| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 04/06/2005 | EP1521091A1 Monitoring of power supply network |
| 04/06/2005 | EP1520319A2 Non-linear transmission line using varactors and non-parallel waveguide |
| 04/06/2005 | EP1520183A2 Single pin multilevel integrated circuit test interface |
| 04/06/2005 | EP1520182A2 Method and control circuitry for accessing multiple taps (test access ports) via a single tap |
| 04/06/2005 | EP1155331A4 Text probe interface assembly and manufacture method |
| 04/06/2005 | EP1120828B1 Method and circuit to perform a trimming phase on electronic circuits |
| 04/06/2005 | EP1101121A4 Polarization-sensitive near-field microwave microscope |
| 04/06/2005 | EP1088237B1 Method and system for performance testing of rotating machines |
| 04/06/2005 | EP1069437B1 Method for controlling ic handler and control system using the same |
| 04/06/2005 | EP0886784B1 Integrated circuit comprising a first and a second clock domain and a method for testing such a circuit |
| 04/06/2005 | CN2690895Y Line on-and-off detector |
| 04/06/2005 | CN2690894Y Fan motor detection circuit |
| 04/06/2005 | CN1605124A Large area silicon carbide devices and manufacturing methods therefor |
| 04/06/2005 | CN1605058A Interface architecture for embedded field programmable gate array cores |
| 04/06/2005 | CN1605029A Microprocessor-based probe for integrated circuit testing |
| 04/06/2005 | CN1604477A Measuring device and method for data converter |
| 04/06/2005 | CN1604429A Motor driver |
| 04/06/2005 | CN1604383A Method and apparatus for estimating state of charge of secondary battery |
| 04/06/2005 | CN1604297A Semiconductor device and method for producing the same |
| 04/06/2005 | CN1604296A Method for measuring semiconductor product reliability |
| 04/06/2005 | CN1604234A Semiconductor device and method for testing semiconductor device |
| 04/06/2005 | CN1603928A Liquid crystal display panel and testing method therefor |
| 04/06/2005 | CN1603854A Electronic apparatus |
| 04/06/2005 | CN1603853A Method for constructing two-stage sweep test structure with low test power dissipation |
| 04/06/2005 | CN1603852A Excitation characteristic test system for current transformer |
| 04/06/2005 | CN1603851A Running and loading detection method for converter |
| 04/06/2005 | CN1603850A Automatic test method for maximum output voltage, current and power magnitude of electrical equipment |
| 04/06/2005 | CN1603849A General simulator for electrical load |
| 04/06/2005 | CN1603778A High and low temperature recycle unit with wide temperature range |
| 04/06/2005 | CN1196199C Nonvolatile semiconductor memory device and its imperfect repairing method |
| 04/06/2005 | CN1196131C Method for revising defective tunnel node |
| 04/06/2005 | CN1195989C Pass/fail battery indicator |
| 04/06/2005 | CN1195988C Apparatus and method for detecting electric trace using photoelectric effect |
| 04/05/2005 | US6877141 Evaluating a validation vector for validating a network design |
| 04/05/2005 | US6877123 Scan clock circuit and method therefor |
| 04/05/2005 | US6877122 Link instruction register providing test control signals to core wrappers |
| 04/05/2005 | US6877121 Boundary scan cell for testing AC coupled line using phase modulation technique |
| 04/05/2005 | US6877120 Method of acquiring scan chain reorder information, and computer product |
| 04/05/2005 | US6877119 Circuit scan output arrangement |
| 04/05/2005 | US6877118 Memory testing method and memory testing apparatus |
| 04/05/2005 | US6876942 Methods and systems for enhanced automated system testing |
| 04/05/2005 | US6876940 Measuring constraint parameters at different combinations of circuit parameters |
| 04/05/2005 | US6876938 Method to provide a calibrated path for multi-signal cables in testing of integrated circuits |
| 04/05/2005 | US6876934 Method for determining fault coverage from RTL description |
| 04/05/2005 | US6876627 Raincheck on voice over packet network calling |
| 04/05/2005 | US6876602 Electronic timepiece, information processing device, method of displaying charged condition of secondary cell, and computer product |
| 04/05/2005 | US6876564 Integrated circuit device and method for applying different types of signals to internal circuit via one pin |
| 04/05/2005 | US6876531 Device for detecting failure of field effect transistor |
| 04/05/2005 | US6876222 Automated stator insulation flaw inspection tool and method of operation |
| 04/05/2005 | US6876221 Fault tolerant semiconductor system |
| 04/05/2005 | US6876220 System and method for measuring fault coverage in an integrated circuit |
