| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
|---|
| 03/22/2005 | US6871308 Semiconductor inspection method |
| 03/22/2005 | US6871168 Failure analysis system of semiconductor memory device |
| 03/22/2005 | US6871155 Sensing circuit for single bit-line semiconductor memory device |
| 03/22/2005 | US6871154 Method and apparatus for automatically configuring and/or inserting chip resources for manufacturing tests |
| 03/22/2005 | US6871151 Electronic battery tester with network communication |
| 03/22/2005 | US6870934 Audio loudspeaker detection using back-EMF sensing |
| 03/22/2005 | US6870781 Semiconductor device verification system and method |
| 03/22/2005 | US6870719 Plausibility checking of current transformers in substations |
| 03/22/2005 | US6870392 Method for generating test signals for an integrated circuit and test logic unit |
| 03/22/2005 | US6870388 System and method for generating a SHMOO plot by varying the resolution thereof |
| 03/22/2005 | US6870387 Method and test structures for measuring interconnect coupling capacitance in an IC chip |
| 03/22/2005 | US6870384 Test instrument with multiple analog modules |
| 03/22/2005 | US6870383 Semiconductor device with high speed switching of test modes |
| 03/22/2005 | US6870380 Conductive material for integrated circuit fabrication |
| 03/22/2005 | US6870379 Indirect stimulation of an integrated circuit die |
| 03/22/2005 | US6870378 Test apparatus and method for reliability assessment of high power switching devices |
| 03/22/2005 | US6870375 System and method for measuring a capacitance associated with an integrated circuit |
| 03/22/2005 | US6870374 Process for identifying abnormalities in power transformers |
| 03/22/2005 | US6870372 Abnormality detection apparatus of comparator |
| 03/22/2005 | US6870362 Docking apparatus |
| 03/22/2005 | US6870360 Apparatus for recognizing working height of device transfer system in semiconductor device test handler and method thereof |
| 03/22/2005 | US6870349 Battery life estimator |
| 03/22/2005 | US6870169 Method and apparatus for analyzing composition of defects |
| 03/22/2005 | US6869819 Recognition method of a mark provided on a semiconductor device |
| 03/22/2005 | US6869808 Method for evaluating property of integrated circuitry |
| 03/22/2005 | CA2342506C Infrared enhanced pulsed solar simulator |
| 03/18/2005 | CA2441447A1 Method and apparatus for electrical commoning of circuits |
| 03/17/2005 | WO2005025114A2 Method and system for out-of-band messaging between customer premises equipment and a cable modem termination station |
| 03/17/2005 | WO2005024589A2 Cable modem termination system having a gateway for transporting out-of-band messaging signals |
| 03/17/2005 | WO2005024588A2 Method and system for internet protocol provisioning of customer premises equipment |
| 03/17/2005 | WO2005024557A2 Integrated network interface supporting multiple data transfer protocols |
| 03/17/2005 | WO2005024446A1 Battery remaining power calculating method, battery remaining power calculating device, and battery remaining power calculating program |
| 03/17/2005 | WO2005024445A1 Testing apparatus |
| 03/17/2005 | WO2005006006A9 Charging rate estimating method, charging rate estimating unit and battery system |
| 03/17/2005 | WO2004109527B1 A network analyzing method and a network analyzing apparatus |
| 03/17/2005 | WO2004070741A3 Power measurement in a transformer coupled plasma source |
| 03/17/2005 | WO2004057351A8 Measuring method for deciding direction to a flickering source |
| 03/17/2005 | WO2004032049A3 Method and apparatus for analyzing serial data streams |
| 03/17/2005 | US20050060681 Using a partial metal level mask for early test results |
| 03/17/2005 | US20050060673 Method and apparatus for packaging test integrated circuits |
| 03/17/2005 | US20050060629 Method and apparatus for implementing redundancy enhanced differential signal interface |
| 03/17/2005 | US20050060627 Integrated test-on-chip system and method and apparatus for manufacturing and operating same |
| 03/17/2005 | US20050060626 Arithmetic built-in self-test of multiple scan-based integrated circuits |
| 03/17/2005 | US20050060625 Mask network design for scan-based integrated circuits |
| 03/17/2005 | US20050060624 Programmable hysteresis for boundary-scan testing |
| 03/17/2005 | US20050060623 Control of tristate buses during scan test |
| 03/17/2005 | US20050060622 System and method for optimized test and configuration throughput of electronic circuits |
| 03/17/2005 | US20050060132 Method and system for test creation |
| 03/17/2005 | US20050060116 Method and apparatus for performing testing of interconnections |
| 03/17/2005 | US20050060098 Methods for calculating the voltage induced in a device |
| 03/17/2005 | US20050059253 Etching method in fabrications of microstructures |
| 03/17/2005 | US20050059173 Test apparatus for a semiconductor package |
| 03/17/2005 | US20050058335 Defect management method |
| 03/17/2005 | US20050058190 Pulse pattern generating apparatus |
| 03/17/2005 | US20050058077 Fast-path implementation for an uplink double tagging engine |
