| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 05/18/2005 | CN2701139Y Load power signal integration sampler for mining motor |
| 05/18/2005 | CN2701058Y Testing button for circuit breaker |
| 05/18/2005 | CN2700893Y Power control apparatus for battery testing |
| 05/18/2005 | CN2700892Y Battery detection sorting instrument |
| 05/18/2005 | CN2700891Y Intelligent type power distribution system fault alarm device |
| 05/18/2005 | CN1618027A Compact ate with timestamp system |
| 05/18/2005 | CN1618026A Testing of circuit with plural clock domains |
| 05/18/2005 | CN1618022A Input buffer and method for voltage level detection |
| 05/18/2005 | CN1618004A Method and apparatus for measuring stress in semiconductor wafers |
| 05/18/2005 | CN1617390A Intelligent earthing stick system |
| 05/18/2005 | CN1617262A Method for detecting FCASH inner unit |
| 05/18/2005 | CN1616982A Battery pack and remaining battery capacity calculation method |
| 05/18/2005 | CN1616981A Battery pack and remaining battery power calculation method |
| 05/18/2005 | CN1616980A Device for displaying accumulator power quantity for automobile |
| 05/18/2005 | CN1616979A No coupling property detecting system and its method for single phase AC series excitation commutator motor |
| 05/18/2005 | CN1616978A Self resetting fuse operation time detector |
| 05/18/2005 | CN1616977A Apparatus for testing liquid crystal display device and testing method thereof |
| 05/18/2005 | CN1616976A Automatic detecting system for relay |
| 05/18/2005 | CN1202616C High frequency clock pulse loss detection circuit with low frequency clock |
| 05/18/2005 | CN1202613C Power change device |
| 05/18/2005 | CN1202426C Apparatus and method for testing coating of an electical conductor |
| 05/18/2005 | CN1202406C Portable wave detector low frequency receiving voltage sensitivity performance measurer |
| 05/17/2005 | US6895566 Methods and apparatus for isolating critical paths on an IC device having a thermal energy generator |
| 05/17/2005 | US6895565 Methods for predicting board test coverage |
| 05/17/2005 | US6895563 Universal laboratory prototyping interface system |
| 05/17/2005 | US6895548 Semiconductor testing apparatus and method for optimizing a wait time until stabilization of semiconductor device output signal |
| 05/17/2005 | US6895540 Mux scan cell with delay circuit for reducing hold-time violations |
| 05/17/2005 | US6895539 Universal method and apparatus for controlling a functional test system |
| 05/17/2005 | US6895536 Testable up down counter for use in a logic analyzer |
| 05/17/2005 | US6895535 Circuit and method for testing high speed data circuits |
| 05/17/2005 | US6895353 Apparatus and method for monitoring high impedance failures in chip interconnects |
| 05/17/2005 | US6895346 Method for test conditions |
| 05/17/2005 | US6895343 System and method for measuring essential power amplification functions |
| 05/17/2005 | US6894973 Fair bandwidth sharing for video traffic sources using distributed feedback control |
| 05/17/2005 | US6894773 Method and apparatus for analyzing the state of generation of foreign particles in semiconductor fabrication process |
| 05/17/2005 | US6894749 Reflection liquid crystal display |
| 05/17/2005 | US6894526 Apparatus for determining burn-in reliability from wafer level burn-in |
| 05/17/2005 | US6894525 Method and device for time measurement on semiconductor modules employing the ball-grid-array technique |
| 05/17/2005 | US6894524 Daisy chain gang testing |
| 05/17/2005 | US6894523 System and method for testing semiconductor devices |
| 05/17/2005 | US6894522 Specific site backside underlaying and micromasking method for electrical characterization of semiconductor devices |
| 05/17/2005 | US6894521 Burn-in carrier for a semiconductor die |
| 05/17/2005 | US6894520 Semiconductor device and capacitance measurement method |
| 05/17/2005 | US6894519 Apparatus and method for determining electrical properties of a semiconductor wafer |
| 05/17/2005 | US6894518 Circuit analysis and manufacture using electric field-induced effects |
| 05/17/2005 | US6894517 Method for monitoring oxide quality |
| 05/17/2005 | US6894516 Method and apparatus for implementing very high density probing (VHDP) of printed circuit board signals |
| 05/17/2005 | US6894515 Inspection unit and method of manufacturing substrate |
| 05/17/2005 | US6894513 Multipoint plane measurement probe and methods of characterization and manufacturing using same |
| 05/17/2005 | US6894503 Preconditional quiescent current testing of a semiconductor device |
| 05/17/2005 | US6894481 Method and apparatus for bringing laser chips to a measurement position |
