| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 05/12/2005 | US20050099170 Method of an apparatus for testing wiring |
| 05/12/2005 | US20050099154 Battery pack charging system |
| 05/12/2005 | US20050098780 Planar voltage contrast test structure and method |
| 05/12/2005 | US20050098779 Production process for producing semiconductor devices, semiconductor devices produced thereby, and test system for carrying out yield-rate test in production of such semiconductor devices |
| 05/12/2005 | US20050098778 Burn-in test adapter and burn-in test apparatus |
| 05/12/2005 | DE4335879B4 Anordnung zur Qualitätskontrolle und -überwachung von durchkontaktierten Mehrlagen-Leiterplatten Arrangement for quality control and monitoring of plated through multi-layer printed circuit boards |
| 05/12/2005 | DE10392306T5 Kontaktstruktur mit Siliziumtastkontaktgeber Contact structure with Siliziumtastkontaktgeber |
| 05/12/2005 | DE10030021B4 Testvorrichtung zur linienförmigen Abtastung von Polflächen Test device for linear scanning of the pole faces |
| 05/12/2005 | CA2761111A1 Electric utility storm outage management |
| 05/11/2005 | EP1530056A2 Method of testing of a silicon-on-insulator wafer |
| 05/11/2005 | EP1530055A1 Device for testing of electronic components |
| 05/11/2005 | EP1530054A1 Test device for testing the operability of an electrical component |
| 05/11/2005 | EP1530053A1 Conductance-voltage (GV) based method for determining leakage current in dielectrics |
| 05/11/2005 | EP1530052A2 Diagnostic method for physical faults of a CAN network in a car |
| 05/11/2005 | EP1529293A1 Built-in-self-test of flash memory cells |
| 05/11/2005 | EP1314045B1 Method for providing bitwise constraints for test generation |
| 05/11/2005 | EP1256006A4 Non-invasive electrical measurement of semiconductor wafers |
| 05/11/2005 | EP1224482B1 Method and device for the data protecting self-test of a microcontroller |
| 05/11/2005 | EP1163532B1 Method for identifying the condition of an energy accumulator |
| 05/11/2005 | EP0914617B1 Process for testing a product and equipment for carrying out the process |
| 05/11/2005 | CN2699312Y Electric motor three-phase current detecting circuit for machine tool AC servo system |
| 05/11/2005 | CN2699311Y Insulator dirtiness discharge monitoring device |
| 05/11/2005 | CN1615444A Flexible test head interface |
| 05/11/2005 | CN1615443A Method and apparatus for broadcasting scan patterns in a scan-based integrated circuit |
| 05/11/2005 | CN1614938A Lateral and straight multi-line testing cable of ADSL circuit |
| 05/11/2005 | CN1614440A Voltage measuring circuit of single accumulator |
| 05/11/2005 | CN1614439A Detector of accumulator |
| 05/11/2005 | CN1614438A Testing method for dynamic characterist ics of electromagnetic relay |
| 05/11/2005 | CN1614437A Methods and apparatus for diagnosing defect locations in electrical paths of connectors of circuit assemblies |
| 05/11/2005 | CN1614436A Method and device for inspecting circuit board |
| 05/11/2005 | CN1614435A Circuit fault directional detecting and protecting method for power supply system |
| 05/11/2005 | CN1614434A Superconductive conversion magnetic signal detecting system for high-voltage experiment |
| 05/11/2005 | CN1614429A Current consumption recorder of mobile device and mobile device therewith |
| 05/11/2005 | CN1201384C Wafer class probe card and its mfg. method |
| 05/11/2005 | CN1201238C Data processing apparatus with circuit for determining serial transismsion data proper characteristic |
| 05/11/2005 | CN1201229C Method and device for tracing hard-ware condition using dynamic reconstruction testing circuit |
| 05/11/2005 | CN1201163C Method of determining effective voltage of battery |
| 05/11/2005 | CN1201162C Battery pack having charging indicator state |
| 05/11/2005 | CN1201161C Probe card for probing wafers with raised contact elements |
| 05/11/2005 | CN1201160C Testing method and device of semiconductor integrated circuit of liquid crastal driver |
| 05/11/2005 | CN1201159C Contacting arm, and device for testing electronic parts by using same |
| 05/11/2005 | CN1201157C Device and method for detecting earthing failure in solar generating system |
| 05/11/2005 | CN1201155C Battery current measuring system of electric motor car |
| 05/10/2005 | US6892338 Analog/digital characteristics testing device and IC testing apparatus |
| 05/10/2005 | US6892337 Circuit and method for testing physical layer functions of a communication network |
| 05/10/2005 | US6892333 IC measuring device |
| 05/10/2005 | US6892165 Diagnosis method and diagnosis apparatus of photovoltaic power system |
| 05/10/2005 | US6892157 On-die automatic selection of manipulated clock pulse |
| 05/10/2005 | US6892154 Method and apparatus for developing multiple test cases from a base test case |
| 05/10/2005 | US6892148 Circuit and method for measurement of battery capacity fade |
