| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 04/28/2005 | WO2004105294A3 Power control and scheduling in an ofdm system |
| 04/28/2005 | WO2004097893A3 Method of restoring encapsulated integrated circuit devices |
| 04/28/2005 | WO2004072660A3 Compressing test responses using a compactor |
| 04/28/2005 | US20050091622 Method of grouping scan flops based on clock domains for scan testing |
| 04/28/2005 | US20050091618 Method and apparatus for decomposing and verifying configurable hardware |
| 04/28/2005 | US20050091562 Testing of modules operating with different characteristics of control signals using scan based techniques |
| 04/28/2005 | US20050091561 Scan test method, device, and system |
| 04/28/2005 | US20050091560 System for optimizing anti-fuse repair time using fuse id |
| 04/28/2005 | US20050090996 Method and system for analyzing quiescent power plane current (IDDQ) test data in very-large scale integrated (VLSI) circuits |
| 04/28/2005 | US20050090916 Intra-chip power and test signal generation for use with test structures on wafers |
| 04/28/2005 | US20050090027 System and apparatus for using test structures inside of a chip during the fabrication of the chip |
| 04/28/2005 | US20050088964 Ethernet passive optical network ring and its method of authorization and collision detection |
| 04/28/2005 | US20050088871 Semiconductor device and method of inspecting the same |
| 04/28/2005 | US20050088870 Semiconductor device and method for testing the same |
| 04/28/2005 | US20050088551 Structure of a CMOS image sensor and method for fabricating the same |
| 04/28/2005 | US20050088271 Sensing apparatus for blown fuse of rectifying wheel and associated methods |
| 04/28/2005 | US20050088198 Inspection system for active matrix panel, inspection method for active matrix panel and manufacturing method for active matrix OLED panel |
| 04/28/2005 | US20050088197 Pin driver for AC and DC semiconductor device testing |
| 04/28/2005 | US20050088196 Apparatus for automatically measuring a relatively wide range of leakage currents |
| 04/28/2005 | US20050088195 Daisy chain gang testing |
| 04/28/2005 | US20050088192 Method of manufacturing contact, contact made by the method, and inspection equipment or electronic equipment having the contact |
| 04/28/2005 | US20050088191 Probe testing structure |
| 04/28/2005 | US20050088190 Modularized probe head |
| 04/28/2005 | US20050088188 Evaluating a property of a multilayered structure |
| 04/28/2005 | US20050088187 Use of coefficient of a power curve to evaluate a semiconductor wafer |
| 04/28/2005 | US20050088186 Structure for measurement of capacitance of ultra-thin dielectrics |
| 04/28/2005 | US20050088169 Compensation for test signal degradation due to DUT fault |
| 04/28/2005 | US20050088168 Control module for use with a test probe |
| 04/28/2005 | US20050088167 Isolation buffers with controlled equal time delays |
| 04/28/2005 | US20050088166 Automated testing of frequency converter device |
| 04/28/2005 | US20050088164 Method for testing analog and mixed-signal circuits using functionally related excitations and functionally related measurements |
| 04/28/2005 | US20050088148 Control apparatus and method for vehicle equipped power supply having battery deterioration diagnostic feature |
| 04/28/2005 | US20050088145 Battery charge indicator such as for an implantable medical device |
| 04/28/2005 | US20050087784 Structure of a CMOS image sensor and method for fabricating the same |
| 04/28/2005 | CA2543048A1 Method and system for diagnosing degradation in vehicle wiring |
| 04/27/2005 | EP1526030A1 Control apparatus and method for vehicle equipped power supply having battery deterioration diagnostic feature |
| 04/27/2005 | EP1525489A1 Method and device for voltage measurement of an ac power supply |
| 04/27/2005 | EP1525488A1 Electronic circuit with asynchronously operating components |
| 04/27/2005 | EP1436636A4 Method and apparatus for sub-micron imaging and probing on probe station |
| 04/27/2005 | EP1285282B1 Method and device for detecting accidental arcs |
| 04/27/2005 | EP1232634A4 Non-contact signal analyzer |
| 04/27/2005 | EP1222472A4 Partial discharge monitoring system for transformers |
| 04/27/2005 | EP1018023B1 Probe card for testing wafers |
| 04/27/2005 | EP0910799B1 Iddq testable programmable logic arrays and a method for testing such a circuit |
| 04/27/2005 | EP0739048B1 System for managing state of storage battery |
| 04/27/2005 | CN2695984Y Anti-cutting alarm for farmland charging line |
| 04/27/2005 | CN2695983Y Power cut open-phase alarm |
| 04/27/2005 | CN2695982Y Electrical leakage testing alarm device for preventing electric fire |
| 04/27/2005 | CN2695979Y Three-pincers graphic phase voltammeter |
