Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
03/2005
03/10/2005US20050052195 Probe pins zero-point detecting method, and prober
03/10/2005US20050052192 In-situ electron beam induced current detection
03/10/2005US20050052191 In situ determination of resistivity, mobility and dopant concentration profiles
03/10/2005US20050052190 Digital time domain reflectometer sytem
03/10/2005US20050052187 Method and apparatus for measuring a parameter of a vehicle electrical system
03/10/2005US20050052186 Circuit testing device for testing electrical subsystems of vehicles
03/10/2005US20050052176 Test head manipulator
03/10/2005US20050052158 Method for prediction of electrical characteristics of an electrochemical storage battery
03/10/2005US20050051353 Massively parallel interface for electronic circuit
03/09/2005EP1513384A2 Electronic circuit unit having small size and good productivity
03/09/2005EP1512980A2 Loaded-board, guided-probe test fixture
03/09/2005EP1512979A2 Loaded-board, guided-probe test fixture
03/09/2005EP1512978A2 Loaded-board, guided-probe test fixture
03/09/2005EP1512977A2 Loaded-board, guided-probe test fixture
03/09/2005EP1512024A1 Module-testing device
03/09/2005EP1512023A1 Device for testing cables provided with luminous signals
03/09/2005EP1390772B1 Method of predicting the available energy of a battery
03/09/2005EP1344071B1 Asynchronous reset circuit testing
03/09/2005EP1145612B1 Method for mounting an electronic component
03/09/2005CN2684354Y Polarity classifying baiting plate
03/09/2005CN2684208Y An experimental device for implementing genuine idling of asynchronous motor
03/09/2005CN2684207Y Prick mark proof testing device
03/09/2005CN2684206Y Film probe tester
03/09/2005CN2684205Y Fast detecting device for dynamic electrocardiographic lead line
03/09/2005CN2684204Y Testing device of anion generator
03/09/2005CN1592854A Time resolved non-invasive diagnostics system
03/09/2005CN1592558A Electronic circuit unit
03/09/2005CN1592023A Output voltage adjustable combined battery
03/09/2005CN1591986A Small contactor pin
03/09/2005CN1591811A Method of defect management system
03/09/2005CN1591696A 半导体集成电路 The semiconductor integrated circuit
03/09/2005CN1591693A Flash memory with pre-detection for data loss
03/09/2005CN1591671A Semiconductor integrated circuit device and error detecting method therefor
03/09/2005CN1591254A Inspecting device and programming tool
03/09/2005CN1591246A Analog circuit automatic calibration system
03/09/2005CN1591037A Method and apparatus for measuring lampbulb effect
03/09/2005CN1591036A Method and apparatus for scanning mode running static time sequence analysis
03/09/2005CN1591035A Test arrangement and method for selecting a test mode output channel
03/09/2005CN1591034A 半导体集成电路 The semiconductor integrated circuit
03/09/2005CN1591033A Method for small current grounding selecting wire and fault positioning
03/09/2005CN1591032A Method and apparatus for testing capacitor of printed circuitboard
03/09/2005CN1591031A System for debugging inspecting apparatus
03/09/2005CN1591030A Inspecting apparatus and waveform display apparatus
03/09/2005CN1591029A Automation inspecting method of memory body assembled state
03/09/2005CN1591028A Combined detecting circuit for display panel
03/09/2005CN1591024A Electric connector
03/09/2005CN1590996A Oscillation detecting method and its device
03/09/2005CN1192668C GSM tramsceiver unit equiped for time of arrival measurements and method for determining mobile user position
03/09/2005CN1192422C Probe card for testing semiconductor device and method for testing semiconductor device
03/09/2005CN1192244C Electric device with accumulator and method for detecting accumulator off
03/09/2005CN1192243C 半导体测试系统 Semiconductor Test Systems
03/09/2005CN1192242C Lead frame structure for testing integrated circuits
03/09/2005CN1192241C Method and device for testing printed circuit board
03/09/2005CN1192228C Apparatus and method for detecting memory effect in nickel-cadmium batteries
03/08/2005US6865723 Method for insertion of test points into integrated logic circuit designs
