| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 05/26/2005 | US20050114067 Measurement control apparatus |
| 05/26/2005 | US20050114065 Test system, test method and test program for an integrated circuit by IDDQ testing |
| 05/26/2005 | US20050114063 Semiconductor device and testing circuit which can carries out a verifying test effectively for non-volatile memory cells |
| 05/26/2005 | US20050114058 Method for analyzing inspected data, apparatus and its program |
| 05/26/2005 | US20050114056 Identifying process and temperature of silicon chips |
| 05/26/2005 | US20050114050 Validation of electrical performance of an electronic package prior to fabrication |
| 05/26/2005 | US20050114048 Method for detecting line-to-line fault location in power network |
| 05/26/2005 | US20050113120 Wireless network system and method |
| 05/26/2005 | US20050112948 Mechanism for testing printed circuit board |
| 05/26/2005 | US20050112848 Method of fabricating vertical integrated circuits |
| 05/26/2005 | US20050112788 Evaluating a multi-layered structure for voids |
| 05/26/2005 | US20050111797 Device package and methods for the fabrication and testing thereof |
| 05/26/2005 | US20050111602 Timing comparator, data sampling apparatus, and testing apparatus |
| 05/26/2005 | US20050111532 Physical coding sublayer for a multi-pair gigabit transceiver |
| 05/26/2005 | US20050111452 Reliable multicast communication |
| 05/26/2005 | US20050111389 Enhanced uplink operation in soft handover |
| 05/26/2005 | US20050111357 Internet endpoint system |
| 05/26/2005 | US20050111293 Synchronous semiconductor device, and inspection system and method for the same |
| 05/26/2005 | US20050111155 Predictive applications for devices with thin dielectric regions |
| 05/26/2005 | US20050110749 Signal generator with display |
| 05/26/2005 | US20050110719 Self-light-emitting display module and method for verifying defect state of the same |
| 05/26/2005 | US20050110561 Precision margining circuitry |
| 05/26/2005 | US20050110548 Variable delay circuit |
| 05/26/2005 | US20050110544 Clock recovery circuit and communication device |
| 05/26/2005 | US20050110526 Disconnection and short detecting circuit that can detect disconnection and short of a signal line transmitting a differential clock signal |
| 05/26/2005 | US20050110521 Dual mode analog differential and cmos logic circuit |
| 05/26/2005 | US20050110515 Failsafe for differential circuit based on current sense scheme |
| 05/26/2005 | US20050110514 Electromagnetic coupling based motor plug detect system and method |
| 05/26/2005 | US20050110513 Semiconductor test module and method of testing semiconductor device |
| 05/26/2005 | US20050110512 Contact resistance device for improved process control |
| 05/26/2005 | US20050110511 Integrated circuit with controllable test access to internal analog signal pads of an area array |
| 05/26/2005 | US20050110510 Die design with integrated assembly aid |
| 05/26/2005 | US20050110509 Contactor having conductive particles in a hole as a contact electrode |
| 05/26/2005 | US20050110508 Apparatus and test method for isolation and electrical shielding prober chuck stage |
| 05/26/2005 | US20050110504 Method and apparatus for implementing very high density probing (vhdp) of printed circuit board signals |
| 05/26/2005 | US20050110501 Electrical circuit test apparatus |
| 05/26/2005 | US20050110500 Method and system for multi-frequency inductive ratio measurement |
| 05/26/2005 | US20050110498 Method for calculating power capability of battery packs using advanced cell model predictive techniques |
| 05/26/2005 | US20050110497 Spark detection apparatus and method that senses the battery voltage |
| 05/26/2005 | US20050110484 Beam current measuring device and apparatus using the same |
| 05/26/2005 | US20050110478 Method and apparatus for detecting electrostatic charges during semiconductor fabrication process |
| 05/26/2005 | US20050110466 Method and apparatus for confirming the charge amount and degradation state of a battery, a storage medium, an information processing apparatus, and an electronic apparatus |
| 05/26/2005 | US20050110464 Fuel cell voltage monitoring system |
| 05/26/2005 | US20050110362 Wear-premonitory carbon brush holder |
| 05/26/2005 | US20050110164 Bump-on-lead flip chip interconnection |
| 05/26/2005 | US20050110157 Device package and method for the fabrication and testing thereof |
| 05/26/2005 | US20050109733 Cleaning and etching methods and their apparatuses |
| 05/26/2005 | US20050108943 Network message processing using inverse pattern matching |
| 05/25/2005 | EP1533882A2 Battery pack with integrated battery protection circuit |
| 05/25/2005 | EP1533624A1 Characterization of electric circuit of electric device |
| 05/25/2005 | EP1533623A2 Method of detecting a branch with an earth fault |
| 05/25/2005 | EP1533622A1 Method for detecting short circuit between conductors |
| 05/25/2005 | EP1532708A2 Fuel cell with a regulated output |
| 05/25/2005 | EP1532461A1 Circuit for simultaneous testing of electricity meters with interconnected current and voltage circuits |
