| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 03/16/2005 | EP1514723A2 Method to control a control circuit and the current running through connected devices of an electrified track with an electrical motor |
| 03/16/2005 | EP1514125A2 A digital system and method for testing analogue and mixed-signal circuits or systems |
| 03/16/2005 | EP1514124A1 Device and method of testing an electronic component |
| 03/16/2005 | EP1399831B1 Device and method for converting a diagnostic interface to spi standard |
| 03/16/2005 | EP1390951B1 Dynamic memory and method for testing a dynamic memory |
| 03/16/2005 | EP1368666B1 Method and apparatus for retaining a spring probe |
| 03/16/2005 | EP1222474A4 Fault location device and method |
| 03/16/2005 | EP1149385B1 Ic test software system for mapping logical functional test data of logic integrated circuits to physical representation |
| 03/16/2005 | EP1118002A4 Thermal isolation plate for probe card |
| 03/16/2005 | CN2685895Y Electrooptical source photoelectical parameter tester |
| 03/16/2005 | CN2685894Y Accumulator Cell intelligent tester |
| 03/16/2005 | CN2685893Y Large current high precision electric resistance sampling shunt in battery testing system |
| 03/16/2005 | CN2685892Y High precision electric resistance sampling shunt in battery testing system |
| 03/16/2005 | CN2685891Y Connecting sheet tester |
| 03/16/2005 | CN2685890Y Multifunction DC electricity test pen |
| 03/16/2005 | CN1595807A Semiconductor integrated circuit in which voltage down converter output can be observed as digital value |
| 03/16/2005 | CN1595630A Low profile pneumatically actuated docking module with power fault release |
| 03/16/2005 | CN1595612A Manufacturing method for semiconductor device |
| 03/16/2005 | CN1595611A Manufacturing method for semiconductor device |
| 03/16/2005 | CN1595610A Manufacturing method for semiconductor device |
| 03/16/2005 | CN1595609A Manufacturing method for semiconductor device |
| 03/16/2005 | CN1595608A Manufacturing method for semiconductor device |
| 03/16/2005 | CN1595188A Online detection method for vacuum circuit breaker contact on-off time based on vibration analysis |
| 03/16/2005 | CN1595187A Method of testing semiconductor apparatus |
| 03/16/2005 | CN1595186A Multicore cable automatic testing method and apparatus |
| 03/16/2005 | CN1595184A Testing device for density variable printed circuit board |
| 03/16/2005 | CN1595183A Test circuit and test method thereof |
| 03/16/2005 | CN1595175A Apparatus for providing externally applied in-situ stress in thin film electrical property measurement and measuring method thereof |
| 03/16/2005 | CN1595174A Road maintenance machinery electronic plug-in unit automatic testing system |
| 03/16/2005 | CN1193419C Device for testing defect in semiconductor device and method for using said device |
| 03/16/2005 | CN1193376C Semiconductor integrated circuit and its storage repairing method |
| 03/16/2005 | CN1193240C Inspection appts. and method adapted to scanning technique employing rolling wire probe |
| 03/15/2005 | US6868534 Circuit modeling |
| 03/15/2005 | US6868532 Method and program product for designing hierarchical circuit for quiescent current testing and circuit produced thereby |
| 03/15/2005 | US6868513 Automated multi-device test process and system |
| 03/15/2005 | US6868357 Frequency domain reflectometry system for testing wires and cables utilizing in-situ connectors, passive connectivity, cable fray detection, and live wire testing |
| 03/15/2005 | US6868062 Managing data traffic on multiple ports |
| 03/15/2005 | US6868059 Clusters of devices, softwares and methods for improved handling of a gatekeeper load in VoIP communication |
| 03/15/2005 | US6868057 Automatic protection switch decision engine |
| 03/15/2005 | US6868047 Compact ATE with time stamp system |
| 03/15/2005 | US6868020 Synchronous semiconductor memory device having a desired-speed test mode |
| 03/15/2005 | US6867613 Built-in self timing test method and apparatus |
| 03/15/2005 | US6867612 Method for wafer-level burn-in stressing of semiconductor devices and semiconductor device substrates configured to effect the method |
| 03/15/2005 | US6867611 Temperature-controlled thermal platform for automated testing |
| 03/15/2005 | US6867610 Test structure for determining the stability of electronic devices comprising connected substrates |
| 03/15/2005 | US6867608 Assembly for electrically connecting a test component to a testing machine for testing electrical circuits on the test component |
| 03/15/2005 | US6867606 Multiple directional scans of test structures on semiconductor integrated circuits |
| 03/15/2005 | US6867604 Apparatus for accurately measuring battery voltage |
| 03/15/2005 | US6867600 Electronic circuit and method for testing a line |
| 03/15/2005 | US6867598 Method for measuring fault locations in high frequency cables and lines |
