| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 03/24/2005 | WO2005026998A1 Method and system for test creation |
| 03/24/2005 | WO2005026966A1 Register file and its storage element |
| 03/24/2005 | WO2005026959A2 Circuit arrangement for monitoring a processor |
| 03/24/2005 | WO2005026820A1 Pellicle |
| 03/24/2005 | WO2005026760A1 Method and circuit arrangement for determining a charge used during a specific period of time in mobile devices |
| 03/24/2005 | WO2005026759A1 Calibration comparator circuit |
| 03/24/2005 | WO2005026758A1 Test apparatus |
| 03/24/2005 | WO2005026757A1 Test apparatus and write control circuit |
| 03/24/2005 | WO2005026756A1 Test apparatus and test method |
| 03/24/2005 | WO2005026755A1 Test apparatus |
| 03/24/2005 | WO2005026754A1 Semiconductor test system |
| 03/24/2005 | WO2005026753A1 Semiconductor test device |
| 03/24/2005 | WO2005026752A1 Method and device for detecting defects of electromagnetic protection for electric harnesses |
| 03/24/2005 | WO2005025943A1 Detection of short circuits in a vehicle |
| 03/24/2005 | WO2005015245A3 Test head positioning system |
| 03/24/2005 | WO2005013229A3 Circuit arrangement comprising a multi-wire line for supplying current and emitting signals |
| 03/24/2005 | WO2005003799A3 Method for predicting the residual service life of an electric energy accumulator |
| 03/24/2005 | WO2004106885A3 Battery pack of a mobile communication terminal to be capable of reading output of bio-sensors and self-diagnosis system |
| 03/24/2005 | WO2004079865B1 High speed connector |
| 03/24/2005 | WO2004061602A3 Method and apparatus for testing embedded cores |
| 03/24/2005 | US20050066295 Adaptable circuit blocks for use in multi-block chip design |
| 03/24/2005 | US20050066248 Methods and systems for determining memory requirements for device testing |
| 03/24/2005 | US20050066246 Lab-on-chip system and method and apparatus for manufacturing and operating same |
| 03/24/2005 | US20050066245 Arrangement having a data processing device and a memory |
| 03/24/2005 | US20050066244 Linear feedback shift register reseeding |
| 03/24/2005 | US20050066243 Mechanism to enhance observability of integrated circuit failures during burn-in tests |
| 03/24/2005 | US20050066242 Hybrid scan-based delay testing technique for compact and high fault coverage test set |
| 03/24/2005 | US20050066232 Debug circuit |
| 03/24/2005 | US20050066215 Method and device for generating an internal time base for a diagnostic function for an output module |
| 03/24/2005 | US20050066214 Semiconductor integrated circuit |
| 03/24/2005 | US20050066189 Methods and structure for scan testing of secure systems |
| 03/24/2005 | US20050066045 Integrated network interface supporting multiple data transfer protocols |
| 03/24/2005 | US20050065761 [integrated circuit and method for simulating and trimming thereof] |
| 03/24/2005 | US20050065748 Disc interface, disc interface system having the same, and disc interfacing method |
| 03/24/2005 | US20050065747 Mixed-signal core design for concurrent testing of mixed-signal, analog, and digital components |
| 03/24/2005 | US20050064682 Failure analysis methods and systems |
| 03/24/2005 | US20050064612 Method of manufacturing a semiconductor device and a fabrication apparatus for a semiconductor device |
| 03/24/2005 | US20050064611 Method of screening semiconductor device |
| 03/24/2005 | US20050064610 Site-specific methodology for localization and analyzing junction defects in mosfet devices |
| 03/24/2005 | US20050063157 Temperature control system which sprays liquid coolant droplets against an IC-module and directs radiation against the IC-module |
| 03/24/2005 | US20050062494 Stall detection circuit and method |
| 03/24/2005 | US20050062493 Method and apparatus for electrical commoning of circuits |
| 03/24/2005 | US20050062491 Process monitor for monitoring and compensating circuit performance |
| 03/24/2005 | US20050062490 Analysis methods of leakage current luminescence in CMOS circuits |
| 03/24/2005 | US20050062489 Probe station having multiple enclosures |
| 03/24/2005 | US20050062481 Wayside LED signal for railroad and transit applications |
| 03/24/2005 | US20050062465 Method and system for loading substrate supports into a substrate holder |
| 03/24/2005 | US20050062464 Apparatus for planarizing a probe card and method using same |
| 03/24/2005 | US20050062463 Sorting handler for burn-in tester |
| 03/24/2005 | US20050062462 Serial communication testing |
| 03/24/2005 | US20050062458 Method for determination of characteristic variable which relates to the state of charge of a storage battery |
