| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 03/31/2005 | US20050071098 Apparatus and method for monitoring and compensating for variation in solenoid resistance during use |
| 03/31/2005 | US20050071093 Method and system for monitoring power supplies |
| 03/31/2005 | US20050071039 System and method for using first-principles simulation to provide virtual sensors that facilitate a semiconductor manufacturing process |
| 03/31/2005 | US20050071036 System and method for using first-principles simulation to characterize a semiconductor manufacturing process |
| 03/31/2005 | US20050070268 Method of testing RF circuit, and arrangement |
| 03/31/2005 | US20050069030 Channel with domain crossing |
| 03/31/2005 | US20050068898 Efficient switching architecture with reduced stub lengths |
| 03/31/2005 | US20050068896 TCP acceleration system |
| 03/31/2005 | US20050068818 Semiconductor device and method for testing semiconductor device |
| 03/31/2005 | US20050068734 Heat pipe with chilled liquid condenser system for burn-in testing |
| 03/31/2005 | US20050068711 Screening method for laminated ceramic capacitors |
| 03/31/2005 | US20050068058 Method and apparatus detecting shorted turns in an electric generator |
| 03/31/2005 | US20050068057 Inspection apparatus for liquid crystal drive substrates |
| 03/31/2005 | US20050068056 Digital cable toning apparatus and method |
| 03/31/2005 | US20050068054 Standardized layout patterns and routing structures for integrated circuit wafer probe card assemblies |
| 03/31/2005 | US20050068053 Device burn in utilizing voltage control |
| 03/31/2005 | US20050068052 Alternating pulse dual-beam apparatus, methods and systems for voltage contrast behavior assessment of microcircuits |
| 03/31/2005 | US20050068051 Capacitive sensor measurement method for discrete time sampled system for in-circuit test |
| 03/31/2005 | US20050068039 In-vehicle battery monitor |
| 03/31/2005 | US20050068037 Efficient diagnosis of faulty distributorless and hybrid ignition systems |
| 03/31/2005 | US20050068000 Motor driver |
| 03/31/2005 | US20050067899 Semiconductor device and method for producing the same |
| 03/31/2005 | US20050067155 Heat pipe evaporator with porous valve |
| 03/31/2005 | US20050067147 Loop thermosyphon for cooling semiconductors during burn-in testing |
| 03/31/2005 | US20050067146 Two phase cooling system method for burn-in testing |
| 03/31/2005 | DE60009709T2 Verfahren und vorrichtung für eine abtastprüfung mit flexibele auswahl Method and apparatus for a scan test with flexible selection |
| 03/31/2005 | DE10340034A1 Potentiometervorrichtung zur Erfassung von Ventilpositionen Potentiometer device for detecting positions of valve |
| 03/31/2005 | DE10338922A1 Elektrische Diagnoseschaltung sowie Verfahren zum Testen und/oder zur Diagnose einer integrierten Schaltung Electrical diagnostic circuit and method for testing and / or diagnosis of an integrated circuit |
| 03/31/2005 | DE10338678A1 Vorrichtung und Verfahren zum Testen von zu testenden Schaltungseinheiten Apparatus and method for testing the circuit under test units |
| 03/31/2005 | DE10330506A1 Vorrichtung zur Waferinspektion Apparatus for wafer inspection |
| 03/31/2005 | DE10315372B4 Verfahren und Vorrichtung zum Bereitstellen eines Messsignals und Vorrichtung zur Erfassung einer elektromagnetischen Störung Method and apparatus for providing a measurement signal and means for detecting an electromagnetic disturbance |
| 03/31/2005 | DE102004042562A1 Line tester for asymmetric digital subscriber line installations, confirms connection between PC and exchange by beaming specific frequency signal and collecting similar return signal |
| 03/31/2005 | DE102004039831A1 Multi-chip module with semiconductor store, includes comparator coupled to non-volatile store for comparing address at write/read accesses with stored address |
| 03/31/2005 | DE102004036302A1 Einfache Optimalwertschätzeinrichtung für den Ladungszustand einer Bleileistungsquelle Simple optimum value estimator for the state of charge of a lead power source |
| 03/31/2005 | DE102004018636A1 System und Verfahren zum Messen eines Stroms System and method for measuring a current |
| 03/31/2005 | DE10157529B4 Verfahren zur Bestimmung von Widerstands- und/oder Kapazitätswerten A method for determining the resistance and / or capacitance values |
| 03/31/2005 | CA2539504A1 A method of analyzing the time-varying electrical response of a stimulated target substance |
| 03/31/2005 | CA2538113A1 A system and method for testing and configuring semiconductor functional circuits |
| 03/30/2005 | EP1519200A1 Method for optimizing probe card analysis and scrub mark analysis data |
| 03/30/2005 | EP1519198A1 A method and test bench for evaluating the transfer impedance (Zt) and the transfer admittance (Yt) of shielded cables |
| 03/30/2005 | EP1518128A2 Cell buffer with built-in test |
| 03/30/2005 | EP1430317A4 Tap switch for frequency response and partial discharge measurement |
| 03/30/2005 | EP1334370B1 Method for locating defects in a test structure |
| 03/30/2005 | EP1173811A4 A system for monitoring connection pattern of data ports |
