| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 05/05/2005 | US20050095880 Stress relieved contact array |
| 05/05/2005 | US20050095734 Reducing damage to test pads, wires, dielectrics; cutting grooves into reinforcement; thin film detector; electrical connecting to wires |
| 05/05/2005 | US20050095728 Method of electrical characterization of a silicon-on-insulator ( SOI) wafer |
| 05/05/2005 | US20050094866 Position reference beacon for integrated circuits |
| 05/05/2005 | US20050094563 Method and device for reproducing data |
| 05/05/2005 | US20050094450 Semiconductor device and testing apparatus for semiconductor device |
| 05/05/2005 | US20050094432 Multi-mode synchronous memory device and methods of operating and testing same |
| 05/05/2005 | US20050093568 Semiconductor logic circuit device having pull-up/pull-down circuit for input buffer pad and wafer-probing testing method therefor |
| 05/05/2005 | US20050093567 Inspection method and inspection device for display device and active matrix substrate used for display device |
| 05/05/2005 | US20050093566 Device and method for isolating a short-circuited integrated circuit (IC) from other ICs on a semiconductor wafer |
| 05/05/2005 | US20050093565 Fabrication method of semiconductor integrated circuit device |
| 05/05/2005 | US20050093564 Signal test procedure for testing semi-conductor components and a test apparatus for testing semi-conductor components |
| 05/05/2005 | US20050093563 Conductance-voltage (gv) based method for determining leakage current in dielectrics |
| 05/05/2005 | US20050093562 Device for measurement and analysis of electrical signals of an integrated circuit component |
| 05/05/2005 | US20050093561 Semiconductor integrated circuit testing device and method |
| 05/05/2005 | US20050093560 New methodology to measure many more transistors on the same test area |
| 05/05/2005 | US20050093559 Connection pin |
| 05/05/2005 | US20050093557 Method of forming an electrical contact |
| 05/05/2005 | US20050093553 Current over-flow detector for motor driving circuit |
| 05/05/2005 | US20050093536 Manual probe carriage system and method of using the same |
| 05/05/2005 | US20050093534 Stage for placing target object |
| 05/05/2005 | US20050093522 Loading device |
| 05/05/2005 | US20050093516 Method and apparatus for measuring electrical cell voltage |
| 05/05/2005 | US20050092988 Mounting member of semiconductor device, mounting configuration of semiconductor device, and drive unit of semiconductor device |
| 05/05/2005 | US20050092985 Single and double-gate pseudo-fet devices for semiconductor materials evaluation |
| 05/05/2005 | US20050092930 Charged particle beam apparatus and automatic astigmatism adjustment method |
| 05/04/2005 | EP1528703A2 Forced-alignment measurement tools for composite eye diagrams |
| 05/04/2005 | EP1528589A2 Stage for placing target object |
| 05/04/2005 | EP1528479A2 Method and system for producing an internal time basis for a diagnostic function of an output stage component |
| 05/04/2005 | EP1528401A1 Test loading device |
| 05/04/2005 | EP1528400A2 Noncontact testing of integrated circuits |
| 05/04/2005 | EP1528391A1 Method of determining modifications in an eletronic card and method of manufacturing. |
| 05/04/2005 | EP1527646A1 System and method for retransmission of data |
| 05/04/2005 | EP1527394A1 Sensor, controller and method for monitoring at least one sensor |
| 05/04/2005 | EP1527348A1 Time-frequency domain reflectometry apparatus and method |
| 05/04/2005 | EP1527347A1 Method for monitoring at least two electromagnetic valves of an internal combustion engine, especially an internal combustion engine of a motor vehicle |
| 05/04/2005 | EP1271894B1 Packet transmitter unit, packet receiver unit and packet transmission system |
| 05/04/2005 | EP1057233A4 Zone arc fault detection |
| 05/04/2005 | DE19531827B4 Meßsystem für elektrische Störungen in einer Hochspannungsschaltanlage A measuring system for electrical faults in a high-voltage switchgear |
| 05/04/2005 | DE10018356B4 Verfahren zum Identifizieren eines elektronischen Steuergeräts und dafür geeignetes Steuergerät A method for identifying an electronic control unit and control unit suitable for this purpose |
| 05/04/2005 | CN2697896Y Alarm socket for preventing electric shock |
| 05/04/2005 | CN2697816Y Dust remover for static characteristic test equipment of color kinescope |
| 05/04/2005 | CN2697815Y Wireless type carlibration tester for dispaly device |
| 05/04/2005 | CN2697664Y High-precision on-line monitoring sensor for leakage current |
| 05/04/2005 | CN2697663Y High-voltage charged display device |
| 05/04/2005 | CN2697662Y Local discharge detection sensor for ultraviolet frequency band |
| 05/04/2005 | CN2697661Y Electronic buzzer for wiring |
| 05/04/2005 | CN2697660Y Tester for circuit board on-line investigating instrument |