| 05/17/2005 | US6894480 Wafer probing test apparatus and method of docking the test head and probe card thereof |
| 05/17/2005 | US6894478 Fault indicator with automatically configured trip settings |
| 05/17/2005 | US6894477 Electrical current monitor |
| 05/17/2005 | US6894308 IC with comparator receiving expected and mask data from pads |
| 05/17/2005 | US6894301 Method and apparatus for testing circuit using light emission |
| 05/17/2005 | US6893753 Rechargeable battery equipped with battery protection circuit |
| 05/12/2005 | WO2005043662A1 Fuel cell test station gas-purge system and method |
| 05/12/2005 | WO2005043661A1 Coolant flow control for a fuel cell testing station |
| 05/12/2005 | WO2005043594A2 Method for forming photo-defined micro electrical contacts |
| 05/12/2005 | WO2005043347A2 Electric utility storm outage management |
| 05/12/2005 | WO2005043276A2 System-in-package and method of testing thereof |
| 05/12/2005 | WO2005043176A2 Probe testing structure |
| 05/12/2005 | WO2005026820A8 Pellicle |
| 05/12/2005 | WO2004114569A3 Optimizing link throughput associated with non-congestion loss |
| 05/12/2005 | WO2004090723A3 A high reliability memory module with a fault tolerant address and command bus |
| 05/12/2005 | WO2004070775A3 Light-induced capacitance spectroscopy and method for obtaining carrier lifetime with micron/nanometer scale |
| 05/12/2005 | US20050102596 Database mining system and method for coverage analysis of functional verification of integrated circuit designs |
| 05/12/2005 | US20050102594 Method for test application and test content generation for AC faults in integrated circuits |
| 05/12/2005 | US20050102593 Method of testing phase lock loop status during a serializer/deserializer internal loopback built-in self-test |
| 05/12/2005 | US20050102592 Circuit testing with ring-connected test instrument modules |
| 05/12/2005 | US20050102591 Failure detection system, failure detection method, and computer program product |
| 05/12/2005 | US20050102589 Flash memory test system and method capable of test time reduction |
| 05/12/2005 | US20050102576 Multi-sample read circuit having test mode of operation |
| 05/12/2005 | US20050102570 Test apparatus and writing control circuit |
| 05/12/2005 | US20050102449 Multi-function data acquisition system and method |
| 05/12/2005 | US20050102445 Apparatus measuring system-on-a-chip efficiency and method thereof |
| 05/12/2005 | US20050102435 Method and device for monitoring an integrated circuit |
| 05/12/2005 | US20050099955 Ethernet OAM fault isolation |
| 05/12/2005 | US20050099949 Ethernet OAM domains and ethernet OAM frame format |
| 05/12/2005 | US20050099866 Method and circuit for determining sense amplifier sensitivity |
| 05/12/2005 | US20050099862 Probe look ahead: testing parts not currently under a probehead |
| 05/12/2005 | US20050099854 Semiconductor wafer test system |
| 05/12/2005 | US20050099832 System and method for securing an integrated circuit as against subsequent reprogramming |
| 05/12/2005 | US20050099741 Tap changer monitoring |
| 05/12/2005 | US20050099203 Voltage apparatus in a semiconductor probe station |
| 05/12/2005 | US20050099202 Method of testing an integrated circuit and an integrated circuit test apparatus |
| 05/12/2005 | US20050099200 LSI testing apparatus |
| 05/12/2005 | US20050099199 Semiconductor device and its test method |
| 05/12/2005 | US20050099198 Arrangement and method for testing a capacitance array in an integrated circuit |
| 05/12/2005 | US20050099197 Dynamic burn-in apparatus and adapter card for dynamic burn-in apparatus |
| 05/12/2005 | US20050099196 Semiconductor inspection device based on use of probe information, and semiconductor inspection method |
| 05/12/2005 | US20050099192 Probe station with low inductance path |
| 05/12/2005 | US20050099190 Evaluating sidewall coverage in a semiconductor wafer |
| 05/12/2005 | US20050099189 Inspection method and apparatus for circuit pattern of resist material |
| 05/12/2005 | US20050099187 Method of diagnosing a fault on a transformer winding |
| 05/12/2005 | US20050099186 Methods and apparatus for diagnosing defect locations in electrical paths of connectors of circuit assemblies |
| 05/12/2005 | US20050099185 Apparatus and method for simulating a battery tester with a fixed resistance load |
| 05/12/2005 | US20050099174 System for testing one or more groups of ic-chips while concurrently loading/unloading another group |
| 05/12/2005 | US20050099173 System for testing a group of ic-chips having a chip holding subassembly that is built-in and loaded/unloaded automatically |