| 04/05/2005 | US6876219 Test configuration with automatic test machine and integrated circuit and method for determining the time behavior of an integrated circuit |
| 04/05/2005 | US6876218 Method for accurate output voltage testing |
| 04/05/2005 | US6876216 Integrated circuit probe card |
| 04/05/2005 | US6876215 Apparatus for testing semiconductor integrated circuit devices in wafer form |
| 04/05/2005 | US6876213 Compliant actuator for IC test fixtures |
| 04/05/2005 | US6876212 Methods and structures for electronic probing arrays |
| 04/05/2005 | US6876211 Printed circuit board test fixture that supports a PCB to be tested |
| 04/05/2005 | US6876210 Method and apparatus for analyzing electromagnetic interference |
| 04/05/2005 | US6876207 System and method for testing devices |
| 04/05/2005 | US6876206 Automatic jack tester |
| 04/05/2005 | US6876204 Test instrument for arc fault circuit interrupters |
| 04/05/2005 | US6876203 Parallel insulation fault detection system |
| 04/05/2005 | US6876192 Testing system in a circuit board manufacturing line for a automatic testing of circuit boards |
| 04/05/2005 | US6876188 Electro-optical voltage sensor for high voltages |
| 04/05/2005 | US6876187 Method and apparatus for measuring photoelectric conversion characteristics |
| 04/05/2005 | US6876186 Measurement of circuit delay |
| 04/05/2005 | US6876185 PLL semiconductor device with testability, and method and apparatus for testing same |
| 04/05/2005 | US6876175 Methods for determining the charge state and/or the power capacity of charge store |
| 04/05/2005 | US6876174 Method for dynamically measuring the state of health and charge of a car battery and device for implementing said method |
| 04/05/2005 | US6876036 Device for measuring parameters of an electronic device |
| 04/05/2005 | US6875997 Test patterns and methods of controlling CMP process using the same |
| 04/05/2005 | US6875671 Method of fabricating vertical integrated circuits |
| 04/05/2005 | US6875625 System and method for split package power and rotational burn-in of a microelectronic device |
| 04/05/2005 | US6875560 Testing multiple levels in integrated circuit technology development |
| 03/31/2005 | WO2005029747A2 System and method for locating and determining discontinuities in a communications medium using frequency domain correlation |
| 03/31/2005 | WO2005029725A2 System for the analysis of the operation of a control network of an installation |
| 03/31/2005 | WO2005029702A1 Semiconductor switch circuit |
| 03/31/2005 | WO2005029666A1 System and method for remotely detecting electric arc events in a power system |
| 03/31/2005 | WO2005029660A1 Arc monitoring system |
| 03/31/2005 | WO2005029584A1 Semiconductor integrated circuit |
| 03/31/2005 | WO2005029505A1 Memory device |
| 03/31/2005 | WO2005029504A2 Methods for identifying non-volatile memory elements with poor subthreshold slope or weak transconductance |
| 03/31/2005 | WO2005029329A2 A system and method for testing and configuring semiconductor functional circuits |
| 03/31/2005 | WO2005029105A1 Electronic circuit comprising a secret sub-module |
| 03/31/2005 | WO2005029104A1 Electronic switching circuit, switching circuit test arrangement and method for determining the operativeness of an electronic switching circuit |
| 03/31/2005 | WO2005029103A1 Method and device for simulating test sets |
| 03/31/2005 | WO2005029097A2 A method of analyzing the time-varying electrical response of a stimulated target substance |
| 03/31/2005 | WO2005015249A3 Electronic element comprising an electronic circuit which is to be tested and test system arrangement which is used to test the electronic element |
| 03/31/2005 | WO2004106957A3 Signal integrity self-test architecture |
| 03/31/2005 | US20050071721 Automated error recovery of a licensed internal code update on a storage controller |
| 03/31/2005 | US20050071720 System verification using one or more automata |
| 03/31/2005 | US20050071719 Method and apparatus for diagnosis and behavior modification of an embedded microcontroller |
| 03/31/2005 | US20050071717 Method and apparatus for low overhead circuit scan |
| 03/31/2005 | US20050071716 Testing of reconfigurable logic and interconnect sources |
| 03/31/2005 | US20050071715 Method and system for graphical pin assignment and/or verification |
| 03/31/2005 | US20050071399 Pseudo-random binary sequence checker with automatic synchronization |
| 03/31/2005 | US20050071102 Method, apparatus, system, program and medium for inspecting a circuit board and an apparatus incorporating the circuit board |
| 03/31/2005 | US20050071101 Apparatus and method for inspecting semiconductor device |
| 03/31/2005 | US20050071100 Method and apparatus for improved detection of multisynchronous signals title |