| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 03/03/2005 | WO2005019846A1 Power line property measurement devices and power line fault location methods,devices and systems |
| 03/03/2005 | WO2005019845A1 Threshold adjustment accuracy for ground fault condition determination |
| 03/03/2005 | WO2005019031A1 Methods and apparatus for passive illumination of refueling hoses |
| 03/03/2005 | WO2005002294A3 Gas-collecting unit, test head, and ic device testing apparatus |
| 03/03/2005 | WO2004113939A3 Method and apparatus for judging deterioration of battery |
| 03/03/2005 | WO2004102056A3 Systems and methods for non-destructively testing conductive members employing electromagnetic back scattering |
| 03/03/2005 | WO2004088331A3 Method of precisely determining the location of a fault on an electrical transmision system |
| 03/03/2005 | WO2004012289B1 Low loss fuel cell configuration |
| 03/03/2005 | US20050050506 System and method for determining connectivity of nets in a hierarchical circuit design |
| 03/03/2005 | US20050050423 Fault diagnosis apparatus |
| 03/03/2005 | US20050050422 Semiconductor integrated circuit |
| 03/03/2005 | US20050050421 Semiconductor integrated circuit device and error detecting method therefor |
| 03/03/2005 | US20050050420 Integrated circuit with self-testing circuit |
| 03/03/2005 | US20050050419 Self-synchronizing pseudorandom bit sequence checker |
| 03/03/2005 | US20050050418 Method and apparatus for generating signal transitions used for testing an electronic device |
| 03/03/2005 | US20050050417 Scan-mode indication technique for an integrated circuit |
| 03/03/2005 | US20050050416 Scan chain modification for reduced leakage |
| 03/03/2005 | US20050050415 Method for separating shift and scan paths on scan-only, single port lssd latches |
| 03/03/2005 | US20050050414 Hierarchical access of test access ports in embedded core integrated circuits |
| 03/03/2005 | US20050050413 Selectively accessing test access ports in a multiple test access port environment |
| 03/03/2005 | US20050050412 Semiconductor circuit apparatus and test method thereof |
| 03/03/2005 | US20050049833 Method and a system for evaluating aging of components, and computer program product therefor |
| 03/03/2005 | US20050049812 Universal test platform and test method for latch-up |
| 03/03/2005 | US20050049811 System and method for indication of fuse defects based upon analysis of fuse test data |
| 03/03/2005 | US20050049809 Analog circuit automatic calibration system |
| 03/03/2005 | US20050049806 Method for canceling transient errors in unsynchronized digital current differential transmission line protection systems |
| 03/03/2005 | US20050048359 Battery, device and charger |
| 03/03/2005 | US20050048336 Fuel cell system, and operation and program for same |
| 03/03/2005 | US20050047555 xDSL line tester |
| 03/03/2005 | US20050047499 System and method for measuring the response time of a differential signal pair squelch detection circuit |
| 03/03/2005 | US20050047495 Semiconductor integrated circuit device and method of testing the same |
| 03/03/2005 | US20050047260 Semiconductor integrated circuit |
| 03/03/2005 | US20050047224 Partial good integrated circuit and method of testing same |
| 03/03/2005 | US20050047202 Magnetic random access memory having test circuit and test method therefor |
| 03/03/2005 | US20050046555 Condition monitor system responsive to different input pulses |
| 03/03/2005 | US20050046473 Semiconductor integrated circuit |
| 03/03/2005 | US20050046439 Combining detection circuit for a display panel |
| 03/03/2005 | US20050046436 Calibration device for the calibration of a tester channel of a tester device and a test system |
| 03/03/2005 | US20050046434 System LSI |
| 03/03/2005 | US20050046433 Integrated printed circuit board and test contactor for high speed semiconductor testing |
| 03/03/2005 | US20050046431 Probe card for use with microelectronic components,and methods for making same |
| 03/03/2005 | US20050046430 RF testing method and arrangement |
| 03/03/2005 | US20050046428 Capacitive probe assembly with flex circuit |
| 03/03/2005 | US20050046426 Simulated module load |
| 03/03/2005 | US20050046425 Potentiometer device for determination of valve positions |
| 03/03/2005 | US20050046412 Apparatus for the automated testing, calibration and characterization of test adapters |
| 03/03/2005 | US20050046411 Methods and apparatus for creating a high speed connection between a device under test and automatic test equipment |
| 03/03/2005 | US20050046410 External verification of package processed linewidths and spacings in semiconductor packages |
| 03/03/2005 | US20050046392 Battery control circuit and electronic device |
| 03/03/2005 | US20050046390 Information processing apparatus and method of displaying remaning battery capacity of the information processing apparatus |
| 03/03/2005 | US20050046389 Method for counting cycle count of a smart battery and method and device for correcting full charge capacity of a smart battery using the same |
| 03/03/2005 | US20050046388 Simple optimal estimator for PbA state of charge |
| 03/03/2005 | US20050046019 Voltage contrast monitor for integrated circuit defects |
| 03/03/2005 | US20050045878 Gate oxide measurement apparatus |
| 03/03/2005 | DE202004019162U1 Vehicle electrical connector test unit has support area arranged around contact area so as to avoid contact area |
