| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 04/13/2005 | CN1605878A Feeder line singlephase fault and multiphase fault distance measuring method based on wavelet decomposition frequency band feature |
| 04/13/2005 | CN1605877A Methods and apparatus for testing continuity of electrical paths through connectors of circuit assemblies |
| 04/13/2005 | CN1197448C Chip transferring device and method |
| 04/13/2005 | CN1197443C Assembly of an electronic component with spring packaging |
| 04/13/2005 | CN1197217C Battery monitor and battery device |
| 04/13/2005 | CN1197211C Ic插座 Ic Socket |
| 04/13/2005 | CN1197008C Device for and method of preventing bus contention |
| 04/13/2005 | CN1196955C Pressurizing device for liquid crystal display and laser correction method with pressurizing process |
| 04/13/2005 | CN1196939C Combined part testing device |
| 04/13/2005 | CN1196938C Power cable lines |
| 04/13/2005 | CN1196937C Instrument for measuring and sorting resistors, sorting device and method therefor |
| 04/13/2005 | CN1196935C Needle-card adjusting device for planarizing needle sets on a needle card |
| 04/13/2005 | CN1196934C Holder of electro-conductive contactor and method for producing same |
| 04/13/2005 | CN1196931C Infrared screening and inspection system |
| 04/12/2005 | US6880140 Method to selectively identify reliability risk die based on characteristics of local regions on the wafer |
| 04/12/2005 | US6880137 Dynamically reconfigurable precision signal delay test system for automatic test equipment |
| 04/12/2005 | US6880120 Sequence-based verification method and system |
| 04/12/2005 | US6880118 System and method for testing operational transmissions of an integrated circuit |
| 04/12/2005 | US6880116 System for testing multiple devices on a single system and method thereof |
| 04/12/2005 | US6879939 Control of distribution of input/output operations during system testing |
| 04/12/2005 | US6879928 Method and apparatus to dynamically recalibrate VLSI chip thermal sensors through software control |
| 04/12/2005 | US6879917 Double-ended distance-to-fault location system using time-synchronized positive-or negative-sequence quantities |
| 04/12/2005 | US6879272 Method and apparatus for controlling data output frequency |
| 04/12/2005 | US6879259 Battery voltage indicator in a portable computing device |
| 04/12/2005 | US6879180 Display panel inspection apparatus and inspection method |
| 04/12/2005 | US6879179 Image-signal supplying circuit and electro-optical panel |
| 04/12/2005 | US6879178 Measuring current on a die |
| 04/12/2005 | US6879177 Method and testing circuit for tracking transistor stress degradation |
| 04/12/2005 | US6879176 Conductance-voltage (GV) based method for determining leakage current in dielectrics |
| 04/12/2005 | US6879175 Hybrid AC/DC-coupled channel for automatic test equipment |
| 04/12/2005 | US6879174 Testing method and testing device for semiconductor integrated circuits |
| 04/12/2005 | US6879173 Apparatus and method for detecting and rejecting high impedance failures in chip interconnects |
| 04/12/2005 | US6879172 Integrated circuit heating system and method therefor |
| 04/12/2005 | US6879169 Method for manufacturing and batch testing semiconductor devices |
| 04/12/2005 | US6879167 Noncontact measuring system for electrical conductivity |
| 04/12/2005 | US6879164 Method and device for insulation monitoring of a DC network |
| 04/12/2005 | US6879162 System and method of micro-fluidic handling and dispensing using micro-nozzle structures |
| 04/12/2005 | US6879146 Pneumatic clamps for electric power leads |
| 04/12/2005 | US6879145 Voltage isolation buffer with hall effect magnetic field sensor |
| 04/12/2005 | US6878963 Device for testing electrical characteristics of chips |
| 04/12/2005 | US6878559 Measurement of lateral diffusion of diffused layers |
| 04/12/2005 | CA2285156C A constant current termination for cable locating tones |
| 04/07/2005 | WO2005031380A1 Method and device for determining the charge of a battery |
| 04/07/2005 | WO2005031379A1 System and method for generating reference signals, test equipment and method using such reference signals |
| 04/07/2005 | WO2005031378A1 Method and system for selectively masking test responses |
| 04/07/2005 | WO2005031377A1 Method for determining the frequency response of an electrooptical component |
| 04/07/2005 | WO2005031376A1 Electrochemically fabricated microprobes |
| 04/07/2005 | WO2005031375A1 Method and measuring device for determining the capacitanceof a capacitive electrical component connected to an integrated circuit |
| 04/07/2005 | WO2005010541A3 Testing and display of electrical system impedance |
| 04/07/2005 | WO2004112168A3 Part tester and method |
| 04/07/2005 | WO2004102216A3 Test systems and methods |
| 04/07/2005 | US20050076282 System and method for testing a circuit design |
| 04/07/2005 | US20050076281 Network terminal that notifies administrator of error |
| 04/07/2005 | US20050076280 Programmable built-in self-test circuit for serializer/deserializer circuits and method |