| 05/04/2005 | CN2697659Y Remote on-line intelligent monitor instrument for metallic oxide lighting arrester |
| 05/04/2005 | CN2697652Y Axial connector |
| 05/04/2005 | CN1613212A Enable propagation controller |
| 05/04/2005 | CN1613016A Method for on-line calibration of low accuracy voltage sensor through communication bus |
| 05/04/2005 | CN1612345A 半导体器件和显示器件 Semiconductor devices and display devices |
| 05/04/2005 | CN1612322A Fabrication method of semiconductor integrated circuit device |
| 05/04/2005 | CN1612321A Fabrication method of semiconductor integrated circuit device |
| 05/04/2005 | CN1612003A Apparatus and method for checking liquid crystal display array substrate |
| 05/04/2005 | CN1611958A Key-controlled board measuring device |
| 05/04/2005 | CN1611957A Integrated circuit measuring system |
| 05/04/2005 | CN1611956A Testing device, device for setting standard to judge if qualified or not, testing method and program |
| 05/04/2005 | CN1611955A Distributed intelligent monitoring system for motor |
| 05/04/2005 | CN1611954A Thin film transistor display array measuring circuit and method |
| 05/04/2005 | CN1611952A Electrical Appliance operation fire monitoring system |
| 05/04/2005 | CN1611949A Method of manufacturing contact, contact made by the method |
| 05/04/2005 | CN1611935A Damage-free and non-contact analysis system |
| 05/04/2005 | CN1200283C Tester with fast refire recovery time and test method |
| 05/04/2005 | CN1200282C Semi-conductor integrated circuit with measurable component block |
| 05/04/2005 | CN1200281C Specific purpose semiconductor memory testing system based on event |
| 05/03/2005 | US6889369 Method and apparatus for determining critical timing path sensitivities of macros in a semiconductor device |
| 05/03/2005 | US6889368 Method and apparatus for localizing faults within a programmable logic device |
| 05/03/2005 | US6889350 Method and apparatus for testing an I/O buffer |
| 05/03/2005 | US6889348 Tester architecture construction data generating method, tester architecture constructing method and test circuit |
| 05/03/2005 | US6889199 Method and apparatus for encoding and generating transaction-based stimulus for simulation of VLSI circuits |
| 05/03/2005 | US6889164 Method and apparatus of determining defect-free semiconductor integrated circuit |
| 05/03/2005 | US6889147 System, computer program product and method for controlling a fuel cell testing device |
| 05/03/2005 | US6888774 Semiconductor memory device and its testing method |
| 05/03/2005 | US6888765 Integrated circuit and method for testing same using single pin to control test mode and normal mode operation |
| 05/03/2005 | US6888764 Semiconductor device including semiconductor memory |
| 05/03/2005 | US6888751 Nonvolatile semiconductor memory device |
| 05/03/2005 | US6888454 Fault diagnosis circuit for LED indicating light |
| 05/03/2005 | US6888453 Environmental monitoring system |
| 05/03/2005 | US6888414 Controllable and testable oscillator apparatus for an integrated circuit |
| 05/03/2005 | US6888368 System and method of monitoring, predicting and optimizing production yields in a liquid crystal display (LCD) manufacturing process |
| 05/03/2005 | US6888367 Method and apparatus for testing integrated circuit core modules |
| 05/03/2005 | US6888366 Apparatus and method for testing a plurality of semiconductor chips |
| 05/03/2005 | US6888365 Semiconductor wafer testing system |
| 05/03/2005 | US6888364 Test system and test contactor for electronic modules |
| 05/03/2005 | US6888363 Method and device for cooling/heating die during burn in |
| 05/03/2005 | US6888361 High density logic analyzer probing system |
| 05/03/2005 | US6888343 Test head manipulator |
| 05/03/2005 | US6888317 Organic electroluminescent device |
| 05/03/2005 | US6888256 Compliant relief wafer level packaging |
| 05/03/2005 | US6888158 Bare chip carrier and method for manufacturing semiconductor device using the bare chip carrier |
| 05/03/2005 | US6887724 Test element group, method of manufacturing a test element group, method of testing a semiconductor device, and semiconductor device |
| 05/03/2005 | US6887723 Method for processing an integrated circuit including placing dice into a carrier and testing |
| 05/03/2005 | US6887085 Terminal for spiral contactor and spiral contactor |
| 04/28/2005 | WO2005038477A1 Method of online testing for an intermediate link |
| 04/28/2005 | WO2005038475A1 Insulation degradation diagnosis apparatus |
| 04/28/2005 | WO2005038474A1 Method and apparatus for identifying intermittent earth fault |
| 04/28/2005 | WO2005038473A1 Method and system for diagnosing degradation in vehicle wiring |
| 04/28/2005 | WO2005013037A3 Method and apparatus for shifting at-speed scan patterns in a scan-based integrated circuit |