| 03/24/2005 | US20050061540 Printed circuit board test access point structures and method for making the same |
| 03/24/2005 | DE69333479T2 Hierarchisches Verbindungsverfahren und -gerät Hierarchical connection method and apparatus |
| 03/24/2005 | DE19719996B4 Computersystem und Verfahren zum Betreiben eines Chipsatzes Computer system and method for operating a chipset |
| 03/24/2005 | DE19602517B4 Flip-Flop-Steuerung Flip-flop control |
| 03/24/2005 | DE10338697A1 Vorrichtung und Verfahren zum Überwachen einer Leitung Apparatus and method for monitoring a line |
| 03/24/2005 | DE10235802B4 Steckverbindung für einen integrierten Schaltkreis Plug connection for an integrated circuit |
| 03/24/2005 | DE102004028185A1 Prüfkarte Probe card |
| 03/24/2005 | DE102004018634A1 System und Verfahren zum Steuern einer VLSI-Umgebung System and method for controlling a VLSI environment |
| 03/23/2005 | EP1517287A2 Inspection method and inspection device for display device and active matrix substrate used for display device |
| 03/23/2005 | EP1517166A2 Device package and methods for the fabrication and testing thereof |
| 03/23/2005 | EP1517152A1 Channel with clock domain crossing |
| 03/23/2005 | EP1516196A1 Device and method for determining a charged state of a battery |
| 03/23/2005 | EP1516195A1 Electromigration test device and electromigration test method |
| 03/23/2005 | EP1516193A1 Method for determination of a parameter of an electrical network |
| 03/23/2005 | EP1516192A1 Test method for yielding a known good die |
| 03/23/2005 | EP1516191A1 Multi-socket board for open/short tester |
| 03/23/2005 | EP1515874A1 Circuit for detecting ground offset of parts of a network |
| 03/23/2005 | EP1451596B1 Method for detecting the operability of a number of identical zener diodes that are connected in parallel to one another and to a solenoid |
| 03/23/2005 | EP1421397B1 Delay fault test circuitry and related method |
| 03/23/2005 | EP1368670B1 Test circuitry of an integrated circuit comprising only one selection element for each signal path |
| 03/23/2005 | EP1325481A4 Apparatus and circuit for use with capacitive presence detection systems |
| 03/23/2005 | EP1247063A4 Scanning force microscope probe cantilever with reflective structure |
| 03/23/2005 | CN2687927Y Intelligent charging and surplus electrical measuring device for electric motor car |
| 03/23/2005 | CN2687688Y Dual-face cell detecting system |
| 03/23/2005 | CN2687687Y Membrane oil-gas separating device for transformer on-line monitoring |
| 03/23/2005 | CN2687686Y High voltage power line short-circuit failure position determining and inspecting device |
| 03/23/2005 | CN2687685Y On-line measuring instrument driving mechanism |
| 03/23/2005 | CN2687674Y High power adjustable electronic load |
| 03/23/2005 | CN1599869A Testing method and tester for semiconducor integrated circuit device comprising high-speed input/output element |
| 03/23/2005 | CN1599124A Battery pack |
| 03/23/2005 | CN1599049A Sorting handler for burn-in tester |
| 03/23/2005 | CN1598608A Debug circuit |
| 03/23/2005 | CN1598607A Directional and positioning testing device for fault of direct application type cable sheath |
| 03/23/2005 | CN1598606A Passive earth detecting method and device for main circuit of ac-dc electric locomotive |
| 03/23/2005 | CN1598605A On-line method for testing leakage current value of power station zine oxide lightning protector |
| 03/23/2005 | CN1598604A Testing an electrical switchgear system |
| 03/23/2005 | CN1598603A Device and method for testing capacitor array in integrated circuit |
| 03/23/2005 | CN1598598A Checking device of display panel |
| 03/23/2005 | CN1194456C 电池状态监测电路以及电池装置 Battery state monitoring circuit and battery device |
| 03/23/2005 | CN1194447C Electronic interconnected adapter for high-speed signal and data transfer |
| 03/23/2005 | CN1194440C Battery and maintenance service system for power supply device |
| 03/23/2005 | CN1194397C Equipment for creating new reference horizontal plane on manufacturing tool plate of semiconductor |
| 03/23/2005 | CN1194396C Nondestructive inspecting method |
| 03/23/2005 | CN1194229C Battery power source protecting device for electromotive device |
| 03/23/2005 | CN1194228C Testing system for piezoelectric oscillator and testing method thereof |
| 03/23/2005 | CN1193919C Transporting and loading/unloading appts. for modular integrated circuit processor |
| 03/22/2005 | US6871335 Methods and circuits for measuring clock skew on programmable logic devices |
| 03/22/2005 | US6871311 Semiconductor integrated circuit having a self-testing function |
| 03/22/2005 | US6871309 Verification of redundant safety functions on a monolithic integrated circuit |