| 03/17/2005 | US20050058007 Method for testing a circuit unit to be tested, and a test apparatus |
| 03/17/2005 | US20050058006 Semiconductor device, method for testing the same and IC card |
| 03/17/2005 | US20050057994 Non-volatile semiconductor memory device with expected value comparison capability |
| 03/17/2005 | US20050057988 Method and device for testing semiconductor memory devices |
| 03/17/2005 | US20050057968 Methods for identifying non-volatile memory elements with poor subthreshold slope or weak transconductance |
| 03/17/2005 | US20050057880 System and method for locating and determining discontinuities and estimating loop loss in a communications medium using frequency domain |
| 03/17/2005 | US20050057869 System and method for remotely detecting and locating faults in a power system |
| 03/17/2005 | US20050057865 Shunt connection to a PCB of an energy management system employed in an automotive vehicle |
| 03/17/2005 | US20050057748 Selecting a hypothetical profile to use in optical metrology |
| 03/17/2005 | US20050057655 Method for automated testing of the modulation transfer function in image sensors |
| 03/17/2005 | US20050057273 Built-in testing apparatus for testing displays and operation method thereof |
| 03/17/2005 | US20050057272 Method and apparatus for testing semiconductor devices using an actual board-type product |
| 03/17/2005 | US20050057271 Method for testing analog and mixed-signal circuits using dynamic element matching for source linearization |
| 03/17/2005 | US20050057270 Contactor assembly for testing electrical circuits |
| 03/17/2005 | US20050057269 Test method for electronic modules |
| 03/17/2005 | US20050057268 Plasma probe, methods for fabricating the same, and methods for using the same |
| 03/17/2005 | US20050057262 Method for testing integrity of electrical connection of a flat cable multiple connector assembly |
| 03/17/2005 | US20050057261 System and method for remotely detecting electric arc events in a power system |
| 03/17/2005 | US20050057259 System and method for remotely detecting and locating damaged conductors in a power system |
| 03/17/2005 | US20050057258 Hand mounted holiday tester |
| 03/17/2005 | US20050057257 Apparatus and method for automatic elimination of round-trip delay errors induced by automatic test equipment calibration |
| 03/17/2005 | US20050057256 Scan tool for electronic battery tester |
| 03/17/2005 | US20050057255 Generalized electrochemical cell state and parameter estimator |
| 03/17/2005 | US20050057254 Testing an electrical switchgear system |
| 03/17/2005 | US20050057246 Fault isolation of circuit defects using comparative magnetic field imaging |
| 03/17/2005 | US20050057241 Band distribution inspecting device and band distribution inspecting method |
| 03/17/2005 | US20050057235 Operation voltage supply apparatus and operation voltage supply method for semiconductor device |
| 03/17/2005 | US20050057227 Blocking impedance |
| 03/17/2005 | US20050057219 Apparatus and method for cell voltage monitoring |
| 03/17/2005 | US20050057193 Method for testing OLED substrate and OLED display |
| 03/17/2005 | US20050056834 Semiconductor integrated circuit device with test element group circuit |
| 03/17/2005 | US20050056102 Gas collecting device, test head and IC device testing apparatus |
| 03/17/2005 | DE19757696B4 Simulationsverfahren in einem lithographischen Prozeß Simulation method in a lithographic process |
| 03/17/2005 | DE10337913A1 Meß- oder Testgerät mit austauschbaren Funktionseinheiten Measuring or testing apparatus with replaceable units |
| 03/17/2005 | DE10337846A1 Motor vehicle generator testing process in which the current through a stationary generator is measured both with and without an applied excitation current, with the measurements being compared to determine generator efficiency |
| 03/17/2005 | DE10337679A1 Verfahren und Vorrichtung zur Restnutzungsdauer-Anzeige Method and apparatus for remaining useful life indicator |
| 03/17/2005 | DE10337090A1 Electrical probe for conducting discharge tests has conductive piston arranged axially movably relative to bush, whereby piston is only electrically connected to contact element in first positional region |
| 03/17/2005 | DE10337045A1 In-Betrieb-Test eines Signalpfades In operation test of a signal path |
| 03/17/2005 | DE10335928A1 Verfahren zur Ermittlung einer auf den Ladezustand einer Speicherbatterie bezogenen Kenngröße Methods for detecting related to the charge state of a storage battery characteristic |
| 03/17/2005 | CA2536177A1 Cable modem termination system having a gateway for transporting out-of-band messaging signals |
| 03/17/2005 | CA2536106A1 Method and system for out-of-band messaging between customer premises equipment and a cable modem termination station |
| 03/17/2005 | CA2536103A1 Method and system for internet protocol provisioning of customer premises equipment |
| 03/16/2005 | EP1515411A1 Testing an electrical switchgear system |
| 03/16/2005 | EP1515364A2 Device package and methods for the fabrication and testing thereof |
| 03/16/2005 | EP1515345A1 Test method and test circuit for electronic device |