| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 04/26/2005 | US6885212 Semiconductor device and test method for the same |
| 04/26/2005 | US6885211 Internal node offset voltage test circuits and methods |
| 04/26/2005 | US6885210 System and method for measuring transistor leakage current with a ring oscillator with backbias controls |
| 04/26/2005 | US6885208 Semiconductor device and test device for same |
| 04/26/2005 | US6885205 Test fixture assembly for printed circuit boards |
| 04/26/2005 | US6885204 Probe card, and testing apparatus having the same |
| 04/26/2005 | US6885203 Wafer level burn-in using light as the stimulating signal |
| 04/26/2005 | US6885202 Non-contact tester for electronic circuits |
| 04/26/2005 | US6885197 Indexing rotatable chuck for a probe station |
| 04/26/2005 | US6885195 Method and apparatus for auditing a battery test |
| 04/26/2005 | US6885180 Apparatus and method for electrical cable identification |
| 04/26/2005 | US6885167 Method and apparatus for determining cold cranking amperes value |
| 04/26/2005 | US6885095 Test circuit and multi-chip package type semiconductor device having the test circuit |
| 04/26/2005 | US6885094 Test circuit and multi-chip package type semiconductor device having the test circuit |
| 04/26/2005 | US6884643 Semiconductor device, method for evaluating the same, and method for fabricating the same |
| 04/26/2005 | US6884642 Wafer-level testing apparatus and method |
| 04/26/2005 | US6884641 Site-specific methodology for localization and analyzing junction defects in mosfet devices |
| 04/26/2005 | US6884637 Inspection pattern, inspection method, and inspection system for detection of latent defect of multi-layer wiring structure |
| 04/26/2005 | US6884300 Method of cleaning a probe |
| 04/26/2005 | US6883636 Power steering apparatus |
| 04/21/2005 | WO2005036192A1 Secondary battery residual capacity calculating apparatus and calculating method |
| 04/21/2005 | WO2005036191A1 Device and method for measuring individual cell voltages in a cell stack of an energy accumulator |
| 04/21/2005 | WO2005036190A1 Method and apparatus for performing testing of interconnections |
| 04/21/2005 | WO2005036189A1 System and method for providing a time varying gain tdr to display abnormalities of a communication cable or the like |
| 04/21/2005 | WO2005036188A1 Circuit board inspection device |
| 04/21/2005 | WO2005036187A1 Magnetic-field-measuring device |
| 04/21/2005 | WO2005035976A1 Methods for diagnosis faulty distributorless and hybrid ignition systems |
| 04/21/2005 | WO2005035090A2 An etching method in fabrications of microstructures |
| 04/21/2005 | WO2004107402A3 Smart capture for atpg (automatic test pattern generation) and fault simulation of scan-based integrated circuits |
| 04/21/2005 | WO2004088478A3 Autonomous built-in self-test for integrated circuits |
| 04/21/2005 | US20050086572 Semiconductor device having ECC circuit |
| 04/21/2005 | US20050086566 System and method for building a test case including a summary of instructions |
| 04/21/2005 | US20050086564 Multi-chip module and method for testing |
| 04/21/2005 | US20050086038 Method and system for determining transistor degradation mechanisms |
| 04/21/2005 | US20050086033 Extracting semiconductor device model parameters |
| 04/21/2005 | US20050086021 Wireless test system |
| 04/21/2005 | US20050086019 Method and apparatus for testing a bridge circuit |
| 04/21/2005 | US20050085932 Technique for evaluating a fabrication of a semiconductor component and wafer |
| 04/21/2005 | US20050085105 Arrangement for producing an electrical connection between a BGA package and a signal source, and method for producing such a connection |
| 04/21/2005 | US20050085032 Technique for evaluating a fabrication of a die and wafer |
| 04/21/2005 | US20050084990 Endpoint detection in manufacturing semiconductor device |
| 04/21/2005 | US20050084989 Semiconductor device manufacturing method |
| 04/21/2005 | US20050084745 Systems and methods for selective cell and/or stack control in a flowing electrolyte battery |
| 04/21/2005 | US20050084026 Pair-swap independent trellis decoder for a multi-pair gigabit transceiver |
| 04/21/2005 | US20050083931 Method and apparatus providing dial on demand scaling |
| 04/21/2005 | US20050083850 Method for adjusting a transmission rate to obtain the optimum transmission rate in a mobile ad hoc network environment |
| 04/21/2005 | US20050083834 Method for providing guaranteed distributed failure notification |
| 04/21/2005 | US20050083078 Test key for bridge and continuity testing |
| 04/21/2005 | US20050083077 Dynamically switched voltage screen |
| 04/21/2005 | US20050083076 Dynamically switched voltage screen |
| 04/21/2005 | US20050083075 Method for measuring capacitance-voltage curves for transistors |
| 04/21/2005 | US20050083073 Probe apparatus |