| 03/30/2005 | CN2689564Y Charge-discharge controlling circuit structure of multifunctional battery |
| 03/30/2005 | CN2689254Y Illuminance visibility range indicator for reading |
| 03/30/2005 | CN2689252Y Power supply comprehensive testing tables |
| 03/30/2005 | CN2689251Y Hollow fiber oil and gas separator for transformer on-line monitor |
| 03/30/2005 | CN2689250Y Universal board structure of circuit board testing tool |
| 03/30/2005 | CN2689249Y Improved structure of circuit board testing tool |
| 03/30/2005 | CN2689248Y Detector of liquid-crystal mould set |
| 03/30/2005 | CN2689232Y Digital signal source with wave form display |
| 03/30/2005 | CN1602548A Semiconductor package device and method of formation and testing |
| 03/30/2005 | CN1602138A Printed circuit board test access point structures and method for making the same |
| 03/30/2005 | CN1601841A Traveling wave protective data acquisition plan considering asynchronous switching of 3-phase breaker |
| 03/30/2005 | CN1601717A Probe card substrate |
| 03/30/2005 | CN1601407A Detection method of clock accuracy |
| 03/30/2005 | CN1601296A Secondary cell residual capacity calculation method and battery pack |
| 03/30/2005 | CN1601295A Estimation for accumulator loading state of electric vehicle and carrying out method thereof |
| 03/30/2005 | CN1601294A Detection method of d.c. permanent magnet dynamo parameter and performance non-loading |
| 03/30/2005 | CN1601293A Method of scanning chain and scanning forest for construction of non-fault shielding odd-couple detection |
| 03/30/2005 | CN1601292A 自动传输线脉冲系统 Automatic Transmission Line Pulse System |
| 03/30/2005 | CN1601291A Controller of auto detector for dielectric strength between sheets of commutator |
| 03/30/2005 | CN1601290A Screening method for laminated ceramic capacitors |
| 03/30/2005 | CN1601289A Method of identifying inverted medium inverse Snell refraction by using T-shape waveguide |
| 03/30/2005 | CN1601287A Detector of two-D display and its operation method |
| 03/30/2005 | CN1601283A Connection pin |
| 03/30/2005 | CN1195325C 半导体集成电路及其测试方法 Semiconductor integrated circuit and test methods |
| 03/29/2005 | US6874112 Fault coverage and simplified test pattern generation for integrated circuits |
| 03/29/2005 | US6874111 System initialization of microcode-based memory built-in self-test |
| 03/29/2005 | US6874110 Apparatus and method for self testing programmable logic arrays |
| 03/29/2005 | US6874109 Phase shifter with reduced linear dependency |
| 03/29/2005 | US6874108 Fault tolerant operation of reconfigurable devices utilizing an adjustable system clock |
| 03/29/2005 | US6874107 Integrated testing of serializer/deserializer in FPGA |
| 03/29/2005 | US6873939 Method and apparatus for evaluating and calibrating a signaling system |
| 03/29/2005 | US6873932 Method and apparatus for predicting semiconductor device lifetime |
| 03/29/2005 | US6873927 Control method of an automatic integrated circuit full testing system |
| 03/29/2005 | US6873746 Apparatus and method for monitoring a cable |
| 03/29/2005 | US6873556 Semiconductor memory device with test mode and testing method thereof |
| 03/29/2005 | US6873197 Scan flip-flop circuit capable of guaranteeing normal operation |
| 03/29/2005 | US6873190 Apparatus for sensing the presence of an inductive load driven by a pulse width modulated signal |
| 03/29/2005 | US6873176 Die-level prober |
| 03/29/2005 | US6873175 Apparatus and method for testing pixels arranged in a matrix array |
| 03/29/2005 | US6873174 Electronic inspection of an array |
| 03/29/2005 | US6873173 Test circuit arrangement and method for testing a multiplicity of transistors |
| 03/29/2005 | US6873171 Integrated circuit early life failure detection by monitoring changes in current signatures |
| 03/29/2005 | US6873170 Method for detecting the reliability of integrated semiconductor components at high temperatures |
| 03/29/2005 | US6873167 Connection box, system, and method for evaluating a DUT board |
| 03/29/2005 | US6873166 Localized heating for defect isolation during die operation |
| 03/29/2005 | US6873165 Near-field probe for use in scanning system |
| 03/29/2005 | US6873161 Method and device for detecting accidental arcs |
| 03/29/2005 | US6873160 Method and apparatus for testing filter/protector units for fiber optic cables |
| 03/29/2005 | US6873159 Device and method for monitoring a capacitor bushing |
| 03/29/2005 | US6873147 Optimized pin assignment with constraints |
| 03/29/2005 | US6873146 Integrated circuit testing device and a method of use therefor |
| 03/29/2005 | US6873135 Battery pack and battery pack checking method |
| 03/29/2005 | US6872581 Measuring back-side voltage of an integrated circuit |
| 03/24/2005 | WO2005027293A1 Method and circuit arrangement for the detection of ground faults on electronic trips for low-voltage circuit breakers comprising serially connected measuring amplifiers |
| 03/24/2005 | WO2005027292A1 Method for controlling an electronic overcurrent trip for low-voltage circuit breakers |
| 03/24/2005 | WO2005027218A1 Object-to-be-treated carrying system and object-to-be-treated carrying method |