24/2005 | US20050041393 Temperature control system which sprays liquid coolant droplets against an IC-module at a sub-atmospheric pressure |
| 02/24/2005 | US20050040901 System and method for measuring current |
| 02/24/2005 | US20050040870 System toTemporarily Modify an Output Waveform |
| 02/24/2005 | US20050040858 Method and system to temporarily modify an output waveform |
| 02/24/2005 | US20050040842 Electrical connection plug for remote monitoring of high voltage motors |
| 02/24/2005 | US20050040841 Method and circuit for testing a regulated power supply in an integrated circuit |
| 02/24/2005 | US20050040840 Method for monitoring quality of an insulation layer |
| 02/24/2005 | US20050040839 System and method for testing devices utilizing capacitively coupled signaling |
| 02/24/2005 | US20050040838 Apparatus for functional and stress testing of exposed chip land grid array devices |
| 02/24/2005 | US20050040837 System for evaluating probing networks |
| 02/24/2005 | US20050040835 Method and apparatus for measuring impedance across pressure joints in a power distribution system |
| 02/24/2005 | US20050040830 Integrated circuit for testing circuit components of a semiconductor chip |
| 02/24/2005 | US20050040829 Battery power detecting method and device |
| 02/24/2005 | US20050040812 Test head manipulator |
| 02/24/2005 | US20050040811 Universal test interface between a device under test and a test head |
| 02/24/2005 | US20050040810 System for and method of controlling a VLSI environment |
| 02/24/2005 | US20050040809 Power line property measurement devices and power line fault location methods, devices and systems |
| 02/24/2005 | US20050040488 a-C:H ISFET device, manufacturing method, and testing methods and apparatus thereof |
| 02/24/2005 | US20050040487 a-C:H ISFET device, manufacturing method, and testing methods and apparatus thereof |
| 02/24/2005 | US20050040331 Inspection method and inspection apparatus using electron beam |
| 02/24/2005 | US20050040155 Unit for varying a temperature of a test piece and testing instrument incorporating same |
| 02/24/2005 | DE10336903A1 High frequency screening electrical contact element sealing quality assessment procedure measures contact surface impedance between adjustable rollers |
| 02/24/2005 | DE10336055A1 Schaltungsanordnung mit einer Mehrdrahtleitung zur Stromversorgung und Signalausgabe Circuit with a multi-wire cable for power supply and signal output |
| 02/24/2005 | DE10328719A1 Vorrichtung und Verfahren zum Testen von elektronischen Bauteilen Apparatus and method for testing electronic components |
| 02/24/2005 | DE10235008B4 Verfahren und Einheit zum Berechnen des Degradationsgrades für eine Batterie Method and unit for calculating the Degradationsgrades for a battery |
| 02/24/2005 | DE102004033136A1 Test data compressing method for testing electronic device-under-test e.g. microprocessor, involves compressing two sets of test data using respective compression techniques |
| 02/24/2005 | DE102004032197A1 Leistungsmodul für Kraftfahrzeuge Power module for motor vehicles |
| 02/24/2005 | DE10064478B4 Verfahren zur Prüfung einer integrierten Schaltung und Schaltungsanordnung A method for testing an integrated circuit and the circuit arrangement |
| 02/23/2005 | EP1508842A2 Condition monitoring of an electrical machine |
| 02/23/2005 | EP1508813A1 Spectral jitter analysis allowing jitter modulation waveform analysis |
| 02/23/2005 | EP1508812A1 Scan-test method and circuit using a substitute enable signal |
| 02/23/2005 | EP1508811A2 Method and apparatus for measuring impedance |
| 02/23/2005 | EP1444729B1 Large area silicon carbide devices and manufacturing methods therefor |
| 02/23/2005 | EP1395840B1 Fault detection system and method |
| 02/23/2005 | EP1296154B1 Semiconductor integrated circuit |
| 02/23/2005 | EP1146343B1 Adapting Scan-BIST architectures for low power operation |
| 02/23/2005 | EP0909380B1 Model-based fault detection system for electric motors |
| 02/23/2005 | CN2681148Y Electrical circuit perfecting and monitoring system |
| 02/23/2005 | CN2681147Y Anti-theft alarm device for power line |
| 02/23/2005 | CN2681146Y Burglar alarm for communication cable |
| 02/23/2005 | CN2681141Y Probe improvement for composite fixture |
| 02/23/2005 | CN1585901A Test probe for a finger tester and corresponding finger tester |
| 02/23/2005 | CN1585310A GPS receiver testing system of communication network mobile platform and testing method thereof |
| 02/23/2005 | CN1585270A Condition monitor system responsive to different input pulses |
| 02/23/2005 | CN1585030A Outputting circuit for detecting cable connection on outputting end, related apparatus and method thereof |
| 02/23/2005 | CN1584719A LCD device |