| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 05/25/2005 | CN1202979C Method for making conveying tray cycle by using module IC to operate lifting unit and device therefor |
| 05/24/2005 | US6898750 In-chip monitoring system to monitor input/output of functional blocks |
| 05/24/2005 | US6898749 IC with cache bit memory in series with scan segment |
| 05/24/2005 | US6898748 Test circuit method and apparatus |
| 05/24/2005 | US6898747 Method for testing circuit units to be tested with increased data compression for burn-in |
| 05/24/2005 | US6898746 Method of and apparatus for testing a serial differential/mixed signal device |
| 05/24/2005 | US6898745 Integrated device with operativity testing |
| 05/24/2005 | US6898734 I/O stress test |
| 05/24/2005 | US6898545 Semiconductor test data analysis system |
| 05/24/2005 | US6898544 Instruction register and access port gated clock for scan cells |
| 05/24/2005 | US6898539 Method for analyzing final test parameters |
| 05/24/2005 | US6898189 Restartable spanning tree for high availability network systems |
| 05/24/2005 | US6898184 Private arbitrated loop self-test management for a fibre channel storage enclosure |
| 05/24/2005 | US6898183 Method of determining a data link path in a managed network |
| 05/24/2005 | US6897784 Water monitoring system and water monitoring method for high voltage cables |
| 05/24/2005 | US6897679 Programmable logic array integrated circuits |
| 05/24/2005 | US6897678 Programmable logic device with circuitry for observing programmable logic circuit signals and for preloading programmable logic circuits |
| 05/24/2005 | US6897674 Adaptive integrated circuit based on transistor current measurements |
| 05/24/2005 | US6897673 Method and integrated circuit for capacitor measurement with digital readout |
| 05/24/2005 | US6897671 System and method for reducing heat dissipation during burn-in |
| 05/24/2005 | US6897670 Parallel integrated circuit test apparatus and test method |
| 05/24/2005 | US6897668 Double-faced detecting devices for an electronic substrate |
| 05/24/2005 | US6897667 Test system for silicon substrate having electrical contacts |
| 05/24/2005 | US6897665 In-situ electron beam induced current detection |
| 05/24/2005 | US6897664 Laser beam induced phenomena detection |
| 05/24/2005 | US6897663 Optical testing port and wafer level testing without probe cards |
| 05/24/2005 | US6897662 Method and apparatus for optimizing the accuracy of an electronic circuit |
| 05/24/2005 | US6897646 Method for testing wafers to be tested and calibration apparatus |
| 05/24/2005 | US6897645 Docking system and method for docking in automated testing systems |
| 05/24/2005 | US6897635 Method for predicting remaining charge of portable electronics battery |
| 05/24/2005 | US6897554 Test circuit and multi-chip package type semiconductor device having the test circuit |
| 05/24/2005 | US6897476 Test structure for determining electromigration and interlayer dielectric failure |
| 05/24/2005 | US6897475 Test structure and related methods for evaluating stress-induced voiding |
| 05/24/2005 | US6897385 Semiconductor test board for fine ball pitch ball grid array package |
| 05/24/2005 | US6896186 Semiconductor device and an information management system thereof |
| 05/24/2005 | US6895809 Method and apparatus for testing a motor |
| 05/21/2005 | CA2450507A1 Methods and systems for load bank control and operation |
| 05/19/2005 | WO2005045767A1 Wireless communication for diagnostic instrument |
| 05/19/2005 | WO2005045453A1 Apparatus and method for fuel cell resistance test |
| 05/19/2005 | WO2005045452A1 Test equipment and cable guide unit |
| 05/19/2005 | WO2005045451A1 Conductive contact holder and conductive contact unit |
| 05/19/2005 | WO2005045450A1 Noncontact conductivity measuring instrument |
| 05/19/2005 | WO2005003884A3 Dynamic signaling and routing |
| 05/19/2005 | WO2004090558A3 Test head positioning system and method |
| 05/19/2005 | WO2004084461A3 Method and system for emulating a fibre channel link over a sonet/sdh path |
| 05/19/2005 | WO2004053928A3 Methods of measuring integrated circuit structure and preparation thereof |
| 05/19/2005 | WO2002090054A3 Contactor cleaning sheet, contactor cleaning sheet manufacturing method, and contactor cleaning method |
| 05/19/2005 | US20050108609 Method for testing circuit units to be tested by means of majority decisions and test device for performing the method |
| 05/19/2005 | US20050108608 Long running test method for a circuit design analysis |
| 05/19/2005 | US20050108607 Semiconductor memory device and test pattern data generating method using the same |
| 05/19/2005 | US20050108606 Input/output switching arrangement for semiconductor circuits, a method for testing driver circuits in semiconductor circuits |
| 05/19/2005 | US20050108605 Pseudo random test pattern generation using Markov chains |
| 05/19/2005 | US20050108604 Scan chain registers that utilize feedback paths within latch units to support toggling of latch unit outputs during enhanced delay fault testing |