| 03/15/2005 | US6867597 Method and apparatus for finding a fault in a signal path on a printed circuit board |
| 03/15/2005 | US6867596 Fault detection system |
| 03/15/2005 | US6867595 Verification system for verifying authenticity of a battery and method thereof |
| 03/15/2005 | US6867580 Structures and methods for determining the effects of high stress currents on conducting layers and contacts in integrated circuits |
| 03/15/2005 | US6867579 Testing system in a circuit board manufacturing line for automatic testing of circuit boards |
| 03/15/2005 | US6867578 Semiconductor integrated circuit tester with pivoting interface unit |
| 03/15/2005 | US6867059 A-C:H ISFET device manufacturing method, and testing methods and apparatus thereof |
| 03/15/2005 | US6867056 System and method for current-enhanced stress-migration testing of interconnect |
| 03/15/2005 | US6866531 Socket for electrical parts |
| 03/15/2005 | US6866094 Temperature-controlled chuck with recovery of circulating temperature control fluid |
| 03/15/2005 | CA2843395A1 Device package and methods for the fabrication and testing thereof |
| 03/15/2005 | CA2793031A1 Device package and methods for the fabrication and testing thereof |
| 03/15/2005 | CA2481637A1 Device package and methods for the fabrication and testing thereof |
| 03/15/2005 | CA2481616A1 Device package and methods for the fabrication and testing thereof |
| 03/10/2005 | WO2005022930A1 Apparatus and method for monitoring transmission systems using embedded test signals |
| 03/10/2005 | WO2005022798A1 Enhanced uplink operation in soft handover |
| 03/10/2005 | WO2005022721A1 Production method for motor |
| 03/10/2005 | WO2005022390A1 Microcomputer and method for developing system program |
| 03/10/2005 | WO2005022181A1 Integrated circuit with signature computation |
| 03/10/2005 | WO2005022180A1 Method and device for measuring electric field distribution of semiconductor device |
| 03/10/2005 | WO2005022179A1 Non-invasive electric-field-detection device and method |
| 03/10/2005 | WO2005022178A1 Method and arrangement for rf testing of an electronic device in conjunction with production |
| 03/10/2005 | WO2005022177A1 Integrated circuit with jtag port, tap linking module, and off-chip tap interface port |
| 03/10/2005 | WO2005022176A2 Temperature control system which sprays liquid coolant droplets against an ic-module at a sub-atmospheric pressure |
| 03/10/2005 | WO2005022175A1 Device and method for monitoring a line |
| 03/10/2005 | WO2005022174A1 System for detecting and locating faults in an electric fence |
| 03/10/2005 | WO2005022171A2 Method and apparatus for measuring impedance of electrical component under high interference conditions |
| 03/10/2005 | WO2005022135A1 In situ determination of resistivity, mobility and dopant concentration profiles |
| 03/10/2005 | WO2004025314A8 A method and apparatus for iddq measuring |
| 03/10/2005 | US20050055731 System and method for prevention of accidental activation of portable audio device |
| 03/10/2005 | US20050055671 Key Distribution |
| 03/10/2005 | US20050055651 Semiconductor device, and design method, inspection method, and design program therefor |
| 03/10/2005 | US20050055618 Test arrangement and method for selecting a test mode output channel |
| 03/10/2005 | US20050055617 Method and apparatus for shifting at-speed scan patterns in a scan-based integrated circuit |
| 03/10/2005 | US20050055615 At-speed ATPG testing and apparatus for SoC designs having multiple clock domain using a VLCT test platform |
| 03/10/2005 | US20050055614 Multi-clock domain logic system and related method |
| 03/10/2005 | US20050055613 Compacting circuit responses |
| 03/10/2005 | US20050055612 Design supporting apparatus |
| 03/10/2005 | US20050055611 Method of testing semiconductor apparatus |
| 03/10/2005 | US20050055189 Verification method and system for logic circuit |
| 03/10/2005 | US20050055173 Self-test architecture to implement data column redundancy in a RAM |
| 03/10/2005 | US20050054301 Apparatus and method for monitoring transmission systems using embedded test signals |
| 03/10/2005 | US20050054125 Method and apparatus for thermally assisted testing of integrated circuits |
| 03/10/2005 | US20050053777 Polymers with reflector film; electrooptics moderators; alternating layers of dielectric material; flat display; tear strength, toughness, softness, elasticity |
| 03/10/2005 | US20050053162 Phase adjustment apparatus and semiconductor test apparatus |
| 03/10/2005 | US20050052810 Method and apparatus for soft-sensor characterization of batteries |
| 03/10/2005 | US20050052307 Semiconductor integrated circuit in which voltage down converter output can be observed as digital value and voltage down converter output voltage is adjustable |
| 03/10/2005 | US20050052198 Electronic circuit unit having small size and good productivity |
| 03/10/2005 | US20050052197 Multi-tool manager |
| 03/10/2005 | US20050052196 Active cooling to reduce leakage power |