| 04/07/2005 | US20050076279 Method and system for using statistical signatures for testing high-speed circuits |
| 04/07/2005 | US20050076278 Testing of circuit with plural clock domains |
| 04/07/2005 | US20050076277 Test apparatus with static storage device and test method |
| 04/07/2005 | US20050076276 System and method for defect projection in transaction management in a target computer environment |
| 04/07/2005 | US20050076275 Integraged circuit and method for testing the integrated circuit |
| 04/07/2005 | US20050075830 Process parameter based I/O timing programmability using electrical fuse elements |
| 04/07/2005 | US20050075821 Method for testing circuit units to be tested and test apparatus |
| 04/07/2005 | US20050075820 Method for checking test points of printed circuit board layout text data before plotting the printed circuit board layout map |
| 04/07/2005 | US20050075816 System and method for controlling a fuel cell testing device |
| 04/07/2005 | US20050075810 Spectral jitter analysis allowing jitter modulation waveform analysis |
| 04/07/2005 | US20050075807 Electronic battery tester with network communication |
| 04/07/2005 | US20050075806 Method and system for testing battery connectivity |
| 04/07/2005 | US20050075076 Method and apparatus for measuring impedance of electrical component under high interference conditions |
| 04/07/2005 | US20050074910 Manufacturing method of semiconductor device |
| 04/07/2005 | US20050073961 Method for measuring characteristics of path between nodes by using active testing packets based on priority |
| 04/07/2005 | US20050073891 Semiconductor memory device and method for testing same |
| 04/07/2005 | US20050073788 Integrated circuit outputs protection during JTAG board tests |
| 04/07/2005 | US20050073428 Indicator system having multiple leds |
| 04/07/2005 | US20050073333 Specific site backside underlaying and micromasking method for electrical characterization of semiconductor devices |
| 04/07/2005 | US20050073332 Semiconductor testing apparatus |
| 04/07/2005 | US20050073331 Electrical bias electrical test apparatus and method |
| 04/07/2005 | US20050073329 Method and apparatus for enabling reliable testing of printed circuit assemblies using a standard flying prober system |
| 04/07/2005 | US20050073328 OBIRCH dual power circuit |
| 04/07/2005 | US20050073325 Method and circuit arrangement for offset correction of a measurement bridge |
| 04/07/2005 | US20050073320 State detecting method and insulation resistance fall detector |
| 04/07/2005 | US20050073319 Floating impedance high voltage simultaneously test circuit and test method thereof |
| 04/07/2005 | US20050073317 Insulation resistance drop detector and method of detecting state thereof |
| 04/07/2005 | US20050073315 Method and apparatus for estimating state of charge of secondary battery |
| 04/07/2005 | US20050073314 Electronic battery tester/charger with integrated battery cell temperature measurement device |
| 04/07/2005 | US20050073296 Adjustable test head docking apparatus |
| 04/07/2005 | US20050072972 Method of semiconductor device protection, package of semiconductor device |
| 04/07/2005 | US20050071974 Method of retrofitting a probe station |
| 04/07/2005 | DE19549134B4 Vorrichtung zur EMV-Prüfung von elektrischen Geräten Apparatus for EMC testing of electrical equipment |
| 04/07/2005 | DE10392347T5 Gerät mit einer Schaltung zur Erfassung von Substratfehlern Device with a circuit for detecting substrate defects |
| 04/07/2005 | DE10342064A1 Schaltungsanordnung zur Überwachung eines Prozessors Circuit arrangement for monitoring a processor |
| 04/07/2005 | DE10341549A1 Verfahren und Schaltungsanordnung zur Bestimmung einer in einem Zeitraum verbrauchten Ladung bei Mobilgeräten Method and circuit for determining a period spent in a charge to mobile devices |
| 04/07/2005 | DE10340236A1 Anordnung mit einer Datenverarbeitungseinrichtung und einem Speicher Arrangement with a data processing device and a memory |
| 04/07/2005 | DE10297660T5 Prüfgerät für elektronische Bauelemente An electronic component tester |
| 04/07/2005 | DE102004041102A1 Semiconductor wafer testing arrangement used in semiconductor production, has temperature control station that transfers wafer to prober through handling system, after applying thermal or mechanical load to wafer |
| 04/07/2005 | DE102004032908A1 Batterielastenergie-Erfassungssystem Battery load energy detection system |
| 04/07/2005 | DE102004020699A1 Integrierte Halbleiterschaltung A semiconductor integrated circuit |
| 04/07/2005 | DE102004013707A1 Substrate e.g. semiconductor wafer, testing apparatus for use during semiconductor production, has two test arrangements that are jointly connected to handling system, substrate magazine station and alignment station |
| 04/07/2005 | DE10119170A1 Digital circuit failure analysis procedure emulates circuit at high clock speed with all inputs connected to shift register for examination on failure |
| 04/06/2005 | EP1521367A1 Semiconductor chip |
| 04/06/2005 | EP1521093A1 Design analysis technique |
| 04/06/2005 | EP1521092A1 Motor driver |