| 05/19/2005 | US20050108603 Input switching arrangement for a semiconductor circuit and test method for unidirectional input drivers in semiconductor circuits |
| 05/19/2005 | US20050108602 Methodology for performing register read/writes to two or more expanders with a common test port |
| 05/19/2005 | US20050108600 Process and device for testing a serializer circuit arrangement and process and device for testing a deserializer circuit arrangement |
| 05/19/2005 | US20050108599 Using clock gating or signal gating to partition a device for fault isolation and diagnostic data collection |
| 05/19/2005 | US20050108228 Apparatus and method for performing a polling operation of a single bit in a JTAG data stream |
| 05/19/2005 | US20050107977 Test device for signaling and waveform generation and monitoring |
| 05/19/2005 | US20050107976 Programmable system for device testing and control |
| 05/19/2005 | US20050107974 Method for testing displays |
| 05/19/2005 | US20050107970 Built in self test circuit for measuring total timing uncertainty in a digital data path |
| 05/19/2005 | US20050107966 System and method for determining voltage levels |
| 05/19/2005 | US20050106926 Independently-adjustable circuit board carrier |
| 05/19/2005 | US20050106904 Connector and method of manufacturing the same |
| 05/19/2005 | US20050106881 Wafer reuse techniques |
| 05/19/2005 | US20050106764 Test pattern for reliability measurement of copper interconnection line having moisture window and method for manufacturing the same |
| 05/19/2005 | US20050105351 Ic transfer device |
| 05/19/2005 | US20050105333 Method of measuring threshold voltage for a NAND flash memory device |
| 05/19/2005 | US20050104830 Method and device for measuring drive current of thin film transistor array |
| 05/19/2005 | US20050104734 Short circuit detector for shield conductor in a fieldbus network |
| 05/19/2005 | US20050104636 Dynamic resynchronization of clocked interfaces |
| 05/19/2005 | US20050104616 Electric motor monitoring system |
| 05/19/2005 | US20050104615 Apparatus for testing liquid crystal display device and testing method thereof |
| 05/19/2005 | US20050104614 Inspection device for inspecting TFT |
| 05/19/2005 | US20050104613 Electrostatic discharge testers for undistorted human-body-model and machine-model characteristics |
| 05/19/2005 | US20050104612 Current mirror multi-channel leakage current monitor circuit and method |
| 05/19/2005 | US20050104611 Device for measuring supply voltage and method thereof |
| 05/19/2005 | US20050104610 Probe station with low noise characteristics |
| 05/19/2005 | US20050104609 Microprobe tips and methods for making |
| 05/19/2005 | US20050104608 Method and system of testing complex MCM's |
| 05/19/2005 | US20050104602 Method and apparatus for implementing automated electronic package transmission line characteristic impedance verification |
| 05/19/2005 | US20050104598 Method and apparatus for detecting wear in components of high voltage electrical equipment |
| 05/19/2005 | US20050104597 Protective relay test device having a hand-held controller |
| 05/19/2005 | US20050104559 Method and circuit arrangement for determining the average current consumption of a battery-operated apparatus |
| 05/19/2005 | US20050104063 Shallow trench isolation void detecting method and structure for the same |
| 05/19/2005 | US20050103034 Cooling air flow control valve for burn-in system |
| 05/19/2005 | DE202004019280U1 Electrochemical traction battery life status and availability prediction unit records actual current and voltage so as to construct polynomial approximation of charging process versus time |
| 05/19/2005 | DE19738569B4 Testschaltkreis für integrierte Schaltkreise und Verfahren zum Testen Test circuit for integrated circuits and methods for testing |
| 05/19/2005 | DE10392593T5 Halbleitertestgerät Semiconductor testing apparatus |
| 05/19/2005 | DE10346379A1 Verfahren zum Bestimmen des Frequenzgangs eines elektrooptischen Bauelements A method for determining the frequency response of an electro-optical device |
| 05/19/2005 | DE10345615A1 System und Verfahren zum Testen von Steuervorgängen bei einem Fahrzeug System and method for testing of control operations in a vehicle |
| 05/19/2005 | DE10234537B4 Verfahren und Vorrichtung zum Orten von Kabelmuffen und Kabelfehlern bei verlegten Kabeln Method and apparatus for locating cable glands and cable faults in cables laid |
| 05/19/2005 | CA2544231A1 Apparatus and method for fuel cell resistance test |
| 05/18/2005 | EP1531515A2 Battery pack and remaining battery power calculation method |
| 05/18/2005 | EP1531335A2 Battery pack and remaining battery capacity calculation method |
| 05/18/2005 | EP1530727A1 Module, electronic device and evaluation tool |
| 05/18/2005 | EP1451599A4 Method and apparatus for embeded built-in self-test (bist) of electronic circuits and systems |
| 05/18/2005 | EP1402278A4 Method and apparatus for optimized parallel testing and access of electronic circuits |
| 05/18/2005 | EP1322967B1 Module for a testing device for testing printed circuit boards |