| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 04/19/2005 | US6882173 Method and apparatus detecting shorted turns in an electric generator |
| 04/19/2005 | US6882172 System and method for measuring transistor leakage current with a ring oscillator |
| 04/19/2005 | US6882171 Bonding pads for testing of a semiconductor device |
| 04/19/2005 | US6882170 Device speed alteration by electron-hole pair injection and device heating |
| 04/19/2005 | US6882169 Semiconductor testing device |
| 04/19/2005 | US6882168 Probe tile for probing semiconductor wafer |
| 04/19/2005 | US6882167 Method of forming an electrical contact |
| 04/19/2005 | US6882161 Method of measuring dielectric constant of PCB for RIMM |
| 04/19/2005 | US6882159 Associated grouping of embedded cores for manufacturing test |
| 04/19/2005 | US6882156 Printed circuit board assembly for automatic test equipment |
| 04/19/2005 | US6882141 Sorting handler for burn-in tester |
| 04/19/2005 | US6882139 Electronic component, tester device and method for calibrating a tester device |
| 04/19/2005 | US6882014 Protection circuit for MOS components |
| 04/19/2005 | US6881974 Probe card for testing microelectronic components |
| 04/19/2005 | US6881597 Method of manufacturing a semiconductor device to provide a plurality of test element groups (TEGs) in a scribe region |
| 04/19/2005 | US6881595 Method of and apparatus for testing the quality of printed circuits |
| 04/19/2005 | US6881593 Semiconductor die adapter and method of using |
| 04/19/2005 | US6881088 Connector assembly with actuation system |
| 04/19/2005 | US6880350 Dynamic spray system |
| 04/19/2005 | US6880245 Method for fabricating a structure for making contact with an IC device |
| 04/19/2005 | US6880213 Method for screening piezoelectric transformer apparatus |
| 04/14/2005 | WO2005034408A2 Wireless network system and method |
| 04/14/2005 | WO2005034232A1 Back-light block for semiconductor vision system |
| 04/14/2005 | WO2005034185A2 System and method for on-tool semiconductor simulation |
| 04/14/2005 | WO2005033906A2 System verification using one or more automata |
| 04/14/2005 | WO2005033722A1 Efficient switching architecture with reduced stub lengths |
| 04/14/2005 | WO2005033721A1 Digital cable toning apparatus and method |
| 04/14/2005 | WO2005022176A3 Temperature control system which sprays liquid coolant droplets against an ic-module at a sub-atmospheric pressure |
| 04/14/2005 | WO2005004370A3 Quality determination for packetized information |
| 04/14/2005 | WO2004111662A3 Integrated circuit device for monitoring power supply |
| 04/14/2005 | WO2004111660A3 System and method for classifying defects in and identifying process problems for an electrical circuit |
| 04/14/2005 | WO2004107400A3 Chuck for holding a device under test |
| 04/14/2005 | US20050081168 Multiple gate electrode linewidth monitor method |
| 04/14/2005 | US20050081130 Using constrained scan cells to test integrated circuits |
| 04/14/2005 | US20050081103 Resource management during system verification |
| 04/14/2005 | US20050081100 System and method for automatically initializing and diagnosing backplanes of electronic devices |
| 04/14/2005 | US20050081094 Automaton synchronization during system verification |
| 04/14/2005 | US20050080957 Controller based hardware device and method for setting the same |
| 04/14/2005 | US20050080745 Electronic licensing for device tester |
| 04/14/2005 | US20050080583 Device testing control |
| 04/14/2005 | US20050080582 Method of adjusting strobe timing and function testing device for semiconductor device |
| 04/14/2005 | US20050080580 Device for testing lsi to be measured, jitter analyzer, and phase difference detector |
| 04/14/2005 | US20050080575 Methods and apparatus for optimizing lists of waveforms |
| 04/14/2005 | US20050080573 Methods and apparatus for optimizing the masking of waveforms to reduce the number of waveforms in a list of waveforms |
| 04/14/2005 | US20050079822 Automated test of receiver sensitivity and receiver jitter tolerance of an integrated circuit |
| 04/14/2005 | US20050079664 Method of fabricating multi layer devices on buried oxide layer substrates |
| 04/14/2005 | US20050078967 Office information system having a device which provides an operational message of the system when a specific event occurs |
| 04/14/2005 | US20050078758 Method for training a transceiver for high speed communications |
| 04/14/2005 | US20050078057 Display device, display panel therefor, and inspection method thereof |
| 04/14/2005 | US20050077913 Compliant contact structures, contactor cards and test system including same, and methods of fabrication and use |
| 04/14/2005 | US20050077912 Method and probe structure for implementing a single probe location for multiple signals |
| 04/14/2005 | US20050077908 Continuity tester apparatus for wiring |
| 04/14/2005 | US20050077907 Methods and apparatus for testing continuity of electrical paths through connectors of circuit assemblies |
| 04/14/2005 | US20050077906 Systems and methods for measuring picoampere current levels |
| 04/14/2005 | US20050077905 Testing method and tester for semiconductor integrated circuit device comprising high-speed input/output element |
| 04/14/2005 | US20050077904 Electronic battery tester with probe light |