| 03/03/2005 | DE202004018707U1 Automatic safety test system for electronic products has bus interfaces to connect test instruments through server unit to product test points |
| 03/03/2005 | DE10336604A1 Verfahren und Schaltungsanordnung zur Überwachung der Funktionsweise eines oder mehrerer Verbraucherstromkreise, insbesondere eines Hausgeräts Method and circuit for monitoring the functioning of one or more load circuits, in particular a household appliance |
| 03/03/2005 | DE10334548A1 Verfahren zum Kontaktieren von zu testenden Schaltungseinheiten und selbstplanarisierende Prüfkarteneinrichtung zur Durchführung des Verfahrens Method of contacting of circuit to be tested units and selbstplanarisierende probe card assembly for performing the method |
| 03/03/2005 | DE10334061A1 Car access control system antenna circuit diagnosis unit switches antenna to static diagnosis unit with exact resistors in supply path |
| 03/03/2005 | DE10333397A1 Drehmoment-Meßvorrichtung für Elektromotoren Torque-measuring device for electric motors |
| 03/03/2005 | DE10333101A1 Kalibrierungseinrichtung für die Kalibrierung eines Testerkanals einer Testereinrichtung und ein Testsystem Calibration means for calibration of a tester channel of a tester apparatus and a test system |
| 03/03/2005 | DE10325446B3 Verfahren zum Detektieren eines Fehlers bei einem Piezoaktor und Ansteuerschaltung für einen Piezoaktor, sowie Piezoaktorsystem A method for detecting a fault in a drive circuit for a piezoelectric actuator and piezoelectric actuator, and Piezoaktorsystem |
| 03/03/2005 | DE102004031424A1 Mikrochemischer Chip und Verfahren zu dessen Herstellung Microchemical chip and process for its preparation |
| 03/03/2005 | DE10013553B4 Delay device for delaying incoming transmission signals in electronic instrument, has delay elements operating on power supply voltages, connected in series, and with a switch unit that outputs one of outputs of delay elements |
| 03/02/2005 | EP1510829A1 Scan chain modification for reduced leakage |
| 03/02/2005 | EP1510826A1 Integrated printed circuit board and test contactor for high speed semiconductor testing |
| 03/02/2005 | EP1510788A2 Potentiometer device for detecting the position of a valve |
| 03/02/2005 | EP1509796A1 Laser production and product qualification via accelerated life testing based on statistical modeling |
| 03/02/2005 | EP1509779A2 Methods and apparatus for indicating a fault condition in fuel cells and fuel cell components |
| 03/02/2005 | EP1509778A1 Cell with fixed output voltage for integrated circuit |
| 03/02/2005 | EP1509777A1 Automatic teaching method for printed circuit board inspection system |
| 03/02/2005 | EP1509323A1 Fischer-tropsch catalyst prepared with a high purity iron precursor |
| 03/02/2005 | EP1395841B1 Low noise microwave synthesizer employing high frequency combs for tuning drift cancel loop |
| 03/02/2005 | CN2682709Y IGBT overcurrent processing circuit for middle and high voltage frequency converter |
| 03/02/2005 | CN2682428Y Dark line defect detector |
| 03/02/2005 | CN2682427Y Transmission network fault location device based on travelling wave time deviation |
| 03/02/2005 | CN2682426Y Comprehensive detector for automotive appliances |
| 03/02/2005 | CN1589070A Mother plate glass for organic electriluminescent display and its ageing line producing method |
| 03/02/2005 | CN1588804A Method and its device for broad band signal frequency band separating and signal synthesizing |
| 03/02/2005 | CN1588716A Filling liquid heat conductive medium temperature control device for semiconductor laser parameter test |
| 03/02/2005 | CN1588636A Detecting clamp and its top cover |
| 03/02/2005 | CN1588305A Design method for switch equipment on-line state monitor special chip |
| 03/02/2005 | CN1588255A DC power screen intelligent monitor and control method |
| 03/02/2005 | CN1588182A Pressure programming electrical property detecting device and method |
| 03/02/2005 | CN1588114A Quick correcting method for multiple test port |
| 03/02/2005 | CN1588108A Load current detection method for circuit breaker |
| 03/02/2005 | CN1588107A Latching effect detecting method for CMOS circuit |
| 03/02/2005 | CN1588105A Semiconductor laser tube core detector |
| 03/02/2005 | CN1588104A MOS device hot carrier injection effect measuring method |
| 03/02/2005 | CN1588103A Automatic detector for dielectric strength between commutator segments |
| 03/02/2005 | CN1588102A Breakdown test method for medium relative to time in high temperature constant electric field |
| 03/02/2005 | CN1588101A Accurately positioning method and device for underground layered power cable defect position |
| 03/02/2005 | CN1588100A Method for quick detecting multiple strand different cable |
| 03/02/2005 | CN1588097A Intelligent pulse current multiple parameter digital measurer based on non-linear resistance sheet |
| 03/02/2005 | CN1191701C Non-contact signal analyzer |
| 03/02/2005 | CN1191585C Self-analyzing semiconductor IC unit capable of carrying out redundant replacement with installed memory circrits |
| 03/02/2005 | CN1191478C Battery powering detection method and system |
| 03/02/2005 | CN1191477C Electrical characteristics determining device |
| 03/01/2005 | US6862717 Method and program product for designing hierarchical circuit for quiescent current testing |
| 03/01/2005 | US6862705 System and method for testing high pin count electronic devices using a test board with test channels |