03/08/2005US6865707 Test data generator
03/08/2005US6865706 Apparatus and method for generating a set of test vectors using nonrandom filling
03/08/2005US6865705 Semiconductor integrated circuit device capable of switching mode for trimming internal circuitry through JTAG boundary scan method
03/08/2005US6865704 Scan multiplexing for increasing the effective scan data exchange rate
03/08/2005US6865703 Scan test system for semiconductor device
03/08/2005US6865698 Method and apparatus for testing semiconductor devices
03/08/2005US6865693 System and method for debugging multiprocessor systems
03/08/2005US6865503 Method and apparatus for telemetered probing of integrated circuit operation
03/08/2005US6865502 Method and system for logic verification using mirror interface
03/08/2005US6865501 Using clock gating or signal gating to partition a device for fault isolation and diagnostic data collection
03/08/2005US6865500 Method for testing analog circuits
03/08/2005US6865257 Method for resolving trouble in a connection having a plurality of components
03/08/2005US6865256 Method and apparatus for determining properties of a transmission channel
03/08/2005US6865234 Pair-swap independent trellis decoder for a multi-pair gigabit transceiver
03/08/2005US6865149 Dynamically allocated ring protection and restoration technique
03/08/2005US6865148 Method for routing network switching information
03/08/2005US6865005 Three-dimensional photonic crystal
03/08/2005US6864859 Apparatus for inputting and detecting a display data channel in manufacturing a monitor
03/08/2005US6864719 Semiconductor device protecting built-in transistor from the voltage applied at test mode
03/08/2005US6864703 Electrical inspection method and method of fabricating semiconductor display devices
03/08/2005US6864702 System for oxide stress testing
03/08/2005US6864699 Apparatus for testing integrated circuits having an integrated unit for testing digital and analog signals
03/08/2005US6864698 Hybrid cooling system for automatic test equipment
03/08/2005US6864697 Flip-over alignment station for probe needle adjustment
03/08/2005US6864695 Semiconductor device testing apparatus and semiconductor device manufacturing method using it
03/08/2005US6864694 Voltage probe
03/08/2005US6864693 Semiconductor integrated circuit with negative voltage generation circuit, test method for the same, and recording device and communication equipment having the same
03/08/2005US6864688 Apparatus and method of monitoring insulation of a DC network that is electrically insulated with respect to the ground potential of a device
03/08/2005US6864678 Nestless plunge mechanism for semiconductor testing
03/08/2005US6864675 Mark forming method, mark forming apparatus and analyzing apparatus
03/08/2005US6864674 Loss measurement system
03/08/2005US6864568 Packaging device for holding a plurality of semiconductor devices to be inspected
03/08/2005US6864563 Exposure die to electrical charging; prevent electrical stresses; reactive ion etching
03/08/2005US6864106 Method and system for detecting tunnel oxide encroachment on a memory device
03/08/2005US6864105 Method of manufacturing a probe card
03/08/2005US6863564 Coaxial radio frequency adapter and method
03/08/2005US6863553 Socket for electrical parts
03/08/2005US6863541 Semiconductor socket and method of replacement of its probes
03/03/2005WO2005020324A1 Circuit for detecting and measuring noise in semiconductor integrated circuit
03/03/2005WO2005020297A2 Technique for evaluating a fabrication of a semiconductor component and wafer
03/03/2005WO2005020075A1 Electric diagnostic circuit and method for testing and/or diagnosing an integrated circuit
03/03/2005WO2005019850A1 Method and device for monitoring deterioration of battery
03/03/2005WO2005019849A1 Method and device for displaying the remaining useful life of a battery
03/03/2005WO2005019848A2 Self-heating burn-in
03/03/2005WO2005019847A1 Measuring or test device comprising interchangeable functional units
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