| 04/14/2005 | US20050077892 Semiconductor test system |
| 04/14/2005 | US20050077891 Semiconductor test apparatus |
| 04/14/2005 | US20050077877 Managing service life of a battery |
| 04/14/2005 | US20050077717 Automotive passenger restraint and protection apparatus |
| 04/14/2005 | US20050077281 Shutters for burn-in-board connector openings |
| 04/14/2005 | DE19914004B4 Identifizierbares elektrisches Bauteil mit Verfahren zur Identifikation und Auswerteeinheit Identifiable electrical component with methods for the identification and evaluation |
| 04/14/2005 | DE10392404T5 Messkopfausrichtungsvorrichtung Probe alignment apparatus |
| 04/14/2005 | DE10345305A1 Feststellbremse mit Überwachung der Bordnetz-Leistungsfähigkeiten Parking brake with monitoring of the electrical system capabilities |
| 04/14/2005 | DE10344004A1 Verfahren und Vorrichtung zur Erzeugung einer internen Zeitbasis für eine Diagnosefunktion für einen Endstufenbaustein Method and device for generating an internal time base for a diagnostic function for a stage module |
| 04/14/2005 | DE10343179A1 Current measurement device, especially for monitoring the current of an automotive battery, has voltage measurement means assigned to at least one of a number of consumer fuses |
| 04/14/2005 | DE10342599A1 Verfahren und Schaltungsanordnung zur Erdschlusserfassung an elektronischen Auslösern für Niederspannungs-Leistungsschalter mit vorgeschalteten Messverstärkern Method and circuit for earth fault on electronic releases for low-voltage circuit breakers with upstream amplifiers |
| 04/14/2005 | DE10342472A1 Integrated circuit capacitance field testing arrangement, has means for cyclically charging and discharging capacitors and means for measuring the cycling frequency |
| 04/14/2005 | DE10334813A1 Test unit for a data line, especially for a data line terminating in the train driver's cabin, comprises either a test arrangement connected to a plug at one end of the line or a shorting arrangement for connecting its two plugs |
| 04/14/2005 | DE102004042305A1 Connection pin, especially for a test card for measuring the electrical properties of a semiconductor element, e.g. an LSI chip, has first and second parts with elastic properties |
| 04/14/2005 | DE102004030881A1 Contact area contacting method for prober, involves observing vertical movement of semiconductor wafer along observation axis which runs in plane that is slight distance away from free wafer surface in its expected end position |
| 04/14/2005 | DE102004022575A1 Verfahren zum Berechnen der in einer Vorrichtung induzierten Spannung A method for calculating the voltage induced in a device |
| 04/13/2005 | EP1523229A2 Assembly of an electronic component with spring packaging |
| 04/13/2005 | EP1522866A2 Device and method for the determination of the internal resistance of a batterie |
| 04/13/2005 | EP1522865A1 Battery powered device |
| 04/13/2005 | EP1522864A2 Apparatus measuring system-on-a chip efficiency and method thereof |
| 04/13/2005 | EP1522863A1 Method for the diagnose of a fault in the windings of a transformer |
| 04/13/2005 | EP1522862A1 Systems and methods for monitoring and storing performance and maintenance data related to an electrical component |
| 04/13/2005 | EP1521974A2 Electronic circuit with test unit for testing interconnects |
| 04/13/2005 | EP1521973A2 Control device of an optoelectronic device having improved testing properties |
| 04/13/2005 | EP1423719B1 Method and device for monitoring a sensor unit |
| 04/13/2005 | EP1290726A4 Semiconductor device inspection system |
| 04/13/2005 | EP1041390B1 Synchronous data adaptor |
| 04/13/2005 | CN2692690Y Detecting device for internal resistance of battery |
| 04/13/2005 | CN2692689Y Detector for ground fault of generator stator winding |
| 04/13/2005 | CN2692688Y Multifunctional tester for cable air leaking |
| 04/13/2005 | CN2692687Y Anti-theft alarm for cable of field device |
| 04/13/2005 | CN2692686Y On-line insulation monitoring sampler for electrical apparatus |
| 04/13/2005 | CN2692685Y Low interference frequency change tester |
| 04/13/2005 | CN2692684Y Combined oscillation current transformer measurer |
| 04/13/2005 | CN2692677Y Detecting probe allocating device for printed circuitboard |
| 04/13/2005 | CN1606698A Method for checking the electrical safety of a household appliance, and corresponding household appliance |
| 04/13/2005 | CN1606697A Automated test sequence editor and engine for transformer testing |
| 04/13/2005 | CN1606196A Connecting device using spiral contact |
| 04/13/2005 | CN1606091A Integrated circuit memory devices and operating methods that are configured to output data bits at a lower rate |
| 04/13/2005 | CN1605990A Test card for multiple functions testing |
| 04/13/2005 | CN1605882A Verifying apparatus with verifying signal monitoring function and remote controlled verifying system |
| 04/13/2005 | CN1605881A Adapter method and apparatus for interfacing a tester with a device under test |
| 04/13/2005 | CN1605880A Photoelectricity characteristic measuring device and method for organic light emitting diode |
| 04/13/2005 | CN1605879A Testing method for on-line monitoring internal insulation incipient fault of electric equipment |