| 04/27/2005 | CN1610986A Method and device for estimating remaining capacity of secondary cell, battery pack system, and electric vehicle |
| 04/27/2005 | CN1610835A Improved integrated circuit burn-in methods and apparatus |
| 04/27/2005 | CN1610834A Method and apparatus for optimized parallel testing and access of electronic circuits |
| 04/27/2005 | CN1610833A Test machine for testing an integrated circuit with a comparator |
| 04/27/2005 | CN1610832A Insertosome and electronic parts processing device with the same |
| 04/27/2005 | CN1610485A Inspecting method for testing point before printed circuit board layout chart coming out |
| 04/27/2005 | CN1610352A Adjusting transmission rate to obtain optimum transmission rate in a mobile special network |
| 04/27/2005 | CN1610312A Method for providing guaranteed distributed failure notification |
| 04/27/2005 | CN1610206A Method for detecting voltage zero cross near fault in travelling wave protection |
| 04/27/2005 | CN1610086A Test sample for bridging and continuous testing |
| 04/27/2005 | CN1609626A Testing equipment and control method for electrical endurance (AC-3)of contactor and starter |
| 04/27/2005 | CN1609625A Electromagnetic relay static characteristic test analysis apparatus |
| 04/27/2005 | CN1609624A Automatic tester for electronic elements and testing method thereof |
| 04/27/2005 | CN1609623A Electric checkup apparatus and method for thin film carrying belt for mounting electronic elements |
| 04/27/2005 | CN1609622A Real-time detection method for spot welding nugget diameter |
| 04/27/2005 | CN1609430A Control apparatus and method for vehicle equipped power supply having battery deterioration diagnostic feature |
| 04/27/2005 | CN1199529C Method for checking soft printing circuit |
| 04/27/2005 | CN1199255C Method and device for measuring photoelectric translating characteristic |
| 04/27/2005 | CN1199105C Device and method of preventing bus contention |
| 04/27/2005 | CN1199092C Circuit arrangement and method for detecting undesired attack on integrated circuit |
| 04/27/2005 | CN1199051C Battery level indicator for telephone unit |
| 04/27/2005 | CN1199050C Means for estimating charged state of battery and method for estimating degraded state of battery |
| 04/27/2005 | CN1199049C Timing calibration method and device for integrated circuit testing unit |
| 04/27/2005 | CN1199041C Optical inspection system |
| 04/26/2005 | US6886145 Reducing verification time for integrated circuit design including scan circuits |
| 04/26/2005 | US6886142 Semiconductor device having embedded array |
| 04/26/2005 | US6886124 Low hardware overhead scan based 3-weight weighted random BIST architectures |
| 04/26/2005 | US6886123 Residue number system arithmetic circuits with built-in self test |
| 04/26/2005 | US6886122 Method for testing integrated circuits with memory element access |
| 04/26/2005 | US6886121 Hierarchical test circuit structure for chips with multiple circuit blocks |
| 04/26/2005 | US6886110 Multiple device scan chain emulation/debugging |
| 04/26/2005 | US6886107 Method and system for selecting a master controller in a redundant control plane having plural controllers |
| 04/26/2005 | US6885983 Method for automatically searching for functional defects in a description of a circuit |
| 04/26/2005 | US6885962 Signal inspection device |
| 04/26/2005 | US6885961 Hybrid tester architecture |
| 04/26/2005 | US6885959 Circuit and method for calibrating DRAM pullup Ron to pulldown Ron |
| 04/26/2005 | US6885952 System and method for determining voltage levels |
| 04/26/2005 | US6885951 Method and device for determining the state of function of an energy storage battery |
| 04/26/2005 | US6885700 Charge-based frequency measurement bist |
| 04/26/2005 | US6885670 Method and apparatus for fault tolerant, software transparent and high data integrity extension to a backplane or bus interconnect |
| 04/26/2005 | US6885633 Network node and a system |
| 04/26/2005 | US6885607 Semiconductor device having security technology |
| 04/26/2005 | US6885606 Synchronous semiconductor memory device with a plurality of memory banks and method of controlling the same |
| 04/26/2005 | US6885599 Semiconductor wafer, semiconductor chip, and manufacturing method of semiconductor device |
| 04/26/2005 | US6885598 Shared sense amplifier scheme semiconductor memory device and method of testing the same |
| 04/26/2005 | US6885444 Evaluating a multi-layered structure for voids |
| 04/26/2005 | US6885307 Battery monitor |
| 04/26/2005 | US6885265 Hybrid mode stirred and mode tuned chamber |
| 04/26/2005 | US6885219 Programmable driver for an I/O pin of an integrated circuit |
| 04/26/2005 | US6885214 Method for measuring capacitance-voltage curves for transistors |
| 04/26/2005 | US6885213 Circuit and method for accurately applying a voltage to a node of an integrated circuit |