| 05/25/2005 | EP1532456A1 Method of making microelectronic spring contact array |
| 05/25/2005 | EP1432995B1 Remote-programming of pld modules via boundary scan in the system |
| 05/25/2005 | EP1109629A4 Electronic component handler |
| 05/25/2005 | EP1063529B1 Method and apparatus for testing field programmable gate arrays |
| 05/25/2005 | EP1051632B1 Location of fault on series-compensated power transmission lines |
| 05/25/2005 | EP1038186B1 Test socket |
| 05/25/2005 | EP0871931B1 Signal deskewing system for synchronous logic circuit |
| 05/25/2005 | EP0819275B1 System for testing semiconductor devices in parallel |
| 05/25/2005 | DE19960112B4 Testanordnung zum Testen von Rückwandplatinen, Zwischenträgersubstraten, oder bestückten Leiterplatten Test arrangement for testing backplanes, subcarrier substrates or printed circuit boards |
| 05/25/2005 | DE10359236B3 Arrangement for testing power end stage switches semiconductor switch(es) to conducting state according to predefined program to test whether end stage output voltages are in defined tolerance range for respective switch states |
| 05/25/2005 | DE10359235B3 Testing power end stages involves switching semiconductor switches sequentially or simultaneously into conducting state, checking voltage at star point of motor windings against tolerance range to detecting end stage fault |
| 05/25/2005 | DE10350063A1 Radio interference levels measuring method e.g. for RF circuits, involves measuring level of signal and in each case with limit value compared and during excess of limit value by measuring level, respective measuring frequency is marked |
| 05/25/2005 | DE10347038A1 Sensor ageing determination procedure measures Wheatstone sensor bridge centre voltage average for comparison with reference value |
| 05/25/2005 | DE10338693B3 Estimating remaining operating life of x-ray source involves predicting remaining operating life from predicted profile of measurement values measured at intervals and threshold value stored for individual x-ray source |
| 05/25/2005 | DE102004030542A1 Gerätteststeuerung Unit test controller |
| 05/25/2005 | CN2702320Y Electric energy meter fault connection stored program controlled simulation arrangement |
| 05/25/2005 | CN2702319Y CCD measurement experimental device |
| 05/25/2005 | CN2702314Y Detecting probe arrangement |
| 05/25/2005 | CN1620723A Probe card transporting apparatus and to-be-connected body moving mechanism |
| 05/25/2005 | CN1620696A Multi-mode synchronous memory device and methods of operating and testing same |
| 05/25/2005 | CN1620614A Probe card covering system and method |
| 05/25/2005 | CN1620603A Employing infrared thermography for defect detection and analysis |
| 05/25/2005 | CN1620112A Multifunction target mark |
| 05/25/2005 | CN1619909A Over current detector of motor driving circuit |
| 05/25/2005 | CN1619907A 电路断路器 Circuit breaker |
| 05/25/2005 | CN1619899A Semiconductor laser ageing method |
| 05/25/2005 | CN1619884A Terminal row capable of remote controlling and measuring |
| 05/25/2005 | CN1619797A Connector and method of manufacturing the same |
| 05/25/2005 | CN1619789A Test system for testing integrated chips and an adapter element for a test system |
| 05/25/2005 | CN1619701A Method of measuring threshold voltage for a NAND flash memory device |
| 05/25/2005 | CN1619328A Semiconductor device and testing method thereof |
| 05/25/2005 | CN1619327A System of virtual cascade time delay alignment characteristic used for testing chip and its method |
| 05/25/2005 | CN1619326A Testing method of peripheral interconnecting wire |
| 05/25/2005 | CN1619325A Boundary scanning testing controller and boundary scanning testing method |
| 05/25/2005 | CN1619324A Test pattern for reliability measurement of copper interconnection line having moisture window and method for manufacturing the same |
| 05/25/2005 | CN1619323A High voltage electric transmission line automatic survey inspection robot monobody |
| 05/25/2005 | CN1619322A Method and device for measuring drive current of thin film transistor array |
| 05/25/2005 | CN1619321A Automatic testing system for safety standard |
| 05/25/2005 | CN1619319A Nano second grade discharging value quantitative fingerprint analysis method based on parting dimensionality |
| 05/25/2005 | CN1619315A Test probe for electrical devices having low or no wedge depression |
| 05/25/2005 | CN1619314A Detector and tester for display panel experiment |
| 05/25/2005 | CN1619288A Selecting a hypothetical profile to use in optical metrology with sample diffraction signal |
| 05/25/2005 | CN1203739C Interconnect assembly for printed circuit boards and manufacturing method thereof |
| 05/25/2005 | CN1203383C Automatic measuring apparatus, automatic measurement data processing and control apparatus, network system |
| 05/25/2005 | CN1203320C Method for judging state of secondary cell and device for judging state thereof, and method for regenerating secondary cell |
| 05/25/2005 | CN1203307C Complex microwave dielecric constant measuring method for ceramic with high dielectric constant and low loss |