| 05/10/2005 | US6892147 Information handling system including a power management apparatus capable of independently switching between a primary and secondary battery |
| 05/10/2005 | US6891794 System and method for bandwidth protection in a packet network |
| 05/10/2005 | US6891410 Method and apparatus for determining a processing speed of an integrated circuit |
| 05/10/2005 | US6891408 Current pulse receiving circuit |
| 05/10/2005 | US6891403 On-chip PLL locked frequency determination method and system |
| 05/10/2005 | US6891395 Application-specific testing methods for programmable logic devices |
| 05/10/2005 | US6891393 Synchronous semiconductor device, and inspection system and method for the same |
| 05/10/2005 | US6891391 Measuring method, inspection method, inspection device, semiconductor device, method of manufacturing a semiconductor device, and method of manufacturing an element substrate |
| 05/10/2005 | US6891390 Circuit analysis using electric field-induced effects |
| 05/10/2005 | US6891389 System and method for detecting quiescent current in an integrated circuit |
| 05/10/2005 | US6891388 Lead protrusion tester |
| 05/10/2005 | US6891387 System for probing, testing, burn-in, repairing and programming of integrated circuits |
| 05/10/2005 | US6891386 Semiconductor device socket and semiconductor device connecting method using anisotropic conductive sheet |
| 05/10/2005 | US6891385 Probe card cooling assembly with direct cooling of active electronic components |
| 05/10/2005 | US6891384 Multi-socket board for open/short tester |
| 05/10/2005 | US6891378 Electronic battery tester |
| 05/10/2005 | US6891363 Apparatus and method for detecting photon emissions from transistors |
| 05/10/2005 | US6891361 Automatic gain control (AGC) loop for characterizing continuous-time or discrete-time circuitry gain response across frequency |
| 05/10/2005 | US6891360 Plated probe structure |
| 05/10/2005 | US6891359 Circuitry and methodology to establish correlation between gate dielectric test site reliability and product gate reliability |
| 05/10/2005 | US6891354 Method for detecting slow and small changes of electrical signals |
| 05/10/2005 | US6891341 Aligning apparatus in semiconductor device test handler |
| 05/10/2005 | US6891132 Shutters for burn-in-board connector openings |
| 05/10/2005 | US6890772 Method and apparatus for determining two dimensional doping profiles with SIMS |
| 05/10/2005 | US6889509 Coolant recovery system |
| 05/06/2005 | WO2005041296A1 Chip-mount wiring sheet, sheet-mounted chip, and sheet-mounted chip manufacturing method |
| 05/06/2005 | WO2005041259A2 A system-level test architecture for delivery of compressed tests |
| 05/06/2005 | WO2005040844A1 Method and device for self-diagnosis of sensor comprising jump element |
| 05/06/2005 | WO2005040840A1 Method and device for estimating remaining service life of coil |
| 05/06/2005 | WO2005040839A1 Evaluation circuit for detecting and/or locating faulty data words in a data stream tn |
| 05/06/2005 | WO2005040838A1 System and method for testing control processes in a vehicle |
| 05/06/2005 | WO2005040836A2 Isolation buffers with controlled equal time delays |
| 05/06/2005 | WO2004107103A3 Apparatus and method for sensing emulator cable orientation while providing signal drive capability |
| 05/06/2005 | WO2004077260A3 Method and apparatus for creating circuit redundancy in programmable logic devices |
| 05/05/2005 | US20050097420 Apparatus for jitter testing an IC |
| 05/05/2005 | US20050097419 Method and apparatus for selectively compacting test reponses |
| 05/05/2005 | US20050097418 Semiconductor integrated circuit |
| 05/05/2005 | US20050097417 Novel bisr mode to test the redundant elements and regular functional memory to avoid test escapes |
| 05/05/2005 | US20050097416 Testing of integrated circuits using boundary scan |
| 05/05/2005 | US20050097415 Scan test method, integrated circuit, and scan test circuit |
| 05/05/2005 | US20050097414 Apparatus and method for performing poll commands using JTAG scans |
| 05/05/2005 | US20050097413 System-level test architecture for delivery of compressed tests |
| 05/05/2005 | US20050097069 Method of choosing tester designs and use model using operating characteristics |
| 05/05/2005 | US20050096863 System and method for testing a component in a computer system using voltage margining |
| 05/05/2005 | US20050096862 Auto-linking of function logic state with testcase regression list |
| 05/05/2005 | US20050096858 Fuel cell evaluation method and fuel evaluation apparatus |
| 05/05/2005 | US20050096856 Electric utility storm outage management |
| 05/05/2005 | US20050096805 Wireless communication for diagnostic instrument |
| 05/05/2005 | US20050096773 Procedure for determining modifications made to an electronic card and methods of fabricating an electronic card and an item equipment provided with an electronic card |
| 05/05/2005 | US20050095988 Adaptive communication methods and apparatus |