| 04/21/2005 | US20050083071 Electronic circuit assembly test apparatus |
| 04/21/2005 | US20050083070 Method for detecting the operability of a number of identical zener diodes that are connected in parallel to one another and to a solenoid |
| 04/21/2005 | US20050083068 Testing and calibration device with diagnostics |
| 04/21/2005 | US20050083067 Coded multi-frequency transmitter and receiver for testing multi-conductor cables |
| 04/21/2005 | US20050083066 Open-circuit detecting circuit |
| 04/21/2005 | US20050083038 Apparatus and method for the testing of circuit boards, and test probe for this apparatus and this method |
| 04/21/2005 | US20050083037 Arrangement and method for testing substrates under load |
| 04/21/2005 | US20050083036 Apparatus for testing substrates |
| 04/21/2005 | US20050083015 Voltage detector of battery assembly |
| 04/21/2005 | DE10338677B3 Verfahren zum Testen einer zu testenden Schaltungseinheit und Testvorrichtung A method of testing a circuit under test unit and test device |
| 04/21/2005 | DE10230527B4 Verfahren und Einrichtung zur Überwachung der Funktionstüchtigkeit elektronischer Leistungsbauelemente Method and apparatus for monitoring the functionality of electronic power devices |
| 04/21/2005 | DE10225359B4 Verbinder-Prüfvorrichtung Connector Tester |
| 04/20/2005 | EP1524808A2 Adjusting transmission rate in a mobile ad hoc network |
| 04/20/2005 | EP1524600A2 A method for providing guaranteed distributed failure notification |
| 04/20/2005 | EP1524530A1 Semiconductor logic circuit device having pull-up/pull-down circuit for input buffer pad and wafer-probing testing method therefore |
| 04/20/2005 | EP1523820A1 A fault-tolerant broadcast router |
| 04/20/2005 | EP1523686A2 Compensation for test signal degradation due to dut fault |
| 04/20/2005 | EP1523685A2 Assembly for connecting a test device to an object to be tested |
| 04/20/2005 | EP1334416B1 Circuit arrangement and a method for detecting an undesired attack on an integrated circuit |
| 04/20/2005 | EP1236053B1 A test access port (tap) controller system and method to debug internal intermediate scan test faults |
| 04/20/2005 | EP1123515B1 Battery pack having a state of charge indicator |
| 04/20/2005 | CN2694480Y Crystal granules sorted carrying block arrangement for rapid detaching and attaching |
| 04/20/2005 | CN2694289Y High tension battery alternating current internal resistance tester |
| 04/20/2005 | CN2694288Y Switch cabinet leakage current checking and warning device |
| 04/20/2005 | CN1608336A Socket for inspection |
| 04/20/2005 | CN1607654A Semiconductor device manufacturing method |
| 04/20/2005 | CN1607653A Spiral contactor and manufacturing method for this apparatus, and a semiconductor inspecting equipment and electronical parts using this apparatus |
| 04/20/2005 | CN1607398A Method for real time estimating state variable of power accumulator model |
| 04/20/2005 | CN1607397A Method for on line identifying parameters of power accumulator model |
| 04/20/2005 | CN1607396A Semi-conductor component test process and a system for testing semi-conductor components |
| 04/20/2005 | CN1607395A Method and apparatus for detecting non-destructive contact |
| 04/20/2005 | CN1607394A Universal open type testing clamp for circuit board |
| 04/20/2005 | CN1198326C Signal test method for integrated circuit chips |
| 04/20/2005 | CN1198189C Method for compensating deviation of test temperature |
| 04/20/2005 | CN1198147C Semiconductor testing appts. and its monitor device |
| 04/19/2005 | US6883151 Method and device for IC identification |
| 04/19/2005 | US6883150 Automatic manufacturing test case generation method and system |
| 04/19/2005 | US6883129 Electronic circuit and method for testing |
| 04/19/2005 | US6883128 PC and ATE integrated chip test equipment |
| 04/19/2005 | US6883127 Comparison circuit and method for verification of scan data |
| 04/19/2005 | US6883115 LSI diagnostic system and method of diagnosing LSI |
| 04/19/2005 | US6883113 System and method for temporally isolating environmentally sensitive integrated circuit faults |
| 04/19/2005 | US6883109 Method for accessing scan chains and updating EEPROM-resident FPGA code through a system management processor and JTAG bus |
| 04/19/2005 | US6882950 Building and testing complex computer products with contract manufacturers without supplying proprietary information |
| 04/19/2005 | US6882620 Token exchange system with fault protection |
| 04/19/2005 | US6882586 Semiconductor memory device equipped with control circuit for controlling memory cell array in non-normal operation mode |
| 04/19/2005 | US6882238 Method and apparatus for detecting on-die voltage variations |
| 04/19/2005 | US6882204 Semiconductor integrated circuit device with differential output driver circuit, and system for semiconductor integrated circuit device |